Spectroscopy Patents (Class 356/451)
  • Patent number: 8577639
    Abstract: A calibration assembly for a spectrometer is provided. The assembly includes a spectrometer having n detector elements, where each detector element is assigned a predetermined wavelength value. A first source emitting first radiation is used to calibrate the spectrometer. A device is placed in the path of the first radiation to split the first radiation into a first beam and a second beam. The assembly is configured so that one of the first and second beams travels a path-difference distance longer than the other of the first and second beams. An output signal is generated by the spectrometer when the first and second beams enter the spectrometer. The assembly includes a controller operable for processing the output signal and adapted to calculate correction factors for the respective predetermined wavelength values assigned to each detector element.
    Type: Grant
    Filed: February 19, 2011
    Date of Patent: November 5, 2013
    Assignee: The United States of America as Represented by the Administrator of the National Aeronautics and Space Administration
    Inventors: Robert C. Youngquist, Stephen M. Simmons
  • Publication number: 20130286402
    Abstract: There is provided a method for referencing and correcting the beating spectrum generated by the interference of the components of a frequency comb source. The proposed method allows monitoring of variations of a mapping between the source and the beating replica. This can then be used to compensate small variations of the source in Fourier transform spectroscopy or in any other interferometry application in order to overcome the accuracy and measurement time limitations of the prior art. Constraints on source stability are consequently reduced.
    Type: Application
    Filed: May 31, 2013
    Publication date: October 31, 2013
    Inventors: Philippe Giaccari, Pierre Tremblay, Philippe Saucier, Jérôme Genest, Jean-Daniel Deschênes
  • Patent number: 8570524
    Abstract: Calibration of an arbitrary spectrometer can use a stable monolithic interferometer as a wavelength calibration standard. Light from a polychromatic light source is input to the monolithic interferometer where it undergoes interference based on the optical path difference (OPD) of the interferometer. The resulting wavelength-modulated output beam is analyzed by a reference spectrometer to generate reference data. The output beam from the interferometer can be provided to an arbitrary spectral instrument. Wavelength calibration of the arbitrary spectral instrument may then be performed based on a comparison of the spectral instrument output with the reference data. By appropriate choice of materials for the monolithic interferometer, a highly stable structure can be fabricated that has a wide field and/or is thermally compensated. Because the interferometer is stable, the one-time generated reference data can be used over an extended period of time without re-characterization.
    Type: Grant
    Filed: August 3, 2010
    Date of Patent: October 29, 2013
    Assignee: University of Florida Research Foundation, Inc.
    Inventors: Xiaoke Wan, Jian Ge
  • Patent number: 8564785
    Abstract: A method of comb-based spectroscopy with synchronous sampling for real-time averaging includes measuring the full complex response of a sample in a configuration analogous to a dispersive Fourier transform spectrometer, infrared time domain spectrometer, or a multiheterodyne laser spectrometer. An alternate configuration of a comb-based spectrometer for rapid, high resolution, high accuracy measurements of an arbitrary cw waveform.
    Type: Grant
    Filed: September 16, 2010
    Date of Patent: October 22, 2013
    Assignee: The United States of America, as represented by the Secretary of Commerce, The National Institute of Standards and Technology
    Inventors: Nathan R. Newbury, Ian Coddington, William C. Swann
  • Publication number: 20130265581
    Abstract: A system for measuring a phase-matching spectral phase curve by nonlinear spectral interferometry includes a broadband light source, a first beam splitter, a first nonlinear crystal, a second nonlinear crystal and a spectrometer. The first beam splitter splits the broadband light source into a first light and a second light. The first nonlinear crystal is used for converting the first light into a third light, wherein the third light has a reference phase spectrum. The second nonlinear crystal is used for converting the second light into a fourth light which encoded a phase-matching spectral phase of the second nonlinear to crystal. The spectrometer is used for providing an interferogram from an interference between the third light and the fourth light. Thus, by analyzing the interferogram, the phase-matching spectral phase curve of the second nonlinear crystal can be measured without knowing the spectral phase of the broadband light source.
