Having A Movable Contact Probe Patents (Class 33/556)
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Patent number: 8336220Abstract: In one embodiment, a coordinate measurement apparatus includes an articulated arm having a first end and a second end with at least a first arm segment and a second arm segment therebetween. Further, the apparatus can comprise at least one ball and socket joint connecting the first arm segment to the second arm segment, with the ball and socket joint including a ball member and a socket member, and a measurement probe attached to the first end of said articulated arm.Type: GrantFiled: August 23, 2011Date of Patent: December 25, 2012Assignee: Hexagon Metrology ABInventors: Homer L Eaton, Paul A Ferrari
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Patent number: 8336224Abstract: Measuring device for in-process measurement of test specimens during a machining process on a machine tool, in particular a grinding machine, has a measuring head connected pivotably about a first pivot axis to a base body of the measuring device via a linkage, for providing an apparatus for pivoting measuring head in and out of a measuring position. Linkage has a first linkage element and a second linkage element arranged pivotably about first pivot axis. A third linkage element is connected pivotably about a second pivot axis to the end of second linkage element facing away from first pivot axis. A fourth linkage element is connected pivotably about a third pivot axis to the end of third linkage element facing away from second pivot axis, fourth linkage element being connected pivotably about a fourth pivot axis to first linkage element at a distance from third pivot axis.Type: GrantFiled: September 20, 2010Date of Patent: December 25, 2012Assignee: Hommel-Etamic GmbHInventor: Yan Arnold
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Patent number: 8316553Abstract: A coordinate measuring machine has a coordinate measuring machine body and a controller. The coordinate measuring machine body has a probe having a measurement piece and a drive mechanism for driving the probe. The probe has a drive unit for driving the measurement piece. The controller includes a first measuring unit and a second measuring unit. The first measuring unit measures a displacement of the measurement piece driven by the drive unit. The second measuring unit measures a displacement of the probe. The measurement accuracy of the second measuring unit is lower than the measurement accuracy of the first measuring unit.Type: GrantFiled: April 22, 2010Date of Patent: November 27, 2012Assignee: Mitutoyo CorporationInventors: Sadayuki Matsumiya, Hidemitsu Asano
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Patent number: 8302322Abstract: A detector includes a stylus, a holding portion that holds a proximal end portion of the stylus, a body portion that supports the holding portion rotatably about a rotational axis, and a sensor that detects a rotational displacement of the holding portion. The holding portion includes an abutting member, on which the proximal end portion of the stylus abuts, and a plate spring that biases the proximal end portion of the stylus against the abutting member. The abutting member includes a groove portion on which the proximal end portion of the stylus abuts, and a semispherical portion that extends toward the plate spring, compared with a bottom of the groove portion. The stylus includes a proximal end inclined portion at the proximal end portion of the stylus. The proximal end inclined portion is inclined toward the plate spring, with a decreasing distance from the rotational axis.Type: GrantFiled: September 10, 2010Date of Patent: November 6, 2012Assignee: Mitutoyo CorporationInventors: Junsuke Yasuno, Hideki Sindo
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Patent number: 8296923Abstract: A reconfigurable system having at least one detachable component and at least one detachable head assembly. The reconfigurable system may be a numerically controlled (NC) machine for manufacturing processes, such as milling or automatic fiber placement (AFP). The reconfigurable system may further comprise a gantry structure comprised of movably attached beams on which detachable components may be movably attached. The detachable components may include a concave component and a convex component. At least one detachable head assembly may be movably attached to at least one of the detachable components. The detachable components and head assemblies may be at least one of physically, electrically, and pneumatically connected to a connecting assembly attached to the gantry structure.Type: GrantFiled: November 29, 2007Date of Patent: October 30, 2012Assignee: Spirit AeroSystems, Inc.Inventors: Robert Ray Wampler, Muhammad Zia Ullah
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Patent number: 8290695Abstract: Probe data is analyzed to derive Longitudinal Speed Profiles (LSPs) and an Optimal Longitudinal Speed Profile (18) for each road segment or link in a digital map network. The Longitudinal Speed Profiles (LSPs) profiles are calculated during defined time spans whereas the Optimal Longitudinal Speed Profile (18) is based on the LSP for the time span corresponding only to free flow traffic conditions. All of the LSPs can used to create a respective energy cost for each time span, or only the OLSP (18) can be used (or alternatively the RRDSL 16 or LRRDSL 17) to calculate an energy cost for the free flow conditions only. The energy cost can be used to predict the energy required by a vehicle to traverse the link. Navigation software can use the energy cost to plan the most energy efficient route between two locations in the digital map. Sensory signals can be activated if a driver strays from the Optimal Longitudinal Speed Profile (18) to achieve extremely high levels of energy efficiency.Type: GrantFiled: January 13, 2010Date of Patent: October 16, 2012Inventors: Volker Hiestermann, Robert Joannes Van Essen, Edwin Bastiaensen, Stephen T'Siobbel
