Having A Movable Contact Probe Patents (Class 33/556)
  • Patent number: 8336220
    Abstract: In one embodiment, a coordinate measurement apparatus includes an articulated arm having a first end and a second end with at least a first arm segment and a second arm segment therebetween. Further, the apparatus can comprise at least one ball and socket joint connecting the first arm segment to the second arm segment, with the ball and socket joint including a ball member and a socket member, and a measurement probe attached to the first end of said articulated arm.
    Type: Grant
    Filed: August 23, 2011
    Date of Patent: December 25, 2012
    Assignee: Hexagon Metrology AB
    Inventors: Homer L Eaton, Paul A Ferrari
  • Patent number: 8336224
    Abstract: Measuring device for in-process measurement of test specimens during a machining process on a machine tool, in particular a grinding machine, has a measuring head connected pivotably about a first pivot axis to a base body of the measuring device via a linkage, for providing an apparatus for pivoting measuring head in and out of a measuring position. Linkage has a first linkage element and a second linkage element arranged pivotably about first pivot axis. A third linkage element is connected pivotably about a second pivot axis to the end of second linkage element facing away from first pivot axis. A fourth linkage element is connected pivotably about a third pivot axis to the end of third linkage element facing away from second pivot axis, fourth linkage element being connected pivotably about a fourth pivot axis to first linkage element at a distance from third pivot axis.
    Type: Grant
    Filed: September 20, 2010
    Date of Patent: December 25, 2012
    Assignee: Hommel-Etamic GmbH
    Inventor: Yan Arnold
  • Patent number: 8316553
    Abstract: A coordinate measuring machine has a coordinate measuring machine body and a controller. The coordinate measuring machine body has a probe having a measurement piece and a drive mechanism for driving the probe. The probe has a drive unit for driving the measurement piece. The controller includes a first measuring unit and a second measuring unit. The first measuring unit measures a displacement of the measurement piece driven by the drive unit. The second measuring unit measures a displacement of the probe. The measurement accuracy of the second measuring unit is lower than the measurement accuracy of the first measuring unit.
    Type: Grant
    Filed: April 22, 2010
    Date of Patent: November 27, 2012
    Assignee: Mitutoyo Corporation
    Inventors: Sadayuki Matsumiya, Hidemitsu Asano
  • Patent number: 8302322
    Abstract: A detector includes a stylus, a holding portion that holds a proximal end portion of the stylus, a body portion that supports the holding portion rotatably about a rotational axis, and a sensor that detects a rotational displacement of the holding portion. The holding portion includes an abutting member, on which the proximal end portion of the stylus abuts, and a plate spring that biases the proximal end portion of the stylus against the abutting member. The abutting member includes a groove portion on which the proximal end portion of the stylus abuts, and a semispherical portion that extends toward the plate spring, compared with a bottom of the groove portion. The stylus includes a proximal end inclined portion at the proximal end portion of the stylus. The proximal end inclined portion is inclined toward the plate spring, with a decreasing distance from the rotational axis.
    Type: Grant
    Filed: September 10, 2010
    Date of Patent: November 6, 2012
    Assignee: Mitutoyo Corporation
    Inventors: Junsuke Yasuno, Hideki Sindo
  • Patent number: 8296923
    Abstract: A reconfigurable system having at least one detachable component and at least one detachable head assembly. The reconfigurable system may be a numerically controlled (NC) machine for manufacturing processes, such as milling or automatic fiber placement (AFP). The reconfigurable system may further comprise a gantry structure comprised of movably attached beams on which detachable components may be movably attached. The detachable components may include a concave component and a convex component. At least one detachable head assembly may be movably attached to at least one of the detachable components. The detachable components and head assemblies may be at least one of physically, electrically, and pneumatically connected to a connecting assembly attached to the gantry structure.
    Type: Grant
    Filed: November 29, 2007
    Date of Patent: October 30, 2012
    Assignee: Spirit AeroSystems, Inc.
    Inventors: Robert Ray Wampler, Muhammad Zia Ullah
  • Patent number: 8290695
    Abstract: Probe data is analyzed to derive Longitudinal Speed Profiles (LSPs) and an Optimal Longitudinal Speed Profile (18) for each road segment or link in a digital map network. The Longitudinal Speed Profiles (LSPs) profiles are calculated during defined time spans whereas the Optimal Longitudinal Speed Profile (18) is based on the LSP for the time span corresponding only to free flow traffic conditions. All of the LSPs can used to create a respective energy cost for each time span, or only the OLSP (18) can be used (or alternatively the RRDSL 16 or LRRDSL 17) to calculate an energy cost for the free flow conditions only. The energy cost can be used to predict the energy required by a vehicle to traverse the link. Navigation software can use the energy cost to plan the most energy efficient route between two locations in the digital map. Sensory signals can be activated if a driver strays from the Optimal Longitudinal Speed Profile (18) to achieve extremely high levels of energy efficiency.