    Type: Application
    Filed: October 11, 2012
    Publication date: October 10, 2013
    Applicant: NATIONAL TSING HUA UNIVERSITY
    Inventor: Shang-Da YANG
  • Publication number: 20130258315
    Abstract: A device can be used for establishing gas concentrations in an examination volume. A radiation source is configured to generate an electromagnetic beam. A beam guiding apparatus is arranged downstream of the radiation source. The beam guiding apparatus is configured to set a plurality of variations of beam guidance of the beam entering the beam guiding apparatus in an observation plane in the examination volume. A spectrometer is arranged downstream of the beam guiding apparatus. The spectrometer is configured to carry out a spectral analysis of the beam leaving the beam guiding apparatus. An evaluation unit is configured to establish in the observation plane a 2D concentration distribution for one or more gases in the examination volume on the basis of the spectral analysis for different variations of beam guidance.
    Type: Application
    Filed: March 27, 2013
    Publication date: October 3, 2013
    Applicant: Infineon Technologies AG
    Inventors: Dieter Kohlert, Gerhard Poeppel, Franz Schreier
  • Patent number: 8526002
    Abstract: The present invention relates to a system and methods for acquiring two-dimensional Fourier transform (2D FT) spectra. Overlap of a collinear pulse pair and probe induce a molecular response which is collected by spectral dispersion of the signal modulated probe beam. Simultaneous collection of the molecular response, pulse timing and characteristics permit real time phasing and rapid acquisition of spectra. Full spectra are acquired as a function of pulse pair timings and numerically transformed to achieve the full frequency-frequency spectrum. This method demonstrates the ability to acquire information on molecular dynamics, couplings and structure in a simple apparatus. Multi-dimensional methods can be used for diagnostic and analytical measurements in the biological, biomedical, and chemical fields.
    Type: Grant
    Filed: September 8, 2008
    Date of Patent: September 3, 2013
    Assignee: Massachusetts Institute of Technology
    Inventors: Lauren DeFlores, Andrei Tokmakoff
  • Publication number: 20130222809
    Abstract: In a rough adjustment step before spectroscopic analysis, a moving mirror is moved (#1), the outputs of division elements when the interfering light of reflected light off the moving mirror and reflected light off a fixed mirror is received by a four-division sensor are totalized and variations in the contrast of the interfering light are detected (#12), and, based on the variations in the contrast, the amount of relative tilt of the two reflected light beams is detected (#13), and the initial tilt error is corrected (#14). In a fine adjustment step before the spectroscopic analysis, based on a phase difference between the outputs of the division elements when the interfering light is received by the four-division sensor, the relative tilt amount of and the tilt direction of the two reflected light beams are detected, and the initial tilt error is corrected.
    Type: Application
    Filed: July 26, 2011
    Publication date: August 29, 2013
    Applicant: KONICA MINOLTA, INC.
    Inventor: Yoshihiro Hara
  • Publication number: 20130222790
    Abstract: An interferometer (1) measures a measuring interference beam, while detecting the position of a moving mirror (16) on the basis of detection results obtained from a reference beam detector (25). In the interferometer, a reference beam source (21) is configured by including a light source (21a) composed of a semiconductor laser device. A reference optical system (20) has a collimating optical system (22) for a reference beam, said collimating optical system converting a laser beam outputted from the reference beam source (21) into a collimated beam, and the collimated beam is diagonally inputted to a fixed mirror (15).
    Type: Application
    Filed: September 6, 2011
    Publication date: August 29, 2013
    Applicant: KONICA MINOLTA INC
    Inventor: Yusuke Hirao
  • Publication number: 20130215428
    Abstract: Multiple rays such as scattered lights and fluorescent lights emitted radially in a variety of directions from each bright point in a measurement area enter an objective lens, where the multiple rays are converted into a parallel beam. The parallel beam is reflected by both a reference mirror unit and an oblique mirror unit, and the reflected beams pass through an imaging lens to form an interference image on a light-receiving surface of a detection unit. The detection of the light intensity of the interference image on the light-receiving surface enables an acquisition of the interferogram (the waveform of the change of imaging intensity) in which the light intensity continuously changes. By Fourier-converting the interferogram, spectral characteristics can be obtained which show the relative intensities for each wavelength of the lights emitted from one bright point of an object to be measured.