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Patent number: 8261461Abstract: A linear guiding mechanism includes a fixed member, a moving member, a first double parallel leaf spring mechanism and a second double parallel leaf spring mechanism arranged between the fixed member and the moving member and configured to movably support the moving member. The first double parallel leaf spring mechanism and the second double parallel leaf spring mechanism are arranged at an angle other than 180° (for example, 90°) about an axis of movement of the moving member.Type: GrantFiled: January 14, 2010Date of Patent: September 11, 2012Assignee: Mitutoyo CorporationInventors: Atsushi Shimaoka, Takeshi Yamamoto
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Patent number: 8256129Abstract: A plurality of types of body cases, a movement unit housed inside each of the body cases, and a dial unit are provided. The movement unit is configured to include a gauge head swingably supported by a movement frame; a crown gear rotatably supported by the movement frame; and a magnifying transmission mechanism magnifying and transmitting a swing amount of the gauge head to a rotation amount of the crown gear. The dial unit is configured to include an indicating needle rotatably provided in a dial frame; a scale plate provided along a rotation area of the indicating needle; and a pinion transmitting rotation of the crown gear to the indicating needle.Type: GrantFiled: April 14, 2011Date of Patent: September 4, 2012Assignee: Mitutoyo CorporationInventor: Kouichi Adachi
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Patent number: 8225519Abstract: A contact type measurement device performs measurement with displacement of a probe, while a contact member attached to the probe is in contact with an object to be measured. Data on the relationship of a contact force of the probe to the object to be measured with an angle between the central axis of the probe and the direction of gravity, the amount of displacement of the probe, and a fluid pressure for applying a pushing-out or pulling-in force to the probe is stored in advance and, on the basis of this data, the fluid pressure or the amount of displacement of the probe is controlled to automatically and precisely adjust a fine contact force of the probe to the object to be measured.Type: GrantFiled: February 24, 2011Date of Patent: July 24, 2012Assignee: Fanuc CorporationInventors: Yonpyo Hon, Kenzo Ebihara, Masayuki Hamura
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Patent number: 8214080Abstract: A method to compensate geometrical errors in processing machines, in which a workpiece holder (8) is arranged such that it can be adjusted on the basis of measurement signals that have been received by being able to be rotated relative to a fixture (9) in the processing machine to which the workpiece holder is attached. A method for the alignment of a workpiece in processing machines, and an arrangement for the realization of the method are disclosed. The arrangement includes a workpiece holder (8), the angle of which relative to a fixture (9) in the processing machine to which the workpiece holder (8) is connected can be adjusted.Type: GrantFiled: November 16, 2007Date of Patent: July 3, 2012Assignee: Hexagon Metrology ABInventor: Bo Petterson
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Patent number: 8196306Abstract: A method and device for analyzing a formed weld of a wind turbine system is disclosed. The device includes a gage for measuring a distance, a first member configured for receiving the gage, a second member attached to the first member, the second member being configured to releasably attach to a first surface on a first side of the formed weld, a third member attached to the first member, the third member being configured to releasably attach to a second surface on a second side of the formed weld, and the gage being positionable at a plurality of locations on the first member, the plurality of locations including a first location being proximal to the second member and distal from the third member and a second location being proximal to the third member and distal from the second member.Type: GrantFiled: July 9, 2009Date of Patent: June 12, 2012Assignee: General Electric CompanyInventor: Kurt Sieber
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Patent number: 8191408Abstract: A surface texture measuring instrument includes a contact piece to be in contact with an object, a sensor driving mechanism that moves the contact piece along the surface of the object, a controller that controls the sensor mechanism, and a force sensor that detects a measuring force exerted on the contact piece when the contact piece is brought into contact with the object. The controller includes a target value output that outputs a target value of the measuring force, a feedback controller that performs feedback control of the sensor driving mechanism based on a deviation between the measuring force and the target value, and a feedback compensator provided on the feedback controller. The feedback compensator performs feedback compensation in accordance with the measuring force.Type: GrantFiled: June 30, 2009Date of Patent: June 5, 2012Assignee: Mitutoyo CorporationInventors: Shiro Igasaki, Masaoki Yamagata
