Test Of Solar Cell Patents (Class 324/761.01)
-
Publication number: 20140333340Abstract: Apparatus and method for registering conditions of performance in a photovoltaic array are provided. A group of neighboring photovoltaic modules may be arranged to sense a reference performance for a respective photovoltaic module of the photovoltaic array. Each of the neighboring photovoltaic modules may have a transmitter to transmit data indicative of the reference performance. The respective photovoltaic module may have a receiver to receive the data transmitted by the group of neighboring photovoltaic modules. A processor in the respective photovoltaic module may be provided to compare data indicative of its respective performance relative to the data received from the group of neighboring photovoltaic modules. The processor may be configured to register a condition of the performance of the respective photovoltaic module based on a result of the data comparison.Type: ApplicationFiled: May 13, 2013Publication date: November 13, 2014Applicant: General Electric CompanyInventors: Mark Ronald Lynass, Said Farouk Said El-Barbari, Lucian Vasile Stoica
-
Patent number: 8884777Abstract: A mobile device including a solar battery having a light-receiving surface provided on a casing of the mobile device, an illuminance detector that detects an illuminance of light incident on the casing, an output section that outputs a state of light incident on the light-receiving surface of the solar battery, and a controller that controls the output section based on the illuminance detected by the illuminance detector.Type: GrantFiled: April 8, 2011Date of Patent: November 11, 2014Assignees: Sony Corporation, Sony Mobile Communications Inc.Inventors: Hiroshi Kato, Kimitaka Benise, Jusuke Shimura, Yoshiaki Inoue, Yasuhide Hosoda
-
Patent number: 8878562Abstract: A solar battery panel inspection apparatus is an apparatus for inspecting a solar battery panel including a transparent insulating substrate having a main surface, and a transparent electrode layer, a semiconductor photoelectric conversion layer and a back electrode layer which are sequentially stacked and having an outer circumferential insulating region in which the main surface is exposed, to check the insulation performance of the outer circumferential insulating region.Type: GrantFiled: April 12, 2010Date of Patent: November 4, 2014Assignee: Sharp Kabushiki KaishaInventors: Shinsuke Tachibana, Akira Shimizu
-
Patent number: 8878563Abstract: A system and apparatus for detecting and locating an arc fault in a photovoltaic solar power array. A plurality of capacitors divide strings of photovoltaic cells into a series of magnetic loops. When an arc fault occurs within one of the loops, a time-varying magnetic field is produced, with flux lines emanating from the area enclosed by the loop. At least three magnetic field sensors arranged at locations in or around the solar power array detect the spectral signature of the arc fault, and send related data to a computer via a communication network. The computer analyzes the data from the sensors to determine the location of the arc fault.Type: GrantFiled: October 13, 2011Date of Patent: November 4, 2014Inventor: Steven Andrew Robbins
-
Patent number: 8860424Abstract: An apparatus is provided for highly accelerated life testing (HALT) of multi-junction solar cells according to a method that utilizes a high vacuum chamber, as well as lenses and windows transparent to broad spectrum solar radiation from typically a single source to house packaged solar chips and temperature monitoring and control means during testing, thereby allowing substantially greater control of environmental variables such as temperature, atmospheric composition, and light spectrum than is currently available.Type: GrantFiled: February 28, 2012Date of Patent: October 14, 2014Assignee: Solar Junction CorporationInventors: Paul F. Lamarche, Brett Julian Chicotka
-
Publication number: 20140300384Abstract: Techniques for solar cell electrical characterization are provided. In one aspect, a solar testing device is provided. The device includes a solar simulator; and a continuous neutral density filter in front of the solar simulator having regions of varying light attenuation levels ranging from transparent to opaque, the continuous neutral density filter having an area sufficiently large to filter all light generated by the solar simulator, and wherein a position of the continuous neutral density filter relative to the solar simulator is variable so as to control a light intensity produced by the device. A solar cell electrical characterization system and a method for performing a solar cell electrical characterization are also provided.Type: ApplicationFiled: June 19, 2014Publication date: October 9, 2014Inventors: Oki Gunawan, Bao Lei
-
Publication number: 20140266288Abstract: An apparatus for detecting an arc on a circuit having a solar panel assembly is arranged to determine that an output of the solar panel assembly is below a threshold value and is therefore indicative of an arc on the circuit.Type: ApplicationFiled: March 12, 2014Publication date: September 18, 2014Applicant: CONTROL TECHNIQUES LIMITEDInventors: Paolo Trabacchin, Colin Hargis
-