    Type: Grant
    Filed: January 13, 2010
    Date of Patent: October 16, 2012
    Inventors: Volker Hiestermann, Robert Joannes Van Essen, Edwin Bastiaensen, Stephen T'Siobbel
  • Patent number: 8261461
    Abstract: A linear guiding mechanism includes a fixed member, a moving member, a first double parallel leaf spring mechanism and a second double parallel leaf spring mechanism arranged between the fixed member and the moving member and configured to movably support the moving member. The first double parallel leaf spring mechanism and the second double parallel leaf spring mechanism are arranged at an angle other than 180° (for example, 90°) about an axis of movement of the moving member.
    Type: Grant
    Filed: January 14, 2010
    Date of Patent: September 11, 2012
    Assignee: Mitutoyo Corporation
    Inventors: Atsushi Shimaoka, Takeshi Yamamoto
  • Patent number: 8256129
    Abstract: A plurality of types of body cases, a movement unit housed inside each of the body cases, and a dial unit are provided. The movement unit is configured to include a gauge head swingably supported by a movement frame; a crown gear rotatably supported by the movement frame; and a magnifying transmission mechanism magnifying and transmitting a swing amount of the gauge head to a rotation amount of the crown gear. The dial unit is configured to include an indicating needle rotatably provided in a dial frame; a scale plate provided along a rotation area of the indicating needle; and a pinion transmitting rotation of the crown gear to the indicating needle.
    Type: Grant
    Filed: April 14, 2011
    Date of Patent: September 4, 2012
    Assignee: Mitutoyo Corporation
    Inventor: Kouichi Adachi
  • Patent number: 8225519
    Abstract: A contact type measurement device performs measurement with displacement of a probe, while a contact member attached to the probe is in contact with an object to be measured. Data on the relationship of a contact force of the probe to the object to be measured with an angle between the central axis of the probe and the direction of gravity, the amount of displacement of the probe, and a fluid pressure for applying a pushing-out or pulling-in force to the probe is stored in advance and, on the basis of this data, the fluid pressure or the amount of displacement of the probe is controlled to automatically and precisely adjust a fine contact force of the probe to the object to be measured.
    Type: Grant
    Filed: February 24, 2011
    Date of Patent: July 24, 2012
    Assignee: Fanuc Corporation
    Inventors: Yonpyo Hon, Kenzo Ebihara, Masayuki Hamura
  • Patent number: 8214080
    Abstract: A method to compensate geometrical errors in processing machines, in which a workpiece holder (8) is arranged such that it can be adjusted on the basis of measurement signals that have been received by being able to be rotated relative to a fixture (9) in the processing machine to which the workpiece holder is attached. A method for the alignment of a workpiece in processing machines, and an arrangement for the realization of the method are disclosed. The arrangement includes a workpiece holder (8), the angle of which relative to a fixture (9) in the processing machine to which the workpiece holder (8) is connected can be adjusted.
    Type: Grant
    Filed: November 16, 2007
    Date of Patent: July 3, 2012
    Assignee: Hexagon Metrology AB
    Inventor: Bo Petterson
  • Patent number: 8196306
    Abstract: A method and device for analyzing a formed weld of a wind turbine system is disclosed. The device includes a gage for measuring a distance, a first member configured for receiving the gage, a second member attached to the first member, the second member being configured to releasably attach to a first surface on a first side of the formed weld, a third member attached to the first member, the third member being configured to releasably attach to a second surface on a second side of the formed weld, and the gage being positionable at a plurality of locations on the first member, the plurality of locations including a first location being proximal to the second member and distal from the third member and a second location being proximal to the third member and distal from the second member.
    Type: Grant
    Filed: July 9, 2009
    Date of Patent: June 12, 2012
    Assignee: General Electric Company
    Inventor: Kurt Sieber
  • Patent number: 8191408
    Abstract: A surface texture measuring instrument includes a contact piece to be in contact with an object, a sensor driving mechanism that moves the contact piece along the surface of the object, a controller that controls the sensor mechanism, and a force sensor that detects a measuring force exerted on the contact piece when the contact piece is brought into contact with the object. The controller includes a target value output that outputs a target value of the measuring force, a feedback controller that performs feedback control of the sensor driving mechanism based on a deviation between the measuring force and the target value, and a feedback compensator provided on the feedback controller. The feedback compensator performs feedback compensation in accordance with the measuring force.
    Type: Grant
    Filed: June 30, 2009
    Date of Patent: June 5, 2012
    Assignee: Mitutoyo Corporation
    Inventors: Shiro Igasaki, Masaoki Yamagata
  • Patent number: 8179132
    Abstract: A method for integrating a measurement device for use in measuring a machine component includes providing a coordinate measuring machine (CMM) and combining eddy current (EC) capabilities and CMM capabilities to form an inspection probe. The method further includes installing the inspection probe on the CMM so that the inspection probe measures external boundaries of the machine component with the CMM capabilities and substantially simultaneously measures at least one of internal boundaries, internal defects, surface defects, and material properties of the machine component with the EC capabilities, which are directly linked to actual component dimensional information provided by CMM. The inspection data can be simultaneously linked to and/or displayed with a CAD model to enable a direct comparison between the inspection data and the nominal requirements specified on the CAD model.
