Abstract: A microstrip probe that can be inserted into the mouth or radiating portion of a thick flared notch or open ridged waveguide radiator element within an array antenna aperture and coupled to the TEM feed circuit transition of that element. The probe can then be used to extract performance diagnostic data of the circuitry behind the array aperture without removing the aperture itself. The probe bypasses the radiating portion of the array element and the effects of mutual coupling associated with the array. The probe is a printed circuit board whose thickness matches the gap dimension of the flared notch feed circuit transition line at its feed launch point. A coaxial connector at one end provides a connection to a microstrip line formed on the circuit board. The ground plane of the microstrip narrows to transform the microstrip line into a broadside coupled strip transmission line, which runs to the insertion end of the probe. The strips are shorted together at the insertion end.

Abstract: Disclosed is a system that determines whether input and output leads of semiconductor components are present and properly soldered to a printed circuit board. The system includes a signal source which is connected to a wiring trace on the printed circuit board, which is soldered to the lead being tested. A capacitive test probe is placed on top of the component and connected to a capacitance measuring device. The signal source signal is capacitively coupled through the lead of the integrated circuit package being tested to the capacitive test probe, so if a predetermined capacitance is measured by the capacitance measuring device, the lead is connected to the circuit assembly. As the capacitances being measured are small, the capacitive test probe may include an amplifier, a shield or a buffer circuit to reduce stray capacitance.

Abstract: An apparatus and method for providing durable, high performance, probing of semiconductor devices having a large number of narrow pitch terminals. A single probe of the present invention provides flexible probing of a wide range of the devices having various sizes and terminal arrangements. In contrast, teachings of the prior art require a separate probe to be manufactured or a probe to be re-formed for each different size and terminal arrangement of the devices. The probe of the invention includes electrodes electrically coupled with a test system in such a way so as to provide the devices to be probed with a selection of more than two arrangements in which device terminals contacting the probe electrodes are not shorted with each other by the probe.

Abstract: An adaptable probe card assembly for testing an IC die includes a probe card and a decoupling apparatus selectably mounted on the probe card. A different decoupling apparatus is used for each IC die to be tested having a different power and ground bond pad configuration. Each decoupling apparatus includes a conductive ground bus connected to ground, a nonconductive support structure, and a plurality of chip capacitors sandwiched between the conductive ground bus and nonconductive support structure in such positions that they are each connected at one end to the ground bus and at another end to one of the power or ground bond pads of the IC die being tested via a conductive contact extending through a hole in the nonconductive support structure down to a signal contact formed on the probe card, which signal contact is in turn, connected to a needle making touch contact with the appropriate power or ground bond pad of the IC die being tested.

Abstract: A testing apparatus has a probe card having a plurality of first contact elements to be put in contact with an object to be tested, and a plurality of electrodes electrically connected with the first contact elements, a test head to be shifted between a retreat position and a test position, for performing electrical measurement of the object in the test position, a cylindrical connection unit, having a plurality of second contact elements to be put in contact with the electrodes of the probe card in the test position, for electrically connecting the probe card with the test head, the connection member being movably supported by the test head, a head plate for supporting the probe card, a driving mechanism for moving the probe card between a test position near the head plate and a wait position away from the head plate, and a movement limiting member for limiting movement of the connection member towards the test head and applying a pressing force to the connection member and the probe card via the second cont

Abstract: A probe apparatus especially useful in probing circuit boards used in electronic equipment. Two beam support members of unequal length and in a spaced relationship to a work object having the longer beam between the shorter beam and the work-object, the two beams being attached to a moveable support at joints substantially displaced in the direction of the beams' lengths, the other end of the two beams being attached to the probe support members at joints that follow the arcs of rotation required to cause the probe tip to pass through three points of a straight line travel of the probe tip during z-axis flexing, thus maintaining the position of the probe tip in the x-y plane during z-axis flexing. The resulting motion is a rotation of the end opposite the probe tip, in the x-z plane, pivoting at the initial contact point of the probe tip, thus avoiding an x-y plane "wiping" of the probe over the contact area which may damage the work object being probed.