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Patent number: 8179132Abstract: A method for integrating a measurement device for use in measuring a machine component includes providing a coordinate measuring machine (CMM) and combining eddy current (EC) capabilities and CMM capabilities to form an inspection probe. The method further includes installing the inspection probe on the CMM so that the inspection probe measures external boundaries of the machine component with the CMM capabilities and substantially simultaneously measures at least one of internal boundaries, internal defects, surface defects, and material properties of the machine component with the EC capabilities, which are directly linked to actual component dimensional information provided by CMM. The inspection data can be simultaneously linked to and/or displayed with a CAD model to enable a direct comparison between the inspection data and the nominal requirements specified on the CAD model.Type: GrantFiled: February 18, 2009Date of Patent: May 15, 2012Assignee: General Electric CompanyInventors: Yanyan Wu, Thomas James Batzinger, Nicholas Joseph Kray, Changting Wang, Haiyan Sun, Francis Howard Little, David Paul Lappas, David Michael Dombrowski
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Patent number: 8151480Abstract: A contour measuring device includes a guide rail, a slidable assembly, and a measuring probe. The slidable assembly is slidably engaged with the guide rail. The slidable assembly includes a weight adjusting unit connected to the slidable assembly. At least part of the weight adjusting unit is detachable from the slidable assembly. The measuring probe is fixed on the slidable assembly. A weight of the slidable assembly provides a measuring force and a weight of the weight adjusting unit is adjustable to adjust a value of the measuring force.Type: GrantFiled: December 23, 2009Date of Patent: April 10, 2012Assignees: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd., Hon Hai Precision Industry Co., Ltd.Inventors: Fa-Ping Xia, Wei Huang
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Patent number: 8145446Abstract: A portable coordinate measurement machine for measuring the position of an object in a selected volume includes a positionable articulated arm having a plurality of jointed arm segments. The arm includes a measurement probe having an integrated line laser scanner mounted thereon. The laser may be a fiber coupled laser. Wireless data transfer and communication capability for the CMM is also possible.Type: GrantFiled: January 31, 2011Date of Patent: March 27, 2012Assignee: Faro Technologies, Inc.Inventors: Paul Christopher Atwell, Jacint R. Barba, Frederick York
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Patent number: 8140178Abstract: In a simultaneous multi-axis measuring machine tool system including linear drive axes and rotation axes to measure a surface shape of an object to be measured by using an on-board measuring device having a probe mounted, at one end thereof, with a spherical contactor, a numerical controller controls driving of the linear drive axes and the rotation axes so that a central axis of the probe is always oriented in a direction perpendicular to the surface of the object to be measured and that the spherical contactor of the probe comes in contact with and follows a surface of the object to be measured.Type: GrantFiled: June 4, 2009Date of Patent: March 20, 2012Assignee: Fanuc LtdInventors: Yonpyo Hon, Kenzo Ebihara, Akira Yamamoto, Masayuki Hamura
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Publication number: 20120043303Abstract: The present invention includes steps of, determining a search starting position; setting a center position, and a first position and a second position with a distance provided therebetween; obtaining a measurement point group including measurement points of the center position, the first position, and the second position; and determining a measurement point closest to the tip portion in the measurement point group based on positions of the measurement points in a second direction and selecting a position of the measurement point in a first direction as a selected position. When the measurement point group is obtained initially after the determination of the search starting position, the search starting position is set as the center position; and when the measurement point group is obtained after the selection of the selected position, the selected position is set as the center position. The distance is narrowed for every selection of the selected position.Type: ApplicationFiled: April 28, 2009Publication date: February 23, 2012Applicant: MITSUBISHI ELECTRIC CORPORATIONInventors: Toshiaki Kurokawa, Hidetaka Katougi
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Patent number: 8107554Abstract: A system and a method for the transmission of signals representative of an event include a first low frequency clock and a low frequency counter for generating a first delay, and a second high frequency clock and a high frequency counter for generating a second delay. The system further includes a transmitter for transmitting the representative signals after a delay from the event made up by the sum of the first and the second delay. The second delay can be generated also by an analog device including for example a capacitor, and devices for charging the capacitor up to the reaching of a preset voltage at its ends. A wireless transmission system according to the invention is utilized in a checking system with a contact detecting probe, for transmitting a signal representative of contact with the piece to be checked.Type: GrantFiled: January 16, 2007Date of Patent: January 31, 2012Assignee: Marposs Societa' per AzioniInventors: Andrea Ferrari, Roberto Padovani
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Publication number: 20120017455Abstract: A shape measuring device to measure a shape of a workpiece, wherein the shape measuring device includes: the probe; a probe support shaft to pivotally support the probe; and a probe drive device to which the probe support shaft is attached to contact the probe with a measuring position of the workpiece and to move relatively the workpiece and the probe; wherein the probe is a sphere pivotally supported by the probe support shaft and has a cut face which is a shape cut so as to be nearly vertical to the probe support shaft and a shape measurement of a workpiece surface is carried out in such a manner that the cut face of the probe is faced with a face intersecting a face containing the measuring position of the workpiece surface, and a surface of the sphere is contacted with the measuring position of the workpiece.Type: ApplicationFiled: February 15, 2010Publication date: January 26, 2012Applicant: KONICA MINOLTA OPTO, INC.Inventor: Akihiro Fujimoto
