Hand-held Patents (Class 324/754.02)
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Patent number: 10502640Abstract: A meat probe has a shaft, plug, and stabilizer for measuring a parameter (e.g., temperature) of a piece of meat and communicating the measurement to a cooking appliance. The stabilizer may have a plurality of wings. For example, two wings may be cantilevered about a proximal end that is at the shaft. As the shaft is inserted into the piece of meat, the wings are bent outwardly about the proximal end. In another example, four wings are connected on opposite ends to a first and second base, and the shaft extends through the first and second bases. As the shaft is inserted into the piece of meat, the second base is pushed upward, decreasing the distance between the first and second base and bending the wings about a middle portion.Type: GrantFiled: June 25, 2018Date of Patent: December 10, 2019Assignee: Electrolux Home Products, Inc.Inventors: Steven M. Swayne, Brendan McGinnis, Elizabeth A. Byrne
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Patent number: 9182425Abstract: An apparatus for testing electrical characteristics of a device, having one or more testing sites. The apparatus comprises a nonconductive plate having a through-hole. The through-hole is positioned such that it at least partially overlays one of the one or more testing sites when at least a portion of the bottom surface of the nonconductive plate is adjacent to the device to be tested. The apparatus also comprises an adhesive on at least a portion of the bottom surface of the nonconductive plate for attaching the bottom surface of the nonconductive plate to the device to be tested. The apparatus also comprises a probe positioning body protruding from the top surface of the nonconductive plate and having a through-hole. The probe positioning body is positioned such that the through-hole of the probe positioning body at least partially aligns with the through-hole of the nonconductive plate.Type: GrantFiled: May 21, 2012Date of Patent: November 10, 2015Assignee: Lenovo Enterprise Solutions (Singapore) Pte. Ltd.Inventor: Jian Meng
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Patent number: 9110095Abstract: A tool for use in the testing of railroad relays allows for the uninterrupted completion of an electric circuit while performing a mechanical operation. The device provides an electrical connection point at a midpoint of a driver shaft. The connection point is used to connect a voltmeter or similar measuring instrument lead. The connection point utilizes a copper brush mechanism to keep constant electrical contact with the shaft even when turning. The connection point is held in place by a pair of retaining washers. These features allow a user to perform electrical readings through the driver while using the driver to perform mechanical adjustments.Type: GrantFiled: July 10, 2012Date of Patent: August 18, 2015Inventor: Roy E. Weir
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Patent number: 8922196Abstract: A multifunction test instrument probe includes a housing having a hollow bore with an open end. A clamp plunger is carried in the hollow bore, with a first end including a thumb press, and a second end including an alligator clamp having a pair of jaws, with a compression spring normally biasing the thumb press away from the housing, and normally biasing the alligator clamp substantially within the hollow bore proximate the open end. A point plunger is also carried in the bore, with a first end including a thumb press, and a second end terminating in a point, with a second compression spring normally biasing the thumb press away from the housing, and biasing the point within the hollow bore proximate the open end.Type: GrantFiled: March 15, 2013Date of Patent: December 30, 2014Inventors: Paul Nicholas Chait, Stanley Chait
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Patent number: 8791689Abstract: Disclosed is a probe for an oscilloscope comprising a multi-stage transistor amplifier that acts as an impedance transformer. Said amplifier is a d.c.-coupled emitter follower circuit that is composed of bipolar transistors or a d.c.-coupled source follower circuit which is composed of field effect transistors and the successive amplifier elements of which are dimensioned and tuned to each other in such a way that the resulting offset direct voltage between the input and the output is minimal.Type: GrantFiled: July 16, 2007Date of Patent: July 29, 2014Assignee: Rohde & Schwarz GmbH & Co. KGInventors: Martin Peschke, Alexander Schild
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Patent number: 8680844Abstract: A force compensated probe for electrical measurement is provided and includes a support structure having a back plate and sidewalls, a probe for electrical measurement of an article and an elastic base disposed to supportively couple the probe to the back plate such that the probe normally protrudes away from the back plate beyond distal edges of the sidewalls, and, when the probe is applied to the article for the electrical measurement such that components of the support structure contact the article, a predefined load is consistently applied to the elastic base.Type: GrantFiled: December 1, 2010Date of Patent: March 25, 2014Assignee: General Electric CompanyInventors: Philip Frank Burnett, Daniel Lawrence Banowetz, Lisa Ann Hong
