Abstract: Method and apparatus to control delay between lanes in an I/O interface is disclosed. To control the delay between the lanes in the I/O system a programmed delay may be determined and introduced between the lanes. For this purpose the effective time “T” of the lanes is determined. The number of lanes “N” in the I/O interface is identified. The programmed lane to lane delay “D” is determined and a delay circuit having the programmed delay may be introduced between the lanes to reduce AC peak to peak noise in the I/O system.

Abstract: A design structure and more particularly to a design structure to minimize driver output slew rate variation. The design structure is embodied in a machine readable medium for designing, manufacturing, or testing an integrated circuit. The design structure includes a driver circuit having an input signal and an output signal, where the driver circuit is structured and arranged to control the slew rate of the output signal. A delay circuit is coupled to an output of the driver circuit, where the delay circuit has a delay proportional to a desired target slew rate of the driver output signal. A first comparator for detecting when the driver output signal rises through a specified level, and a second comparator for detecting when the driver output falls through a second specified level are included.

Abstract: It is desired to reduce the current consumption of an autonomous impedance adjustment circuit. The semiconductor integrated circuit according to the present invention stops the change in the drive capability of a driver correspondingly to the output (count data) of a comparator which is sequentially outputted for changing the drive capability of a replica driver and an output driver.

Abstract: An impedance calibration circuit includes: a first calibration unit configured to compare a first converted voltage obtained by converting a first calibration signal with a reference voltage and vary the first calibration signal; a voltage detection unit configured to activate a voltage detection signal according to a level of a power supply voltage; a multiplexing unit configured to select and output the reference voltage or the first converted voltage in response to the detection signal; and a second calibration unit configured to compare a second converted voltage obtained by converting a second calibration signal with the level of the output signal of the multiplexing unit and vary the second calibration signal.

Abstract: A bussed system with a fast and compact majority voter in the circuitry responsible for the bus inversion decision. The majority voter is implemented in analog circuitry having two branches. One branch sums the advantage of transmitting the bits without inversion, the other sums the advantage of transmitting the bits with inversion. The majority voter computes the bus inversion decision in slightly more than one gate delay by simultaneously comparing current drive in each branch.

Abstract: A semiconductor device includes a signal generating circuit that generates an impedance adjustment command signal which indicates at least one of initiation and termination of an impedance adjustment. The semiconductor device outputs an output signal in synchronism with the impedance adjustment command signal.

Abstract: Embodiments of a circuit for use with an inter-chip connection that has a variable complex impedance (which can be conductive, capacitive or both), a system that includes the circuit, and a communication technique are described. This inter-chip connection may be formed between a microspring or an anisotropic film and a metal connector on or proximate to a surface of a chip. Moreover, the circuit may mitigate signal distortion associated with the variable complex impedance. For example, the circuit may include an internal impedance that is electrically coupled in series with the metal connector, and that has an impedance which dominates the variable complex impedance over a range of operating frequencies. Separately or additionally, the circuit may be adapted to correct for the signal distortion.

Abstract: A buffer circuit includes an input configured to receive an input signal; and a buffer configured to generate an output signal based on the input signal. In an embodiment, the output signal has a linear relationship with the input signal when the input signal is within the input voltage range; and the buffer circuit further includes a level-shifting circuit coupled with the input, wherein the level shifting circuit determines an input voltage range, and wherein one of an upper limit and a lower limit of the input voltage range is within 50 millivolts from a supply rail voltage. In another embodiment, the buffer circuit further includes a programmable chopping module coupled with the buffer, wherein the programmable chopping module is programmable with a selected configuration from a plurality of configurations, and wherein the programmable chopping modulates the input signal based on the selected configuration.