Abstract: A non-contacting electrostatic measurement apparatus including a vibratory element and an electrode, affixed to the vibratory element, suitable for sensing a capacitive coupling relationship with an electrostatic field to produce a signal indicative of the magnitude of the electrostatic field. The signal is transmitted to signal processing circuitry via conductive fibers so as to impose little mechanical loading on the vibrating electrode. The electrode may be either unshielded, for an electrically floating electrostatic voltmeter, or shielded, for an electrostatic voltmeter employing electrically grounded components.

Abstract: A return-loss detector for a serial digital signal source uses a return-loss bridge circuit to exploit the broadband spectral characteristics of a serial digital signal from the signal source to monitor the termination conditions of a system being driven. A differential pair of serial digital signals from the source are input to the bridge circuit having a reference termination in one leg and the system termination in the other. A broadband detector is used at the output of the bridge circuit to generate an error signal, which is measured by a detector or metering circuit. The measured signal may be displayed as a value in dB or may be input to a comparator to provide an alarm or warning signal to an operator.

Abstract: A buckling beam test probe assembly for the electrical test of integrated circuit devices is provided having contact probes made of a composite material and a stripper plate constructed so as to allow scrubbing and controllable wiping of the contact probe on the surface of the device to be tested. The assembly is designed for the maximum number of expected contact probes. Only the contact probe compartments which are needed for testing the devices are populated.

Abstract: To test for proper connections of integrated-circuit connection pins (22) on a circuit board (12) to the conductive paths to which they should be connected, a tester (10) applies signals of different frequencies to paths to be connected to different IC pins provided by the same integrated-circuit package (24). The resultant composite electric-field signal in the vicinity of the integrated-circuit package (24) is coupled to a capacitive probe (42), and the probe signal is subjected to frequency analysis (58-1, 58-2 , . . . 58-J) to determine whether the applied frequency components are present in the signal with sufficient magnitudes. If the magnitude in the sensed signal of an applied frequency component is not great enough, the tester generates an indication that the corresponding IC pin has not been properly connected.

Abstract: The output of a bridge measurement circuit is sampled at a time when there is no desired, or expected, bridge output signal, and a balance voltage applied to the bridge measurement circuit is automatically adjusted such that the sample bridge output signal is equivalent to a reference output signal. After the bridge is balanced, the balance voltage is automatically modified by a calibration voltage calculated to provide a known change in the sample bridge output signal, and the sample bridge output signal is compared to a reference output to automatically check the bridge measurement circuit gain. The balance voltage may be automatically modified by multiple calibration voltages, and the sample bridge output signal provides an indication of the linearity of the amplifier gain. The sample bridge output signal is monitored after a change in the balance voltage to automatically provide an indication of the bridge measurement circuit filter cutoff frequency.

Abstract: A body block is fixed to a conductive frame, and the frame has a terminal inserting hole and a contact block accommodating hole which open into each other. A conductive contact is movably supported within the accommodating hole and biased toward the terminal inserting hole by a conductive elastic member. A cover is provided for insertion into the terminal inserting hole to hold the terminal in place, and a driving device is provided for moving the cover in and out of the terminal inserting hole. An electric wire is connected between a measuring device and the frame. A terminal is inserted into the terminal inserting hole in contact with the conductive contact block, and the cover is moved into the terminal inserting hold to fix the position of the terminal. A connection wire or lead from the terminal is connected to the measuring device, so that a circuit is formed by the terminal, the conductive block, the elastic member, the frame, the electric wire, the measuring device, the lead, and the terminal.

Abstract: An electrical test device for use by an electrician in testing circuits. The device includes a voltage sensor, display, voltage transducer and steady current source. The voltage sensor measures the voltage between two conductors and provides a signal to the display, which responsively displays the voltage. The steady current source is in series with the voltage transducer, so that the voltage sensor may respond to a broad range of voltages while only a limited amount of current flows through the voltage transducer. Consequently, lower cost components may be used in the voltage transducer.

Abstract: An integrated circuit test system provides a quick change flexible circuit membrane (214). The flexible circuit membrane is a quadrant based design which allows steep launch angles away from a rectangular die under test (112). The flexible circuit membrane is edge guided (308,309) for positioning and concentric alignment in a probe tooling fixture (212). The system may include a focusing force member (528) focusing force only at the test point locations in line with the die pad contact positions (512) which allows greater force to be concentrated on the contact area, and helps to alleviate the debris tracking or "dust mop" effect. Additionally, a relieved area (620) may be provided on the pressure applicator (616) to prevent membrane droop or the pillowing effects.