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Publication number: 20140035607Abstract: Embodiments of the present disclosure are generally directed to handheld systems, individual components, and methods of using such systems and components for measuring parameters, such as electrical, mechanical, and physical measurement parameters. In one embodiment of the present disclosure, a host handheld device generally includes a measuring system for measuring a first parameter, wherein the first parameter is an electrical parameter, and a receiving system for receiving at least a second parameter from a separate module device.Type: ApplicationFiled: March 14, 2013Publication date: February 6, 2014Inventors: Paul Herman Heydron, Henricus Koppelmans, David Lawrence Epperson, Luis Alberto Katz, Jeffrey Charles Hudson, Glen Howard Vetter
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Patent number: 8536858Abstract: An oscilloscope includes a number of probe assemblies. Each probe assembly includes a probe and a connecting member. The connecting member includes a first connecting portion that may be coiled around the probe and a second connecting portion. The probes are connected together by the connecting members, and can be grounded by soldering one of the second connecting portions to a ground plane.Type: GrantFiled: August 27, 2010Date of Patent: September 17, 2013Assignee: Hon Hai Precision Industry Co., Ltd.Inventor: Chun-Yuan Tien
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Patent number: 8448306Abstract: A tool accessory (10) for clamping a pair of multimeter probes allowing the probes to pivot relative to each other or separate from each other to be used separately for testing electrical components. The tool accessory (10) behaves as a pair tweezers. The tool accessory (10) utilizes a lock (16) that adjusts the angle of the probes. The lock (16) also biases the probes via pushing a pair of legs (12, 14) of the tool accessory (10).Type: GrantFiled: December 1, 2010Date of Patent: May 28, 2013Inventor: Ernesto Garcia
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Patent number: 8410804Abstract: A system for making high frequency measurements on a DUT includes a high frequency measurement instrument; a plurality of DUT probes; a first coaxial cable having a center conductor and a coaxial conductor for connection between the instrument and a first DUT probe; and a second coaxial cable having a center conductor and a coaxial conductor for connection between the instrument and a second DUT probe, at least one of the first and second cables being selectively shortable between the respective center conductor and coaxial conductor at a location near the respective DUT probe.Type: GrantFiled: February 24, 2009Date of Patent: April 2, 2013Assignee: Keithley Instruments, Inc.Inventor: Wayne C. Goeke
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Patent number: 8368415Abstract: A circuit tester having a multi-position probe is provided. The circuit tester includes a handle with a detent assembly that allows for positioning the probe at various angles for testing a device. Once a good connection is made with the device under test, an indicator such as a light is lit or a sound is emanated. The probe may be folded into a compartment within the handle once the testing is completed.Type: GrantFiled: February 20, 2009Date of Patent: February 5, 2013Assignee: SPX CorporationInventors: Thomas J. Jaite, Alexander Shaland, Christopher D. Labedz
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Patent number: 8310223Abstract: An electrical probe and associated method are provided to establish electrical contact with a wire. The electrical probe includes an elongate member extending between opposed first and second ends, and first and second needles connected to the elongate member and extending beyond the first end of the elongate member. The electrical probe also includes first and second conductors electrically connected to the first and second needles, respectively, and extending along the elongate member. The electrical probe also includes a bumper stop connected to the elongate member proximate the first end of the tube. Further, the electrical probe includes a movable engagement member extending lengthwise along the elongate member. The moveable engagement member includes a hook that extends beyond the first end of the elongate member and beyond the first and second needles. The hook may include a terminal portion configured to contact the bumper stop.Type: GrantFiled: August 19, 2010Date of Patent: November 13, 2012Assignee: The Boeing CompanyInventors: Edward K. Hoffman, Thomas A. Miller