Abstract: In a multi-rank memory module having a terminal resistance of a data input/output pad 13 and a terminal resistance control pad 14 that inputs a signal that controls on/off of the terminal resistance, a high-speed operation is enabled with the aid of an enclosed terminal resistance, even in cases where the number of ranks is greater than that of terminal resistance control terminals (ODT terminals) provided on the memory module. To this end, a terminal resistance control pad 14 of a memory chip 12, having a longer length of an interconnect between a data bus 19 on a module substrate 8 and a data input/output pad 13, is connected to a terminal resistance control interconnect 18 or 21 to control the on/off of the terminal resistance from the ODT terminal. A terminal resistance control pad on a memory chip 11, having a shorter length of an interconnect between the data bus 19 on the module substrate and the data input/output pad 13, is connected to a fixed potential 20 to turn on the terminal resistance.

Abstract: A system comprises signal paths. There are first through n signal paths, n being a positive integer. A critical one of the first through n signal paths is based on being a respective one of the first through n signal paths having a slowest signal propagation and/or a path in which a signal propagates slower than a clock cycle. The critical one of the first through n signal paths comprises a first size of a standard cell including corresponding logic devices. The non-critical ones of the first through n signal paths comprise a second size of a standard cell including corresponding logic devices, the second size being smaller than the first size.

Abstract: Techniques for controlling a driver to reduce data dependent noise, such as simultaneous switching effects and cross-talk effects. A plurality of drivers may each receive a data segment to transmit and a plurality of data segments that other drivers will transmit. A driver controller may adjust the time at which the data segment is transmitted in response to the plurality of data segments that the other drivers will transmit. The adjustment may compensate for simultaneous switching noise and cross-talk by, for example, delaying the transmission of a data segment or changing the slew rate of the signal carrying the data segment.

Abstract: A semiconductor device is provided. A pull-up slew rate controller receives a first driving control signal generated in a first mode of operation, a second driving control signal generated in a second mode of operation, and data, and upon a first transition of the data, sequentially activates the data and a first pull-up delayed signal having different delay times in the first mode of operation and sequentially activates the data and the first to third pull-up delayed signals having different delay times in the second mode of operation. A pull-up driving unit sequentially pulls a data output terminal up in response to the data and the first to third pull-up delayed signals.

Abstract: A semiconductor device includes a plurality of pads configured to receive a plurality of external signals, an internal circuit configured to perform a predetermined internal operation in response to one of the external signals that is inputted through one of the plurality of pads, and a signal transferring unit configured to receive the external signal, output the external signal to an internal circuit an output signal during a normal mode, and output a fixed signal regardless of changes in the external signal to the internal circuit in a test mode.

Abstract: Techniques are provided for controlling on-chip termination (OCT) impedance using OCT calibration blocks that serially transmit OCT control signals to input/output (IO) blocks. The OCT control signals are serially transmitted through a shared conductor. An OCT calibration block can transmit OCT control signals to one or multiple IO blocks. The IO blocks can be programmed to select OCT control signals from one of the calibration blocks. Enable signals enable one or more of the IO blocks to receive the selected OCT control signals. The OCT control signals are used to control the on-chip termination impedance at one or more IO buffers.

Abstract: Some embodiments of the present invention provide a programmable transmitter which includes a set of drivers and one or more chains of configuration registers. Each driver is capable of being configured to perform a transmission function from a predetermined set of transmission functions. Each configuration register can correspond to a driver, and can store configuration data which is used to configure the corresponding driver. The programmable transmitter can include configuration circuitry which serially shifts configuration data into the one or more chains of configuration registers. The programmable transmitter can also include programming circuitry which can determine configuration data for each driver based partly or solely on a desired transmitter behavior.

Abstract: An output buffer circuit includes a control unit and an output driver. The control unit generates a control signal in response to a mode signal applied from an internal circuit. The output driver selectively performs a driver operation, a termination operation or an electrostatic discharge (ESD) protection operation in response to the control signal.

Abstract: A termination resistance circuit includes a control signal generator for generating a control signal whose logical value changes when a calibration code has a predetermined value, a plurality of parallel resistors which are respectively turned on/off in response to the calibration code, and a resistance value changing unit for changing the total resistance value of the termination resistance circuit in response to the control signal.

