Having Program Control Or An Analogue To Digital Device Patents (Class 33/505)
  • Patent number: 10817160
    Abstract: To provide a three-dimensional coordinate measuring device having high convenience with respect to setting of measurement conditions. A geometric element and a measurement item selected on a first main screen sc01 are accepted. A first sub screen sc11 including a part of the plurality of geometric elements and the plurality of measurement items displayed on the first main screen sc01 is displayed on a touch panel display 230 provided in a handheld probe. Based on an operation of the touch panel display 230, a geometric element and a measurement item are selected from the displayed first sub screen sc11. Base on the geometric element and the measurement item accepted by at least one of the main accepting unit and a sub accepting unit and the coordinates of a measurement point instructed by the handheld probe, the value of the selected measurement item of the selected geometric element is calculated.
    Type: Grant
    Filed: June 21, 2019
    Date of Patent: October 27, 2020
    Assignee: KEYENCE CORPORATION
    Inventor: Masayasu Ikebuchi
  • Patent number: 10415949
    Abstract: A measuring probe includes two supporting members, each having a rotationally symmetric shape and allowing for an attitude change of a stylus, in an axial direction of a probe housing. Four detection elements are disposed at fourfold symmetric positions in one of the two supporting members that includes four deformable arm parts. A signal processing circuit includes a first processing part that processes outputs of the detection elements to output three displacement signals representing displacement components of a contact part in mutually perpendicular three directions, respectively. The measuring probe capable of reducing measurement directional dependency of sensitivity with a simple configuration while maintaining high sensitivity is thus provided.
    Type: Grant
    Filed: February 23, 2017
    Date of Patent: September 17, 2019
    Assignee: MITUTOYO CORPORATION
    Inventors: Satoshi Koga, Akinori Saito, Hiroyuki Kanamori, Yutaka Kuriyama, Nobuhiro Ishikawa
  • Patent number: 10393495
    Abstract: A measuring probe includes: a stylus having a contact part to be brought into contact with an object to be measured; a probe housing capable of supporting the stylus on an axial center; and a detection element capable of detecting a movement of the contact part. The measuring probe further includes: two supporting members disposed in an axial direction of the probe housing, the supporting member allowing for an attitude change of the stylus; and a coupling shaft for coupling the two supporting members together. The detection element is disposed in one of the two supporting members that is farthest away from a rotational center position of rotation generated in the stylus when a measuring force is applied to the contact part from a direction perpendicular to the axial direction, to detect a strain amount of the one of the two supporting members.
    Type: Grant
    Filed: February 23, 2017
    Date of Patent: August 27, 2019
    Assignee: MITUTOYO CORPORATION
    Inventors: Satoshi Koga, Akinori Saito, Hiroyuki Kanamori, Yutaka Kuriyama, Nobuhiro Ishikawa
  • Patent number: 10363658
    Abstract: To provide an angle detection method with which a control for positioning an output shaft using an input shaft encoder and output shaft encoder at a high accuracy and a torsional feedback control can be realized and an angle detection apparatus that executes the angle detection method. In a robot arm constituted by an input shaft encoder, an output shaft encoder, a motor, a reduction gear, and the like, an output shaft encoder detection error is corrected by setting rotation position information using a periodicity of rotations of the input shaft encoder as a reference. When the input/output shaft encoder detection error is corrected in this manner, the control for positioning the output shaft at a high accuracy and the torsional feedback control can be realized.
    Type: Grant
    Filed: March 24, 2015
    Date of Patent: July 30, 2019
    Assignee: Canon Kabushiki Kaisha
    Inventors: Satoshi Hasebe, Yohji Nakajima
  • Patent number: 10197392
    Abstract: An apparatus comprises an automated guided vehicle that moves on a surface of a composite structure during operation of the apparatus to inspect the composite structure, a surface inspection sensor system associated with the automated guided vehicle, and an automated guided vehicle and surface inspection sensor system controller in communication with the automated guided vehicle and the surface inspection sensor system.
    Type: Grant
    Filed: June 23, 2015
    Date of Patent: February 5, 2019
    Assignee: The Boeing Company
    Inventor: Gregory L. Clark
  • Patent number: 9144860
    Abstract: A method for controlling a welding robot having a servo gun with a movable tip and a fixed tip includes the steps of separately contacting a surface of a part with the movable tip to measure a base test point and an at least two additional test points displaced from the base test point. Two non-collinear vectors are calculated from the at least two additional test points. A normal vector is calculated from the two non-collinear vectors. An angle between the original servo gun orientation and the normal vector is determined. An orientation of the servo gun may be corrected, for example, if the angle is within user specified tolerances.
