Abstract: A computing device for investigating a load is described. The computing device includes a processor and executable instructions stored in memory that is in electronic communication with the processor. The computing device requests load driving data corresponding to a load that is driven by an electronic device. The computing device also receives the load driving data from the electronic device. The computing device further obtains load characterization data.

Abstract: The present invention relates to a sensor arrangement to monitor at least one ambient parameter, the sensor arrangement comprising: a first layer exhibiting a first electrical conductivity, and at least a second layer exhibiting a second electrical conductivity different than the first electrical conductivity and being at least partially in direct contact with the first layer, wherein the first and the second layer in an initial configuration comprise different concentrations of a diffusible component, having an impact on the conductivity of the first and/or the second layer.

Abstract: A method and a device for measuring a current flowing through a switch which has an unknown inner resistance and two connections, a voltage difference being measured at the switch. During operation, the current provided by an AC voltage source, which is part of an AC voltage circuit connected in parallel with the switch, is superimposed on the current to be measured, the current flowing through the switch, by way of the AC voltage source. Both the amplitude and the frequency of the current provided by the AC voltage source are known. An AC voltage component of the voltage difference and the amplitude of the component are ascertained, and the current between the connections is ascertained and output proportionally to the amplitude of the current of the AC voltage source.

Abstract: A pH sensor may include a reference electrode including a p-channel field effect transistor (FET) whose gate includes a diamond surface having a hydrogen ion insensitive terminal, and a working electrode.

Abstract: A quench detection device (or method) is provided that receives real-time information of concurrently monitored electrical characteristics of a high temperature superconducting (HTS) device, or any superconducting material, device, or system including low temperature superconductors, during operation. The quench detection device determines whether an electrical threshold is satisfied based on the received real-time information. The quench detection device detects a quench condition if the electrical threshold remains satisfied over a predetermined period of time or a predetermined successive number of times. If a quench detection is detected, the quench detection device sends a signal to terminate the operation of the HTS device.

Abstract: The present invention relates to an apparatus and method for measuring the critical current of a superconducting tape. A continuous critical current measurement apparatus for measuring critical current of a superconducting tape while feeding a superconducting tape in a liquid nitrogen container includes wheel-type current terminals and wheel-type voltage terminals. The superconducting tape is continuously supplied and fed by a reel-to-reel device, and the critical current of the superconducting tape is measured in real time using the wheel-type current terminals and the wheel-type voltage terminals while the superconducting tape is fed at constant linear velocity in contact with the wheel-type current terminals and the wheel-type voltage terminals.

Abstract: A measuring device for measuring the alternating current (AC) loss of a high-temperature superconductor is disclosed. In accordance with an embodiment of the present invention, the device includes a pulse power supply unit, which outputs pulse power in a cycle, a lead wire, which is formed on both sides of the pulse power supply unit and applies the pulse power to a superconductor, a degaussing coil unit, which is connected to one side of the superconductor and cancels an inductive voltage, a shunt unit, which is serially connected between one side of the degaussing coil unit and one side of the pulse power supply unit, and a measurement unit, which is connected to both ends of the shunt unit and measures an electric current flowing through the superconductor.

Abstract: A method of testing a superconducting coil path formed in a layer of superconducting material. The material is provided on a former (6) having a substantially curved surface. The method comprises the step of scanning the layer to detect defects in the layer.

Abstract: A method for testing a superconducting coated conductor is disclosed. The method includes providing a superconducting coated conductor having an dimension ratio of not less than about 102; and measuring a voltage over a plurality of segments of the superconducting article while applying a constant current Icc.

Abstract: The invention relates to an MRT device with a superconducting magnet whose coils are located in a helium tank and with electronic control components whereby a section of control components is located inside the helium tank or the helium tank has a hollow depression in its outer surface in which a section of the control components is located. The invention also relates to an MRT device with a superconducting magnet whose coils are located in a helium tank which is located in a vacuum vessel and with electronic control components whereby the helium tank has a hollow depression in its outer surface and whereby the vacuum vessel has a further hollow depression in its outer surface which is located in the area of the hollow depression in the helium tank whereby a section of the control components is located in the further hollow depression in the vacuum vessel.

Abstract: When supplying electric power to a superconducting cable including a superconducting shield covering a superconductive conductor, a phase A of a current generated by a magnetic field leaking from the superconducting shield and a phase B of a current passing through the superconductive conductor are detected, and a phase difference between the phase A and the phase B is obtained so as to determine that a quench has occurred in the case where a difference between a reference phase difference and the obtained current phase difference exceeds a threshold.

Abstract: According to the present invention, there is provided an insulator capacitance analyzer for analyzing C-V characteristics of a first MIS structure having unknown capacitance, which includes: a capacitance structure having known capacitance and configured so as to be serially connectable to the first MIS structure; and a measuring section for measuring synthesis capacitance of the serially-connected first MIS structure and capacitance structure.

Abstract: The invention relates to a device for measuring the concentration of ions, notably of hydrogen ions, in a measuring liquid using at least one ion-sensitive field effect transistor which is integrated into an electric circuit within the device in such a way that said circuit emits an output signal which serves as measure of the ion concentration in the measuring liquid. To provide a circuit which is as simple as possible and in particular comprises as few components as possible, the invention provides for the at least one pH-ISFET to be bridge-connected with at least three resistors.

Abstract: In a quasi-hemispherical Fabry-Perot resonator for the non-destructive determination of the surface resistance Rs of electrically conductive thin material films, spherical and planar mirrors are disposed opposite each other in a double shielded cooled resonator space structure supported on individual base plates and the planar mirror, on which a wafer with the thin material film is supported, is mounted on a support arm which extends through the double shield structure. Shield sections through which the support arm extends are supported on pivot arms which are pivotally mounted in the center of the base plates and the shield sections are engaged by the support arm so that they move along with the support arm when the support arm is moved sidewardly for a positioning change of the planar mirror thereby preventing radiation leakage from the resonator space.

Abstract: The invention relates to an electrode arrangement for an electronic component, also acting as a support for sensors. Said electrode arrangement is mounted on a substrate (1) as a suitably dimensioned surface-structure of two electro-conductive electrodes which are not electrically connected to one another. The electrode arrangement reproduces the conductivities and/or the substance of a sensor-active layer on the conductance of a measuring head or a functional element when said conductivities of the electrode arrangement and/or substance of a sensor-active layer are reproduced in a highly flexible manner. Said electrode arrangement can be produced in a simple and cost-effective manner. The invention provides for a plurality of conductive islands (3) which are not linked or not essentially linked to one another and which are mounted on a dielectric substrate (1) between two electrodes (2) in the form of a planar two-dimensional arrangement.

Abstract: A superconducting current measuring circuit is provided with a detection loop through which a current flows by the influence of a magnetic field generated by a measurement target current. The detection loop contains a superconductor. The superconducting current measuring circuit is also provided with a superconducting sampler circuit for measuring the current flowing through the detection loop.

Abstract: With the help of the millimeter wave measurement system, the surface impedance is determined by means of one or a plurality of resonators with very high three dimensional resolution when there are relatively large resonator openings in the millimeter wave range. By means of this, structures with measurements of {fraction (1/10)} the resonator openings can be solved with no trouble (FIG. 1).