    Type: Grant
    Filed: February 18, 2009
    Date of Patent: May 15, 2012
    Assignee: General Electric Company
    Inventors: Yanyan Wu, Thomas James Batzinger, Nicholas Joseph Kray, Changting Wang, Haiyan Sun, Francis Howard Little, David Paul Lappas, David Michael Dombrowski
  • Patent number: 8151480
    Abstract: A contour measuring device includes a guide rail, a slidable assembly, and a measuring probe. The slidable assembly is slidably engaged with the guide rail. The slidable assembly includes a weight adjusting unit connected to the slidable assembly. At least part of the weight adjusting unit is detachable from the slidable assembly. The measuring probe is fixed on the slidable assembly. A weight of the slidable assembly provides a measuring force and a weight of the weight adjusting unit is adjustable to adjust a value of the measuring force.
    Type: Grant
    Filed: December 23, 2009
    Date of Patent: April 10, 2012
    Assignees: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd., Hon Hai Precision Industry Co., Ltd.
    Inventors: Fa-Ping Xia, Wei Huang
  • Patent number: 8145446
    Abstract: A portable coordinate measurement machine for measuring the position of an object in a selected volume includes a positionable articulated arm having a plurality of jointed arm segments. The arm includes a measurement probe having an integrated line laser scanner mounted thereon. The laser may be a fiber coupled laser. Wireless data transfer and communication capability for the CMM is also possible.
    Type: Grant
    Filed: January 31, 2011
    Date of Patent: March 27, 2012
    Assignee: Faro Technologies, Inc.
    Inventors: Paul Christopher Atwell, Jacint R. Barba, Frederick York
  • Patent number: 8140178
    Abstract: In a simultaneous multi-axis measuring machine tool system including linear drive axes and rotation axes to measure a surface shape of an object to be measured by using an on-board measuring device having a probe mounted, at one end thereof, with a spherical contactor, a numerical controller controls driving of the linear drive axes and the rotation axes so that a central axis of the probe is always oriented in a direction perpendicular to the surface of the object to be measured and that the spherical contactor of the probe comes in contact with and follows a surface of the object to be measured.
    Type: Grant
    Filed: June 4, 2009
    Date of Patent: March 20, 2012
    Assignee: Fanuc Ltd
    Inventors: Yonpyo Hon, Kenzo Ebihara, Akira Yamamoto, Masayuki Hamura
  • Publication number: 20120043303
    Abstract: The present invention includes steps of, determining a search starting position; setting a center position, and a first position and a second position with a distance provided therebetween; obtaining a measurement point group including measurement points of the center position, the first position, and the second position; and determining a measurement point closest to the tip portion in the measurement point group based on positions of the measurement points in a second direction and selecting a position of the measurement point in a first direction as a selected position. When the measurement point group is obtained initially after the determination of the search starting position, the search starting position is set as the center position; and when the measurement point group is obtained after the selection of the selected position, the selected position is set as the center position. The distance is narrowed for every selection of the selected position.
    Type: Application
    Filed: April 28, 2009
    Publication date: February 23, 2012
    Applicant: MITSUBISHI ELECTRIC CORPORATION
    Inventors: Toshiaki Kurokawa, Hidetaka Katougi
  • Patent number: 8107554
    Abstract: A system and a method for the transmission of signals representative of an event include a first low frequency clock and a low frequency counter for generating a first delay, and a second high frequency clock and a high frequency counter for generating a second delay. The system further includes a transmitter for transmitting the representative signals after a delay from the event made up by the sum of the first and the second delay. The second delay can be generated also by an analog device including for example a capacitor, and devices for charging the capacitor up to the reaching of a preset voltage at its ends. A wireless transmission system according to the invention is utilized in a checking system with a contact detecting probe, for transmitting a signal representative of contact with the piece to be checked.
    Type: Grant
    Filed: January 16, 2007
    Date of Patent: January 31, 2012
    Assignee: Marposs Societa' per Azioni
    Inventors: Andrea Ferrari, Roberto Padovani
  • Publication number: 20120017455
    Abstract: A shape measuring device to measure a shape of a workpiece, wherein the shape measuring device includes: the probe; a probe support shaft to pivotally support the probe; and a probe drive device to which the probe support shaft is attached to contact the probe with a measuring position of the workpiece and to move relatively the workpiece and the probe; wherein the probe is a sphere pivotally supported by the probe support shaft and has a cut face which is a shape cut so as to be nearly vertical to the probe support shaft and a shape measurement of a workpiece surface is carried out in such a manner that the cut face of the probe is faced with a face intersecting a face containing the measuring position of the workpiece surface, and a surface of the sphere is contacted with the measuring position of the workpiece.