Publication number: 20140266289Abstract: An improved interface for renewable energy systems is disclosed for interconnecting a plurality of power sources such as photovoltaic solar panels, windmills, standby generators and the like. The improved interface for renewable energy systems includes a multi-channel micro-inverter having novel heat dissipation, novel mountings, electronic redundancy and remote communication systems. The improved interface for renewable energy systems is capable of automatic switching between a grid-tied operation, an off grid operation or an emergency power operation. The interface provides for monitoring and for detecting performance and/or faults in power sources such as photovoltaic solar panels.Type: ApplicationFiled: March 14, 2014Publication date: September 18, 2014Applicant: Technology Research CorporationInventors: Aldo P. Della Sera, Arnold Kravitz
-
Patent number: 8829938Abstract: A measuring method and device for characterizing a semiconductor component (1) having a pn junction and a measuring surface, which has a contacting subarea, covered by a metallization. The method including: A. Planar application of electromagnetic excitation radiation onto the measuring area of the semiconductor component (1) for separating charge carrier pairs in the semiconductor component (1), and B. spatially resolved measurement of electromagnetic radiation originating from the semiconductor component (1) using a detection unit. In one step A, a predetermined excitation subarea of the measuring surface has a predetermined intensity of the excitation radiation and at least one sink subarea of the measuring surface has an intensity of the excitation radiation which is less than the intensity applied to the excitation subarea. The excitation and sink subareas are disposed on opposite sides of said contacting subarea and adjoin it and/or entirely or partially overlap it.Type: GrantFiled: February 23, 2009Date of Patent: September 9, 2014Assignees: Fraunhofer-Gesellschaft zur Föderung der angewandten Forschung e.V., Christian-Albrechts-Universität zu Kiel, Albert-Ludwigs-Universität FrieburgInventors: Jürgen Carstensen, Andreas Schütt, Helmut Föll, Wilhelm Warta, Martin Kasemann
-
Publication number: 20140247066Abstract: A method for detecting a series arc in a photovoltaic device, operating in direct current mode, including N (N=1 or N>1) photovoltaic modules, connected to a charging device having a capacitive behaviour for the modules, the method including: a) detecting, across n of the N modules (1?n?N), time evolution of voltage; b) identifying a voltage variation between a first zone of stable voltage and a second zone of stable voltage for a duration of at least 5 ?s, which immediately follows the voltage variation; and c) determining whether the voltage variation is between a value Vmin higher than or equal to 0.2 V and a value Vmax lower than or equal to 20 V, with rise time of the variation between a duration Tmin higher than or equal to 0.5 ?s and a duration Tmax lower than or equal to 5 ?s.Type: ApplicationFiled: July 4, 2012Publication date: September 4, 2014Applicant: Commisariat a I'energie atomique et aux ene altInventors: Nicolas Chaintreuil, Vincent Chauve
-
Patent number: 8823408Abstract: An evaluation system 1 according to the present invention includes: a light source 2 for exposing a pulsed white light or a pulsed laser light onto a sample; a microwave exposing and detecting unit 8 for exposing a microwave onto an organic material 12 and for detecting the intensity of the microwave which has passed through the organic material 12; a microwave passing unit 7 for making the microwave pass through the organic material 12 a plurality of times; and an evaluating unit 10 for evaluating the photoelectric conversion characteristics of the sample based on the intensity of the microwave which has passed through the organic material 12 when the pulsed white light or the pulsed laser light is exposed and the intensity of the microwave which has passed through the organic material 12 when the pulsed white light or the pulsed laser light is not exposed.Type: GrantFiled: March 8, 2012Date of Patent: September 2, 2014Assignee: Japan Science and Technology AgencyInventors: Akinori Saeki, Shuhei Seki
-
Patent number: 8810271Abstract: The present invention generally relates to an apparatus used for simulating spectrum of solar radiation and testing a photovoltaic device using the simulated spectrum of solar radiation. In one embodiment, the apparatus includes a light-source device configured to reproducing spectrum of solar radiation, the light-source device comprising a radiation plate divided into a plurality of cells, and each of the cells comprises a plurality of light-emitting diodes emitting at least two different wavelengths, and a substrate support disposed opposite to the light-source device. In one example, the plurality of light-emitting diodes emit a wavelength that is selected from the group consisting of colors blue, green, yellow, red, a first and a second color in infrared having different wavelengths with respect to each other.Type: GrantFiled: July 16, 2012Date of Patent: August 19, 2014Assignee: Applied Materials Italia S.R.L.Inventors: Alessandro Voltan, Giorgio Cellere, Gaudenzio Meneghesso, Matteo Meneghini, Diego Barbisan, Enrico Zanoni
-
Patent number: 8803537Abstract: A method for conditioning a photovoltaic module for testing includes setting an effective irradiance of a continuous light source at a target plane, configuring a test photovoltaic module to operate at a substantially maximum power point configuration, positioning the test photovoltaic module adjacent to the target plane, and configuring the test photovoltaic module for testing by removing the light source, cooling the test module to a testing temperature, and reversing the substantially maximum power point configuration.Type: GrantFiled: February 18, 2011Date of Patent: August 12, 2014Assignee: First Solar, Inc.Inventors: Pat Buehler, Sumanth Varma Lokanath, Madhu Sayala, Christinia Snider, Jim Sorensen, Paul Wolffersdorff