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Publication number: 20110314686Abstract: A profile measurement apparatus includes: a probe which includes a gauge head for measuring a profile of an object to be measured and which moves the gauge head within a given range; a movement mechanism which moves the probe; and a controller which measures the profile by controlling the movement mechanism to contact the gauge head against the object. The controller comprises: a movement amount acquisition section which acquires a movement amount of the gauge head from a reference position; a deviation acquisition section which acquires as a deviation the movement amount when the gauge head is in a non-contact state; a determination section which determines whether the deviation is greater than a first threshold value; and a resetting section which, when the deviation is greater than the first threshold value, resets the reference position to a position arrived at by combining the reference position and the deviation.Type: ApplicationFiled: June 24, 2011Publication date: December 29, 2011Applicant: MITUTOYO CORPORATIONInventor: Takashi Noda
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Publication number: 20110271538Abstract: A plurality of types of body cases, a movement unit housed inside each of the body cases, and a dial unit are provided. The movement unit is configured to include a gauge head swingably supported by a movement frame; a crown gear rotatably supported by the movement frame; and a magnifying transmission mechanism magnifying and transmitting a swing amount of the gauge head to a rotation amount of the crown gear. The dial unit is configured to include an indicating needle rotatably provided in a dial frame; a scale plate provided along a rotation area of the indicating needle; and a pinion transmitting rotation of the crown gear to the indicating needle.Type: ApplicationFiled: April 14, 2011Publication date: November 10, 2011Applicant: MITUTOYO CORPORATIONInventor: Kouichi ADACHI
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Patent number: 8051576Abstract: An attitude arm mounted to a support arm is rotatable about a pivot. The attitude arm holds a stylus gauge, which generates a signal representing deflection of the stylus in a measurement direction as the stylus follows a surface of a workpiece rotated on a turntable. An attitude switching mechanism allows switching between a first stylus attitude generally aligned with the turntable spindle axis and a second stylus attitude generally aligned perpendicular to the turntable spindle axis. To enable alignment of the measurement direction with the spindle axis, first and second adjusters enable the stylus tip to be moved perpendicular to the spindle axis and the measurement direction when in the first and second stylus attitudes, respectively. An orientation mechanism is provided to rotate the measurement direction of the stylus. A stylus tilt mechanism is provided to tilt the stylus about a tilt axis parallel with the measurement direction.Type: GrantFiled: May 1, 2007Date of Patent: November 8, 2011Assignee: Taylor Hobson LimitedInventors: Ivor McDonnell, Jeremy Ayres
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Patent number: 8042279Abstract: A coordinate measuring machine (1) comprising a base (2) provided with guides (3) parallel to a first axis X, a first mobile carriage (4) on the guides (3) along the axis X and provided with an upright (17), a second carriage (6) carried by the upright (17) and mobile along a second vertical axis Z, and a horizontal arm (7) carried by the second carriage (6) and axially mobile along a third horizontal axis Y perpendicular to the axis X; the first carriage (4) comprises a base (16) provided with a first portion (19, 20) coupled to the guides (3) and a second portion (18) rigidly connected to the upright (17), releasable connection means (27) for reciprocally connecting the first portion (19, 20) and the second portion (18) of the base (16), and articulated connection means (28) between the first portion (19, 20) and the second portion (18) of the base to allow the upright (17) to be tipped when the releasable connection means (27) are released.Type: GrantFiled: April 6, 2006Date of Patent: October 25, 2011Assignee: Hexagon Metrology S.p.A.Inventor: Enrico Garau
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Publication number: 20110247228Abstract: An apparatus for measuring objects, in particular to a coordinate measuring unit, is provided. The unit has a probe which is movable relative to an object to be measured by means of an actuator to sample the surface of the object in a contacting manner, wherein a sampling body, whose front end is designed as a measuring tip for a contact with the object is supported at the probe. The relative position of the measuring tip with respect to the probe is determined. The sampling body is supported at the probe with movement play along at least one direction. A change in the inclination of the sampling body relative to the probe, or vice versa, can be detected via a measurement of a test parameter.Type: ApplicationFiled: April 6, 2011Publication date: October 13, 2011Applicant: STOTZ FEINMESSTECHNIK GMBHInventor: Milan Stamenkovic
