Abstract: An optical characteristic measuring apparatus includes an optical system 10 including first and second carrier retarders 24 and 32 having the retardations being known and differing from each other. The optical characteristic measuring apparatus performs: a spectrum extraction process of extracting a plurality of spectral peaks from a frequency spectrum obtained by analyzing a light intensity signal detected by light-receiving/spectroscopic means; and an optical characteristic element calculation process of calculating an optical characteristic element representing optical characteristics of a measurement target based on the spectral peaks and the retardations of the first and second carrier retarders.

Abstract: Embodiments of a system and method for collecting hyperspectral and polarimetric data that are spatially and temporally coincident include a dispersive element configured to receive incident electromagnetic radiation. The dispersive element is configured to disperse a non-zero order of the electromagnetic radiation into its constituent spectra, which is directed to a first focal plane array, and may be read out as hyperspectral data. The dispersive element is also configured to reflect a zero order of the electromagnetic radiation, which is directed through a polarity discriminating element to a second focal plane array, which may be read out as polarimetric data. By synchronously reading out the first and second focal plane arrays, the hyperspectral and polarimetric data may be both spatially and temporally coincident.

Abstract: A procedure for self-calibration of an optical polarimeter has been developed that eliminates the need for “known” input signals to be used. The self-calibration data is then taken by moving a polarization controller between several random and unknown states of polarization (SOPs) and recording the detector output values (D0, . . . , D3) for each state of polarization. These values are then used to create an “approximate” calibration matrix. In one exemplary embodiment, the SOP of the incoming signal is adjusted three times (by adjusting a separate polarization controller element, for example), creating a set of four detector output values for each of the four polarizations states of the incoming signal—an initial calibration matrix. The first row of this initial calibration matrix is then adjusted to fit the power measurements using a least squares fit. In the third and final step, the remaining elements of the calibration matrix are adjusted to a given constraint (for example, DOP=100% for all SOPs).

Abstract: The invention relates to a method and to a device for determining a piece of polarisation information on a measurement point of a target sample, the device comprising: -a light source capable of emitting a rectilinearly polarised light beam in a predefined direction, the light beam being intended to be reflected by the measurement point of the target sample; -a unit for computing the piece of polarisation information on the measurement point using the beam reflected by the target sample; -a waveguide for guiding the incident beam towards the target sample and the reflected beam towards the computing means; and -a unit for rotating the polarisation, capable of rotating two orthogonal polarimetric components of the incident beam exiting the waveguide and two orthogonal polarimetric components of the reflected beam before passing through the waveguide.

Abstract: A polarimeter and method of polarizing incoming light includes an optical assembly, a first adjustable circular retarder that rotates the polarization content of incoming light, a polarization beam splitter that receives light from the adjustable circular retarder and polarizing the light into a first portion of light having a first polarization and a second portion of light having a second polarization. The first portion of light is directed to a focal plane and the second portion of light is directed to the optical assembly. The optical assembly is switchable between a polarizing mode of operation in which the first portion of light is viewable at the focal plane in absence of the second portion of light and an imaging mode of operation in which the first portion of light and the second portion of light are viewable at the focal plane.

Abstract: A treatment pattern (such as a focused spot, an image, or an interferogram) projected on a treatment target may lose precision if the treatment beam must pass through a birefringent layer before reaching the target. In the general case, the birefringent layer splits the treatment beam into ordinary and extraordinary components, which propagate in different directions and form two patterns, displaced from each other, at the target layer. The degree of birefringence and the orientation of the optic axis, which influence the amount of displacement, often vary between workpieces or between loci on the same workpiece. This invention measures the orientation of the optic axis and uses the data to adjust the treatment beam incidence direction, the treatment beam polarization, or both to superpose the ordinary and extraordinary components into a single treatment pattern at the target, preventing the birefringent layer from causing the pattern to be blurred or doubled.