    Type: Grant
    Filed: March 29, 2012
    Date of Patent: September 29, 2015
    Assignee: Fanuc Robotics America Corporation
    Inventors: Frank Garza, Brad Niederquell
  • Patent number: 8943703
    Abstract: A digital indicator includes: a body; a spindle formed in the body, movably in an axial direction; a displacement detecting sensor configured to detect a movement displacement amount of the spindle; a display device configured to display the movement displacement amount of the spindle detected by the displacement detecting sensor; and a display controller configured to linearly move a measured value display mark representing a measured value in a display surface of the display device according to variations in the measured value.
    Type: Grant
    Filed: March 5, 2013
    Date of Patent: February 3, 2015
    Assignee: Mitutoyo Corporation
    Inventor: Shuji Hayashida
  • Publication number: 20130247403
    Abstract: A digital indicator includes: a body; a spindle formed in the body, movably in an axial direction; a displacement detecting sensor configured to detect a movement displacement amount of the spindle; a display device configured to display the movement displacement amount of the spindle detected by the displacement detecting sensor; and a display controller configured to linearly move a measured value display mark representing a measured value in a display surface of the display device according to variations in the measured value.
    Type: Application
    Filed: March 5, 2013
    Publication date: September 26, 2013
    Applicant: MITUTOYO CORPORATION
    Inventor: Shuji HAYASHIDA
  • Patent number: 8112897
    Abstract: A monitoring device assembly and method may include a primary interface for attaching to a monitored device, and a monitoring device mechanically coupled to the primary interface that captures an image of the monitored device.
    Type: Grant
    Filed: January 21, 2009
    Date of Patent: February 14, 2012
    Assignee: Cypress Semiconductor Corporation
    Inventors: Scott Valoff, Marcus Kramer, Eric Gawehn
  • Patent number: 7721455
    Abstract: A measuring instrument includes a detector that outputs a measured value, a digital display unit, an analog display unit having a plurality of display segments, and a display controller. The display controller includes: a tolerance range display unit that lights or blinks display segments corresponding to a preset tolerance range relative to a preset value; a first determiner that obtains a difference between the present value and a present measured value and determines whether the difference is within an analog display range wider than the tolerance range; a difference display unit that lights a display segment corresponding to the last one or the last two digits of the present measured value when the first determiner determines that the difference is within the analog display range; a second determiner that determines whether the difference is within the tolerance range; and an acceptance or rejection display unit that displays a result determined by the second determiner.
    Type: Grant
    Filed: October 31, 2008
    Date of Patent: May 25, 2010
    Assignee: Mitutoyo Corporation
    Inventors: Sadayuki Matsumiya, Mikio Suzuki, Shuji Hayashida, Yoshiaki Shiraishi, Nobuyuki Hayashi
  • Publication number: 20090113734
    Abstract: A measuring instrument includes a detector that outputs a measured value, a digital display unit, an analog display unit having a plurality of display segments, and a display controller. The display controller includes: a tolerance range display unit that lights or blinks display segments corresponding to a preset tolerance range relative to a preset value; a first determiner that obtains a difference between the present value and a present measured value and determines whether the difference is within an analog display range wider than the tolerance range; a difference display unit that lights a display segment corresponding to the last one or the last two digits of the present measured value when the first determiner determines that the difference is within the analog display range; a second determiner that determines whether the difference is within the tolerance range; and an acceptance or rejection display unit that displays a result determined by the second determiner.
    Type: Application
    Filed: October 31, 2008
    Publication date: May 7, 2009
    Applicant: MITUTOYO CORPORATION
    Inventors: Sadayuki Matsumiya, Mikio Suzuki, Shuji Hayashida, Yoshiaki Shiraishi, Nobuyuki Hayashi
  • Patent number: 7392692
    Abstract: A surface scan measuring device, a surface scan measuring method, a surface scan measuring program and a recording medium storing such a program which can appropriately adjust the scanning speed, the sampling pitch and other measurement parameters according to the surface condition of a workpiece are provided. The surface scan measuring device includes a radius of curvature computing section (543) for computing the radius of curvature of the scanning point from the measurement data acquired during the ongoing scanning operation, a moving speed deciding section (544) for deciding the moving speed of the scanning probe according to the computed radius of curvature and a sampling pitch deciding section (546) for deciding the sampling pitch according to the computed radius of curvature.