Abstract: A device (100) for use in a test fixture system which uses a plurality of ultrasonic transducers (103,105,107) to transfer energy to a plurality of contact probes (109). The ultrasonic energy enables the pins (111) to pierce and move obstructing materials to insure adequate electrical contact between the contact probe and an electrical connector on a device under test.

Abstract: The present invention provides a connector inspecting apparatus (D1, D2, D3, D4) for inspecting a connector having a retainer (R1, R2, R3, R4) for positioning and fixing a plurality of terminal metal fittings to predetermined positions in a housing (H1, H2, H3, H4). A receiving portion (40) for receiving the housing (H1, H2, H3, H4) of the connector (C1, C2, C3, C4) has a size regulating member (60) adapted to come in contact with the retainer (R1, R2, R3, R4) for positioning the housing (H1, H2, H3, H4) at the time of inspection.

Abstract: A probe for making electrical connections to the legs of an already mounted integrated circuit carries rows of tapered wedges. The wedges within a row are spaced apart by an amount that corresponds to the width of the IC's legs. For n-many legs on a side of the IC there are n+1 corresponding wedges, which then have n-many intervening spaces. As the positioned probe is pressed down the spaces between the wedges receive the legs of the IC, and wedges become wedged between the IC's legs. Each wedge has left and right conductive surfaces separated by an insulator. Each leg of the IC has a wedge to its left and a wedge to its right. Within the probe the right-hand conductive surface of the wedge to the left of a leg, and the left-hand conductive surface of the wedge to the right of that leg, are electrically connected together. Thus, the probe makes electrical contact to each leg in two places. The tapered wedges are of Ni- and Au-plated BeCu separated by acrylic adhesive and Kapton.

Abstract: A test system 100 for performing electrical testing in a high voltage or inhospitable or inconvenient environment 150 electrically isolates a measurement detector 130 located within the environment from an externally located measurement result display and selector 110. Electrical isolation is accomplished using a non-conducting fiber optic link 120 for communicating the measurement results.

Abstract: An assembly suitable for use as an overclamp assembly is provided. The assembly includes a base having a shaft inserted therethrough. The shaft rotates about an axis relative to the base. A center block is pivotably coupled to the shaft for arcuate movement about the axis and relative to the base. A longitudinal drive assembly is inserted into the center block and coupled to the shaft. Rotation of the shaft causes the longitudinal drive assembly to traverse a longitudinal path and an arcuate path about the axis. The longitudinal drive assembly includes a holder which is suitable for attachment to a probe arm.

Abstract: A probe apparatus tests the electrical characteristics of chips formed on a semiconductor wafer by bringing probes into contact with pads of each chip. The probes, which include ones for power supply potentials, signals, and ground potential, are mounted vertically penetrating a ring block which is attached to the center of a main PCB of a probe card. A tray containing a number of fuses is mounted over the probe card by means of struts. The fuses in the tray connect wires of the main PCB, to which the supply potential of a DC power source is applied, and their corresponding probes. The fuses and the tray can be collectively removed from the probe card to be replaced with new ones.

Abstract: A feedback operated DC bridge circuit for monitoring the voltage variations in a voltage divider circuit using a voltage controlled resistance component to reach a null balance across the bridge. Amplification is provided at higher accuracy near the null point when the voltage difference across the bridge is zero. The feedback bridge circuit includes an integrator which directly drives the controlling component to the value of the resistance in an unknown branch to force the null condition. The voltage controlled component (configured as a discrete metal oxide semiconductor device or bipolar junction transistor) and the balancing scheme are suitable for microfabrication and provides noise-rejection enhancement. The interconnected integral feedback of the autonulling DC bridge enables both a neural network for pre-processing sensor input in a spatial domain as well as general analog computation that mimics a first order differential equation in the form of the system state equation.