Abstract: An apparatus for information extraction from electromagnetic energy via multi-characteristic spatial geometry processing to determine three-dimensional aspects of an object from which the electromagnetic energy is proceeding. The apparatus receives the electromagnetic energy. The received electromagnetic energy has a plurality of spatial phase characteristics. The apparatus separates the plurality of spatial phase characteristics of the received electromagnetic energy. The apparatus r identifies spatially segregated portions of each spatial phase characteristic, with each spatially segregated portion of each spatial phase characteristic corresponding to a spatially segregated portion of each of the other spatial phase characteristics in a group. The apparatus quantifies each segregated portion to provide a spatial phase metric of each segregated portion for providing a data map of the spatial phase metric of each separated spatial phase characteristic.

Abstract: The present invention discloses an optical measurement and/or inspection device that, in one application, may be used for inspection of semiconductor devices. A method is disclosed for extracting information of a device-under-test for an ellipsometer, comprising the steps: providing a plurality of incoming polarized beams using a plurality of polarizers, where each of the beams being polarized at a designated polarizing angle; using a parabolic reflector to focus said plurality of incoming polarized beams on a spot on a DUT; using a parabolic reflector to collect a plurality of beams reflected from said DUT; and analyzing said collected beams using a plurality of analyzers, wherein each of the analyzers having a designated polarizing angle with respect to its respective polarizer.

Abstract: A system, method of configuring, and application a system for introducing a relative phase retardation into orthogonally polarized components of an electromagnetic beam entered thereinto, wherein the system involves a substantially achromatic multiple element retarder system for use in wide spectral range (for example, 190-1700 nm) rotating compensator spectroscopic ellipsometer and/or polarimeter systems.

Abstract: A polarimeter based on coherent detection and a method for measuring the optical rotation of a polarized light beam by an optically active substance, while enabling the subtraction of background signals, are provided.

Abstract: Systems, apparatus and methods for characterizing linear retarders using a waveplate analyzer constructed by polarization rotators. In one implementation of such an analyzer, both the retardation of the waveplate sample and the orientation of optical axis of the waveplate sample can be simultaneously measured.

Abstract: In at least one embodiment, the inventive technology relates to in-vessel generation of a material from a solution of interest as part of a processing and/or analysis operation. Preferred embodiments of the in-vessel material generation (e.g., in-vessel solid material generation) include precipitation; in certain embodiments, analysis and/or processing of the solution of interest may include dissolution of the material, perhaps as part of a successive dissolution protocol using solvents of increasing ability to dissolve.

Abstract: In embodiments of the present invention a second, different waveplate is introduced into a single rotating compensator normal incidence ellipsometer. The second waveplate provides a quarter wavelength retardation that is different from and complementary to that of the first waveplate in order to increase the spectral range for which useful retardation is available, especially towards the deep UV spectrum. The sensitivity for the system may also be increased in the conventional spectral range, since each of the two waveplates may be optimized for its own, somewhat more narrow spectral range of operation. With the proper choice of two waveplates of different retardation, the useful spectral range may be extended from typically 190-820 nm to 150-1000 nm, and beyond if necessary, while increasing the sensitivity within the conventional wavelength range at the same time.

Abstract: Ellipsometry using two waveplates of complementary retardation in a dual rotating compensator configuration is disclosed. Two waveplates of complementary retardation may be used to increase the useful spectral range of a rotating compensator ellipsometer, in particular towards the deep Ultraviolet (UV) spectrum. The improved rotating compensating ellipsometer disclosed herein enables a user to select specific and different waveplate retardations for the purpose of increasing the operating wavelength range of the rotating compensating ellipsometer.

Abstract: A kit having a supporting device for maintaining a transparent article having a longitudinal axis A, a proximal end and a distal end. The supporting device including a proximal holder including a port intended to receive the proximal end of the article, and a distal holder including a receiving part intended to receive the distal end of the article, the port and the receiving part being aligned on the same longitudinal axis B. The supporting device further having a compressor for putting the article under longitudinal compression directed towards a center of the article, when the article is mounted on the supporting device with its longitudinal axis A aligned on the longitudinal axis B, and a polarimeter. The invention also pertains to a method for measuring the stress inside an article made of transparent material.