-
Patent number: 8797058Abstract: Techniques for solar cell electrical characterization are provided. In one aspect, a solar testing device is provided. The device includes a solar simulator; and a continuous neutral density filter in front of the solar simulator having regions of varying light attenuation levels ranging from transparent to opaque, the continuous neutral density filter having an area sufficiently large to filter all light generated by the solar simulator, and wherein a position of the continuous neutral density filter relative to the solar simulator is variable so as to control a light intensity produced by the device. A solar cell electrical characterization system and a method for performing a solar cell electrical characterization are also provided.Type: GrantFiled: March 3, 2011Date of Patent: August 5, 2014Assignee: International Business Machines CorporationInventors: Oki Gunawan, Bao Lei
-
Publication number: 20140191776Abstract: Embodiments of methods and systems for identifying or determining spatially resolved properties in indirect bandgap semiconductor devices such as solar cells are described. In one embodiment, spatially resolved properties of an indirect bandgap semiconductor device are determined by externally exciting the indirect bandgap semiconductor device to cause the indirect bandgap semiconductor device to emit luminescence (110), capturing images of luminescence emitted from the indirect bandgap semiconductor device in response to the external excitation (120), and determining spatially resolved properties of the indirect bandgap semiconductor device based on a comparison of relative intensities of regions in one or more of the luminescence images (130).Type: ApplicationFiled: March 12, 2014Publication date: July 10, 2014Applicant: BT Imaging Pty LtdInventors: Thorsten TRUPKE, Robert Andrew BARDOS
-
Patent number: 8773159Abstract: A plurality of assembly sheets are placed on an upper surface of a substrate adsorption platform, and a pressing plate is placed on the plurality of assembly sheets placed on the substrate adsorption platform such that the plurality of assembly sheets are pressed by the pressing plate. In this state, a DC power supply device is turned on and causes the upper surface of the substrate adsorption platform to be charged, thereby causing the plurality of assembly sheets to be adsorbed on the upper surface by an electrostatic force. Then, the pressing plate placed on the plurality of assembly sheets is removed while the upper surface of the substrate adsorption platform is charged, and automatic appearance inspection is performed on the plurality of assembly sheets adsorbed on the upper surface of the substrate adsorption platform.Type: GrantFiled: October 21, 2010Date of Patent: July 8, 2014Assignee: Nitto Denko CorporationInventors: Kousuke Murakami, Yoshihiro Toyoda
-
Patent number: 8773156Abstract: Methods for measuring insulation resistance in a photovoltaic (PV) array may include partitioning the PV array into groups of PV panels, isolating a group of PV panels selected for an insulation resistance measurement from other groups of panels by setting bypass selectors on each PV panel in the PV array, and making an insulation resistance measurement for the selected group. If a measured value of insulation resistance for a selected group corresponds to an insulation problem in a PV array component, a separate measurement of insulation resistance may be made for each PV panel in the selected group. Insulation resistance measurements may be made accurately and rapidly for large PV arrays without disconnecting and reconnecting cables between panels. Measurements may be made at frequent, regular intervals to permit changes in insulation resistance to be detected before damage from dielectric breakdown occurs.Type: GrantFiled: March 5, 2012Date of Patent: July 8, 2014Assignee: Applied Core Technologies, Inc.Inventors: Shinichi Takada, Toru Takehara
-
Patent number: 8766660Abstract: A method of measuring the efficiency with which a solar cell converts incident photons into charge carriers, including the following steps: (a) illuminating the solar cell with a broadband light source; (b) illuminating the solar cell with the broadband light source of which the intensity of a selected range of wavelengths has been reduced; (c) determining the change in the number of photons incident on the cell and the change in the number of charge carriers produced by the cell between steps (a) and (b); and (d) using the changes determined in step (c) to calculate the said efficiency measure.Type: GrantFiled: November 18, 2009Date of Patent: July 1, 2014Assignee: Technical University of DenmarkInventor: Frederik Christian Krebs
-
Patent number: 8766661Abstract: A malfunction detecting device for a solar cell panel includes an AC source that is provided on one of positive and negative sides of a solar cell panel body and can apply AC voltage superimposed on DC voltage to the solar cell panel, a measuring means provided on another of the positive and negative sides of the solar cell panel body to measure voltage or current output from the solar cell panel, and a control unit including a malfunction determination portion that controls the AC source to control input voltage or input current to be input to the solar cell panel and determines malfunction in the solar cell panel by comparing the input voltage or the input current to output voltage or output current measured by the measuring means. The malfunction determination portion includes a panel body malfunction determination portion and a bypass diode malfunction determination portion.Type: GrantFiled: May 10, 2012Date of Patent: July 1, 2014Assignee: Hitachi Metals, Ltd.Inventors: Haruyasu Komano, Kazuo Kotani, Naofumi Chiwata