Abstract: A circuit for balancing an error signal delivered by an apparatus. When the apparatus is switched on initially, the error signal may be large and thereafter change only slowly with time. The error signal may be a signal which is delivered by a measuring sensor and which is independent of the quantity to be measured. The circuit includes a negative feedback loop 7, 11 which, immediately upon activating or starting the apparatus, feeds back a balancing signal which rapidly compensates the error signal. The circuit also includes components 12-16 for changing the feedback loop when the error signal has been substantially compensated, so that only slow changes in the error signal with a frequency below a selected upper limit frequency are fed back.

Abstract: The invention relates to an instrument for testing and/or measuring electric magnitudes, in particular voltages and/or resistances. The instrument consists of two handle parts (10, 12), which are connected by a flexible cable (14), and which each have a contact point (16, 18). In addition to the contact point (16, 18), the handle parts (10, 12) each have a receptacle for the contact point (18, 16) of the other handle part (12, 10). The handle parts (10, 12) can be plugged together in such a way that their contact points (16, 18) each are pluggable into the receptacle of the other handle part (12, 10) nonparallel with the contact point (18, 16) of such other handle part. The contact point (16) and the receptacle of the one handle part (10) are arranged in a down-folding point part (22), so that the instrument, in the plugged-together condition, can be folded together for convenient, safe and space-saving storage.

Abstract: A test circuit for testing operation of a liquid level detector. The liquid level detector includes a probe that is placed at a test site. A control circuit monitors changes in capacitance of the probe due to changes in the liquid level at the test site. A test switch grounds an input to the probe which and causes the control circuit to sense an alarm condition. If the detector does not activate an alarm when the test switch is actuated, the detector is not properly functioning and repair or replacement of the level detector is needed.

Abstract: Electrical connections to extremely small contact points or test connections are obtained by a tool which includes a stable base having a deformable flexible shaft extending therefrom. A needle type contact point in a spring biased mounting subassembly maintains contact electrically as the tip is forced against the test point by the shaft. The connector can include shielding against Radio Frequency Interference (RFI) or Electromagnetic Interference (EMI).

Abstract: A semiconductor apparatus for functionally inspecting semiconductor devices is designed to prevent contact failure, deformation, and the like caused by solder transferred from external leads of semiconductor devices and deposited on contact terminals of the inspection apparatus. A sheet having metal-film patterns corresponding to an array of external leads of a semiconductor device is interposed between the external leads and the contact terminals to electrically connect the external leads to the contact terminals. The semiconductor device is inspected and the sheet is changed at a suitable time when it is contaminated with solder.

Abstract: A multi-channel electromagnetically transparent voltage probe transmission link system for monitoring a plurality of voltage signals at a plurality of test points of a device under test that is subjected to a radiation field. Each channel includes two voltage probes, an electrical to optical signal transmitter, an optical signal transmission line and a receiver located out of the radiation field. The voltage probes contact and sense the voltage signals at the test point. The electrical to optical transmitters are removably mounted in a common base and are powered by either a common (or shared) power supply and/or by dedicated power supplies, such as rechargeable batteries. The receivers process the optical signals and provide display signals corresponding to the sensed voltage signal at the plurality of test points for evaluating the effect of the test radiation field.

Abstract: An electrostatic discharge generator device for generating/simulating controlled electrostatic discharges, in both positive and negative polarities is disclosed for testing electronic equipment. The device includes an electrically conductive body with an attached contact probe mounted thereon and insulated therefrom. The device includes a high voltage generator and a mechanism to operate the generator. An impedance element is electrically connected to the generator. An electrical coupling interconnects the impedance element and the probe and has a spark gap formed therein. The spark gap is located in a sealed, vacuum or gas filled, chamber. The width of the spark gap determines in part the voltage level and signal characteristic of the ESD. Because of the conductive body, no ground wire is required from the equipment-under-test to the generator, as the human body of the user is used to complete the electric circuit loop.

