Abstract: The disclosure provides an ICG (integrated clock gating) cell that utilizes a low area and a low power latch. The ICG cell includes a first logic gate that receives an enable signal and generates a latch input. A latch is coupled to the first logic gate and receives the latch input and a clock input. The latch includes a tri-state inverter and an inverting logic gate. The tri-state inverter is activated by a control signal generated by the inverting logic gate. A second logic gate receives the control signal and generates a gated clock.

Abstract: Flip-flops in a monolithic three-dimensional (3D) integrated circuit (IC)(3DIC) and related method are disclosed. In one embodiment, a single clock source is provided for the 3DIC and distributed to elements within the 3DIC. Delay is provided to clock paths by selectively controllable flip-flops to help provide synchronous operation. In certain embodiments, 3D flip-flop are provided that include a master latch disposed in a first tier of a 3DIC. The master latch is configured to receive a flip-flop input and a clock input, the master latch configured to provide a master latch output. The 3D flip-flop also includes at least one slave latch disposed in at least one additional tier of the 3DIC, the at least one slave latch configured to provide a 3DIC flip-flop output. The 3D flip-flop also includes at least one monolithic intertier via (MIV) coupling the master latch output to an input of the slave latch.

Abstract: Techniques for resolving a metastable state in a synchronizer are described herein. In one embodiment, a circuit for resolving a metastable state in a synchronizer comprises a signal delay circuit coupled to a node of the synchronizer, wherein the signal delay circuit is configured to delay a data signal at the node to produce a delayed data signal, and a transmission circuit coupled to the signal delay circuit, wherein the transmission circuit is configured to couple the delayed data signal to the node after a delay from a first edge of a clock signal.

Abstract: In an embodiment of the invention, a dual-port positive level sensitive reset preset data retention latch contains a clocked inverter and a dual-port latch. Data is clocked through the clocked inverter when clock signal CKT goes high, CLKZ goes low, preset control signal PRE is low, rest control signal REN is high and retention control signal RET is low. The dual-port latch is configured to receive the output of the clocked inverter, a second data bit D2, the clock signals CKT and CLKZ, the retain control signals RET and RETN, the preset control signal PRE and the control signals SS and SSN. The signals CKT, CLKZ, RET, RETN, PRE, REN, SS and SSN determine whether the output of the clocked inverter or the second data bit D2 is latched in the dual-port latch. Control signals RET and RETN determine when data is stored in the dual-port latch during retention mode.

Abstract: In an embodiment of the invention, a dual-port negative level sensitive reset data retention latch contains a clocked inverter and a dual-port latch. Data is clocked through the clocked inverter when clock signal CKT goes low, CLKZ goes high, reset control signal REN is high and retention control signal RET is low. The dual-port latch is configured to receive the output of the clocked inverter, a second data bit D2, the clock signals CKT and CLKZ, the retain control signal RET, the reset control signal REN and the control signals SS and SSN. The signals CKT, CLKZ, RET, REN, SS and SSN determine whether the output of the clocked inverter or the second data bit D2 is latched in the dual-port latch. Control signal RET determines when data is stored in the dual-port latch during retention mode.

Abstract: In an embodiment of the invention, a dual-port negative level sensitive data retention latch contains a clocked inverter and a dual-port latch. Data is clocked through the clocked inverter when clock signal CKT goes high, CLKZ goes low and retention control signal RET is low. The dual-port latch is configured to receive the output of the clocked inverter, a second data bit D2, the clock signals CKT and CLN, the retain control signals RET and the control signals SS and SSN. The signals CKT, CLKZ, RET, SS and SSN determine whether the output of the clocked inverter or the second data bit D2 is latched in the dual-port latch. Control signal RET determines when data is stored in the dual-port latch during retention mode.

Abstract: A flip flop circuit has a first stage and a second stage. The first stage and the second stage each have interleaved filters.

Abstract: In an embodiment of the invention, a dual-port positive level sensitive preset data retention latch contains a clocked inverter and a dual-port latch. Data is clocked through the clocked inverter when clock signal CKT goes high, CLKZ goes low, preset control signal PRE is low and retention control signal RET is low. The dual-port latch is configured to receive the output of the clocked inverter, a second data bit D2, the clock signals CKT and CLKZ, the retain control signals RET and RETN, the preset control signal PRE and the control signals SS and SSN. The signals CKT, CLKZ, RET, RETN, PRE, SS and SSN determine whether the output of the clocked inverter or the second data bit D2 is latched in the dual-port latch. Control signals RET and RETN determine when data is stored in the dual-port latch during retention mode.