    Type: Application
    Filed: September 6, 2011
    Publication date: August 22, 2013
    Applicant: NATIONAL UNIVERSITY CORPORATION KAGAWA UNIVERSITY
    Inventor: Ichiro Ishimaru
  • Patent number: 8514399
    Abstract: An information acquiring apparatus includes a light source portion for generating pulse-shaped pump light, and first and second probe light in synchronization with each other. A generating portion generates terahertz pulses when irradiated with the pump light. A detecting portion detects pulses of terahertz radiation from the object. A first delay portion adjusts an optical path difference between optical paths of the pump light and the first probe light reaching the detecting portion, so that the detecting portion detects a field intensity of a fixed point on the time domain waveform of the terahertz pulse from the object, following the fixed point. A second delay portion adjusts an optical path difference between the optical path of the pump light and the second probe light reaching the detecting portion by a sum of an additional optical path adjustment amount and the optical path difference, so that the detecting portion obtains the time domain waveform.
    Type: Grant
    Filed: February 2, 2009
    Date of Patent: August 20, 2013
    Assignee: Canon Kabushiki Kaisha
    Inventors: Kousuke Kajiki, Toshihiko Ouchi
  • Publication number: 20130188192
    Abstract: A spectrometric instrument comprising: a scanning interferometer having a beamsplitter for dividing incident optical radiation into a reflected beam, following a reflected beam path and a transmitted beam following a transmitted beam path; a monochromatic optical radiation source for launching a reference beam into the interferometer along a first propagation path to be initially incident on a first face of the beamsplitter; an observation optical radiation source for launching a divergent observation beam into the interferometer along a second propagation path to be initially incident on the first face of beamsplitter and overlap the reference beam at the first face; wherein the radiation sources cooperate to generate a first angle between the directions of propagation of the two beams along respective first and second propagation paths when initially and simultaneously incident at the first face which is larger than a divergence half-angle of the observation beam 64.
    Type: Application
    Filed: April 26, 2012
    Publication date: July 25, 2013
    Applicant: FOSS ANALYTICAL A/S
    Inventors: Jacob Riis Folkenberg, Hans Larsen
  • Patent number: 8488124
    Abstract: An optical low-coherence reflectometry with spectral reception for obtaining images without coherent noise caused by self-interference of the radiation scattered from the studied object and by spurious reflections in the optical path of the system is disclosed. Two or more consecutive measurements of the interference spectrum are made. During at least one measurement of the interference spectrum by means of the interference control unit the phase between the interfering parts of the radiation is modulated by a certain law during exposure, which results in averaging and zeroing of the cross-correlation (useful) component of the registered spectrum, and during at least one additional measurement of the interference spectrum, the phase between the interfering parts of the radiation is not modulated during exposure. The phase between the interfering parts of the radiation may be set to be different in additional measurements of the interference spectrum.
    Type: Grant
    Filed: January 17, 2012
    Date of Patent: July 16, 2013
    Assignee: Limited Liability Company “Biomedical Technologies”
    Inventors: Grigory Valentinovich Gelikonov, Valentin Mikhailovich Gelikonov, Pavel Andreevich Shilyagin
  • Patent number: 8482739
    Abstract: A heterodyne photomixer spectrometer comprises a receiver photomixer that is driven at a different frequency than the source photomixer, thereby maintaining the coherent nature of the detection, eliminating etalon effects, and providing not only the amplitude but also the phase of the received signal. The heterodyne technique can be applied where the source and receiver elements are components of a waveguide thereby forming an on-chip heterodyne spectrometer.
    Type: Grant
    Filed: September 28, 2010
    Date of Patent: July 9, 2013
    Assignee: Sandia Corporation
    Inventors: Michael C. Wanke, Kevin Fortier, Eric A. Shaner, Todd A. Barrick
  • Patent number: 8477314
    Abstract: There is provided a method for referencing and correcting the beating spectrum generated by the interference of the components of a frequency comb source. The proposed method allows monitoring of variations of a mapping between the source and the beating replica. This can then be used to compensate small variations of the source in Fourier transform spectroscopy or in any other interferometry application in order to overcome the accuracy and measurement time limitations of the prior art. Constraints on source stability are consequently reduced.