Abstract: A micropolarimeter is described for simultaneously extracting all Stokes parameters from incident light. The micropolarimeter includes at least one superpixel, which further includes three or more subpixels, each exact a different polarization components from the incident light. The micropolarimeter includes a first and second alignment layers and a liquid crystal layer disposed between the first and second alignment layers. The liquid crystal molecules of the liquid crystal layer are aligned in accordance with the first and second alignment layers to form the superpixel. A method is provided for manufacturing the photo-aligned liquid-crystal micropolarimeter array.

Abstract: An optical rotating power measurement method comprising: an optical rotating power data acquisition step of starting measurement of the optical rotating power of the sample in a measurement apparatus during a temperature changing process where a controller controls the temperature of the sample such that the temperature reaches the predetermined temperature and of obtaining temperature data and optical rotating power data of the sample as time passes during the temperature changing process; and a data processing step of obtaining a straight line relationship data between the temperature data and the optical rotating power data, by using the fact that the optical rotating power of the sample is proportional to a measurement temperature; wherein the optical rotating power data of the sample at the predetermined temperature or the temperature dependence data of the optical rotating power of the sample is determined based on the straight line relationship data.

Abstract: Disclosed is a system for controlling focus, angle of incidence and intensity of an electromagnetic beam over a spectrum of wavelengths, and methodology for optimizing investigation of samples which demonstrate low specular reflectance and/or are depolarizing of a polarized beam of electromagnetic radiation, such as solar cells.

Abstract: The present invention relates to near-field scanning optical microscopy (NSOM) and near-field/far-field scanning microscopy methods, systems and devices that permit the imaging of biological samples, including biological samples or structures that are smaller than the wavelength of light. In one embodiment, the present invention permits the production of multi-spectral, polarimetric, near-field microscopy systems that can achieve a spatial resolution of less than 100 nanometers. In another embodiment, the present invention permits the production of a multifunctional, multi-spectral, polarimetric, near-field/far-field microscopy that can achieve enhanced sub-surface and in-depth imaging of biological samples. In still another embodiment, the present invention relates to the use of polar molecules as new optical contrast agents for imaging applications (e.g., cancer detection).

Abstract: Method and apparatus for testing of LCD cells is disclosed. An LCD cell under test (14, 30) may be mounted to translatable table (40) between polarization state generator (10) and polarization state analyzer (16). For each location on cell (14, 30) to be tested, a variety of known polarization states (22) are launched through LCD cell (14, 30) and detected by polarization state analyzer (16). Electrical signals representative of polarization states are acquired by computer (18). Within computer (18), a model (58, 60) of polarization properties of LCD cell (14, 30) is developed based on estimations of what physical parameters of LCD cell (14, 30) are believed to be. RMS differences between simulated polarization properties and measured polarization properties are minimized by iteratively refining (60) modeled physical cell properties, at which point cell thickness and other physical parameters of the LCD cell may be deduced.

Abstract: A physiological monitor utilizes rotation measurements to estimate mean photon pathlengths through tissue. These pathlength estimates, along with corresponding optical spectroscopy measurements allow the noninvasive monitoring of blood constituent concentrations. The technique is particularly applicable to noninvasive blood glucose measurements. The physiological monitor has a polarized light source for illuminating tissue and a magnetic field generator which creates a magnetic field within the tissue during illumination. The magnetic field imparts a rotation in the plane of polarization of the incident light beam as it propagates through the tissue and emerges as a transmitted light beam. A polarimeter is used to measure the rotation of the transmitted light. A signal processor then computes an estimate of the mean pathlength from the polarimeter output. The polarized light source has a multiple wavelength optical emitter and, in conjunction with the polarimeter detector, also functions as a spectrometer.