    Type: Application
    Filed: February 15, 2010
    Publication date: January 26, 2012
    Applicant: KONICA MINOLTA OPTO, INC.
    Inventor: Akihiro Fujimoto
  • Publication number: 20110314686
    Abstract: A profile measurement apparatus includes: a probe which includes a gauge head for measuring a profile of an object to be measured and which moves the gauge head within a given range; a movement mechanism which moves the probe; and a controller which measures the profile by controlling the movement mechanism to contact the gauge head against the object. The controller comprises: a movement amount acquisition section which acquires a movement amount of the gauge head from a reference position; a deviation acquisition section which acquires as a deviation the movement amount when the gauge head is in a non-contact state; a determination section which determines whether the deviation is greater than a first threshold value; and a resetting section which, when the deviation is greater than the first threshold value, resets the reference position to a position arrived at by combining the reference position and the deviation.
    Type: Application
    Filed: June 24, 2011
    Publication date: December 29, 2011
    Applicant: MITUTOYO CORPORATION
    Inventor: Takashi Noda
  • Publication number: 20110271538
    Abstract: A plurality of types of body cases, a movement unit housed inside each of the body cases, and a dial unit are provided. The movement unit is configured to include a gauge head swingably supported by a movement frame; a crown gear rotatably supported by the movement frame; and a magnifying transmission mechanism magnifying and transmitting a swing amount of the gauge head to a rotation amount of the crown gear. The dial unit is configured to include an indicating needle rotatably provided in a dial frame; a scale plate provided along a rotation area of the indicating needle; and a pinion transmitting rotation of the crown gear to the indicating needle.
    Type: Application
    Filed: April 14, 2011
    Publication date: November 10, 2011
    Applicant: MITUTOYO CORPORATION
    Inventor: Kouichi ADACHI
  • Patent number: 8051576
    Abstract: An attitude arm mounted to a support arm is rotatable about a pivot. The attitude arm holds a stylus gauge, which generates a signal representing deflection of the stylus in a measurement direction as the stylus follows a surface of a workpiece rotated on a turntable. An attitude switching mechanism allows switching between a first stylus attitude generally aligned with the turntable spindle axis and a second stylus attitude generally aligned perpendicular to the turntable spindle axis. To enable alignment of the measurement direction with the spindle axis, first and second adjusters enable the stylus tip to be moved perpendicular to the spindle axis and the measurement direction when in the first and second stylus attitudes, respectively. An orientation mechanism is provided to rotate the measurement direction of the stylus. A stylus tilt mechanism is provided to tilt the stylus about a tilt axis parallel with the measurement direction.
    Type: Grant
    Filed: May 1, 2007
    Date of Patent: November 8, 2011
    Assignee: Taylor Hobson Limited
    Inventors: Ivor McDonnell, Jeremy Ayres
  • Patent number: 8042279
    Abstract: A coordinate measuring machine (1) comprising a base (2) provided with guides (3) parallel to a first axis X, a first mobile carriage (4) on the guides (3) along the axis X and provided with an upright (17), a second carriage (6) carried by the upright (17) and mobile along a second vertical axis Z, and a horizontal arm (7) carried by the second carriage (6) and axially mobile along a third horizontal axis Y perpendicular to the axis X; the first carriage (4) comprises a base (16) provided with a first portion (19, 20) coupled to the guides (3) and a second portion (18) rigidly connected to the upright (17), releasable connection means (27) for reciprocally connecting the first portion (19, 20) and the second portion (18) of the base (16), and articulated connection means (28) between the first portion (19, 20) and the second portion (18) of the base to allow the upright (17) to be tipped when the releasable connection means (27) are released.
    Type: Grant
    Filed: April 6, 2006
    Date of Patent: October 25, 2011
    Assignee: Hexagon Metrology S.p.A.
    Inventor: Enrico Garau
  • Publication number: 20110247228
    Abstract: An apparatus for measuring objects, in particular to a coordinate measuring unit, is provided. The unit has a probe which is movable relative to an object to be measured by means of an actuator to sample the surface of the object in a contacting manner, wherein a sampling body, whose front end is designed as a measuring tip for a contact with the object is supported at the probe. The relative position of the measuring tip with respect to the probe is determined. The sampling body is supported at the probe with movement play along at least one direction. A change in the inclination of the sampling body relative to the probe, or vice versa, can be detected via a measurement of a test parameter.