    Type: Grant
    Filed: June 26, 2008
    Date of Patent: July 2, 2013
    Assignee: Université Laval
    Inventors: Philippe Giaccari, Jerome Genest, Pierre Tremblay, Philippe Saucier, Jean-Daniel Deschênes
  • Patent number: 8472027
    Abstract: A spectral interferometry apparatus and method is provided to supply unambiguous profiles (A-scans free of mirror terms) of the reflectivity versus optical path difference and make difference between the positive and negative optical path difference or provide output in a selected interval of optical path differences. The apparatus comprises object optics that transfer a beam from an optical source to a target object (55) to produce an object beam and reference optics that produce a reference beam. Displacing means (57) are provided to produce a gap (g) between the object beam (41?) and the reference beam (42?). Optical spectrum dispersing means (7) such as a grating or a prism receive the two relatively displaced beams, and disperse their spectral content onto a reading element such as a CCD.
    Type: Grant
    Filed: July 8, 2011
    Date of Patent: June 25, 2013
    Assignee: University of Kent
    Inventor: Adrian Podoleanu
  • Publication number: 20130155412
    Abstract: A spectrum detecting device including a laser apparatus, an optical splitting apparatus, an optical gate, a first polarizer, a second polarizer, and an optical analysis apparatus is provided. The optical splitting apparatus splits the laser beam providing from the laser apparatus into a first and a second light beam, and the second light beam is transmitted to a sample to produce a spectral signal. The optical gate activated by the first light beam is disposed between the optical analysis apparatus and the sample. The first polarizer is disposed between the sample and the optical gate, and the second polarizer is disposed between the optical gate and the optical analysis apparatus. The spectral signal passes through the first polarizer, the optical gate, and the second polarizer to be transmitted and received to the optical analysis apparatus when the optical gate is activated and turned on in a predetermined time period.
    Type: Application
    Filed: October 2, 2012
    Publication date: June 20, 2013
    Applicant: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
    Inventor: Industrial Technology Research Institute
  • Patent number: 8465202
    Abstract: A microstructured sensor for detecting IR radiation includes: one measuring channel having a measuring diaphragm, on which a first sensitive detector surface is implemented for the absorption of a first IR radiation; and one reference channel having a reference diaphragm, on which a second sensitive detector surface is implemented for the absorption of a second IR radiation. A measuring structure, e.g., a thermopile measuring structure as a series circuit made of thermocouple pairs, is implemented between the measuring diaphragm and the reference diaphragm for measuring a temperature differential between the measuring diaphragm and the reference diaphragm. First and second thermal contacts lie alternately on the two diaphragms.
    Type: Grant
    Filed: September 29, 2010
    Date of Patent: June 18, 2013
    Assignee: Robert Bosch GmbH
    Inventors: Udo Kaess, Christian Lemier, Markus Niemann
  • Patent number: 8462347
    Abstract: A method for monitoring of siloxane compounds in a biogas includes the step of generating a first absorption spectrum based on a ratio of a first spectral measurement and a second spectral measurement. The first spectral measurement is from a non-absorptive gas having substantially no infrared absorptions in a specified wavelength range of interest and the second spectral measurement is from a sample gas comprising the biogas. The method also includes the step of calculating a concentration of at least one siloxane compound in the biogas using a second absorption spectrum based on, at least, a first individual absorption spectrum for a known concentration of the at least one siloxane compound.
    Type: Grant
    Filed: March 9, 2010
    Date of Patent: June 11, 2013
    Assignee: MKS Instruments, Inc.