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Publication number: 20110242524Abstract: An object is to provide a flat surface inspection apparatus that can prevent sliders from being damaged and detect micro defects. A flat surface inspection apparatus includes: a measured subject; a stage that supports the measured subject; a spindle that rotates the stage; a first part having light sources applying light beam onto the measured subject, a scattered-light-detecting section, a signal processing section that converts the scattered light into information about a first defect, and a first memory section that stores therein the information about the first defect; and a second part having sliders mounted with a contact sensor that detects a second defect smaller than the first defect, a loading/unloading mechanism that flies the slider over the measured subject, a slider control section that controls the loading/unloading mechanism based on the information about the first defects and second defects.Type: ApplicationFiled: January 14, 2011Publication date: October 6, 2011Inventors: YUKI SHIMIZU, Junguo Xu, Shigeo Nakamura, Toshiyuki Nakao, Toshihiko Nakata, Toshifumi Honda
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Patent number: 8028430Abstract: A height measurement apparatus for measuring a height of a workpiece is provided. The height measurement apparatus includes a support member, a level bar and a height gauge. The level bar is installed on the support member and movable along a horizontal direction. The height gauge is installed on the level bar and vertically movable along a vertical direction relative to the level bar. The height gauge comprises a probe for contacting the workpiece, thereby detecting the position of the workpiece.Type: GrantFiled: May 13, 2009Date of Patent: October 4, 2011Assignee: Hon Hai Precision Industry Co., Ltd.Inventor: Hou-Yao Lin
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Publication number: 20110232117Abstract: A measuring device includes a base body, and a measuring head which is movable between a rest position and a measuring position. The measuring device also includes an apparatus for moving the measuring head from the rest position into the measuring position, and a stop for limiting the motion of the measuring head from the rest position into the measuring position. A motorized drive unit for adjusting the position of the stop is operatively associated with the stop in such a way that the measuring position is adjustable, and a control unit is provided for activating the drive unit.Type: ApplicationFiled: March 28, 2011Publication date: September 29, 2011Applicant: HOMMEL-ETAMIC GmbHInventor: Yan ARNOLD
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Patent number: 8020308Abstract: An inspection system comprises a sensor configured to acquire inspection data of the object, a motion control device, a joint assembly coupled to the motion control device, and a probe housing coupled to the joint assembly and configured to hold the sensor. The inspection system further comprises a compliant element coupled to the probe housing and configured to cooperate with the joint assembly and the motion control device to position the sensor relative to the object. A self-aligning probe assembly is also presented.Type: GrantFiled: May 29, 2009Date of Patent: September 20, 2011Assignee: General Electric CompanyInventors: Byungwoo Lee, Yanyan Wu, Nicholas Joseph Kray
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Patent number: 8015721Abstract: In one embodiment, a coordinate measurement apparatus includes an articulated arm having a first end and a second end with at least a first arm segment and a second arm segment therebetween. Further, the apparatus can comprise at least one ball and socket joint connecting the first arm segment to the second arm segment, with the ball and socket joint including a ball member and a socket member, and a measurement probe attached to the first end of said articulated arm.Type: GrantFiled: June 24, 2010Date of Patent: September 13, 2011Assignee: Hexagon Metrology ABInventors: Homer L Eaton, Paul A Ferrari
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Patent number: 8006402Abstract: A moving vector calculation unit calculates a moving vector M representing a quantity and a direction of movement of a probe on basis of a stylus displacement vector, a stylus displacement vector D, and a direction change angle ? of the stylus displacement vector D that is caused by a frictional force between a stylus 32 and the measuring surface 5a during scanning of the measuring surface 5a by the stylus 32. The stylus displacement vector D is a vector including a quantity and a direction of position displacement of the stylus 32 relative to the probe 5. Movement of an XY-stage 7 is controlled so that the probe 6 moves in accordance with the moving vector M.Type: GrantFiled: June 2, 2009Date of Patent: August 30, 2011Assignee: Panasonic CorporationInventors: Keiichi Yoshizumi, Masateru Doi, Takayuki Kurata
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Patent number: 8006403Abstract: An edge detect system, using a torch height control system based on the use of a free floating probe in contact with the workpiece, uses a drop in pressurized air supplied to the probe tip in contact with the workpiece when the probe moves off the plate edge to generate a signal that prevents the torch from following the free floating probe downwardly and thereby prevents the cutting tool from crashing into the workpiece.Type: GrantFiled: August 21, 2009Date of Patent: August 30, 2011Assignee: Messer Cutting Systems Inc.Inventor: Alan E. Anderson
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Patent number: 8001697Abstract: A portable articulated arm coordinate measurement device is provided. The coordinate measurement device includes a base and an articulated arm portion having at least one arm segment. A biasing member is coupled on a first end to the base and on a second end to the articulated arm portion. The first end of the biasing member is movable between a first position and a second position. An adjuster is coupled between the base and the biasing member. The adjuster is coupled to move the first end of the biasing member from the first position to the second position.Type: GrantFiled: January 14, 2011Date of Patent: August 23, 2011Assignee: Faro Technologies, Inc.Inventors: David M. Danielson, Marc M. Barber, Clark H. Briggs