    Type: Grant
    Filed: May 26, 2005
    Date of Patent: July 1, 2008
    Assignee: Mitutoyo Corporation
    Inventor: Takashi Noda
  • Patent number: 7352271
    Abstract: A probe body (200) includes a middle closing portion (250) formed upright on a connector front portion (261A) and a female thread (261D) into which a male screw (110) is screwed. A sensor module (300) includes a slidable-contact portion (322) that slidably contacts with the connector front portion (261A), a pressing member (321) that is pressed against the middle closing portion (250) and an insertion hole (325). The insertion hole (325) has a widened portion (325B) that is inclined in such a manner that a distance between an opening on the pressing portion (321) side, the opening positioned on a screw-hole-forming-portion end surface (324), and the pressing portion (321) gradually becomes larger toward the slidable-contact portion (322) side. The insertion hole (325) has a diameter larger than that of the male screw (110).
    Type: Grant
    Filed: May 14, 2007
    Date of Patent: April 1, 2008
    Assignee: Mitutoyo Corporation
    Inventors: Kentaro Nemoto, Takeshi Yamamoto
  • Patent number: 7024333
    Abstract: A coordinate measuring apparatus includes probe pin(s) fixed to a probe head displaceable in coordinates. The probe pin includes probe shafts having respective ends to which probe balls are attached. At least two of the probe shafts are differently oriented when the probe pins are fixed to the probe head. A control and evaluation unit controls the course of measurement and evaluates the measuring points recorded. At least one probe shaft is determined for measuring a geometric element on a workpiece by determining at least one characteristic piece of directional information for the points to be measured of a geometric element to be measured on the workpiece, either on the basis of the measured measuring points or according to predefined nominal data of the geometric element. At least one probe shaft for measuring the measuring points is determined from the directional information.
    Type: Grant
    Filed: September 10, 2003
    Date of Patent: April 4, 2006
    Assignee: Carl-Zeiss-Stiftung
    Inventors: Rudolf Rögele, Dieter Kalmbach
  • Patent number: 6832877
    Abstract: A dental measuring and machining system includes a measuring and machining unit for preparing measurement data by measuring a prosthesis model based on a predetermined algorithm and for producing a prosthesis by machining a prosthesis block based on the above measurement data, and an operating unit for operating the measuring and machining unit from the outside. A user is able to produce a dental prosthesis by operating the measuring and machining unit under the control of a computer. The measuring and machining unit is connected to the external operating unit by communication, and the measuring and machining unit can be operated from the outside.
    Type: Grant
    Filed: November 26, 2002
    Date of Patent: December 21, 2004
    Assignee: Kabushiki Kaisya Advance
    Inventor: Hiroaki Hamada
  • Patent number: 6830659
    Abstract: An apparatus for measuring wear of a doctor blade includes measuring members placed around the doctor blade for measuring at least one dimension of the doctor blade. The measuring members are arranged to permit longitudinal movement of the doctor blade between the doctor blade and the measuring members. In addition, measurement sensors are connected to the measuring members to obtain a continuous measurement result when the doctor blade or the apparatus is moved. The invention also relates to a method in the measurement of wear of a doctor blade and in controlling a paper machine.
    Type: Grant
    Filed: November 5, 2002
    Date of Patent: December 14, 2004
    Assignee: Metso Paper, Inc.
    Inventor: Tero Sovijärvi
  • Patent number: 6694634
    Abstract: Disclosed is a position error evaluating method of a moving device, which includes the following steps. Specifically, in a moving device which moves a movable body in two axial directions or in three axial directions orthogonal to each other, a straightness error curve indicating a state of change in a position error of the movable body along a uniaxial direction out of predetermined two axial directions is obtained by a sequential two-point method, the position error being related to a direction orthogonal to the predetermined two axial directions out of the biaxial or three axial directions. Then, the above step is repeated for the other uniaxial direction out of the two axial directions.
    Type: Grant
    Filed: July 29, 2002
    Date of Patent: February 24, 2004
    Assignee: Educational Foundation Chuo University
    Inventors: Hisayoshi Sato, Kazunori Umeda
  • Patent number: 6611786
    Abstract: In coordinate and surface texture measurement in which measurement control is performed by a part program, a part program is analyzed to extract measurement information or measurement condition. The measurement condition is rewritably stored such that optimal measurement conditions of an actual measurement can be reflected in a part program, and such that the actual measurement conditions can be added to subsequent measurement control.
    Type: Grant
    Filed: April 20, 2000
    Date of Patent: August 26, 2003
    Assignees: Mitutoyo Corporation, Mori Seiki Co., Ltd., Okuma Corporation
    Inventors: Yuwu Zhang, Masayoshi Uneme, Yasushi Fukaya, Kazuo Yamazaki
  • Patent number: 6400998
    Abstract: A method and apparatus for NC machining management based on a measurement program, wherein a machining shape at an arbitrary machining stage is determined by an NC program, a geometric element or a geometric model is generated, and a measurement program is generated on the basis of the geometric model. The measurement program is executed when at least one of the steps of the NC program is completed, and the results of measurement are used as control information for machining measurement.