    Inventors: Charles Mark Phillips, Barbara Marshik-Geurts, Leonard I. Kamlet, Martin L. Spartz, Vidi Saptari
  • Publication number: 20130141731
    Abstract: An optical interference apparatus of detecting an object is provided. The optical interference apparatus includes a light source capable of emitting a light beam, an optical coupler, a reflector, a first lens set and a light sensing unit. The optical coupler is capable of dividing the light beam into a measuring sub-light beam and a reference sub-light beam. The reflector reflects the reference sub-light beam. The first lens set includes a first lens. The measuring sub-light beam is transmitted to the object. The object reflects or scatters a part of the measuring sub-light beam back to the first lens. The first lens is capable of extending a depth of field of the first lens set. The light sensing unit is adapted to detect an interference signal formed by the reference sub-light beam and the measuring sub-light beam.
    Type: Application
    Filed: February 1, 2012
    Publication date: June 6, 2013
    Applicant: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
    Inventor: Chuan-Chung Chang
  • Publication number: 20130135614
    Abstract: Current apparatuses and methods for analysis of spectroscopic optical coherence tomography (SOCT) signals suffer from an inherent tradeoff between time (depth) and frequency (wavelength) resolution. In one non-limiting embodiment, multiple or dual window (DW) apparatuses and methods for reconstructing time-frequency distributions (TFDs) that applies two windows that independently determine the optical and temporal resolution is provided. For example, optical resolution may relate to scattering information about a sample, and temporal resolution may be related to absorption or depth related information. The effectiveness of the apparatuses and methods is demonstrated in simulations and in processing of measured OCT signals that contain fields which vary in time and frequency. The DW technique may yield TFDs that maintain high spectral and temporal resolution and are free from the artifacts and limitations commonly observed with other processing methods.
    Type: Application
    Filed: January 24, 2011
    Publication date: May 30, 2013
    Inventors: Adam Wax, Robert N. Graf, Francisco E. Robles
  • Publication number: 20130135622
    Abstract: A quasi-translator for economically producing pure, smooth translational motion with broad arcuate or error-free motion regardless of orientation, which is useful in numerous interferometer applications including spectroscopy, a Fourier modulator and a Fourier spectrometer are provided. The quasi-translator utilizes a support, an arm including a driving magnet on a first end and a driven element on a second end, an axis for rotation of the arm, a bearing system that controls the rotation of the arm about the axis, a drive coil and a drive amplifier to drive the arm in the arcuate motion. The quasi-translator may be employed in a Fourier modulator to change the optical path difference of the interferometer/quasi-translator at a substantially constant rate of change. The quasi-translator and/or Fourier modulator may be used in a Fourier spectrometer to create an optical spectrum from a light beam and/or electrical signal created from the light beam.
    Type: Application
    Filed: November 21, 2012
    Publication date: May 30, 2013
    Applicant: FTRX LLC
    Inventor: FTRX LLC
  • Publication number: 20130128275
    Abstract: The interference optical system includes a light source, a collimator, a light-receiving element, a tunable filter, and a calculation apparatus. The collimator emits measuring light from the light source to a first main surface of the object, and receives reflected light from the first main surface and a second main surface. The light-receiving element acquires an intensity of light from the collimator. The tunable filter sweeps a wavelength of the light incident to the light-receiving element. The calculation apparatus measures an interference intensity distribution that has wavelength dependence and is an intensity distribution of the reflected light from the first main surface and the second main surface, and measures the thickness or the temperature of the object based on a waveform obtained by Fourier transforming the interference intensity distribution.
    Type: Application
    Filed: November 1, 2012
    Publication date: May 23, 2013
    Applicant: TOKYO ELECTRON LIMITED
    Inventor: TOKYO ELECTRON LIMITED
  • Publication number: 20130107269
    Abstract: Every depth of the measurement object measures energy structural information, refractive index, transmittance, reflectance other than property information of (as for the resolution several microns), e.g., space information at the same time. A spectrum measurement device receives a reference wave propagating in a reference path and a measurement wave propagating in a measurement path having a start point same as a start point of the reference path, and derives a spectrum of the measurement wave. The space information of the measuring object, energy structural information, refractive index, transmittance, a reflective index using spectrum measurement device are derived.