Abstract: A polarimeter includes a multi-wavelength source for generating electromagnetic waves having at least two different wavelengths, means for separating electromagnetic waves, the electromagnetic waves including electromagnetic waves generated by the multi-wavelength source and electromagnetic waves received from a sample contacted by the electromagnetic waves generated by the multi-wavelength source, a fixed waveplate, wherein the fixed waveplate is configured to convert one polarization state to multiple polarization states that allow for calculations of linear and circular polarization components of the electromagnetic waves, a free space coupler, a beam splitter, and more than one detector. The polarimeter may be used in a method for high-speed measurement of linear and circular polarization components of electromagnetic waves.

Abstract: A noninvasive polarimetric apparatus used to measure levels of a substance in a sample in the presence of dynamically changing sample birefringence is provided. A polarization system generates multiple states of polarized light which interact with the sample. An analyzer system receives a signal from the sample and generates a secondary signal. This signal is detected and then processed to measure levels of a substance in a sample that may be have time varying birefringent components.

Abstract: A measuring apparatus includes a light intensity information acquisition section 40 that acquires light intensity information relating to a measurement light containing a given band component, the measurement light having been modulated by optical elements included in an optical system 10 and a measurement target (or a sample 100), and a calculation section 50 that calculates at least one matrix element of a Mueller matrix that indicates the optical characteristics of the measurement target based on the light intensity information relating to the measurement light and a theoretical expression for the light intensity of the measurement light. The light intensity information acquisition section 40 acquires the light intensity information relating to a plurality of the measurement lights obtained from the optical system 10 by changing setting of a principal axis direction of at least one of the optical elements.

Abstract: This invention relates to the manufacture of semiconductor substrates such as wafers and to a method for monitoring the state of polarization incident on a photomask in projection printing using a specially designed polarization monitoring reticle for high numerical aperture lithographic scanners. The reticle measures 25 locations across the slit and is designed for numerical apertures above 0.85. The monitors provide a large polarization dependent signal which is more sensitive to polarization. A double exposure method is also provided using two reticles where the first reticle contains the polarization monitors, clear field reference regions and low dose alignment marks. The second reticle contains the standard alignment marks and labels. For a single exposure method, a tri-PSF low dose alignment mark is used. The reticles also provide for electromagnetic bias wherein each edge is biased depending on that edge's etch depth.

Abstract: Methods and apparatus for concentration determination using polarized light. The apparatus includes a first polarized light source having a first light source polarization axis and a second polarized light source having a second light source polarization axis generally perpendicular to the first light source polarization axis. Also, a first polarized light receiver having a first polarized light receiver polarization axis and configured to measure an intensity of light transmitted from the first light receiver polarizer and a second polarized light receiver having a second polarized light receiver polarization axis substantially perpendicular to the first light receiver polarization axis and configured to measure an intensity of light transmitted from the second light receiver polarizer, wherein the first and second light receiver polarization axes are generally +/?45 degrees relative to the first and second light source polarization axes.

Abstract: A polarimetric imaging apparatus (2) and method for distinguishing objects of interest within a scene, said apparatus comprising means for resolving electromagnetic radiation received from the scene having a first substantially circular polarisation state into a first image and for resolving electromagnetic radiation received from the scene having a substantially circular polarisation state of opposite handedness to that of the first circular polarisation state into a second image so as to identify differences there-between, and means for providing an output indicative of the difference there-between, wherein the resolving means is arranged in use to resolve said electromagnetic radiation into said first and second images successively.

Abstract: A polarimeter and method of polarizing incoming light includes an optical assembly, a first adjustable circular retarder that rotates the polarization content of incoming light, a polarization beam splitter that receives light from the adjustable circular retarder and polarizing the light into a first portion of light having a first polarization and a second portion of light having a second polarization. The first portion of light is directed to a focal plane and the second portion of light is directed to the optical assembly. The optical assembly is switchable between a polarizing mode of operation in which the first portion of light is viewable at the focal plane in absence of the second portion of light and an imaging mode of operation in which the first portion of light and the second portion of light are viewable at the focal plane.