    Type: Grant
    Filed: July 2, 1998
    Date of Patent: June 4, 2002
    Assignees: Mitutoyo Corporation, Kabushiki Kaisha Mori Seiki Seisakusho, Okuma Corporation
    Inventors: Kazuo Yamazaki, Sadayuki Matsumiya, Naoki Morita, Yasushi Fukaya
  • Patent number: 6370787
    Abstract: A measuring machine having a base (10), a touch signal probe (P), a moving mechanism (20) for retaining the touch signal probe (P) movably in three-dimensional directions, and a controller (60) for controlling a movement of the moving mechanism (20) and for acquiring coordinates value of respective axes based on a contact signal from the touch signal probe (P) to measure a dimension etc. of a workpiece based on the coordinates value is provided. Main structural members structuring the moving mechanism (20), more specifically, a column (21), a supporter (22), a X-beam (23), a Z-axis structure (25) and a Z-axis spindle (26) are made of aluminum or aluminum alloy including aluminum as main component, which has large thermal conductivity, thereby making temperature distribution uniform to improve geometrical accuracy.
    Type: Grant
    Filed: July 7, 1999
    Date of Patent: April 16, 2002
    Assignee: Mitutoyo Corporation
    Inventor: Shigeo Kikuchi
  • Patent number: 6366831
    Abstract: A novel, portable coordinate measuring machine comprises a multijointed (preferably six joints) manually positionable measuring arm for accurately and easily measuring a volume. In addition to the articulated measuring arm, the present invention employs a software interface which permits the arm to be used in connection with one or more applications programs.
    Type: Grant
    Filed: January 12, 1999
    Date of Patent: April 2, 2002
    Assignee: Faro Technologies Inc.
    Inventor: Simon Raab
  • Patent number: 6161079
    Abstract: A method of operating a coordinate measuring machine (CMM) provides the operator with the ability to automatically set the tolerance value of the part measurement based on preset conditions, and make an educated guess or estimate of the nominal part value during the measurement. This nominal estimation technique is based on the actual measurement value taken by the CMM, and the information supplied about the tolerance limits. This estimation technique of the present invention makes it much easier for the operator to measure the part and produce a report, since it significantly reduces the amount of operator keystroke information required to be manually input via the keyboard.
    Type: Grant
    Filed: August 18, 1997
    Date of Patent: December 12, 2000
    Assignee: Giddings & Lewis, LLC
    Inventors: Joseph H. Zink, Mark K. Schindler
  • Patent number: 5966681
    Abstract: The invention is directed to a method which is provided for controlling coordinate measuring apparatus wherein a probe head (2) is moved and has a movably attached probe unit (24) attached thereto. The probe unit (24) is charged with a measurement force Fmeas relative to the probe head (2). The measurement force Fmeas operates against the mass inertial forces Fzp which occur because of acceleration of the probe. The measurement force Fmeas is comprised of a desired measurement force Fdes and a corrective measurement force Fcorr. The desired measurement force Fdes is constant in magnitude and is directed perpendicularly to the surface of the workpiece (15) to be measured. The corrective measurement force Fcorr at least partially compensates for the mass inertial forces (Ftr, Fzp) which occur because of the acceleration of the probe unit (24).
    Type: Grant
    Filed: December 18, 1997
    Date of Patent: October 12, 1999
    Assignee: Carl-Zeiss-Stiftung
    Inventors: Ralf Bernhardt, Otto Ruck, Gunter Grupp
  • Patent number: 5926781
    Abstract: A roundness measuring machine is described which measures the position of the surface of an object as the object is rotated on a turntable. The machine determines the circle which is the best fit to the measured points and converts the measurements to distances from the best fit circle. An improved algorithm for determining the best fit circle is used in place of the limacon fit. Calculated differences between the measured surface position and the best fit circle are corrected for the effect of measuring the difference in the direction towards the center of rotation of the turntable instead of in the direction towards the center of the circle. Data values are calculated representing points at equal angles around the center of the best fit circle rather than equal angles around the center of rotation of the turntable. The improved accuracy of correction allows the machine to tolerate greater eccentricity of the workplace relative to the turntable, reducing the necessity for accurate centering of the workpiece.