Abstract: A state retention power gated cell includes a logic cell arranged in two or more rows. The logic cell has an active layer including at least a first well and a second well disposed in first and second rows, respectively. In a normal operation mode, the first well is powered with a first bias voltage, the second well is powered with a second bias voltage, the first power supply line is powered with VDDC, and the second power supply line is powered with VDD. In a standby mode, the first well preferably is powered down, the second well is powered with the second bias voltage, the first power supply line is powered with VDDC, and the second power supply line is powered down.

Abstract: Embodiments of a flip-flip circuit are disclosed that may allow a reduction in data setup time and lower switching power. The flip-flop circuit may include an input circuit, an output circuit, a clock circuit, and a feedback circuit. The clock circuit may be operable to generate internal clocks dependent upon received data, and the generated internal clocks may enable the feedback and input circuits.

Abstract: A flip flop circuit has a first stage and a second stage. The first stage and the second stage each have interleaved filters.

Abstract: An integrated circuit cell includes a set of circuit elements associated with a logic function along a logical path between an input and an output of the integrated circuit cell. The set of circuit elements includes a first subset of circuit elements having a first width size and a first threshold voltage and configured to operate within a cycle of time. The set of circuit elements also includes a second subset of circuit elements having a second width size and a second threshold voltage and configured to operate within the cycle of time. The first subset and second subset of circuit elements are configured to toggle data between the input and the output. The second threshold voltage is less than the first threshold voltage when the second width size is less than the first width size.

Abstract: A pulsed latching apparatus and a method for generating a pulse signal are provided. The pulsed latching apparatus consists of a pulsed latch and a pulse signal generator. A data input terminal of the pulsed latch receives input data, the pulsed latch latches the input data according to a pulse signal, and transmits the latched input data through the data output terminal to serve as output data. The pulse signal generator duplicates a data transmission delay between the data input terminal and the data output terminal of the pulsed latch to obtain a duplicated delay. The pulse signal generator receives a clock signal, and processes the clock signal according to the duplicated delay to generate the pulse signal.

Abstract: A critical path monitor (CPM) is configured in an integrated circuit (IC). The IC includes a set of critical paths. The CPM includes a set of split paths, a split path in the set of split paths corresponding to a critical path in the set of critical paths, and a split path in the set of split paths including an edge detector. The edge detector is configured with a set of edge detector latches. A set of set-reset (SR) latches is configured such that an edge detector latch is associated with a corresponding SR latch. A reset signal is configured to reach the set of edge detector latches in an offset synchronization with a latch clock signal used in the set of edge detector latches. The CPM is configured to operate using a frequency of the latch clock signal such that the frequency is higher than a threshold frequency.

Abstract: An RFID transponder in one embodiment comprises a radio frequency (RF) transceiver, processing logic coupled to the RF transceiver, a switch coupled to the processing logic, a tunneling device coupled to the switch and a differential sensing circuit having a first input coupled to the tunneling device and a second input coupled to a predetermined reference voltage. In one embodiment, the tunneling device can discharge to a voltage below the predetermined reference voltage.

Abstract: A scannable fast dynamic register including a data and scan enable circuit, a precharge circuit, a select circuit, a store circuit, and a scan input enable circuit. The data and scan enable circuit pulls a first precharge node to a discharge node in response to the clock upon evaluation in normal mode. The precharge circuit precharges first and second precharge nodes high, in which one of the precharged nodes discharges depending upon whether a data block evaluates. The store circuit and an output gate are responsive to the second precharge node to provide the output. The select circuit is interposed before the store circuit to allow injection of scan data in a scan mode. In scan mode, the scan input enable circuit provides scan data to the select and store circuits. The scan input enable circuit also includes a store circuit which operates with the first store circuit in a master-slave configuration.

Abstract: A circuit includes a pulsed-latch circuit. The pulsed-latch circuit includes a first plurality of transistors. One or more of the first plurality of transistors is length-of-diffusion (LOD) protected.