-
Publication number: 20140176179Abstract: A simulated sunlight irradiation apparatus of the present invention (100a) includes: a light guide plate (5) having an irradiation surface and a counter surface opposite to the irradiation surface; and a light absorbing member (8) which is provided on at least one of an irradiation surface side and a counter surface side of the light guide plate (5) and absorbs light in a predetermined wavelength region.Type: ApplicationFiled: April 2, 2012Publication date: June 26, 2014Applicant: SHARP KABUSHIKI KAISHAInventors: Kohji Minami, Masaru Ogawa
-
Publication number: 20140159763Abstract: This invention provides a solar photovoltaic system, comprising: a plurality of photovoltaic assemblies, for harvesting solar energy to generate DC currents; a plurality of micro-optimizers having input terminals coupled to the photovoltaic assemblies and having output terminals connected in series with each other, for optimizing output currents and/or output voltages of the photovoltaic assemblies, to generate maximum power; a manager configured to communicate with the plurality of micro-optimizers, for managing operating states of the micro-optimizers; and an inverter coupled to one or more strings of the micro-optimizers, for converting the optimized DC currents into AC currents and outputting the AC currents to a power grid. This invention further provides a method for energy harvest optimization and a method for fault detection of a solar photovoltaic system.Type: ApplicationFiled: February 14, 2014Publication date: June 12, 2014Applicant: Altenergy Power System, Inc.Inventors: Yuhao LUO, Zhimin LING
-
Patent number: 8749256Abstract: The invention discloses a contacting device for a thin film solar cell, comprising a positioning plane for positioning the solar cell thereon, a contact element for electrically contacting the solar cell and a suction element, wherein the solar cell is arrangeable on the top side of the positioning plane, the contact element is arranged slideably in a direction orthogonal to the positioning plane and arranged slideably through an opening of the positioning plane, and the suction element is arranged on the bottom side of the positioning plane for sucking air through the opening. The contacting device allows for obtaining improved measurement accuracy.Type: GrantFiled: September 2, 2010Date of Patent: June 10, 2014Assignee: Tel Solar AGInventors: Marco Apolloni, Jean Randhahn
-
Publication number: 20140147944Abstract: Methods and structures for extracting at least one electric parametric value from a back contact solar cell having dual level metallization are provided.Type: ApplicationFiled: April 23, 2013Publication date: May 29, 2014Applicant: Solexel, Inc.Inventors: Swaroop Kommera, Pawan Kapur, Mehrdad M. Moslehi
-
Patent number: 8736272Abstract: An adjustable spectrum LED solar simulator method and system which provides power to LEDs, senses the LED output, compares the LED output to a predetermined norm, and adjusts the LED outputs accordingly. An adjustable spectrum LED solar simulator system includes a multiplicity of LEDs of a number of different color wavelength ranges, an LED driver system for providing power to the LEDs, a sensor system for sensing the output of the LEDs and a controller responsive to the sensor system for comparing the color spectrum of the output of the LEDs to a desired solar spectrum and enables the driver system to adjust the power to the LEDs to more closely match the desired solar spectrum. The solar simulator system may include a modulator structure of hierarchical assemblies. Solar simulator calibration is also disclosed.Type: GrantFiled: November 30, 2011Date of Patent: May 27, 2014Assignee: Spire CorporationInventors: Kurt J. Linden, William R. Neal, Harvey Serreze
-
Publication number: 20140139249Abstract: An apparatus and a method for detecting defects within a photovoltaic module are provided. To detect defects within the photovoltaic module, light from a light source is directed towards the photovoltaic module. The light generates a voltage within each solar cell of the photovoltaic module. The generated voltages are measured and compared in order to detect defects within the solar cells of the photovoltaic module.Type: ApplicationFiled: November 20, 2012Publication date: May 22, 2014Applicant: PRIMESTAR SOLAR, INC.Inventors: Weston Alan Dobson, Douglas Garth Jensen
-
Patent number: 8729919Abstract: With a light source evaluation device 10 according to the present invention and a solar cell evaluation device 1 employing the same, a dependency P (?, Ib) for each wavelength ? of a short-circuit current Ib generated by white bias light of a measurement target solar cell 2, which is pre-measured at each of a plurality (i) of irradiance levels, is regarded as a spectral responsivity Pi (?) at each irradiance level, and a value for adjusting a light quantity of an illumination light source 3 that illuminates the solar cell 2 is computed using a spectral responsivity Ps (?), which is computed using the spectral responsivity Pi (?), a pre-supplied spectral irradiance S (?) of reference sunlight, and a pre-measured spectral irradiance L (?) of the illumination light source 3.Type: GrantFiled: July 15, 2011Date of Patent: May 20, 2014Assignee: Konica Minolta Optics, Inc.Inventors: Yoshihiro Nishikawa, Tsutomu Okura
-