    Type: Application
    Filed: March 17, 2011
    Publication date: May 2, 2013
    Applicant: National University Corporation Nagaoka University of Technology
    Inventor: Tatsutoshi Shioda
  • Publication number: 20130107270
    Abstract: The reported invention belongs to spectral interference devices and can be used for spectral research in various fields of technology. The objective of the present invention is to improve the optical characteristics of the spectrometer in which reduced loss of light from the radiation object on aberration is attained with a minimum number of optical elements produced at lower costs. The objective is achieved by the fact that the static Fourier spectrometer contains an input collimator optically coupled with the interferometric unit consisting of a beam splitter and at least two mirrors installed with the ability to create an interference image localized in the plane of the mirrors, and an image recording device optically coupled with the interferometric unit by means of the projective system with the ability to project the figure of the indicated interference image on the image recording device.
    Type: Application
    Filed: June 7, 2011
    Publication date: May 2, 2013
    Inventors: Alexander Anatolyevich Stroganov, Alexandr Olegovich Belash, Dmitrii Lvovich Bogachev, Vasilii Andreevich Senichenkov
  • Patent number: 8406580
    Abstract: A transform spectrometer measurement apparatus and method for a planar waveguide circuit (PLC). The spectrometer typically includes an input optical signal waveguide carrying an input optical signal; a plurality of couplers, each connected to the input optical signal waveguide, and each including a coupler output for carrying a coupled optical signal related to the input optical signal; and an array of interleaved, waveguide Mach-Zehnder interferometers (MZI), each having at least one input MZI waveguide, each MZI input waveguide receiving a coupled optical signal from a respective coupler output. A phase shifting circuit is applied to at least one arm of the MZIs to induce an active phase shift on the arm to thereby measure phase error in the MZIs. Light output from the MZIs is measured under intrinsic phase error conditions and after an active phase shift by the phase shifting circuit.
    Type: Grant
    Filed: July 28, 2011
    Date of Patent: March 26, 2013
    Assignees: AiDi Corporation, GUNMA University
    Inventors: Kazumasa Takada, Katsunari Okamoto
  • Patent number: 8405406
    Abstract: A detection apparatus and an imaging apparatus are capable of accurately conducting non-destructive observation of a target by using an incoherent electromagnetic wave. The detection apparatus has a generating section, a first coupler section, a delaying section, a second coupler section and a signal processing section. The generating section 101 includes a coherent electromagnetic wave source 102 and a diffusing section 103 for generating a pseudoincoherent electromagnetic wave by changing a propagation state of the coherent electromagnetic wave in accordance with a code pattern. The incoherent electromagnetic wave is split into first and second waves and the first wave is affected by the target of observation while the second wave is delayed by the delaying section. The first and second waves are then coupled to produce a coupled wave having a correlation signal of them and the signal is utilized to acquire information on the inside of the target of observation.
    Type: Grant
    Filed: March 27, 2008
    Date of Patent: March 26, 2013
    Assignee: Canon Kabushiki Kaisha
    Inventor: Takeaki Itsuji
  • Patent number: 8395780
    Abstract: An optical assembly for use in coherent two- or more-dimensional optical spectroscopy includes a beam splitter that splits a base light pulse into first, second, third and fourth light pulse and a delay element that varies the arrival times of the first to fourth light pulses at a sample location with respect to each other. The beam splitter includes a cross-grating a first reflector arranged to receive the first to fourth light pulses emerging from the cross-grating and to reflect the same in parallel to each other, a second reflector arranged to receive the first to fourth light pulses from the delay element and to focus the same at the sample location, wherein the delay element is arranged between first and second reflectors. Also shown is an apparatus including such optical assembly and a method for carrying out two- or more-dimensional optical spectroscopy using the assembly.
    Type: Grant
    Filed: December 8, 2010
    Date of Patent: March 12, 2013
    Assignee: Julius-Maximilians-Universitat Wurzburg
    Inventors: Tobias Brixner, Ulrike Selig, Florian Langhojer, Carl-Friedrich Schleuβner
  • Publication number: 20130044327
    Abstract: In the field of Fourier transform interferometry and in particular a device and a method for improving the precision of such a device for remotely analysing a gaseous compound, a Fourier transform interferometer includes: at least one movable retroreflector; a metrology subsystem using at least three laser beams; and a metrology unit generating, for each sounding point represented by a pixel on the capture matrix imaging a gaseous compound, a metrology signal incorporating the displacements in space of the movable element(s).