    Type: Application
    Filed: April 6, 2011
    Publication date: October 13, 2011
    Applicant: STOTZ FEINMESSTECHNIK GMBH
    Inventor: Milan Stamenkovic
  • Publication number: 20110242524
    Abstract: An object is to provide a flat surface inspection apparatus that can prevent sliders from being damaged and detect micro defects. A flat surface inspection apparatus includes: a measured subject; a stage that supports the measured subject; a spindle that rotates the stage; a first part having light sources applying light beam onto the measured subject, a scattered-light-detecting section, a signal processing section that converts the scattered light into information about a first defect, and a first memory section that stores therein the information about the first defect; and a second part having sliders mounted with a contact sensor that detects a second defect smaller than the first defect, a loading/unloading mechanism that flies the slider over the measured subject, a slider control section that controls the loading/unloading mechanism based on the information about the first defects and second defects.
    Type: Application
    Filed: January 14, 2011
    Publication date: October 6, 2011
    Inventors: YUKI SHIMIZU, Junguo Xu, Shigeo Nakamura, Toshiyuki Nakao, Toshihiko Nakata, Toshifumi Honda
  • Patent number: 8028430
    Abstract: A height measurement apparatus for measuring a height of a workpiece is provided. The height measurement apparatus includes a support member, a level bar and a height gauge. The level bar is installed on the support member and movable along a horizontal direction. The height gauge is installed on the level bar and vertically movable along a vertical direction relative to the level bar. The height gauge comprises a probe for contacting the workpiece, thereby detecting the position of the workpiece.
    Type: Grant
    Filed: May 13, 2009
    Date of Patent: October 4, 2011
    Assignee: Hon Hai Precision Industry Co., Ltd.
    Inventor: Hou-Yao Lin
  • Publication number: 20110232117
    Abstract: A measuring device includes a base body, and a measuring head which is movable between a rest position and a measuring position. The measuring device also includes an apparatus for moving the measuring head from the rest position into the measuring position, and a stop for limiting the motion of the measuring head from the rest position into the measuring position. A motorized drive unit for adjusting the position of the stop is operatively associated with the stop in such a way that the measuring position is adjustable, and a control unit is provided for activating the drive unit.
    Type: Application
    Filed: March 28, 2011
    Publication date: September 29, 2011
    Applicant: HOMMEL-ETAMIC GmbH
    Inventor: Yan ARNOLD
  • Patent number: 8020308
    Abstract: An inspection system comprises a sensor configured to acquire inspection data of the object, a motion control device, a joint assembly coupled to the motion control device, and a probe housing coupled to the joint assembly and configured to hold the sensor. The inspection system further comprises a compliant element coupled to the probe housing and configured to cooperate with the joint assembly and the motion control device to position the sensor relative to the object. A self-aligning probe assembly is also presented.
    Type: Grant
    Filed: May 29, 2009
    Date of Patent: September 20, 2011
    Assignee: General Electric Company
    Inventors: Byungwoo Lee, Yanyan Wu, Nicholas Joseph Kray
  • Patent number: 8015721
    Abstract: In one embodiment, a coordinate measurement apparatus includes an articulated arm having a first end and a second end with at least a first arm segment and a second arm segment therebetween. Further, the apparatus can comprise at least one ball and socket joint connecting the first arm segment to the second arm segment, with the ball and socket joint including a ball member and a socket member, and a measurement probe attached to the first end of said articulated arm.
    Type: Grant
    Filed: June 24, 2010
    Date of Patent: September 13, 2011
    Assignee: Hexagon Metrology AB
    Inventors: Homer L Eaton, Paul A Ferrari
  • Patent number: 8006402
    Abstract: A moving vector calculation unit calculates a moving vector M representing a quantity and a direction of movement of a probe on basis of a stylus displacement vector, a stylus displacement vector D, and a direction change angle ? of the stylus displacement vector D that is caused by a frictional force between a stylus 32 and the measuring surface 5a during scanning of the measuring surface 5a by the stylus 32. The stylus displacement vector D is a vector including a quantity and a direction of position displacement of the stylus 32 relative to the probe 5. Movement of an XY-stage 7 is controlled so that the probe 6 moves in accordance with the moving vector M.
    Type: Grant
    Filed: June 2, 2009
    Date of Patent: August 30, 2011
    Assignee: Panasonic Corporation
    Inventors: Keiichi Yoshizumi, Masateru Doi, Takayuki Kurata
  • Patent number: 8006403
    Abstract: An edge detect system, using a torch height control system based on the use of a free floating probe in contact with the workpiece, uses a drop in pressurized air supplied to the probe tip in contact with the workpiece when the probe moves off the plate edge to generate a signal that prevents the torch from following the free floating probe downwardly and thereby prevents the cutting tool from crashing into the workpiece.
    Type: Grant
    Filed: August 21, 2009
    Date of Patent: August 30, 2011
    Assignee: Messer Cutting Systems Inc.
    Inventor: Alan E. Anderson
  • Patent number: 8001697
    Abstract: A portable articulated arm coordinate measurement device is provided. The coordinate measurement device includes a base and an articulated arm portion having at least one arm segment. A biasing member is coupled on a first end to the base and on a second end to the articulated arm portion. The first end of the biasing member is movable between a first position and a second position. An adjuster is coupled between the base and the biasing member. The adjuster is coupled to move the first end of the biasing member from the first position to the second position.