Abstract: An integrated circuit may have a clock input pin coupled to a buffer (24). The buffer may supply a clock signal (28) to an integrated circuit chip such as the memory. To conserve power, the buffer is powered down. When ready for use, the buffer is quickly powered back up. In one embodiment, in response to a predetermined number of toggles Of the clock signal, the buffer is automatically powered up.

Abstract: A circuit including a data storage element; first and second input circuitry coupled respectively to first and second inputs of the data storage element and each including a plurality of components adapted to generate, as a function of an initial signal, first and second input signals respectively provided to the first and second inputs; wherein the data storage element includes a first storage node and is configured such that a voltage state stored at the first storage node is protected from a change in only one of the first and second input signals by being determined by the conduction state of a first transistor coupled to the first storage node and controlled based on the first input signal and by the conduction state of a second transistor coupled to the first storage node and controlled based on the second input signal.

Abstract: A first circuit is configured to communicatively couple to a second circuit including an analog circuit and a digital circuit. The first circuit comprises a lock unit and a sleep unit. The lock unit is configured to receive a lock enable signal and to lock a configuration signal of the digital circuit in response to the lock enable signal. The sleep unit is configured to receive a sleep triggering signal indicating to switch into sleep mode and to generate an off signal to switch off the digital circuit in response to the sleep triggering signal, while the analog circuit remains on.

Abstract: A dual flip-flop circuit combines two or more flip-flip sub-circuits into a single circuit. The flip-flop circuit comprises a first flip-flop sub-circuit and a second flip-flop sub-circuit. The first flip-flop sub-circuit comprises a first storage sub-circuit configured to store a first selected input signal and transfer the first selected input signal to a first output signal when a buffered clock signal transitions between two different logic levels and a dock driver configured to receive a clock input signal, generate an inverted clock signal, and generate the buffered clock signal. The second flip-flop sub-circuit is coupled to the clock driver and configured to receive the inverted clock signal and the buffered clock signal. The second flip-flop sub-circuit comprises a second storage sub-circuit configured to store a second selected input signal and transfer the second selected input signal to a second output signal when the buffered clock signal transitions.

Abstract: To provide a novel nonvolatile latch circuit and a semiconductor device using the nonvolatile latch circuit, a nonvolatile latch circuit includes a latch portion having a loop structure where an output of a first element is electrically connected to an input of a second element, and an output of the second element is electrically connected to an input of the first element; and a data holding portion for holding data of the latch portion. In the data holding portion, a transistor using an oxide semiconductor as a semiconductor material for forming a channel formation region is used as a switching element. In addition, an inverter electrically connected to a source electrode or a drain electrode of the transistor is included. With the transistor, data held in the latch portion can be written into a gate capacitor of the inverter or a capacitor which is separately provided.

Abstract: A latch circuit includes: a data latch that holds data that has been input according to a first control signal or a second control signal; and a latch controller that includes a first input terminal to which a first operation signal is input, the first operation signal operating the data latch in a first scan method, and a second input terminal to which a second operation signal is input, the second operation signal operating the data latch in a second scan method; wherein when a prescribed value is input to the first input terminal, the latch controller outputs the second control signal to control the data latch, and when a prescribed value is input to the second input terminal, the latch controller outputs the first control signal to control the data latch.

Abstract: Equalization techniques are provided for high-speed data communications and, more specifically, DFE (decision feedback equalizer) circuits and methods are provided which implement a high-order continuous time filter in a DFE feedback path to emulate structured elements of a channel response.

Abstract: A latch includes a current source, an input amplifier, and a latch output circuit. The current source is configured to output a current based on a voltage source. The input amplifier is configured to receive a differential analog input signal including a first differential input and a second differential input and selectively provide the current based on the first differential input and the second differential input. A latch output circuit is configured to selectively output a differential digital output signal including a first differential output and a second differential output. The latch output circuit includes an over voltage protection circuit configured to receive the current output from the input amplifier, receive the voltage source limit, and output a modified differential digital output signal based on a comparison between a voltage corresponding to each of the first differential output and the second differential output and the voltage source limit.