    Type: Grant
    Filed: May 28, 1997
    Date of Patent: July 20, 1999
    Assignee: Taylor Hobson Limited
    Inventor: Paul James Scott
  • Patent number: 5898590
    Abstract: A probing system that checks a pattern formed by a plurality of features of an object. The system includes an input device that receives an ideal position and an ideal set of dimensions of each of the plurality of features, as well as an acceptable tolerance for the plurality of features. The input device generates a first signal. A probe device is electrically connected to the input device to receive the first signal, and in response, directs a probe to a location of samples. The probe device outputs a second signal indicative of a measured location of each of the samples.
    Type: Grant
    Filed: August 21, 1996
    Date of Patent: April 27, 1999
    Assignee: The Boeing Company
    Inventors: Robert R. Wampler, Lisa D. Riley
  • Patent number: 5737244
    Abstract: The control of a coordinate measuring apparatus includes a device for correcting the pregiven desired path when the actual geometry of the workpiece 17 to be measured deviates from the desired geometry. This device is a two-stage controller which includes a first control stage 27 which operates in response to a control signal proportional to the deflection of the moveable probe pin 7 and controls out deviations in the direction of the normal vector Ni on the workpiece surface. The second control stage 28 becomes active only when the deflection Ai of the probe pin 7 or the force F acting on the workpiece reaches or exceeds a predetermined amount. The second control stage 28 then controls out deviations in the direction of the probe deflection Ai.
    Type: Grant
    Filed: August 9, 1996
    Date of Patent: April 7, 1998
    Assignee: Carl-Zeiss-Stiftung
    Inventor: Otto Ruck
  • Patent number: 5471406
    Abstract: For rapid measurement of workpieces having elemental shapes of known geometry in any orientation in space, the elemental shapes are scanned on a coordinate measuring machine which is equipped with a measuring probe head having a permissible measurement range (MR). The computer of the measuring machine is programmed with basic data for establishing a predetermined path of probe-scanning contact with the workpiece, the predetermined path being so calculated (1) that the probe ball of the probe will remain in continuous contact with the workpiece surface, (2) that probe-head measurements always occur within the permissible measurement range (MR) of the probe head, and (3) that probe-ball displacements reflect probe-head measurements that are taken as measured corrections of the predetermined path.
    Type: Grant
    Filed: March 23, 1993
    Date of Patent: November 28, 1995
    Assignee: Carl Zeiss-Stiftung
    Inventors: Karl-Hermann Breyer, Berndt Kammleiter, Otto Ruck
  • Patent number: 5461797
    Abstract: A monitoring system having a stylus mounted to a support that controllably moves the stylus along a travel path as it contacts an object of interest. The object is supported by a rotating turntable and held in place by a retainer that exerts a repeatable downward force on the object. A frame that supports the stylus is moved by a number of motors to provide three mutually orthogonal directions of motion to the stylus. Coordinated translations of the stylus and rotations of the object allow the monitoring system to check the shape of the object and compare the measured shape with specifications for the object.
    Type: Grant
    Filed: April 19, 1994
    Date of Patent: October 31, 1995
    Assignee: M&M Precision Systems Corporation
    Inventors: Tony A. Royer, Mark Cowan
  • Patent number: 5448505
    Abstract: A feed-through dimensional measurement system for gathering crossectional measurement data from an elongated part and correlating that data with the longitudinal position on the part from which the data was measured. The system includes a measurement apparatus supported on a part support stand having measuring instruments coupled to a central processing unit for recording and correlating the measurement data. A part drive system drives the part through a transport zone on the support stand while a clamping roller module holds the part against two orthogonal planes established by a set of rollers in the transport zone. Web thickness is measured in relation to a vertical reference plane established by one set of the rollers, and part height and warpage is measured with reference to the orthogonal reference plane.
    Type: Grant
    Filed: November 24, 1993
    Date of Patent: September 5, 1995
    Assignee: Tbe Boeing Company
    Inventor: Ronald E. Novak
  • Patent number: 5418730
    Abstract: A computer interface device for a coordinate measuring machine comprises a trackball that transmits perpendicular movement signals to a computer in response to corresponding perpendicular tangential movement of the trackball. The computer is interconnected with the coordinate measuring machine and normally receives measurement data corresponding to a location of a probe on the computer. The trackball is located adjacent the probe so that a user grasping the probe can manipulate the trackball to transmit data manipulation signals to the computer. Typically, the trackball moves a cursor about the computer screen. A plurality of data entry buttons are included on the interface device and enable the user to execute computer procedures selected by the cursor.