Abstract: Embodiments of the present invention include systems for calibrating an output circuit. A comparator is coupled to a calibration terminal and configured to determine whether the calibration terminal is in a first state coupled to a calibration resistor or in a second state. A calibration circuit is coupled to the calibration terminal and configured to generate a calibration value based in part on the presence or absence of the calibration resistor. An impedance selector is coupled to the calibration circuit, the comparator, and a default calibration value. The impedance selector is configured to select the default calibration value when the comparator indicates the calibration terminal is in the second state and to select the calibration value coupled from the calibration circuit when the comparator indicates the calibration terminal is in the first state.

Abstract: An input circuit, includes a first buffer circuit whose output is couple to an output signal terminal of the input circuit, and whose input is coupled to an input signal terminal of the input circuit, a second buffer circuit, a third buffer circuit, a first differential amplification circuit whose first input is coupled to a first external power source terminal, whose second input is coupled to an output of the second buffer circuit, and whose output is coupled to an input of the second buffer circuit, a second differential amplification circuit whose first input is coupled to a second external power source terminal, whose second input is coupled to an output of the third buffer circuit, and whose output is coupled to an input of the third buffer circuit, a first resistance whose one end is coupled to the output of the first differential amplification circuit, and whose another end is coupled between the input signal terminal of the input circuit and the input of the first buffer circuit, a second resistance

Abstract: An impedance adjusting device includes: a calibration node; a comparison unit configured to compare a reference voltage with a voltage of the calibration node; a counting unit configured to generatean impedance code according to a comparison result of the comparison unit; a reference impedance unit having an impedance value according to the impedance code and connected to the calibration node; a storage unit configured to store the comparison result of the comparison unit upon the generation of the impedance code being completed; an interface node; and a termination unit configured to terminate the interface node, the termination unit including a plurality of parallel resistors configured to be turned on/off according to the impedance code, and a parallel resistor configured to be turned on/off according to a value stored in the storage unit.

Abstract: A semiconductor device includes a first circuit block, a second circuit block, and a data bus. The data bus is coupled between the first and second circuit blocks. A first data inverter on the data bus inverts a selected segment of data that is transferred onto the data bus. A second data inverter at an end of the data bus re-inverts the selected segment of data before the data is transferred off the data bus. The data that is transferred onto the data is not analyzed in order to determine the selected segment of data that is inverted.

Abstract: A digital noise filter circuit includes a gating clock generating circuit and a noise filter circuit. The gating clock generating circuit compares logic levels of an input signal and an output signal of the noise filter circuit. The gating clock generating circuit supplies a gating clock as an operating clock to the noise filter circuit when the logic levels of both signals do not coincide, and halts supply of the gating clock when the logic levels of both signals do coincide. The noise filter circuit removes noise from the input signal and outputting the resultant signal as the output signal.

Abstract: The present invention includes a circuit-level system and method for preventing the propagation of soft errors in logic cells. A radiation jammer circuit in accordance with the present invention, including an RC differentiator and a depletion mode MOS circuit, when inserted at the output of a logic cell, significantly reduces the propagation of transient glitches. The radiation jammer circuit is a novel transistor-level optimization technique, which has been used to reduce soft errors in a logic circuit. A method to insert radiation jammer cells on selective nodes in a logic circuit for low overheads in terms of delay, power, and area is also introduced.

Abstract: The invention discloses a method for tuning nano-scale analog-circuit designs in order to reduce random-device mismatches and optimize said design, where nano-scale devices potentially have large-scale process variations. The method includes providing a tunable circuit topology, wherein each nano-scale device comprises a single component or comprises multiple parallel components. Each component is decomposed into multiple discrete sub-components, wherein each said sub-component either operates in parallel with other like components to effectively operate like one bigger component. The sub-components are subjected to a dynamic-programming process to adaptively select the sub-components to be kept operational, while configuring the nonselected sub-components to be nonoperational, based on the measurement of at least one operational parameter.

Abstract: Disclosed is a differential pre-emphasis driver. The driver includes a first current source supplying a first current, a second current source supplying a second current greater than the first current, a first select circuit for selectively connecting the first current source to a first output terminal or a second output terminal, and a second select circuit for selectively connecting the second current source to the first output terminal or the second output terminal. The first and second select circuits pre-emphasize a transmission signal by selectively combining the first output terminal, the second output terminal, the first current source and the second current source.