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Patent number: 7983790Abstract: A method for modifying a component may comprise measuring the component using a modifying tool, and recording position data for the component based on the measuring. A path for the modifying tool may be provided using the position data, and the component may be modified by moving the same modifying tool based on the provided path.Type: GrantFiled: December 19, 2008Date of Patent: July 19, 2011Assignee: The Boeing CompanyInventors: Phillip John Crothers, Robert Coulter Fraser
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Patent number: 7963047Abstract: A braking device of a measuring instrument includes a body case and a spindle that penetrates the body case to be axially and reciprocably displaceable. The braking device includes a cylinder of which a first end is attached to the body case for accommodating a second end of the spindle, a piston provided on the second end of the spindle and accommodated to be reciprocably displaceable within the cylinder, a closing member provided on a second end of the cylinder to form a damper chamber between the closing member and the piston; a shaft connected to a side of the piston opposite to the spindle and penetrates the closing member; and a knob provided on a distal end of the shaft. A clearance is provided between the closing member and the shaft to circulate air.Type: GrantFiled: June 9, 2009Date of Patent: June 21, 2011Assignee: Mitutoyo CorporationInventors: Makoto Furuta, Kouichi Adachi
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Patent number: 7950164Abstract: A roundness measuring apparatus includes: a stylus having a contact part; a holding member that holds the stylus while allowing displacement of the contact part; an elastic member that presses the contact part against a measurement target object; a detector holder that supports the holding member rotatably; a motor; an elastic force adjustment member that is rotatable and concentric with the holding member; a joining section that joins the elastic force adjustment member with the holding member to maintain relative rotational positions; and a restricting section that restricts rotation of the elastic force adjustment member at a predetermined rotational position. The displacement direction of the contact part is adjusted in a first rotation range. The rotational position of the holding member relative to the rotational position of the elastic force adjustment member changes with the rotation of the elastic force adjustment member being restricted in a second rotation range.Type: GrantFiled: July 7, 2010Date of Patent: May 31, 2011Assignee: Mitutoyo CorporationInventors: Tatsuki Nakayama, Hideki Shindo
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Publication number: 20110119943Abstract: Measuring device for in-process measurement of test specimens during a machining process on a machine tool, in particular a grinding machine, has a measuring head connected pivotably about a first pivot axis to a base body of the measuring device via a linkage, for providing an apparatus for pivoting measuring head in and out of a measuring position. Linkage has a first linkage element and a second linkage element arranged pivotably about first pivot axis. A third linkage element is connected pivotably about a second pivot axis to the end of second linkage element facing away from first pivot axis. A fourth linkage element is connected pivotably about a third pivot axis to the end of third linkage element facing away from second pivot axis, fourth linkage element being connected pivotably about a fourth pivot axis to first linkage element at a distance from third pivot axis.Type: ApplicationFiled: September 20, 2010Publication date: May 26, 2011Inventor: Yan Arnold
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Patent number: 7934323Abstract: The invention relates to a method and a device for the positioning of a displaceable component in an examining system, particularly a measuring or an analytic system wherein, during the process, the displaceable component is displaced with the support of an actuating element coupled to the displaceable component from a home position into an end position, wherein the actuating element is moved by means of a drive force and the displaceable component is impacted with a fixation force fixating the displaceable component in the end position by way of a fixation component connected to the displaceable component, where the fixation component is submerged at least partially in a reservoir of a medium and is fixated in the medium by means of the transformation of the medium from a liquid state into a solidified state, wherein the medium is transformed from the liquid state into the solidified state by means of the impact-application with a manipulating variable.Type: GrantFiled: September 29, 2006Date of Patent: May 3, 2011Assignee: JPK Instruments AGInventors: Detlef Knebel, Torsten Jähnke
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Publication number: 20110083335Abstract: A detector includes a stylus, a holding portion that holds a proximal end portion of the stylus, a body portion that supports the holding portion rotatably about a rotational axis, and a sensor that detects a rotational displacement of the holding portion. The holding portion includes an abutting member, on which the proximal end portion of the stylus abuts, and a plate spring that biases the proximal end portion of the stylus against the abutting member. The abutting member includes a groove portion on which the proximal end portion of the stylus abuts, and a semispherical portion that extends toward the plate spring, compared with a bottom of the groove portion. The stylus includes a proximal end inclined portion at the proximal end portion of the stylus. The proximal end inclined portion is inclined toward the plate spring, with a decreasing distance from the rotational axis.Type: ApplicationFiled: September 10, 2010Publication date: April 14, 2011Applicant: MITUTOYO CORPORATIONInventors: Junsuke YASUNO, Hideki SINDO