Publication number: 20140132302Abstract: The invention relates to a method for measuring the high-voltage induced degradation (PID) of at least one solar cell. According to the invention, a conductive plastic material is pressed on the upper side or bottom side of the respective solar cell, in particular on the front side thereof, and a DC voltage greater than 50 V is applied between the plastic material and the respective solar cell. Alternatively, corona discharges may be applied to solar cells or photovoltaic modules. In one embodiment, a characteristic electric parameter of the respective solar cell or of the photovoltaic module is repeatedly measured at time intervals. The method according to the invention can be carried out on individual solar cells, which can be further processed directly after passing the test and without further complex processing, e.g. to a photovoltaic module. In principle, the method is also suitable for measurements on complete photovoltaic modules.Type: ApplicationFiled: June 5, 2012Publication date: May 15, 2014Applicant: Fraunhofer - Gesellschaft zur Förderung der angewandten Forschung e.V.Inventor: Henning Nagel
-
Publication number: 20140132301Abstract: A measurement instrument capable of electrically isolating the connected photovoltaic (“PV”) module in an array of PV modules to perform a health diagnosis including of current versus voltage measurements on the attached device by using a resistive load to acquire the current-voltage (“IV”) curve in the positive power quadrant of the module. The instrument is capable of switching a charge storage element into the array during the period when the solar module is under test to provide uninterrupted electrical power to the PV array. The measurement instrument contains a battery and charger allowing the device to run from the connected PV module's energy. The instrument contains a microprocessor to allow a high degree of configuration through software, including altering the speed of an IV sweep, the interval between sweeps, and integrating temperature and tilt measurements. The instrument is equipped with low power radio devices to communicate wirelessly, further negating the need for a common ground.Type: ApplicationFiled: November 14, 2012Publication date: May 15, 2014Applicant: Stratasense LLCInventors: Kellen Gillispie, Peter Wrisley
-
Patent number: 8723547Abstract: A solar photovoltaic junction box for being electrically connected to a solar cell array. The junction box comprises a plurality of input branch lines electrically connected to solar cell strings, an output aggregate line that converges the plurality of branch lines, a back-flow preventing diode provided on each of the branch lines, a capacitor parallel-connected to each of the back-flow preventing diodes, an AC voltage generator that is provided on the aggregate line to allow an AC voltage to be applied to the solar cell array, a measuring means for measuring an alternating current flowing in the solar cell array, and a control unit comprising an malfunction determination portion for determining a malfunction in the solar cell array on the basis of the AC voltage applied by the AC voltage generator and the alternating current measured by the measuring means.Type: GrantFiled: June 29, 2012Date of Patent: May 13, 2014Assignee: Hitachi Metals, Ltd.Inventors: Haruyasu Komano, Kazuo Kotani, Naofumi Chiwata
-
Patent number: 8717050Abstract: A device for panel reliability testing and method thereof are proposed. The device includes a connection module, for connecting the panel and an aging module; a reliability chamber control module for sending a voltage regulation command to a bias module and/or a switch control command to the aging module; the bias module, for regulating voltage and transmitting information about voltage regulation to the aging module; and the aging module, for performing an aging operation on the panel depending on the switch control command sent from the reliability chamber control module and the information about voltage regulation transmitted from the bias module. Compared with the prior art, LCD panels undergo the aging testing before being packaged, thereby shortening a time period of manufacturing LCD panels and enhancing production efficiency.Type: GrantFiled: June 19, 2011Date of Patent: May 6, 2014Assignee: Shenzhen China Star Optoelectronics Technology Co., Ltd.Inventors: Shiue-Shih Liao, Jung-Mao Tsai, Xiao-Xin Zhang
-
Patent number: 8710860Abstract: Embodiments of methods and systems for identifying or determining spatially resolved properties in indirect bandgap semiconductor devices such as solar cells are described. In one embodiment, spatially resolved properties of an indirect bandgap semiconductor device are determined by externally exciting the indirect bandgap semiconductor device to cause the indirect bandgap semiconductor device to emit luminescence (110), capturing images of luminescence emitted from the indirect bandgap semiconductor device in response to the external excitation (120), and determining spatially resolved properties of the indirect bandgap semiconductor device based on a comparison of relative intensities of regions in one or more of the luminescence images (130).Type: GrantFiled: May 4, 2007Date of Patent: April 29, 2014Assignee: BT Imaging Pty LtdInventors: Thorsten Trupke, Robert Andrew Bardos
-