Abstract: In an embodiment of the invention, a flip-flop circuit contains a 2-input multiplexer, a master latch, a transfer gate and a slave latch. The scan enable control signals SE and SEN of the multiplexer determine whether data or scan data is input to the master latch. The clock signals CLK and CLKN and retention control signals RET and RETN determine when the master latch is latched. The slave latch is configured to receive the output of the master latch, a second data bit D2, the clock signals CLK and CLN, the retain control signals RET and RETN, the slave control signals SS and SSN. The signals CLK, CLKN, RET, RETN, SS and SSN determine whether the output of the master latch or the second data bit D2 is latched in the slave latch. Control signals RET and RETN determine when data is stored in the slave latch during retention mode.

Abstract: In an embodiment of the invention, a flip-flop circuit contains a 2-input multiplexer, a master latch, a transfer gate and a slave latch. The scan enable control signals SE and SEN of the multiplexer determine whether data or scan data is input to the master latch. The clock signals CLK and CLKN and retention control signals RET and RETN determine when the master latch is latched. The slave latch is configured to receive the output of the master latch, a second data bit D2, the clock signals CLK and CLN, the retain control signals RET and RETN, the slave control signals SS and SSN. The signals CLK, CLKN, RET, RETN, SS and SSN determine whether the output of the master latch or the second data bit D2 is latched in the slave latch. Control signals RET and RETN determine when data is stored in the slave latch during retention mode.

Abstract: A duty ratio correction circuit includes a duty cycle ratio controlling unit configured to generate an internal clock signal having a duty cycle ratio defined according to a first reference clock signal and a reset signal and a reset signal generating unit configured to generate the reset signal in response to a second reference clock signal and the internal clock signal fed back thereto.

Abstract: In an embodiment of the invention, a flip-flop circuit contains a 2-input multiplexer, a master latch, a transfer gate and a slave latch. The scan enable control signals SE and SEN of the multiplexer determine whether data or scan data is input to the master latch. Clock signals CKT and CLKZ and retention control signals RET and RETN determine when the master latch is latched. The slave latch is configured to receive the output of the master latch, a second data bit D2, the clock signals CKT and CLKN, the retain control signals RET and RETN, the slave control signals SS and SSN. The signals CKT, CLKZ, RET, RETN, SS, SSN RE, and PREN determine whether the output of the master latch or the second data bit D2 is latched in the slave latch. Control signals RET and RETN determine when data is stored in the slave latch during retention mode.

Abstract: A current reuse frequency divider including a first latch circuit and a second latch circuit is provided. The first latch circuit includes a first transistor pair and a second transistor pair. The first latch circuit receives a first differential oscillation signal through bodies of the first transistor pair and the second transistor pair and divides the frequency of the first differential oscillation signal to generate a second differential oscillation signal. The second latch circuit is coupled to the first latch circuit and includes a third transistor pair and a fourth transistor pair. The second latch circuit receives the first differential oscillation signal through bodies of the third transistor pair and the fourth transistor pair and divides the frequency of the first differential oscillation signal to generate a third differential oscillation signal.

Abstract: A system and method to perform scan testing using a pulse latch with a blocking gate is disclosed. In a particular embodiment, a scan latch includes a pulse latch operable to receive data while a pulse clock signal has a first logical clock value and a blocking gate coupled to an output of the pulse latch. The blocking gate is operable to propagate the data from the output of the pulse latch while the pulse clock signal has a second logical clock value.

Abstract: Provided is a semiconductor circuit. The semiconductor circuit includes a pulse generator which is enabled by a rising edge of a clock signal and generates a read pulse which varies depending on a voltage of a feedback node; and a sense amplifier which generates a voltage of a dynamic node and the voltage of the feedback node in accordance with a data value of an input signal using the read pulse.

Abstract: Apparatuses, circuits, and methods are disclosed for reducing or eliminating unintended operation resulting from metastability in data synchronization. In one such example apparatus, a sampling circuit is configured to provide four samples of a data input signal. A first and a second of the four samples are associated with a first edge of a latching signal, and a third and a fourth of the four samples are associated with a second edge of the latching signal. A masking circuit is configured to selectively mask a signal corresponding to one of the four samples responsive to the four samples not sharing a common logic level. The masking circuit is also configured to provide a decision signal responsive to selectively masking or not masking the signal.