Abstract: A system for unintrusively determining parameters such as current, voltage and power delivered through a service line to a customer for verifying accuracy of the customer's entrance meter. The system includes a sensor apparatus for monitoring voltage and current on the power line. A voltage clamp mechanism is disposed within a sensor housing such that an insulation piercing voltage sensor can be manually actuated to pierce the electrical insulation of the power line and contact the conductor. The sensor apparatus also includes a split-core current transformer fabricated to minimize the air gap between the split-core sections when the apparatus is closed about the power line. A pole unit is electrically connected to each sensor apparatus for monitoring the voltage and current, calculating the power consumed in kilowatt-hours and storing calculated kilowatt-hours in memory with an appropriate date/time stamp, for subsequent retrieval and comparison with the customer's entrance meter readings.

Abstract: A device for detecting the presence of an electric current in a conductor having a elongate hollow tubular body defining a handle, an electrically conductive blade having a sharpened edge attached to and extending from one end of the handle, an electric lamp visibly housed within the handle and electrically connected to the blade and a ground wire electrically connected to the lamp and including a clamp for secured attachment to a ground. The sharpened edge of the blade is specifically structured and disposed for cutting through the insulation of a wire conductor for conductive contact therewith whereupon the presence of an electric current through the conductor will illuminate the lamp in the handle of the device.

Abstract: Disclosed is a system for testing continuity that determines whether input and output leads of semiconductor components are present and properly soldered to a printed circuit board. The system includes a signal source stimulus which is connected to a wiring trace on the printed circuit board, which is soldered to the lead being tested. A capacitive test probe is placed on top of the component. The stimulus signal is capacitively coupled through the lead of the integrated circuit package being tested to the capacitive test probe, so if a predetermined signal level is detected by the capacitance test probe, the lead is connected to the circuit assembly. As the capacitances involved are small, the capacitive test probe includes an amplifier, a shield or guard and a buffer circuit to reduce stray fields pick up effects.

Abstract: A double-headed spring contact probe for loaded board testing including a barrel having a hollow interior and opposite plungers which slide axially in the barrel is described. The plungers have outer portions which extend through the opposite open ends of the barrel, each terminating in a contact tip outside the barrel for contacting a test point on a circuit board. One of the plungers has a hollow receptacle extending into the barrel with a rectangular or notched keyway opening into the receptacle. The keyway is disposed at an angle of about 6.degree. to the longitudinal axis thereof. The other plunger has a twisted guide member extending through the barrel into the keyway of the other plunger whereby axial translation of the plungers relative to each other causes a rotation thereof and the keyway rides in the groove for electrical contact as translational movement occurs.

Abstract: A method and apparatus for measuring mass flow rates and other characteristics of a fluid in a large conduit uses a sensor circuit having a heater/thermometer, a reference resistor, and a thermometer resistor arranged in four-wire network to enable measurement of all characteristics of the resistor network. That sensor circuit is preferably mounted on an interior wall surface of a support tube. A plurality of such support tubes, each having a plurality of sensors within the support tube, are mounted in an array in the cross section of the duct. A cleaning plate for cleaning the exterior surface of the support tube permits calibration of the network while cleaning. A program for using the circuit to calculate values of interest and to display desirable output data is also disclosed, as is a program for controlling the cleaning/calibration cycle.

Abstract: An apparatus and method for reliably interconnecting a test device with a circuit board designed for fine pitch solder lead surface mounted components is described. The test equipment interface system of the present invention includes a board interconnect unit, an interposer, and a test device cable. The test device cable is coupled to a test device, which can receive and manipulate signals via the cable. These signals correspond to signals provided by a component being emulated by the present invention. A component being emulated is replaced on the circuit board by the board interconnect unit. The board interconnect unit has leads or pins in a quantity, size, and configuration corresponding to a component being emulated and is typically soldered to a circuit board under test for the purpose of analyzing and debugging the circuitry on the circuit board. The board interconnect unit features a lead frame which is attached to a metal body.

Abstract: The probe is a tubular shaped device held in one hand such as one would hold a hypodermic syringe. An extended L shaped hook acquires and presses an electrical wire to be tested into the apex of a V notched holding block. The hook and holding block, with test wire in between, are held pressed together by spring action. The holding block has a guide and outlet hole centered at the apex of the V notch which receives and guides a needle probe along a radial line towards the central axis of the wire. The needle pressure and position are controlled independently by the operator via a threading mechanism. Proper penetrating pressure can be applied for a range of wire sizes and insulation types. The needle is removable for sharpening or replacement.