Abstract: Provided are an inverter, a method of operating the inverter, and a logic circuit including the inverter. The inverter may include a load transistor and a driving transistor, and at least one of the load transistor and the driving transistor may have a double gate structure. A threshold voltage of the load transistor or the driving transistor may be adjusted by the double gate structure, and accordingly, the inverter may be an enhancement/depletion (E/D) mode inverter.

Abstract: A driving circuit includes: a first reference current source injects a reference current; each first switch unit is coupled between the first reference current source and one of first and second output ports; a second reference current source sinks the reference current; each second switch unit is coupled between the second reference current source and one of the output ports; a load unit is coupled between the output ports, and a common voltage is applied onto the load unit; and a calibration module calibrates an impedance of the load unit according to a voltage at one of the output ports, and the voltage is generated due to the reference current passing through one of the first switch units, the load unit, and one of the second switch units.

Abstract: Pre-emphasis may be able to operate in either of two modes. In a first mode, when one bit has a same value as the bit that immediately preceded it, an output signal for said one bit is based on a first electrical current reduced by a second electrical current. Otherwise the output signal for said one bit is based on the first current without regard for the second current. The second mode may be similar to the first mode when said one bit has the same value as the immediately preceding bit; but otherwise the output signal for said one bit is based on the first current increased by the second current. As an alternative to using the immediately preceding bit (as in the above “post-tap” operation), the immediately succeeding (following) bit may be used in generally the same way (in so-called “pre-tap” operation).

Abstract: An input circuit for receiving an input signal supplied to an input terminal includes a capacitor having one end connected to the input terminal and a capacitor driving circuit for converting the input signal into a signal having positive logic that is the same as logic of the input signal and supplying the converted signal to the other end of the capacitor so as to drive the capacitor.

Abstract: A calibration circuit of an on-die termination device includes a code generating unit configured to receive a voltage of a calibration node connected to an external resistor and a reference voltage to generate pull-up calibration codes. The calibration circuit also includes a pull-up calibration resistor unit configured to pull up the calibration node in response to the pull-up calibration codes. The pull-up calibration resistor unit is calibrated such that its resistance becomes higher as a power supply voltage increases.

Abstract: Described herein are various principles for operating a transmitter circuit to reduce noise affecting a signal being generated and reducing jitter. In some embodiments, a circuit is operated in a way that switching occurs at or above a bit rate of transmission, such that at least one switch changes state at least for every bit. Operating the circuit in such a way leads to a switching rate that is above a resonant frequency of the circuit and prevents large oscillations and noise from being inserted into the signal and causing communication problems.

Abstract: A data output driving circuit for a semiconductor apparatus includes a code converter that varies an input on-die termination code according to a control signal and outputs the code, and a driver block having impedance which can be modified according to the code generated by the code converter.

Abstract: In an embodiment, the present invention relates to an integrated circuit comprising at least one data signal input (data1, data2), at least one clock signal input (Clock), at least one control signal input (Cnt_del1, Cnt_del2) and a data signal output (Data_out). According to the invention, the integrated circuit is configured to provide a digital data signal having a variable symbol duration at its output (Data_out), the symbol duration being controllable by means of the control signal (Cnt_del1, Cnt_del2). A further embodiment of the invention relates to a method for generating a digital data signal having a variable symbol duration in which an output signal is generated by at least one first data signal, at least one first clock signal and at least one control signal. For this purpose, at least one second clock signal is generated from the first clock signal, the second clock signal having a variable delay and the delay being set depending on the value of the at least one control signal.

Abstract: A differential signaling circuit and a control circuit. The differential signaling circuit includes a first positive driver and a first negative driver. The first negative driver has different impedance than the first positive driver. The first positive driver and the first negative driver together define a first current path between positive and negative power supply terminals. A first output is defined on the first current path intermediate the first positive driver and the first negative driver. The control circuit includes a first driver that drives a transmission line at a first output voltage, a feedback amplifier responsive to the first output voltage to generate a control signal and a metal oxide semiconductor (MOS) driver coupled to the first driver and responsive to the control signal to make impedance of the first driver equivalent to impedance of the transmission line.