    Type: Grant
    Filed: January 14, 2011
    Date of Patent: August 23, 2011
    Assignee: Faro Technologies, Inc.
    Inventors: David M. Danielson, Marc M. Barber, Clark H. Briggs
  • Patent number: 7983790
    Abstract: A method for modifying a component may comprise measuring the component using a modifying tool, and recording position data for the component based on the measuring. A path for the modifying tool may be provided using the position data, and the component may be modified by moving the same modifying tool based on the provided path.
    Type: Grant
    Filed: December 19, 2008
    Date of Patent: July 19, 2011
    Assignee: The Boeing Company
    Inventors: Phillip John Crothers, Robert Coulter Fraser
  • Patent number: 7963047
    Abstract: A braking device of a measuring instrument includes a body case and a spindle that penetrates the body case to be axially and reciprocably displaceable. The braking device includes a cylinder of which a first end is attached to the body case for accommodating a second end of the spindle, a piston provided on the second end of the spindle and accommodated to be reciprocably displaceable within the cylinder, a closing member provided on a second end of the cylinder to form a damper chamber between the closing member and the piston; a shaft connected to a side of the piston opposite to the spindle and penetrates the closing member; and a knob provided on a distal end of the shaft. A clearance is provided between the closing member and the shaft to circulate air.
    Type: Grant
    Filed: June 9, 2009
    Date of Patent: June 21, 2011
    Assignee: Mitutoyo Corporation
    Inventors: Makoto Furuta, Kouichi Adachi
  • Patent number: 7950164
    Abstract: A roundness measuring apparatus includes: a stylus having a contact part; a holding member that holds the stylus while allowing displacement of the contact part; an elastic member that presses the contact part against a measurement target object; a detector holder that supports the holding member rotatably; a motor; an elastic force adjustment member that is rotatable and concentric with the holding member; a joining section that joins the elastic force adjustment member with the holding member to maintain relative rotational positions; and a restricting section that restricts rotation of the elastic force adjustment member at a predetermined rotational position. The displacement direction of the contact part is adjusted in a first rotation range. The rotational position of the holding member relative to the rotational position of the elastic force adjustment member changes with the rotation of the elastic force adjustment member being restricted in a second rotation range.
    Type: Grant
    Filed: July 7, 2010
    Date of Patent: May 31, 2011
    Assignee: Mitutoyo Corporation
    Inventors: Tatsuki Nakayama, Hideki Shindo
  • Publication number: 20110119943
    Abstract: Measuring device for in-process measurement of test specimens during a machining process on a machine tool, in particular a grinding machine, has a measuring head connected pivotably about a first pivot axis to a base body of the measuring device via a linkage, for providing an apparatus for pivoting measuring head in and out of a measuring position. Linkage has a first linkage element and a second linkage element arranged pivotably about first pivot axis. A third linkage element is connected pivotably about a second pivot axis to the end of second linkage element facing away from first pivot axis. A fourth linkage element is connected pivotably about a third pivot axis to the end of third linkage element facing away from second pivot axis, fourth linkage element being connected pivotably about a fourth pivot axis to first linkage element at a distance from third pivot axis.
    Type: Application
    Filed: September 20, 2010
    Publication date: May 26, 2011
    Inventor: Yan Arnold
  • Patent number: 7934323
    Abstract: The invention relates to a method and a device for the positioning of a displaceable component in an examining system, particularly a measuring or an analytic system wherein, during the process, the displaceable component is displaced with the support of an actuating element coupled to the displaceable component from a home position into an end position, wherein the actuating element is moved by means of a drive force and the displaceable component is impacted with a fixation force fixating the displaceable component in the end position by way of a fixation component connected to the displaceable component, where the fixation component is submerged at least partially in a reservoir of a medium and is fixated in the medium by means of the transformation of the medium from a liquid state into a solidified state, wherein the medium is transformed from the liquid state into the solidified state by means of the impact-application with a manipulating variable.
    Type: Grant
    Filed: September 29, 2006
    Date of Patent: May 3, 2011
    Assignee: JPK Instruments AG
    Inventors: Detlef Knebel, Torsten Jähnke
  • Publication number: 20110083335
    Abstract: A detector includes a stylus, a holding portion that holds a proximal end portion of the stylus, a body portion that supports the holding portion rotatably about a rotational axis, and a sensor that detects a rotational displacement of the holding portion. The holding portion includes an abutting member, on which the proximal end portion of the stylus abuts, and a plate spring that biases the proximal end portion of the stylus against the abutting member. The abutting member includes a groove portion on which the proximal end portion of the stylus abuts, and a semispherical portion that extends toward the plate spring, compared with a bottom of the groove portion. The stylus includes a proximal end inclined portion at the proximal end portion of the stylus. The proximal end inclined portion is inclined toward the plate spring, with a decreasing distance from the rotational axis.