    Type: Grant
    Filed: April 16, 1993
    Date of Patent: May 23, 1995
    Assignee: Brown & Sharp Manufacturing Company
    Inventors: Michael A. Mariani, Kenneth L. Sheehan
  • Patent number: 5283630
    Abstract: A three-dimension measuring apparatus having a probe, such as non-contact optical probe, is used to measure the surface of an object, such as an aspherical lens. Initially, the apparatus is used to obtain reference probe measured values of a reference spherical surface having a concave surface and a convex surface. The thus obtained reference probe measure values are compared with data denoting an ideal spherical surface to determine measurement errors corresponding to inclinations of the surface of an object to be measured. Then, the apparatus is used to measure the object to obtain respective probe measured values. The previously determined measurement errors are subtracted from the measured values of corresponding inclinations, thereby compensating for the measurement errors during measurement of the object surface.
    Type: Grant
    Filed: February 4, 1992
    Date of Patent: February 1, 1994
    Assignee: Matsushita Electric Industrial Co., Ltd.
    Inventor: Keiichi Yoshizumi
  • Patent number: 5053971
    Abstract: A three axis, computer controlled apparatus for edging optical lenses maps the surfaces of a lens blank along a path defining the shape of the lens to be cut from the lens blank and from which mapping a computer controlled cutting algorithm directs the movement of the lens in the R, Z and theta axes direction. The apparatus provides rough cuts, finished cuts and automatic placement of bevels and grooves along the edge of the lens with minimal operator intervention.
    Type: Grant
    Filed: August 30, 1989
    Date of Patent: October 1, 1991
    Assignee: Gerber Optical, Inc.
    Inventors: Kenneth O. Wood, David J. Logan
  • Patent number: 4991304
    Abstract: A succession of nominally identical workpieces is measured using a probe on a coordinate measuring machine. To enable most of the workpieces to be probed at a fast speed (step 40), and compensate for the errors thereby introduced, one workpiece is also probed at a slow speed (step 32). For that workpiece, a series of error values is calculated (step 36) from the differences between the fast and slow measurements. The subsequent fast measurements on succeeding workpieces are corrected by making use of these error values (step 42).
    Type: Grant
    Filed: January 26, 1989
    Date of Patent: February 12, 1991
    Assignee: Renishaw
    Inventor: David R. McMurtry
  • Patent number: 4982504
    Abstract: A method for determining and correcting positional errors or deviations which occur when measuring the position of a point in space, or when positioning to a point which has a specific position in space, where the position refers to a specific coordinate system, such as a rectangular coordinate system. The method comprises making a comparison between a multiple of measured values and at least one reference, and determining a correction on the basis of this comparison, wherewith a positionable member, such as a contact probe, a tool holder or corresponding device (1, 13) is moved to a given position in space during the measuring or positioning process. The method is particularly characterized in that the reference consists of a geometry of known kind, and in that the measured values are correlated to a geometry of known kind, this correlation being used to calculate corrections for the coordinate axes of the system. There is also an apparatus for carrying out the method.
    Type: Grant
    Filed: February 17, 1989
    Date of Patent: January 8, 1991
    Assignee: C.E. Johansson AB
    Inventors: Bo Soderberg, Bo Pettersson, Ulf Hocke, Ambjorn Naeve
  • Patent number: 4945501
    Abstract: Axis correction or machine charateristic data is stored (108) in memory (110) within a control or measurement processor (36) of a CMM (10) (FIG. 8). The axis correction data includes error data representing 21 different geometry errors (FIG. 4A through 4C) of the CMM. As position information is required, the measurement processor captures the actual position signal from each machine axis sensor and uses this position signal to locate (112) a set of the axis correction data which describes the machine characteristics at that position. The measurement processor then mathematically combines (114) (FIG. 9) the position signal with the subset of axis correction data to obtain a corrected position signal having a corrected set of cooridinate values which describe the probe position in a true Cartesian coordinate system.
    Type: Grant
    Filed: April 12, 1989
    Date of Patent: July 31, 1990
    Assignee: The Warner & Swasey Company
    Inventors: Frederick K. Bell, Stephen N. Brown, Michael T. Gale
  • Patent number: 4939678
    Abstract: Methods for determining nonrigid error parameters that result from deflection or deformation of machine elements and correcting scale readings in a coordinate measuring machine. The nonrigid error parameters are a function of probe position along two directions. In a bridge type coordinate measuring machine, the y-direction error parameters are a function of probe position in both x and y directions and thus exhibit nonrigid behavior. Nonrigid error parameters are measured by making error measurements at a plurality of corresponding points along two parallel, spaced-apart measurement lines. The error measurements are substituted into simultaneous equations for the error parameters, and the equations are solved for the coefficients. The coefficients are used to determine the axial errors at any point in the measuring volume. The axial errors are subtracted from the scale readings.
    Type: Grant
    Filed: May 12, 1988
    Date of Patent: July 3, 1990
    Assignee: Brown & Sharpe Manufacturing Company
    Inventor: Walter L. Beckwith, Jr.