    Type: Application
    Filed: March 15, 2012
    Publication date: February 21, 2013
    Applicant: THALES
    Inventors: Jean-Michel GAUCEL, Didier MIRAS
  • Publication number: 20130038880
    Abstract: An apparatus for interrogating wavelength-specific devices has a broadband optical source to illuminate an interferometer which provides a low coherence temporal interferogram. At least one array of wavelength-specific devices, such as fiber Bragg gratings connected in series with one another, receives the interferogram, so that each device interacts with a limited range of wavelength bandwidth relative to the bandwidth of the broadband optical source. Instead of illuminating an interferometer with the output of an array of devices which have each interacted with a broadband light source at their own characteristic wavelengths, therefore, an interferometer is used to modulate the output from a broadband source to produce a low coherence interferogram. The array of devices then extracts or filters a higher coherence interferogram from this low coherence interferogram.
    Type: Application
    Filed: December 21, 2010
    Publication date: February 14, 2013
    Applicant: Waterford Institute of Technology
    Inventor: Kieran O'Mahoney
  • Patent number: 8373112
    Abstract: The disclosure relates to a cold atom interferometry sensor that includes: a source of atoms; a dual-frequency laser capable of generating a first Raman dual-frequency laser beam; a reflector arranged so as to reflect the first Raman dual-frequency laser beam in order to generate a second Raman dual-frequency laser beam, the first laser beam and the second laser beam propagating in different directions in order to obtain atomic interference fringes from the emission of cold atoms obtained from the atom source; characterized in that the reflector is further arranged so as to enable multiple reflections of the first beam on surfaces of the reflector, so that the first beam and the multiple reflections thereof allow the capture of atoms from the atom source in order to obtain the cold atoms.
    Type: Grant
    Filed: March 11, 2009
    Date of Patent: February 12, 2013
    Assignees: CNRS, Observatoire de Paris
    Inventors: Philippe Bouyer, Arnaud Landragin
  • Publication number: 20130027711
    Abstract: An optical coherence tomography (OCT) system comprising: a splitter configured to receive and split an optical source beam generating a reference beam and a sample beam, the sample beam directed at a sample and interacting with the sample to generate a return beam; a delay module configured to receive and introduce an optical delay in the reference beam, to generate a delayed reflected beam configured to interfere with the return beam to generate an interferogram; a spatial filter system capable of filtering randomly scattered light from at least one of the return beam or the interferogram; and a detector array to receive the interferogram for spatial and spectral analysis.
    Type: Application
    Filed: July 29, 2011
    Publication date: January 31, 2013
    Inventors: Arsen R. HAJIAN, Bradford B. BEHR, Jeffrey T. MEADE, Andrew T. CENKO
  • Publication number: 20130015367
    Abstract: An apparatus includes a transverse scanning optical system in the path of a first light beam traveling along a first optic axis; a wavefront correction system in the path of a second light beam traveling along a second optic axis, the wavefront correction system including a wavefront correction device having a spatial phase profile on its surface; a beam combiner that receives the first light beam and the second light beam and outputs an interference beam having a beat frequency equal to a difference frequency between the first light beam and second light beam; and a detection system placed relative to a random scattering medium, which is in the path of the interference beam. The detection system detects measurement light produced by the random scattering medium while the interference beam strikes the random scattering medium.
    Type: Application
    Filed: January 18, 2012
    Publication date: January 17, 2013
    Applicant: Howard Hughes Medical Institute
    Inventor: Meng Cui
  • Patent number: 8345256
    Abstract: A method is provided to calibrate a detection array used for acquiring an image of an interferogram at an instrument. A first interferogram and at least two shifted interferograms are elaborated at the instrument by creating a number of optical path differences, so at least three samples are on a sine wave portion for each optical path difference. A function coinciding with the sine wave portion is determined by interpolation. A calibration coefficient is determined from the function for each optical path difference.