Abstract: A device and a method for testing a resistance value of an on-die-termination (ODT) device and a semiconductor device having the same are presented. The device can include a comparator, a storage unit and and an output unit. When in an ODT test operation mode, the comparator compares a reference voltage against an input data input to a pad to determine the resistance value of the ODT device and outputs a determination data on the resistance value of the ODT device corresponding to the determination results. The storage unit stores the output of the comparator in synchronization with a clock signal. When in the ODT test operation mode, the output unit outputs the determination data on the resistance value of the ODT device stored in the storage unit to the pad. Thereby not only is the device configured to determine whether or not a defect of the resistance value of the ODT device exists but the device and the method are able to achieve this task in a substantially shorter testing time period.

Abstract: A calibration circuit is capable of correcting an error of a calibration operation by adjusting a calibration code generated thereby. The calibration circuit of a semiconductor memory device includes a code generator, a calibration resistor unit, and a variable resistor unit. The code generator is configured to generate a calibration code for determining a termination resistance in response to a voltage of a first node and a reference voltage. The calibration resistor unit, which has internal resistors turned on/off in response to the calibration code, is connected to the first node. The variable resistor unit is connected in parallel with the calibration resistor unit and has a resistance that varies with a setting value.

Abstract: According to one aspect of the present disclosure, a circuit includes a semiconductor device including a plurality of logic blocks and a plurality of programmable interconnects. A delay detector generates a delay signal responsive to a measured delay of an output signal, wherein the output signal is from at least one of the plurality of logic blocks. A biasing circuit responsive to the delay signal to adjust subsequent measured delays toward a predetermined value.

Abstract: An integrated circuit arrangement has a signal input 20 and a signal output 60, a signal processing unit 100 which is connected to the signal input 20 and to the signal output 60, a noise source 50 for generating a noise signal, and a noise line 55 which connects the noise source 50 to the signal input 20.

Abstract: A triple latch flip flop system and method are disclosed. In one embodiment, triple latch flip-flop system includes a pull up latch, a pull down latch, a primary latch and an output. The pull up latch drives a pull up node. The pull down latch driving a pull down node. The primary latch records state of the triple latch flip-flop system. The output for outputting a logic value based upon outputs of the pull up latch, pull down latch and the primary latch.

Abstract: A driving circuit includes at least a driving unit, a first processing unit and a second processing unit. The driving circuit includes a first bias component, a second bias component, a first pre-emphasis unit, a second pre-emphasis unit, and a transmitter unit. The first bias component has a first node coupled to a first reference voltage and a second node for outputting a first bias current. The second bias component has a first node for draining a second bias current and a second node coupled to a second reference voltage different from the first reference voltage.

Abstract: Apparatus, systems, and methods are disclosed that operate to drive an output with a data signal and to boost a potential of the output in response to a boost signal. Additional apparatus, systems, and methods are disclosed.

Abstract: An output amplifier is provided for use in a bidirectional communications interface, for example, connecting a transmitter and a receiver to a transmission line. The output amplifier includes a differential amplifier pair connected to output circuitry. The differential amplifier pair receives differential data signal pairs from each of a transmission line and a transmitter. The output circuitry receives signals from the differential amplifier pair and, in response, forms single-ended output logic signals. The output amplifier suppresses electronic input noise throughput using an asymmetric transfer characteristic that offsets output signal logic levels with respect to input noise signal levels. The asymmetric transfer characteristic is produced by skewing a transfer characteristic of the differential amplifier pair using an asymmetrical transistor configuration at an output side of the differential amplifier pair.

Abstract: An output buffer circuit includes a high voltage detecting circuit, a dynamic gate bias generating circuit, an output stage circuit and a pad voltage detector. The high voltage detecting circuit detects a power supply voltage and generates a first and a second determining signals and a first and a second bias voltages according to the power supply voltage. The dynamic gate bias generating circuit is biased by the first and the second bias voltages and receives the first and the second determining signals, for converting logic control signals into corresponding gate bias voltages according to the first and the second determining signals. The pad voltage detector detects a voltage of an I/O pad and provides a pad voltage detecting signal for the output stage circuit to modify an output signal outputted to an I/O pad. A mixed-voltage input/output (I/O) buffer is disclosed herein.