Publication number: 20140111220Abstract: There is provided a method for fault diagnosis on a solar module in which electrical potentials are checked within the solar module to provide the possibility for carrying out the fault diagnosis even when the solar module is not exposed to sun light. Specifically the solar cell module is excited by both a DCBIAS and an AC voltage over a wide frequency range, and the impedance of the solar cell module is measured as a function of the frequency response. There is also provided an embodiment, wherein time domain reflectometry (TDR) is used in combination with the DC BIAS and AC voltage based fault diagnosis. Based on the method safety operations can be carried out as a part of the integrated electric functionality.Type: ApplicationFiled: May 8, 2012Publication date: April 24, 2014Applicant: EMAZYS TECHNOLOGIES APSInventor: Anders Rand Andersen
-
Publication number: 20140111240Abstract: A method for checking the operation of a photovoltaic module of a photovoltaic power station. The module has a positive terminal, a negative terminal and a number of solar cells, in particular thin-layer solar cells. An electric field emitted by the photovoltaic module as a result of solar radiation is measured at an exposed measurement location during the operation of the power station and the electrical voltage present between the positive terminal and the negative terminal is determined from the measured electric field. A corresponding measuring instrument has a sensor to be placed near the photovoltaic module so as to measure the electric field strength. A rod or wand may be used to position the sensor, or a robot may be configured for automatic travel on the photovoltaic module.Type: ApplicationFiled: December 30, 2013Publication date: April 24, 2014Applicant: ADENSIS GMBHInventors: TIM MUELLER, BERNHARD BECK
-
Patent number: 8679862Abstract: A method for manufacturing a thin film photoelectric conversion module includes the steps of forming a plurality of photoelectric conversion elements connected in series on a substrate, and carrying out reverse bias processing simultaneously on a group of photoelectric conversion elements including a plurality of the photoelectric conversion elements positioned with one or a plurality of the photoelectric conversion elements interposed between each of them, by applying a plurality of voltages electrically isolated from one another to the group of photoelectric conversion elements.Type: GrantFiled: January 28, 2009Date of Patent: March 25, 2014Assignee: Sharp Kabushiki KaishaInventor: Shinsuke Tachibana
-
Publication number: 20140070836Abstract: An apparatus for simulating sunlight includes a light source for generating light rays, a first reflector having a curved surface that is disposed to receive and reflect the light rays from the light source to form first reflected parallel light rays that travel in a first direction, and a second reflector disposed to face the first reflector and disposed to receive and reflect the first reflected parallel light rays from the first reflector to form second reflected parallel light rays that travel in a second direction. The first and second directions are mutually orthogonal.Type: ApplicationFiled: September 11, 2013Publication date: March 13, 2014Applicant: ALL REAL TECHNOLOGY CO., LTD.Inventor: Jon-Lian KUO
-
Publication number: 20140070837Abstract: A solar monitor measures electrical characteristics of a designated solar device within an array of solar devices that are coupled in series. The solar monitor includes a charge storage element and a charger coupled to the charge storage element to establish a positive voltage and/or a negative voltage on the charge storage element. A switch within the solar monitor is coupled in a shunt configuration with the designated solar device and with a subsequent device in the array. The switch selectively couples the charge storage element to the designated solar device to vary an operating current that flows between the designated solar device and the subsequent solar device. The solar monitor includes a current detector to measure the current of the designated solar device, and a voltage detector to measure the voltage of the designated solar device.Type: ApplicationFiled: November 16, 2013Publication date: March 13, 2014Inventors: Roger L. Jungerman, Randall King
-
Publication number: 20140049282Abstract: A photovoltaic device includes a substrate extending between opposite edges, a plurality of photovoltaic cells electrically coupled with each other in series, wherein the plurality of photovoltaic cells includes at least one current-limiting photovoltaic cell, and at least one corrective optic lens positioned over the at least one current-limiting photovoltaic cell. The at least one corrective optic lens is configured to focus light into the at least one current-limiting photovoltaic cell so that current passing through the current-limiting photovoltaic cell is boosted. A monitoring system may include at least one light source aligned with at least one of the plurality of photovoltaic cells. The light source(s) may be configured to emit light into the at least one of the plurality of photovoltaic cells to determine if the power output of the photovoltaic device remains constant.Type: ApplicationFiled: August 16, 2012Publication date: February 20, 2014Applicant: ThinSilicon CorporationInventor: Jason Stephens
-
Publication number: 20140043056Abstract: Provided is a method for evaluating a solar cell incorporated into a solar module. A PL evaluation step is performed. The PL evaluation step is a step for evaluating the solar cell to be evaluated among a plurality of solar cells (10) by illuminating the solar cell (10) with light from a light source (20) and detecting the intensity of photoluminescent light (L2) emitted by the solar cell (10). The light is irradiated while a light-blocking member (21) is provided between the solar module (1) and the light source (20) so that light from the light source (20) is not incident on portions of the solar module other than the solar cell (10) to be evaluated.Type: ApplicationFiled: October 17, 2013Publication date: February 13, 2014Applicant: Sanyo Electric Co., Ltd.Inventor: Toshiaki Baba