Abstract: A probe assembly for testing an integrated circuit includes a probe card of insulating material with a central opening, a rectangular frame with a smaller opening attached to the probe card, four separate probe wings each comprising a flexible laminated member having a conductive ground plane sheet, an adhesive dielectric film adhered to the ground plane, and probe wing traces of spring alloy copper on the dielectric film. Each probe wing has a cantilevered leaf spring portion extending into the central opening and terminates in a group of aligned individual probe fingers provided by respective terminating ends of said probe wing traces. The probe fingers have tips disposed substantially along a straight line and are spaced to correspond to the spacing of respective contact pads along the edge of an IC being tested. Four spring clamps each have a cantilevered portion which contact the leaf spring portion of a respective probe wing, so as to provide an adjustable restraint for one of the leaf spring portions.

Abstract: Apparatus and method for low cost monitoring the level of signal at a test point in a system for susceptibility to electromagnetic fields. A probe, including a detector diode, and a non-metallic, electrically overdamped conductor, which is transparent to the electromagnetic field, is used to monitor the signal level at a test point as an amplitude modulated radio frequency carrier. The carrier is transmitted to a monitor outside of the range of the electromagnetic field using a transmission link, such as an optical waveguide transmitter, that is transparent to the electromagnetic field when the system under test fails. The system under test can then be removed from the electromagnetic field and, for each frequency at which the system failed, a voltage can be injected, using a voltage injection probe, into the system at another point to recreate the detected level of signal at the test point that was coupled into the system from the electromagnetic field.

Abstract: An adjustable probe tip has a female part that includes a ring structure and a hook extending therefrom. The ring structure has a threaded bore. The probe tip also has a male part having a threaded cylindrical surface that is screwably received by the female part. The male part has an inner bore that is not threaded and receives a metal probe tip cap therein. Screwing the male part into the threaded bore of the female part adjusts the relative distance between the hook and the end of the male part. The metal cap is received in the end so that a wire trapped between the metal part and the hook may be pierced by a probe tip of the metal cap. A test probe may be received by the male cap and bore of the male part so that electrical contact will be made between the probe tip and the metal cap. As the probe pierces the wire trapped between the probe tip cap and the hook, a secure contact is made between the conductive core of the wire and the conductive path from the probe tip to the test equipment.

Abstract: A capactive sensor contains a bridge circuit (1,2,3,4) which is comprised of an electrode surface (21) and a reference electrode surface (24) with the electrode surfaces located on the opposite sides of a plate. The bridge circuit is constructed as a multi-layered printed circuit board. The feed areas (23) which are opposite the electrode areas (21, 24) on one or two inner layers serve as feed capacitors (1, 2) in the bridge circuit (1, 2, 3, 4).

Abstract: A high-voltage unit comprising at least a high-voltage electrode which carries a high voltage in the operating condition of the high-voltage unit. A measuring divider/resistor arrangement is connected between the high-voltage electrode and a measuring point wherefrom a measuring voltage is derived corresponding to the variation in time of the high voltage. A reduced volume and thus a more compact device is achieved in that a flat measuring electrode is provided which carries the potential of the measuring point and in that the measuring divider/resistor arrangement is positioned between the high-voltage electrode and the measuring electrode so that it is inclined relative to each of these electrodes.

Abstract: A probe apparatus includes a probe contact connected to a storage capacitance via a photoconductive switch. The photoconductive switch can be operated at high speed by means of a pulsed laser. The laser pulses (L) are synchronized with a moment in the operation cycle of the circuit at which moment the voltage at the point under test is to be measured. After a number of pulses and operation cycles the storage capacitance is charged to the voltage value (V) to be measured. Then, the capacitance does not form a load on the point under test and the voltage (V) can be determined accurately.

Abstract: An electronic sensing circuit, which can be used in place of a linear variable differential transformer (LVDT) has four piezoresistor elements in a Wheatstone bridge configuration. A source voltage is applied across a first pair of bridge points, and the resulting junction voltages appearing at a second pair of bridge points are applied to a pair of inverting amplifiers in balanced configuration which provide first and second output voltages which change relative to each other depending upon the direction and amount of pressure applied to the piezoresistor elements in a manner similar to the output voltages provided by an LVDT.