    Type: Application
    Filed: September 10, 2010
    Publication date: April 14, 2011
    Applicant: MITUTOYO CORPORATION
    Inventors: Junsuke YASUNO, Hideki SINDO
  • Patent number: 7921575
    Abstract: A method is provided for assembling a measurement device for use in measuring a machine component. The method includes providing a coordinate measuring machine (CMM). The method also includes combining ultrasonic inspection (UT) capabilities and CMM capabilities to form an inspection probe. The inspection probe is installed on the CMM so that the inspection probe measures external boundaries of the machine component with the CMM capabilities and substantially simultaneously measures internal boundaries of the machine component with the UT capabilities.
    Type: Grant
    Filed: December 27, 2007
    Date of Patent: April 12, 2011
    Assignee: General Electric Company
    Inventors: Francis Howard Little, Yanyan Wu, Jian Li, Nicholas J. Kray
  • Patent number: 7918033
    Abstract: A coordinate measuring machine has a probe head, a calibrating body and an apparatus for recording and correcting measured values obtained by the probe head. A mechanical flexibility at predetermined points on the surface of the calibrating body is determined. The mechanical flexibility is stored in the apparatus in the form of a data record. The calibrating body is scanned point by point by means of the probe head in order to obtain the measured values. Thereafter, the probe head is calibrated by correcting the measured values using the data record. A similar approach can also be used on workpieces having a known mechanical flexibility.
    Type: Grant
    Filed: April 16, 2010
    Date of Patent: April 5, 2011
    Assignee: Carl Zeiss Industrielle Messtechnik GmbH
    Inventor: Tobias Held
  • Patent number: 7908759
    Abstract: A method for measuring a surface profile using a surface sensing device mounted on an articulating probe head in which the probe head is moved along a nominal path relative to the surface profile, an at least approximation of the surface normal of the surface profile, the surface profile is sensed with the surface sensing device and the distance or force of the surface sensing device relative to the surface profile substantially in the direction of the surface normal. The surface normal may be determined by approximating at least one section to a curved profile which can be mathematically parameterised.
    Type: Grant
    Filed: April 19, 2006
    Date of Patent: March 22, 2011
    Assignee: Renishaw PLC
    Inventors: Ian William McLean, Nicholas John Weston, Martin Simon Rees, Leo Christopher Somerville
  • Patent number: 7900367
    Abstract: A method of calibrating a measurement probe (10) mounted on a machine is described. The measurement probe (10) has a stylus (14) with a workpiece contacting tip (16). The method comprises determining a probe calibration matrix that relates the probe outputs (a,b,c) to the machine coordinate system (x,y,z.). The method comprising the steps of scanning a calibration artefact (18) using a first probe deflection (d1) to obtain first machine data and using a second probe deflection (d2) to obtain second machine data. The first and second machine data are used to obtain a pure probe calibration matrix in which any machine errors are substantially omitted. Advantageously, the method determines the pure probe matrix numerically based on the assumption that the difference between the first and second machine position data is known.
    Type: Grant
    Filed: April 24, 2007
    Date of Patent: March 8, 2011
    Assignee: Renishaw PLC
    Inventor: Alexander Tennant Sutherland
  • Patent number: 7895761
    Abstract: A measurement method and a measuring device for use in measurement systems such as co-ordinate measurement machines and similar, where a position sensor is arranged to register its position in order to determine the form and dimensions of an object. The position sensor is supported by a support, the position and orientation of which are determined through calculation with the aid of data from at least one of accelerometers, GPS receivers and gyroscopes, and based on a known starting position.
    Type: Grant
    Filed: August 3, 2006
    Date of Patent: March 1, 2011
    Assignee: Hexagon Metrology AB
    Inventor: Bo Pettersson
  • Patent number: 7886453
    Abstract: A method is described for measuring a workpiece on a machine tool using an analogue probe having a deflectable stylus. The method comprises the step of taking a workpiece having a nominal surface profile, the workpiece being located within the working area of the machine tool. The machine tool is used to move the analogue probe along a predetermined (known) measurement path relative to the workpiece whilst deflection of the stylus is measured. The analogue probe is moved relative to the workpiece at a speed greater than five millimeters per second and the predetermined measurement path is selected to provide intermittent contact between the stylus and the workpiece.
    Type: Grant
    Filed: December 11, 2007
    Date of Patent: February 15, 2011
    Assignee: Renishaw PLC
    Inventors: John Charles Ould, Kevin James Tett
  • Patent number: 7882644
    Abstract: An alignment mechanism includes: an adjusting plate having first and second adjustment ends parallel to an X axis direction; a probe fixing portion provided to the adjusting plate; a probe fixed to the probe fixing portion; a reinforcing plate having first and second base ends parallel to the X axis direction, displacement of the reinforcing portion in a Y axis direction being restricted; Y-direction adjusting screws for pressing the adjusting plate in the Y axis direction; and adjustment connectors for respectively connecting the first adjustment end with the first base end and the second adjustment end with the second base end. A stylus of the probe is disposed on a line of intersection of a first inclined surface including the first adjustment end and the first base end and a second inclined surface including the second adjustment end and the second base end.