-
Patent number: 8643384Abstract: An electrical insulation test as well as the production of photovoltaic modules, especially of thin-film photovoltaic modules, provides a current-conducting component disposed on a panel-shaped substrate, which are insulated electrically in the area of the module edge. In order to simplify testing of the insulation of such photovoltaic modules, it is proposed that, during the production of the photovoltaic module, testing of the electrical insulation takes place, for which, through the use of a mechanical contacting device a test voltage is applied between the module edge on the one hand and the electrical connections of the photovoltaic module, which are remote from the module edge, lead to the outside, on the other hand.Type: GrantFiled: April 17, 2009Date of Patent: February 4, 2014Assignee: Harrexco AGInventor: Harald Apfelthaler
-
Patent number: 8645089Abstract: Disclosed herein is an information processing device including a voltage measuring unit and a determining unit. The voltage measuring unit measures a voltage across the positive and negative terminals of a set of a plurality of dye-sensitized solar cells connected in series. The determining unit determines the number of the dye-sensitized solar cells not generating electricity according to the amount of voltage drop across the positive and negative terminals from the voltage across the positive and negative terminals in the initial state in which all the dye-sensitized solar cells of the set generate electricity at the voltage measured by the voltage measuring unit.Type: GrantFiled: July 5, 2011Date of Patent: February 4, 2014Assignee: Sony CorporationInventors: Tomohiro Shiotani, Mikio Takenaka, Hiroshi Hasegawa, Kazuhiko Miyahara, Yoshiaki Inoue
-
Patent number: 8624621Abstract: In an embodiment, a chuck to support a solar cell in hot spot testing is provided. This embodiment of the chuck comprises a base portion and a support portion disposed above the base portion. The support portion is configured to support the solar cell above the base portion and to define a cavity between a bottom surface of the solar cell and the base portion that thermally separates a portion of the bottom surface of the solar cell from the base portion.Type: GrantFiled: July 15, 2013Date of Patent: January 7, 2014Assignee: SunPower CorporationInventors: Jose Francisco Capulong, Emmanuel Abas
-
Publication number: 20140002125Abstract: An inspecting device serves to inspect a solar cell. The inspecting device includes an irradiation part for irradiating with pulsed light and a detection part having a detector for detecting an electromagnetic wave pulse radiated from the solar cell depending on the irradiation with the pulsed light. The detector detects an electric field intensity of the electromagnetic wave pulse depending on irradiation with probe light emitted from a light source (a femtosecond laser) of the pulsed light. Moreover, the inspecting device includes a delay part for delaying a timing for detecting the electromagnetic wave pulse in the detector. Furthermore, the inspecting device includes an electromagnetic wave pulse analysis part for detecting a negative peak of the electric field intensity in a temporal waveform of the electromagnetic wave pulse.Type: ApplicationFiled: June 28, 2013Publication date: January 2, 2014Inventors: Hidetoshi NAKANISHI, Akira ITO, Masayoshi TONOUCHI, Iwao KAWAYAMA
-
Publication number: 20130328587Abstract: An LED based solar simulator and method. An emitter plane includes an array of quarter panels below a test plane. Each quarter panel includes multiple close pitch LEDs of different wavelengths in an array, a plurality of LEDs for select wavelengths per quarter panel, and one or more different wavelength LEDs in a plurality of class A wavelength intervals in order to more closely match the solar spectrum.Type: ApplicationFiled: May 17, 2013Publication date: December 12, 2013Applicant: Spire CorporationInventors: Kurt J. Linden, William R. Neal, Harvey B. Serreze
-
Patent number: 8604819Abstract: Provided is an inspecting apparatus for inspecting a photovoltaic devices by applying a current to the photovoltaic devices in a forward direction to make the photovoltaic devices emit EL light which is simple in structure and capable of shortening inspection time in inspecting a defect from a photographed image with a perfect resolution. The inspecting apparatus includes a darkroom (110) provided with an upper surface (111) having an opening portion (112), a support device provided at the upper surface of the darkroom (110) to support the photovoltaic devices as an inspecting object (200) on the opening portion (112), cameras (121, 122 and 123) disposed inside the darkroom (110) for photographing the inspecting object (200), and a moving device configured to move the cameras in the darkroom (110). The moving device includes an x-axial guiding portion (140), a motor (142) and a timing belt (144).Type: GrantFiled: August 26, 2009Date of Patent: December 10, 2013Assignee: Nisshinbo Holdings Inc.Inventors: Mitsuhiro Shimotomai, Hikaru Ichimura
-