Abstract: The invention relates to a sensor for determining a concentration of a substance contained in a fluid-containing matrix, with a measurement chamber (5), a sender (3) for the emission of optical radiation (6) into the measurement chamber, and a receiver (4) for receiving optical radiation which has traversed the measurement chamber, wherein the measurement chamber is designed for bringing into the matrix and is filled with a specific fluid, and the wall (12, 13) is at least sectionally permeable to the diffusion of the substance. A control and evaluation circuit (7) is connected to the sender (3) and controls the sender (3), and is connected to the receiver (4) for selecting the receiver signals and determines, from the receiver signal, a measurement for the concentration of the substance in the matrix.

Abstract: A method and apparatus for analysing the three-dimensional electromagnetic field resulting from an interaction between a focused illuminating beam and a sample to be observed, by characterising the distribution of the state of polarisation of light across a measurement plane, the method comprising the steps of generating a beam of illuminating light; controlling the state of polarisation at different positions across the beam width of the light beam; focussing said illuminating light beam to a focus, wherein said focus is a tight focus and said focused light has a suitable three-dimensional vectorial structure at the focus; detecting and measuring the state of polarisation of the reflected light at different positions across the width of the measurement plane to retrieve information on the three-dimensional vectorial electromagnetic interaction of the illuminated focused field and the sample.

Abstract: This invention solves a problem of registration and improves signal-to-noise ratio (SNR) when using division-by-focal-plane array to produce multiple polarization images. This is achieved by processing a sequence of angular-position-dithered frames to generate a high-definition, Nyquist-sampled, integrated image for each of the polarizations. The integration method transforms individually under-sampled, high-resolution image frames into resultant high-resolution frames that meet the Nyquist sampling criterion. During the resampling transformation, each polarization or waveband is resampled to produce precise registration to the other polarizations, since registration offsets are fixed and defined by the arrangement of the polarized pixels in the focal-plane-array. In the most straight-forward implementation, these offsets would be integer pixel shifts in X and Y.

Abstract: The invention relates to a polarimetric imaging device comprising a multiple-quantum-well structure operating on inter-sub-band transitions by absorbing radiation at a wavelength ?, said structure comprising a matrix of individual detection pixels, characterized in that the matrix is organized in subsets of four individual pixels, a first pixel comprising a first diffraction grating (RP1) sensitive to a first polarization, a second polarimetric pixel comprising a second diffraction grating (RP2) sensitive to a second polarization orthogonal to the first polarization, a third polarimetric pixel comprising a third diffraction grating (RP3) sensitive to a third polarization oriented at an angle between the first and second polarizations and a fourth pixel not comprising a polarization-selective diffraction rating (R2D).

Abstract: The invention relates to a sensor unit for a Surface Plasmon Resonance (SPR) unit, comprising a transparent sensor structure forming at least one wall of a cavity, the wall being defined by a concave inner surface and a convex outer surface The inner surface is provided with a layer of a conductive material capable of supporting a surface plasmon. In the cavity there is provided a flow structure in said cavity so as to form at least one compartment for sample between the flow structure and the inner wall of the cavity. Also, a method for the detection of events at a surface by utilizing surface plasmon resonance is provided. It comprises placing a sample with an analyte of interest in a sensor unit as claimed in claim 1, and measuring the reflectance from said sensor unit at a single or plurality of angle/angles.

Abstract: The present disclosure relates to a method for measuring the maturity or cell wall thickening of a sample of cellulosic fiber. The method at least includes exposing the sample of fiber to polarized light, capturing one or more images of the sample through crossed polar lenses and a compensator plate so that the image(s) include interference colors from the sample; and conducting computer analysis on the captured image(s) to determine the maturity or degree of cell wall thickening of the cellulosic fiber by comparing the image(s) to reference color interference data.