  • Patent number: 4914610
    Abstract: When a probe of a displacement measuring apparatus is moved, a core member connected to the probe is also moved through coils of an oscillator. A movement distance of the probe is calculated in accordance with a change in an oscillation frequency generated in correpondence with the movement of the core member. If strict displacement measuring is to be performed, the non-linear relationship between the moving distance of the core member and the change in the oscillation frequency must be taken into account, i.e., the relationship therebetween is measured in linear manner, the movement distance is calculated and then secondary curvature correction is performed to correct for the linear measurement. Therefore, measurement precision of the displacement measuring apparatus can be greatly improved as compared to that of a conventional displacement measuring apparatus.
    Type: Grant
    Filed: July 25, 1988
    Date of Patent: April 3, 1990
    Assignee: Man Design Co., Ltd.
    Inventors: Giichiro Shimizu, Toshiharu Okuyama, Yoshio Wakatsuki
  • Patent number: 4914609
    Abstract: An oscillator outputs an oscillator frequency corresponding to a moving distance of a probe. A counter counts the oscillator frequency of the oscillator. A computer calculates the moving distance. A display unit displays the moving distance computed by the computer. A voltage booster and a voltage stabilizing circuit are connected between the oscillator and a battery. The driving voltage from the battery is supplied to the oscillator through the voltage booster and the voltage stabilizing circuit, and is supplied to the counter, computer and the display unit without passing through the voltage booster and the voltage stabilizing circuit in order to reduce the power dissipation.
    Type: Grant
    Filed: July 25, 1988
    Date of Patent: April 3, 1990
    Assignee: Man Design Co., Ltd.
    Inventors: Giichiro Shimizu, Toshiharu Okuyama, Yoshio Wakatsuki
  • Patent number: 4819195
    Abstract: Method (FIGS. 4A through 4C) and system (FIG. 3) are disclosed for automatically calibrating a coordinate measuring machine (CMM) (10). The system guides an operator through instrument set-up and data collection procedures. The system automatically converts the collected data into error compensation or axis correction data which represents 21 different geometry errors (i.e. pitch, yaw, roll etc.) of the CMM (10). The error compensation data is then transferred to a CMM measurement processor (36) for subsequent use by the CMM (10) during operation thereof to thereby compensate the CMM (10) for its entire measuring volume (102).
    Type: Grant
    Filed: January 20, 1987
    Date of Patent: April 4, 1989
    Assignee: The Warner & Swasey Company
    Inventors: Frederick K. Bell, Gary E. Brazier, Stephen N. Brown
  • Patent number: 4784539
    Abstract: An intelligent Tool System used with Computer Numerical Controlled machining centers consisting of a method of establishing tool presence and type of tooling device and a method of eliminating any error due to thermal growth.The spindle mechanism provides CNC Communicating and Operating means with spindle mounted devices for establishing tool presence and type of tooling for eliminating error due to thermal growth and for determining the function of tooling devices such as telescoping tool holders for determining work surface location with random length tools and for sensing tool condition; automatic boring tools for high precision boring and contouring; probing devices for work surface location, measurement and definition; combination boring and probing tools for boring and measuring a hole without removing the tool from the spindle.
    Type: Grant
    Filed: May 18, 1988
    Date of Patent: November 15, 1988
    Assignee: Manuflex Corporation
    Inventor: Robert A. Lehmkuhl
  • Patent number: 4761891
    Abstract: In an NC-lathe comprising a thread touch sensor provided with a touch portion to be brought into contact with an effective radius/diameter portion of a screw thread, an automatic measuring device electrically connected to the thread touch sensor, and an automatic correction device connected to the automatic measuring device; an effective radius or diameter of a screw thread is measured by bringing the touch portion of the thread touch sensor into contact with an effective radius/diameter portion of the screw thread, the measured dimension is compared with a desired dimension, and when a difference is produced between the respective dimensions, the NC-lathe is controlled by correcting an amount of machining by means of the automatic correction device.
    Type: Grant
    Filed: November 10, 1987
    Date of Patent: August 9, 1988
    Inventor: Nobuyuki Sugimura
  • Patent number: 4720699
    Abstract: Absolute optical encoder device using a line array detector in conjunction with a single strip of encoding bars. The bars are orthogonal to the detector array line and may be long enough to allow motion parallel to the bars without loss of measurement continuity. High resolution is achieved by combining use of a small difference between the detector element spacing and the bar spacing in selected regions to produce a vernier effect, enabling measurement to the precision of a fraction of a detector element. High resolution is further achieved by traverse of a vernier regin edge across a multiplicity of detector elements upon which adjacent vernier regions are optically superimposed, and by identification of each vernier region as a unique member of a numbered series using distinguishable patterns in the space between vernier regions or in the structure of the vernier regions themselves.