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Patent number: 7921575Abstract: A method is provided for assembling a measurement device for use in measuring a machine component. The method includes providing a coordinate measuring machine (CMM). The method also includes combining ultrasonic inspection (UT) capabilities and CMM capabilities to form an inspection probe. The inspection probe is installed on the CMM so that the inspection probe measures external boundaries of the machine component with the CMM capabilities and substantially simultaneously measures internal boundaries of the machine component with the UT capabilities.Type: GrantFiled: December 27, 2007Date of Patent: April 12, 2011Assignee: General Electric CompanyInventors: Francis Howard Little, Yanyan Wu, Jian Li, Nicholas J. Kray
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Patent number: 7918033Abstract: A coordinate measuring machine has a probe head, a calibrating body and an apparatus for recording and correcting measured values obtained by the probe head. A mechanical flexibility at predetermined points on the surface of the calibrating body is determined. The mechanical flexibility is stored in the apparatus in the form of a data record. The calibrating body is scanned point by point by means of the probe head in order to obtain the measured values. Thereafter, the probe head is calibrated by correcting the measured values using the data record. A similar approach can also be used on workpieces having a known mechanical flexibility.Type: GrantFiled: April 16, 2010Date of Patent: April 5, 2011Assignee: Carl Zeiss Industrielle Messtechnik GmbHInventor: Tobias Held
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Patent number: 7908759Abstract: A method for measuring a surface profile using a surface sensing device mounted on an articulating probe head in which the probe head is moved along a nominal path relative to the surface profile, an at least approximation of the surface normal of the surface profile, the surface profile is sensed with the surface sensing device and the distance or force of the surface sensing device relative to the surface profile substantially in the direction of the surface normal. The surface normal may be determined by approximating at least one section to a curved profile which can be mathematically parameterised.Type: GrantFiled: April 19, 2006Date of Patent: March 22, 2011Assignee: Renishaw PLCInventors: Ian William McLean, Nicholas John Weston, Martin Simon Rees, Leo Christopher Somerville
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Patent number: 7900367Abstract: A method of calibrating a measurement probe (10) mounted on a machine is described. The measurement probe (10) has a stylus (14) with a workpiece contacting tip (16). The method comprises determining a probe calibration matrix that relates the probe outputs (a,b,c) to the machine coordinate system (x,y,z.). The method comprising the steps of scanning a calibration artefact (18) using a first probe deflection (d1) to obtain first machine data and using a second probe deflection (d2) to obtain second machine data. The first and second machine data are used to obtain a pure probe calibration matrix in which any machine errors are substantially omitted. Advantageously, the method determines the pure probe matrix numerically based on the assumption that the difference between the first and second machine position data is known.Type: GrantFiled: April 24, 2007Date of Patent: March 8, 2011Assignee: Renishaw PLCInventor: Alexander Tennant Sutherland
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Patent number: 7895761Abstract: A measurement method and a measuring device for use in measurement systems such as co-ordinate measurement machines and similar, where a position sensor is arranged to register its position in order to determine the form and dimensions of an object. The position sensor is supported by a support, the position and orientation of which are determined through calculation with the aid of data from at least one of accelerometers, GPS receivers and gyroscopes, and based on a known starting position.Type: GrantFiled: August 3, 2006Date of Patent: March 1, 2011Assignee: Hexagon Metrology ABInventor: Bo Pettersson
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Patent number: 7886453Abstract: A method is described for measuring a workpiece on a machine tool using an analogue probe having a deflectable stylus. The method comprises the step of taking a workpiece having a nominal surface profile, the workpiece being located within the working area of the machine tool. The machine tool is used to move the analogue probe along a predetermined (known) measurement path relative to the workpiece whilst deflection of the stylus is measured. The analogue probe is moved relative to the workpiece at a speed greater than five millimeters per second and the predetermined measurement path is selected to provide intermittent contact between the stylus and the workpiece.Type: GrantFiled: December 11, 2007Date of Patent: February 15, 2011Assignee: Renishaw PLCInventors: John Charles Ould, Kevin James Tett
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Patent number: 7882644Abstract: An alignment mechanism includes: an adjusting plate having first and second adjustment ends parallel to an X axis direction; a probe fixing portion provided to the adjusting plate; a probe fixed to the probe fixing portion; a reinforcing plate having first and second base ends parallel to the X axis direction, displacement of the reinforcing portion in a Y axis direction being restricted; Y-direction adjusting screws for pressing the adjusting plate in the Y axis direction; and adjustment connectors for respectively connecting the first adjustment end with the first base end and the second adjustment end with the second base end. A stylus of the probe is disposed on a line of intersection of a first inclined surface including the first adjustment end and the first base end and a second inclined surface including the second adjustment end and the second base end.Type: GrantFiled: May 26, 2010Date of Patent: February 8, 2011Assignee: Mitutoyo CorporationInventors: Takeshi Kawabata, Takeshi Yamamoto