Abstract: A sensor unit for measuring a response characteristic of a polarization rotation liquid crystal cell, includes a measurement light source which emits measurement light, a first polarization plate which has a first polarization direction and receives the measurement light from the measurement light source to output measurement light having the first polarization direction to a polarization rotation liquid crystal cell, a second polarization plate which has a second polarization direction and receives measurement light passed through the polarization rotation liquid crystal cell, a light receiving unit which receives measurement light passed through the second polarization plate, and a measurement unit which determines a response characteristic of the polarization rotation liquid crystal cell on the basis of a drive signal of the polarization rotation liquid crystal cell and the amount of measurement light received by the light receiving unit.

Abstract: A rotation detection kit, comprising a source for generating at least a first polarized beam emitted along a propagation axis, a receiver comprising at least a first beam intensity sensor and an analyzer. The analyser comprises a first polarizer device for location in the at least first polarized beam between the source and at least first beam intensity sensor. The first polarizer device is configured such that the receiver can measure rotation between the source and the analyzer about a first axis that is non-parallel to the propagation axis based on the at least first beam intensity sensor's output.

Abstract: The present invention is directed to the creation of optical waveguiding devices from standard optical fibers by the creation of zones of permanently altered refractive index characteristics therein. A high intensity femtosecond laser beam is focused at a predetermined target region in the fiber so as to soften the glass material at the target region. After aligning the focal region with the target region in the fiber there will be relative movement between the focal region and the fiber, which has the effect of sweeping the focal region across the fiber in a predetermined path, so as to create a secondary waveguide path. A portion of the light traveling along the core is removed from the core along the secondary waveguide path such that the device can be utilized as an attenuator, an optical tap, or a polarimeter.

Abstract: The subject of the invention is a polarimetric imaging system exhibiting an optical axis, and comprising means (35) for the detection and analysis of the light backscattered by an object illuminated by a light source and at least one programmable waveplate (33), wherein the programmable waveplate comprises a material with an isotropic electrooptic tensor and a set of at least three electrodes disposed along the directions parallel to the optical axis of the imaging system.

Abstract: A particle discriminator using circularly polarized light projected through a channel having target particles. Light may be propagated through the channel, with some light scattered separated into forward angle scattered light, small angle scattered light and unscattered light. The forward angle scattered light may be linearly polarized and detected. The small angle scattered light may be linearly polarized in a direction orthogonal to the direction of the polarization of the forward angle scattered light, and at least both these kinds of light may be detected. Data from these detected kinds of light may be analyzed to discriminate particles from one another.

Abstract: Method and apparatus for testing of LCD cells is disclosed. An LCD cell under test (14, 30) may be mounted to translatable table (40) between polarization state generator (10) and polarization state analyzer (16). For each location on cell (14, 30) to be tested, a variety of known polarization states (22) are launched through LCD cell (14, 30) and detected by polarization state analyzer (16). Electrical signals representative of polarization states are acquired by computer (18). Within computer (18), a model (58, 60) of polarization properties of LCD cell (14, 30) is developed based on estimations of what physical parameters of LCD cell (14, 30) are believed to be. RMS differences between simulated polarization properties and measured polarization properties are minimized by iteratively refining (60) modeled physical cell properties, at which point cell thickness and other physical parameters of the LCD cell may be deduced.

Abstract: Method and apparatus for testing of LCD cells is disclosed. An LCD cell under test (14, 30) may be mounted to translatable table (40) between polarization state generator (10) and polarization state analyzer (16). For each location on cell (14, 30) to be tested, a variety of known polarization states (22) are launched through LCD cell (14, 30) and detected by polarization state analyzer (16). Electrical signals representative of polarization states are acquired by computer (18). Within computer (18), a model (58, 60) of polarization properties of LCD cell (14, 30) is developed based on estimations of what physical parameters of LCD cell (14, 30) are believed to be. RMS differences between simulated polarization properties and measured polarization properties are minimized by iteratively refining (60) modeled physical cell properties, at which point cell thickness and other physical parameters of the LCD cell may be deduced.