Abstract: A system on chip (SoC) includes one or more core logic blocks that are configured to operate on a lower supply voltage and a memory array configured to operate on a higher supply voltage. Each bitcell in the memory has two ferroelectric capacitors connected in series between a first plate line and a second plate line to form a node Q. A data bit voltage is transferred to the node Q by activating a write driver to provide the data bit voltage responsive to the lower supply voltage. The data bit voltage is boosted on the node Q by activating a sense amp coupled to node Q of the selected bit cell, such that the sense amp senses the data bit voltage on the node Q and in response increases the data bit voltage on the node Q to the higher supply voltage.

Abstract: A scan flip-flop may include a selector outputting a data signal or a scan input signal in response to a scan enable signal, and a flip-flop that latches an output signal of the selector or the data signal, based on a clock signal and a low voltage signal.

Abstract: Systems and methods are described including receiving a clock signal, using rational clock divider (RCD) logic to generate a lower frequency clock signal in response to the received clock signal, and using the second clock signal to drive software timer logic and generate media timestamps.

Abstract: A scannable storage circuit includes a scan enable input, a storage element having a Node coupled to a data output buffer for driving a data output terminal. The data output buffer includes an inverter; a transmission gate having a first MOS transistor and a second MOS transistor with sources and drains coupled to each other, drains coupled to an output of the inverter and sources coupled to the data output terminal and gates coupled to the scan enable input and an inverted scan enable input. A third MOS transistor and a fourth MOS transistor is coupled to the sources of the first and second MOS transistors, the third MOS transistor and fourth MOS transistor are configured to pull up or pull down the data output terminal in response to a first control signal and a second control signal respectively. A scan output is generated from the output of the inverter.

Abstract: An object is to provide a semiconductor device which can suppress characteristic deterioration in each transistor without destabilizing operation. In a non-selection period, a transistor is turned on at regular intervals, so that a power supply potential is supplied to an output terminal of a shift register circuit. A power supply potential is supplied to the output terminal of the shift register circuit through the transistor. Since the transistor is not always on in a non-selection period, a shift of the threshold voltage of the transistor is suppressed. In addition, a power supply potential is supplied to the output terminal of the shift register circuit through the transistor at regular intervals. Therefore, the shift register circuit can suppress noise which is generated in the output terminal.

Abstract: A system and device for reducing leakage current in a sequential circuit is disclosed. In one embodiment, a system for reducing leakage current in a sequential circuit includes a combinational logic circuit, one or more reset flip-flops coupled to the combinational logic circuit, and one or more set-reset flip-flops coupled to the combinational logic circuit. The system further includes a control module coupled to the reset flip-flops and to the set flip-flops and configured to reset the reset flip-flops and to set the set-reset flip-flops when a standby mode of the sequential circuit is triggered.

Abstract: The present invention provides a data latch circuit which can operate stably with a low-amplitude signal, which consumes less electric power, and which is resistant against the variation in TFTs. When an analog switch is turned on, a data signal is inputted to a gate electrode of an n-channel TFT and, at this time, VDD is supplied to an input terminal of an inverter. When the analog switch in turned off, the n-channel TFT is turned on or off depending on a level of the data signal. When the data signal is at an H level, the n-channel TFT is turned on and VSS is supplied to the input terminal of the inverter. When the data signal is at an L level, VDD is supplied to an input terminal of the inverter. Therefore, only VDD and VSS levels are applied to the input terminal of the inverter.

Abstract: In an embodiment, the present invention includes a latch circuit having a first input to receive a data signal and a second input to receive a clock signal. This latch circuit may have a first pair of transistors including a first transistor gated by the data signal and a second transistor gated by an inverted data signal and a second pair of transistors including third and fourth transistors gated by the clock signal. The first transistor may be coupled to the third transistor at a first inter-latch node and the second transistor coupled to the fourth transistor at a second inter-latch node. A reset circuit may be coupled to the latch circuit to maintain the first and second inter-latch nodes at a predetermined voltage level when the clock signal is inactive.

Abstract: A serial-format data signal is input to a data input terminal. Each of n (n represents an integer of two or more) multiple clock input terminals is configured to receive a clock signal as an input signal. An input flip-flop latches the data signal at each timing that corresponds to the corresponding clock signal. A serial/parallel converter converts the serial-format data signal into a parallel-format intermediate data signal using the corresponding clock signal. A data selector selects one from among the n intermediate data signals according to a selection signal.