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Publication number: 20110005095Abstract: A roundness measuring apparatus includes: a stylus having a contact part; a holding member that holds the stylus while allowing displacement of the contact part; an elastic member that presses the contact part against a measurement target object; a detector holder that supports the holding member rotatably; a motor; an elastic force adjustment member that is rotatable and concentric with the holding member; a joining section that joins the elastic force adjustment member with the holding member to maintain relative rotational positions; and a restricting section that restricts rotation of the elastic force adjustment member at a predetermined rotational position. The displacement direction of the contact part is adjusted in a first rotation range. The rotational position of the holding member relative to the rotational position of the elastic force adjustment member changes with the rotation of the elastic force adjustment member being restricted in a second rotation range.Type: ApplicationFiled: July 7, 2010Publication date: January 13, 2011Applicant: MITUTOYO CORPORATIONInventors: Tatsuki Nakayama, Hideki Shindo
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Patent number: 7866056Abstract: A method is described for calibrating apparatus including a measurement probe mounted on a machine, such as a machine tool. The machine is arranged to capture machine position data indicative of the position of the measurement probe and the measurement probe is arranged to capture probe data indicative of the position of a surface relative to the measurement probe. The measurement probe may be an analogue or scanning probe having a deflectable stylus. The first step of the method involves moving the measurement probe at a known speed relative to an artefact whilst capturing probe data and machine position data. In particular, the measurement probe is moved along a path that enables probe data to be captured that is indicative of the position of two or more points on the surface of the artefact relative to the measurement probe.Type: GrantFiled: February 18, 2008Date of Patent: January 11, 2011Assignee: Renishaw PLCInventors: John Charles Ould, Alexander Tennant Sutherland
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Publication number: 20100299946Abstract: An alignment mechanism includes: an adjusting plate having first and second adjustment ends parallel to an X axis direction; a probe fixing portion provided to the adjusting plate; a probe fixed to the probe fixing portion; a reinforcing plate having first and second base ends parallel to the X axis direction, displacement of the reinforcing portion in a Y axis direction being restricted; Y-direction adjusting screws for pressing the adjusting plate in the Y axis direction; and adjustment connectors for respectively connecting the first adjustment end with the first base end and the second adjustment end with the second base end. A stylus of the probe is disposed on a line of intersection of a first inclined surface including the first adjustment end and the first base end and a second inclined surface including the second adjustment end and the second base end.Type: ApplicationFiled: May 26, 2010Publication date: December 2, 2010Applicant: MITUTOYO CORPORATIONInventors: Takeshi Kawabata, Takeshi Yamamoto
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Patent number: 7797850Abstract: There is provided a contact type measuring instrument in which the contact force of a probe is adjusted by a force created by compressed air and an attraction force between a permanent magnet and a magnetic body. This measuring instrument gives a pulling-in force or a pushing-out force to the probe by controlling a fluid pressure in a probe body. Also, between the permanent magnet attached to the tip end of a movable part of a micrometer attached to the probe body and a plate-shaped member attached to the end part on the side opposite to a contact of the probe, an attraction force according to a distance between the permanent magnet and the plate-shaped member is created.Type: GrantFiled: December 16, 2008Date of Patent: September 21, 2010Assignee: Fanuc LtdInventors: Yonpyo Hon, Kenzo Ebihara, Akira Yamamoto, Masayuki Hamura
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Patent number: RE43250Abstract: Disclosed is a method of moving an articulating mechanism (22,410) for a measuring device, comprising the steps of: releasing two bodies (14,16, 410a,410b) which form the articulating mechanism allowing relative movement thereof; moving one of the bodies with respect to the other until a desired position is reached; and re-constraining the two bodies so they are relatively fixed, perhaps as part of a locking process, characterised in that relative movement prior to re-constraining at the desired position occurs under particular conditions. The particular conditions including moving from the same direction; and stopping, slowing down or maintaining the condition at a position adjacent to the desired position. Also disclosed is a method of positioning an articulating mechanism (22,410) for a measuring device which is controlled by a potentiometer and a controller (11) for a measuring device.Type: GrantFiled: March 31, 2010Date of Patent: March 20, 2012Assignee: Renishaw plcInventors: Peter G. Lloyd, David S. Wallace, David R. McMurtry, James L. Chase, David Jones