Abstract: Embodiments of the present invention are directed to pulsed polarimeters for conducting remote, non-perturbative diagnostic measurements of inducing fields of a medium demonstrating induced optical activity. In one aspect, a pulse polarimeter includes a light source emitting a polarized light pulse having sufficiently narrow spatial extent at a prescribed wavelength and a light gathering optical system including a light gathering optic having an optic axis directed toward the medium and positioned to collect and collimate a predetermined solid angle of an emission from the medium into a collimated emission beam, while preserving the polarization state of the emission.

Abstract: Embodiments of the present invention are directed to pulsed polarimeters for conducting remote, non-perturbative diagnostic measurements of inducing fields of a medium demonstrating induced optical activity. In one aspect, a pulse polarimeter includes a light source emitting a polarized light pulse having sufficiently narrow spatial extent at a prescribed wavelength and a light gathering optical system including a light gathering optic having an optic axis directed toward the medium and positioned to collect and collimate a predetermined solid angle of an emission from the medium into a collimated emission beam, while preserving the polarization state of the emission.

Abstract: An apparatus for testing a liquid crystal display (LCD) panel which is capable of easily attaching or detaching a large polarizer to/from a test board when testing a large LCD panel, the apparatus comprising a test board for outputting light to an LCD panel which is placed thereon, a polarizer fixing unit rotatably formed at the test board and having a groove in which a polarizer is inserted, and a stop formed at the test board to fix the polarizer fixing unit to a desired position.

Abstract: A method and apparatus for accurately retrieving the position of an optical feature. The method uses the optical properties of biaxial crystals to conically refract the optical feature and transform the image of the optical feature to a circular ring structure. The position of the optical feature is then calculated by locating a center point associated with the circular ring structure.

Abstract: Embodiments of the present invention are directed to pulsed polarimeters for conducting remote, non-perturbative diagnostic measurements of inducing fields of a medium demonstrating induced optical activity. In one aspect, a pulse polarimeter includes a light source emitting a polarized light pulse having sufficiently narrow spatial extent at a prescribed wavelength and a light gathering optical system including a light gathering optic having an optic axis directed toward the medium and positioned to collect and collimate a predetermined solid angle of an emission from the medium into a collimated emission beam, while preserving the polarization state of the emission.

Abstract: A measuring apparatus that measures the polarization state of analysis target light includes a modulation section 20 that includes a retarder 22 and an analyzer 24, a light intensity information acquisition section 30 that acquires light intensity information about modulated light obtained by modulating the analysis target light at the modulation section, and a calculation section 50 that calculates a polarization characteristic element of the analysis target light based on the light intensity information. The light intensity information acquisition section acquires the light intensity information about first modulated light to Nth modulated light respectively obtained by modulating the analysis target light at the modulation section set under first to Nth principal axis direction conditions which differ in the principal axis direction of at least one of the retarder and the analyzer.

Abstract: A polarization duobinary optical transmitter is disclosed. The transmitter includes a precoder for coding an electric signal and a light source for generating continuous light. The transmitter also includes a chirped-free modulator for generating an NRZ signal including first and second polarization light beams orthogonal to each other by modulating the light with the electric signal and a band-pass filter for limiting neighbor frequency bands between the first and second polarization light beams.

Abstract: Optical systems and methods that simultaneously measure optical constants (n, k) and thickness of thin films. The systems and methods use of differential polarimetry (differential analysis of spectroscopic multi-angle reflection and ellipsometric data) to measure optical constants (n k) and thickness of ultra-thin films.

Abstract: A polarimeter for receiving input electromagnetic radiation characterized by a polarization state and for determining the polarization state. The polarimeter includes a refractive arrangement for refracting the input electromagnetic radiation so as to provide a spatial pattern corresponding to the polarization state, and an image analysis arrangement for receiving the spatial pattern, producing an electronic image of the spatial pattern, and for determining the polarization state of the input electromagnetic radiation according to the electronic image of the spatial pattern.