Abstract: A method that includes identifying a desired signal connectivity through a switch matrix, where the switch matrix includes a plurality of switching elements, and where the switching elements are selectively operable in a plurality of states to provide a plurality of signal paths for routing signals through the switch matrix. The method also includes identifying a sorting network model that corresponds to a topology of the switch matrix, applying a sorting algorithm to the sorting network model, and determining, based on the results of applying the sorting algorithm, operational states of the plurality of switching elements to provide signal paths corresponding to the desired signal connectivity.

Abstract: The described embodiments provide a configurable clock circuit. The clock circuit includes a control and enable circuit and a clock distribution circuit. During operation, when a signal on an enable input to the control and enable circuit is asserted and the control and enable circuit is configured in a clock mode, the control and enable circuit generates an enable signal on a control output to enable a signal on a clock input to propagate through the clock distribution circuit to the clock output. Alternatively, when a signal on the enable input to the control and enable circuit is asserted and the control and enable circuit is configured in a pulse mode, the control and enable circuit generates a pulsed control signal on the control output to control a length of a pulse generated from the clock input on a clock output by the clock distribution circuit.

Abstract: A control circuit 10 includes an internal clock generating portion (12), which starts generating an internal clock signal (LCLK) required by a control portion (11) to perform action when a specific signal pattern appears in a trigger signal, continually generates the internal clock signal (LCLK) at least before the control portion (11) completes predetermined processing, and then stops generating the internal clock signal (LCLK); and the control portion (11), which uses the internal clock signal (LCLK) to perform the predetermined processing.

Abstract: This disclosure relates generally to sequential state elements (SSEs). More specifically, embodiments of flip-flops are disclosed, along with computerized methods and systems of designing the same. In one embodiment, the flip-flop includes a substrate and subcircuits that are formed on the substrate. The subcircuits provide subfunctions, wherein each of the subcircuits provides at least one of the subfunctions. More specifically, the subfunctions are provided in a sequential logical order by the subcircuits so that the flip-flop provides a flip-flop function. However, the subcircuits are interleaved out of the sequential logical order with respect to a corresponding subfunction provided by each of the subcircuits along a vector defined by the substrate. In this manner, interleaving the subcircuits along the vector of the substrate can provide separation between charge collection nodes without requiring increases in size. Thus, the flip-flop can be more compact and less expensive to manufacture.

Abstract: An object of one embodiment of the present invention to provide a latch circuit includes a level shifter and a buffer in which transistors each including a channel region formed in an oxide semiconductor film are connected in series. Thus, data can be held in the latch circuit even when power is not supplied.

Abstract: Aspects of the present disclosure are directed towards apparatus useful for processing communications between different signaling voltage levels. Different signaling voltage levels are accomplished by creating true and complement signals from at least one input signal, each of which are subject to different delays, and level shifting the true and complement signals to a new signaling voltage level. The true or complement signal subject to a smaller timing delay is selected, and used to provide an output signal.

Abstract: A flip-flop operating with standard threshold voltage MOS devices as compared with high threshold voltage MOS devices may have improved speed performance, but greater leakage current. Likewise, a flip-flop operating with high threshold voltage MOS devices may reduce the leakage current and have better power efficiency, but decreased speed and performance. An optimized flip-flop may include a combination of standard threshold voltage MOS devices and high threshold voltage MOS devices. The optimized flip-flop may have less leakage during stand-by mode as compared to a flip-flop with standard threshold voltage MOS devices. In addition, the optimized flip-flop may have better performance and speed as compared to a flip-flop with high threshold voltage MOS devices.

Abstract: A module control circuit includes an input unit configured to receive a plurality of data signals from a plurality of data input/output pins and output an identification signal and an internal command signal. A latch unit is configured to latch the identification signal in accordance with a first enable signal to output a first group identification signal, latch the identification signal in accordance with a second enable signal to output a second group identification signal, and latch the internal command signal in accordance with the second enable signal to output a group command signal. A comparator is configured to compare the first group identification signal with the second group identification signal, and generate a selection signal. A multiplexer is configured to select one of the group command signal and a module command signal as an input command in response to the selection signal.