    Type: Grant
    Filed: May 26, 2010
    Date of Patent: February 8, 2011
    Assignee: Mitutoyo Corporation
    Inventors: Takeshi Kawabata, Takeshi Yamamoto
  • Publication number: 20110005095
    Abstract: A roundness measuring apparatus includes: a stylus having a contact part; a holding member that holds the stylus while allowing displacement of the contact part; an elastic member that presses the contact part against a measurement target object; a detector holder that supports the holding member rotatably; a motor; an elastic force adjustment member that is rotatable and concentric with the holding member; a joining section that joins the elastic force adjustment member with the holding member to maintain relative rotational positions; and a restricting section that restricts rotation of the elastic force adjustment member at a predetermined rotational position. The displacement direction of the contact part is adjusted in a first rotation range. The rotational position of the holding member relative to the rotational position of the elastic force adjustment member changes with the rotation of the elastic force adjustment member being restricted in a second rotation range.
    Type: Application
    Filed: July 7, 2010
    Publication date: January 13, 2011
    Applicant: MITUTOYO CORPORATION
    Inventors: Tatsuki Nakayama, Hideki Shindo
  • Patent number: 7866056
    Abstract: A method is described for calibrating apparatus including a measurement probe mounted on a machine, such as a machine tool. The machine is arranged to capture machine position data indicative of the position of the measurement probe and the measurement probe is arranged to capture probe data indicative of the position of a surface relative to the measurement probe. The measurement probe may be an analogue or scanning probe having a deflectable stylus. The first step of the method involves moving the measurement probe at a known speed relative to an artefact whilst capturing probe data and machine position data. In particular, the measurement probe is moved along a path that enables probe data to be captured that is indicative of the position of two or more points on the surface of the artefact relative to the measurement probe.
    Type: Grant
    Filed: February 18, 2008
    Date of Patent: January 11, 2011
    Assignee: Renishaw PLC
    Inventors: John Charles Ould, Alexander Tennant Sutherland
  • Publication number: 20100299946
    Abstract: An alignment mechanism includes: an adjusting plate having first and second adjustment ends parallel to an X axis direction; a probe fixing portion provided to the adjusting plate; a probe fixed to the probe fixing portion; a reinforcing plate having first and second base ends parallel to the X axis direction, displacement of the reinforcing portion in a Y axis direction being restricted; Y-direction adjusting screws for pressing the adjusting plate in the Y axis direction; and adjustment connectors for respectively connecting the first adjustment end with the first base end and the second adjustment end with the second base end. A stylus of the probe is disposed on a line of intersection of a first inclined surface including the first adjustment end and the first base end and a second inclined surface including the second adjustment end and the second base end.
    Type: Application
    Filed: May 26, 2010
    Publication date: December 2, 2010
    Applicant: MITUTOYO CORPORATION
    Inventors: Takeshi Kawabata, Takeshi Yamamoto
  • Patent number: 7797850
    Abstract: There is provided a contact type measuring instrument in which the contact force of a probe is adjusted by a force created by compressed air and an attraction force between a permanent magnet and a magnetic body. This measuring instrument gives a pulling-in force or a pushing-out force to the probe by controlling a fluid pressure in a probe body. Also, between the permanent magnet attached to the tip end of a movable part of a micrometer attached to the probe body and a plate-shaped member attached to the end part on the side opposite to a contact of the probe, an attraction force according to a distance between the permanent magnet and the plate-shaped member is created.
    Type: Grant
    Filed: December 16, 2008
    Date of Patent: September 21, 2010
    Assignee: Fanuc Ltd
    Inventors: Yonpyo Hon, Kenzo Ebihara, Akira Yamamoto, Masayuki Hamura
  • Patent number: RE43250
    Abstract: Disclosed is a method of moving an articulating mechanism (22,410) for a measuring device, comprising the steps of: releasing two bodies (14,16, 410a,410b) which form the articulating mechanism allowing relative movement thereof; moving one of the bodies with respect to the other until a desired position is reached; and re-constraining the two bodies so they are relatively fixed, perhaps as part of a locking process, characterised in that relative movement prior to re-constraining at the desired position occurs under particular conditions. The particular conditions including moving from the same direction; and stopping, slowing down or maintaining the condition at a position adjacent to the desired position. Also disclosed is a method of positioning an articulating mechanism (22,410) for a measuring device which is controlled by a potentiometer and a controller (11) for a measuring device.
    Type: Grant
    Filed: March 31, 2010
    Date of Patent: March 20, 2012
    Assignee: Renishaw plc
    Inventors: Peter G. Lloyd, David S. Wallace, David R. McMurtry, James L. Chase, David Jones