    Type: Grant
    Filed: October 28, 1985
    Date of Patent: January 19, 1988
    Inventor: Ronald H. Smith
  • Patent number: 4709482
    Abstract: The present invention is directed to an arbitrary-direction tracer control unit which permits arbitrary setting of the tracer feed direction, and is intended to allow ease in changing the tracer feed direction even during tracing.A memory (M) has stored therein data indicating the tracer feed direction, that is, the angle between the tracer feed axis and the X-axis. A correction angle setting device (COM) sets a correction angle with respect to the tracer feed axis. An adder (ADD) adds together the angle stored in the memory (M) and the correction angle set on the correction angle setting device (COM), and provides the added output to a tracing operation device (PRO). The tracing operation device (PRO) operates, on the basis of the results of addition by the adder (ADD) and a displacement signal from a tracer head (TH), a velocity in each axis direction at which a model and the tracer head (TH) are moved relative to each other in a direction corresponding to the results of addition by the adder (ADD).
    Type: Grant
    Filed: March 21, 1986
    Date of Patent: December 1, 1987
    Assignee: Fanuc Ltd.
    Inventors: Hitoshi Matsuura, Hiroshi Sakurai
  • Patent number: 4631834
    Abstract: A coordinate measuring instrument including: a table (50) movable in the direction of Y-axis on a bedplate (10); a slider (110) movable in the direction of X-axis through supports (90) and a beam member (100); a Z-axis structure (180) supported by this slider (110) in a manner to be movable in the direction of Z-axis; a probe stocker (290) fixed to the table (50) and capable of resting thereon a plurality of probe holders (250) each having a signal producing probe (280); and a probe mounting-removing mechanism (200) provided in the Z-axis structure (180), the probe mounting-removing mechanism (200) being capable of selectively installing a signal producing probe (250) most suitable for the shape of a work (320) to be measured.
    Type: Grant
    Filed: August 29, 1985
    Date of Patent: December 30, 1986
    Assignee: Mitutuoyo Mfg. Co., Ltd.
    Inventors: Koji Hayashi, Susumu Yoshioka, Noritsugu Ono
  • Patent number: 4629378
    Abstract: An integrated factory system affords precision machining and inspection of aircraft turbine blades, as well as other metal parts having two generally opposite principal surfaces. It uses only two stages of chucking by the meltable matrix method. After embedding one of the surfaces in the first chuck, which positions the blank relative to a plane of reference, the other surface is machined and inspected according to programs relative to that plane. Without release from the first chuck, the part is transferred to a second chuck for embedding the machined principal surface relative to a second parallel plane of reference a precise distance from that of the first chuck. Machining and inspection is now completed relative to this second plane of reference. Improved matrix chucks are provided, as well as new chucking apparatus which establishes the planes of reference.
    Type: Grant
    Filed: August 27, 1984
    Date of Patent: December 16, 1986
    Inventor: John T. Parsons
  • Patent number: 4523450
    Abstract: This invention contemplates a rapid method of calibrating probe-pin combinations, such as star probes or rotary-swing probes, which method is applicable when the probe system forms part of or is coupled to the control system of a measuring machine wherein a self-centering probe of workpieces is possible. The calibration procedure employs a calibration standard having a plurality of probe-centering elements distributed over its surface and facing in different directions, the positional geometry of these elements being stored in the computer of the measuring machine. Each of the individual probe balls is successively introduced into a centering element which is accessible. Thereupon, the position of each ball-center point is determined in the computer, from the stored positional data and the pre-established diameter of corresponding probe balls.
    Type: Grant
    Filed: September 20, 1982
    Date of Patent: June 18, 1985
    Assignee: Carl-Zeiss-Stiftung, Heidenheim/Brenz
    Inventor: Klaus Herzog
  • Patent number: RE33774
    Abstract: Multi-coordinate measuring and testing machine which is essentially constituted from a fundamental machine unit, a scanning or sensing system which is movable in at least two coordinate directions, and a machine-controlling unit. The scanning or sensing system is constructed as a multi-sensor system and is constituted from a mechanical sensing head or probe with at least one stylus and/or a video scanner and/or a laser scanner which are controlled from a microprocessor and operate independently of each other, and which are selectively either individually actuatable by means of software connected thereto, or can be coupled to each other in a dual or triple combination.
    Type: Grant
    Filed: July 19, 1990
    Date of Patent: December 24, 1991
    Assignee: Wegu-Messtechnik GmbH
    Inventor: Werner H. Gurny