Publication number: 20130321021Abstract: A method and arrangement of determining starting conditions of a solar converter in a photovoltaic system. The photovoltaic system includes a photovoltaic panel system having one or more photovoltaic panels. The method includes determining an open circuit voltage of the photovoltaic panel system, and determining beforehand limit values for the starting conditions, where the limit values include an open circuit voltage value and a temperature value, with which values the solar converter can be started. The method also includes determining beforehand the temperature dependency of the open circuit voltage of the panel system, determining a temperature of the panel system, and setting a criterion for starting the converter. The criterion includes determining, by using the determined temperature dependency and the determined limit values for the starting conditions, whether the determined temperature and the determined open circuit voltage enable the starting of the converter.Type: ApplicationFiled: May 20, 2013Publication date: December 5, 2013Applicant: ABB OyInventors: Jesse KOKKONEN, Janne Hellberg, Jari Uusimäki
-
Patent number: 8598903Abstract: A testing device includes a laser source, a current testing device, and a processor. The processor includes a user interface, a control unit, a calculation unit, and a data generation unit. The user interface receives user inputs to determine control parameters. The control unit controls the laser source to emit a laser beam on a photoelectric conversion die according to the control parameters. The laser beam has an optical output power value P. The control unit also controls the current testing device to measure a current value I output by the photoelectric conversion die after the laser beam irradiating on the photoelectric conversion die. The calculation unit calculates a photoelectric conversion efficiency F according to the formula: F=P/I. The data generation unit processes the photoelectric conversion efficiency F which indicates the electro-optical property of the photoelectric conversion die.Type: GrantFiled: August 23, 2012Date of Patent: December 3, 2013Assignee: Hon Hai Precision Industry Co., Ltd.Inventor: Kuo-Fong Tseng
-
Publication number: 20130314118Abstract: A testing method of a solar cell panel of the present invention, includes steps of: (a) providing an ambient light with steady illumination to the surface of a solar cell panel to introduce a steady signal to its electrical output; (b) providing a modulation light to a given area of the solar cell panel to introduce a modulated signal to its electrical output corresponding to the given area; and (c) analyzing electrical output of the solar cell panel to obtain electrical properties corresponding to the given area. The testing method can test the solar cell panel efficiently, detect and locate defects accurately so that the defects can be corrected and feed back to improve manufacturing process.Type: ApplicationFiled: June 24, 2013Publication date: November 28, 2013Inventors: Wing Keung MAK, Ho Tong LEE
-
Patent number: 8593165Abstract: A solar generator for spacecraft or satellites, including a solar panel, a detector layer, a first evaluation means and a second evaluation means. The solar panel includes a plurality of solar cells. The detector layer includes first conductors substantially in parallel in a first plane and second conductors substantially in parallel in a second plane. The second plane is substantially in parallel to the first plane such that the first conductors are at an angle to the second conductors. The first evaluation means is for detecting a failure of one or more of the plurality of solar cells. The second evaluation means is for testing electrical status of the first conductors and the second conductors to determine whether the failure detected by the first evaluation means was caused by a space object damaging or severing one or more of the first conductors and the second conductors.Type: GrantFiled: January 7, 2013Date of Patent: November 26, 2013Assignee: Deutsches Zentrum fur Luft- und Raumfahrt e.V.Inventors: Waldemar Bauer, Oliver Romberg
-
Publication number: 20130300449Abstract: In order to provide a system which detects and classifies abnormality in a solar battery even during power generation, an output voltage and an output current of the solar battery during power generation are detected, and a solar battery characteristic equation and a threshold value for detecting an abnormal state are calculated using the detected voltage value and current value and the measurement data of an external environment measurement unit. The kind of abnormal state of the solar battery is classified using the calculation result of the characteristic equation and the threshold value.Type: ApplicationFiled: January 25, 2012Publication date: November 14, 2013Applicant: Hitachi, Ltd.Inventors: Akihiro Nakamura, Tohru Kohno, Tomoharu Nakamura
-
Publication number: 20130300448Abstract: A testing device includes a laser source, a current testing device, and a processor. The processor includes a user interface, a control unit, a calculation unit, and a data generation unit. The user interface receives user inputs to determine control parameters. The control unit controls the laser source to emit a laser beam on a photoelectric conversion die according to the control parameters. The laser beam has an optical output power value P. The control unit also controls the current testing device to measure a current value I output by the photoelectric conversion die after the laser beam irradiating on the photoelectric conversion die. The calculation unit calculates a photoelectric conversion efficiency F according to the formula: F=P/I. The data generation unit processes the photoelectric conversion efficiency F which indicates the electro-optical property of the photoelectric conversion die.Type: ApplicationFiled: August 23, 2012Publication date: November 14, 2013Applicant: HON HAI PRECISION INDUSTRY CO., LTD.Inventor: KUO-FONG TSENG