Abstract: A buffer circuit is disclosed. In one embodiment, the buffer circuit includes a preconditioning circuit and a driver circuit. The preconditioning circuit generates a pre-charge signal in response to receiving an input signal. After a predetermined duration, or when the pre-charge circuit reaches a threshold output signal level, the input signal is coupled to an input of the driver circuit. The output signal of the driver circuit is combined with the output signal of the preconditioning circuit to form a composite output signal of the buffer circuit. In one embodiment, the pre-charge signal is used to lower the effective VDS across the transistors of the driver circuit to reduce hot-carrier injection, and therefore reduce transistor performance degradation.

Abstract: An input circuit, includes a first buffer circuit having an output signal terminal connected to an output; a capacitor having one end connected to an input signal terminal, and the other end connected to an input of the first buffer circuit; a first differential amplification circuit receiving a voltage of a first external power source terminal and an output of a second buffer circuit; a second differential amplification circuit receiving a voltage of a second external power source terminal and an output of a third buffer circuit; a first resistance having one end connected to an output of the first differential amplification circuit, and the other end connected between the capacitor and the first buffer circuit; and a second resistance having one end connected to an output of the second differential amplification circuit, and the other end connected between the capacitor and the first buffer circuit.

Abstract: A data output driving circuit capable of optimizing a slew rate of data according to the variation of operational conditions and a method for controlling a slew rate thereof includes a slew rate control signal generating unit configured to generate slew rate control signals by using a code signal, and a plurality of drivers configured to output data by driving the data at a slew rate set according to the slew rate control signals.

Abstract: Apparatus controlling the driver output slew rate that includes a driver circuit having an input signal and an output signal, where the driver circuit is structured and arranged to facilitate control of the slew rate of the output signal. A delay circuit having a time delay proportional to a desired transition time of the driver output signal is coupled to the output of the driver circuit. A first comparator detects when the driver output signal rises through a specified level, and a second comparator detects when the driver output falls through a second specified level. A phase detector is coupled to outputs of the first and second comparators and an output of the delay circuit for aligning the phases of the comparator outputs and the delayed comparator outputs by adjusting the driver output slew rate.

Abstract: An impedance matching circuit performs a ZQ calibration for a test on a wafer process of a semiconductor memory device. The impedance matching circuit of the semiconductor memory device includes a first pull-down resistance unit, a first pull-up resistance unit, a second pull-up resistance unit and a second pull-down resistance unit. The first pull-down resistance unit supplies a ground voltage to a first node in response to a calibration test signal. The first pull-up resistance unit calibrates its resistance to that of the first pull-down resistance unit to thereby generate a pull-up calibration code. The second pull-up resistance unit supplies a supply voltage to a second node in response to the pull-up calibration code. The second pull-down resistance unit calibrates its resistance to that of the second pull-up resistance unit to thereby generate a pull-down calibration code.

Abstract: An output buffer includes at least a first and a second stage, wherein each stage is formed by respective first transistors and second transistors coupled in series with each other between a first and a second voltage reference. The coupled first and second transistors have a common conduction terminal connected to an output terminal of the output buffer. An input terminal of the buffer is connected to control terminals of the transistors of the first stage through a first open loop driving circuit. A second feedback driving circuit is connected between the input terminal and the control terminals of the transistors of the second stage. The second feedback driving circuit includes a current detector operating to detect a maximum in the value of the current drawn by and supplied to the output buffer. A comparison block, having a threshold value, detects current in excess of the threshold value and processes information coming from the current detector to regulate an output impedance value of the output buffer.

Abstract: A semiconductor integrated circuit includes an ODT signal generator that receives an ODT command signal, an ODT reset signal, and an ODT calibration end signal to generate an ODT control signal according to the phase of the ODT calibration end signal, and an ODT resistance adjusting unit that is to perform an on-die termination operation in response to the ODT control signal.