Abstract: An AC impedance buffer comprising a series of three bipolar transistors in emitter follower configuration is AC coupled to a probe input. An output bipolar transistor has its emitter connected to the output emitter of the AC buffer and its collector provides the probe output. A DC impedance buffer comprises an op amp having inputs connected to the probe input and output and output connected to the base of the output transistor. Another op amp negatively biases the emitter followers so their collectors can be grounded and adds the DC and low frequencies to the AC buffer.

Abstract: A probe card formed of a printed circuit board having an opening therein and having a ground plane formed on the lower surface thereof. A ground strip formed of aluminum is secured to the printed circuit board and positioned adjacent the opening and in electrical contact with the ground plane. The strip includes a support surface for supporting a plurality of probes extending along and parallel to the surface and secured thereto by insulating means to maintain a predetermined distance from the support surface. The probes extend into the opening for making temporary electrical contact with a circuit to be tested.

Abstract: A probe is formed of an Au--Cu alloy essentially consisting of 74 to 76 parts by weight of gold and 24 to 26 parts by weight of copper, by a process comprising the steps of heating the alloy to at least 350.degree. C. and gradually cooling the heated alloy to the room temperature in at least 5 hours.

Abstract: An instrument for performing electrical tests includes a housing adapted to be held in the hand. A conductive probe and a two-conductor power cable adapted to be connected to a vehicle battery protrude from the housing. Red and green light emitting diodes (LED's) mounted in the housing are operatively interconnected with the probe and power cable through circuitry which causes the red LED to glow when the probe contacts a positive voltage, and the green LED to glow when the probe contacts a low voltage, ground, or a negative voltage. Continuity testing may be performed by contacting the probe against one terminal of a device to be tested, and contacting the other terminal of the device to ground or to an auxiliary test lead extending from the housing, causing the green LED to glow. The instrument includes a momentary contact switch that permits the probe to be energized by internal connection to the positive or ground input terminal.

Abstract: A tool for grasping an electrical power conductor has a plurality of pointed pins mounted on a movable platform to pierce cable sheathing and insulation and contact a conductor of a cable held clamped in place by the tool. The pins are arranged so that at least one pin will contact the conductor to determine whether the conductor is energized.

Abstract: A portable hand held diagnostic tool which non-invasively detects an electric field when placed adjacent a component of a spark plug firing portion of an ignition system and provides a positive indication of the detected electric field. A printed circuit board containing a control circuit, a replaceable battery supply, an ON/OFF switch, an indicator such as an LED, and a pickup antenna, is slidably mounted within the hollow interior of a dielectric tubular case. The antenna is located adjacent a pickup end of the case and detects the electric field generated by an ignition system during firing of a spark plug which actuates the LED in response to the detected firing. The dielectric case is free of external metal parts adjacent the pickup end to help minimize arcing. A battery test circuit may be incorporated into the control circuitry to ensure an adequate power supply for operation of the control circuitry. A fixed or variable resistor enables the sensitivity of the firing pickup to be selected.

Abstract: A hand held wand utilizes an elongated rigid hollow longitudinally extending stainless steel tube open at both ends. A data collection probe is disposed in one tube end. A data uploading port is disposed in the other tube end. The probe and port each include a stainless steel body electrically and mechanically engaging the tube. Each body has a front surface disposed outside of the tube with a peripheral annular ring and a central recess extending inwardly and terminating in a rear surface having a first opening. Each body also includes a corresponding longitudinally extending central electrode disposed in the corresponding recess. Each central electrode has an exposed front surface flush with the ring and a rear surface aligned with and spaced from the opening. Electrical insulation is disposed in the recess to electrically isolate the electrode from the body and the tube. The two bodies and the tube define a common external electrical ground with respect to the central electrodes.

Abstract: In a temperature measuring circuit connecting a temperature sensor such as a thermistor to a standard voltage source through tap resistances, detecting a sensed value of the temperature sensor by comparing the voltage of the sensor connecting point with the specified voltage by a comparator, a simplified construction of the circuit makes it possible to detect failures of the temperature sensor such as breakage or burn-out.