    Type: Grant
    Filed: November 20, 2009
    Date of Patent: January 1, 2013
    Assignee: Centre National d'Etudes Spatiales
    Inventors: Elodie Cansot, Alain Rosak
  • Publication number: 20120287439
    Abstract: Provided is a small, highly accurate Fourier spectrometer which enables highly accurate detection of an optical path difference in an interferometer. An element for changing to a narrow band is provided to return reflected light to a second light source (4), and the wavelength of light emitted by the second light source is locked, whereby the position of a movable mirror (8) is measured highly accurately and an optical path length (1) and an optical path length (2) match highly accurately.
    Type: Application
    Filed: December 8, 2010
    Publication date: November 15, 2012
    Applicant: KONICA MINOLTA HOLDINGS, INC.
    Inventor: Yusuke Hirao
  • Publication number: 20120274943
    Abstract: An improved interferometer measurement system is presented. In a preferred embodiment, a chirped fiber Bragg grating is used as a reference surface in a Fizeau interferometer arrangement for optical coherence tomography imaging of the eye. The grating creates a virtual reference surface near the sample and allows for a relatively short reference arm while maintaining close to zero delay interference conditions.
    Type: Application
    Filed: April 26, 2012
    Publication date: November 1, 2012
    Applicant: Carl Zeiss Meditec, Inc.
    Inventor: Alexandre R. Tumlinson
  • Patent number: 8300228
    Abstract: Methods and apparatus for selectively driving the vibrations of normal modes of a target molecule into coherence using stimulated Raman scattering. In concert, many vibrations produce a larger anti-Stokes signal than a single vibration. The same illumination does not drive other molecules to have coherent vibrations, so these molecules produce a weaker signal. Target and confounder molecules can be distinguished by pulses that drive many vibrations coherently, with applications in coherent Raman microspectroscopy.
    Type: Grant
    Filed: October 20, 2009
    Date of Patent: October 30, 2012
    Assignee: The Board of Trustees of the University of Illinois
    Inventors: Daniel L. Marks, Joseph B. Geddes, III, Stephen A. Boppart
  • Patent number: 8300229
    Abstract: This invention relates generally to the systems and methods for standoff trace chemicals detection such as explosives residue and others, and particularly to optical devices and the methods of their use based on sensing of gases and residue materials. This sensing includes detection and measurement of optical absorption spectra and relative concentration of the chemical followed by the chemical identification based on these spectral data. The sensing is based on photothermal interferometry method improved by implementation of coherent optical detection. The coherent optical detection is performed by an integrated polarization-diversity coherent receiver with an electro-optic phase modulator for a local oscillator optical beam. The implementation of pulsed probe sensing and local oscillator optical beams in the coherent detection improves the device with better eye safety performance.
    Type: Grant
    Filed: December 11, 2009
    Date of Patent: October 30, 2012
    Assignee: CeLight, Inc.
    Inventors: Pak Shing Cho, Geoffrey Harston
  • Publication number: 20120257207
    Abstract: A device (10) and methods for simultaneously measuring the thickness of individual wafer layers, the depth of etched features on a wafer, and the three-dimensional profile of a wafer. The structure of the device (10) is comprised of a source/receiver section (12) having a broadband source (14), a receiver (16) and a signal processing section (20). An interferometer (28) separates or combines measurement and reference light and has a measurement leg (30) and a reference leg (34), and a reference mirror (36). The device (10) analyzes a received spectrum which is comprised of a measurement of intensity versus wavelength. There are two measurement methods disclosed: the first method is utilized for taking a single measurement and the second method is utilized for multiple measurements.
    Type: Application
    Filed: April 8, 2011
    Publication date: October 11, 2012
    Inventors: David S. Marx, David L. Grant
  • Publication number: 20120253721
    Abstract: Various systems and methods for analysis of optical pulses are provided. In one embodiment, a method is provided including obtaining a plurality of traces produced by propagating an unknown pulse and a reference pulse along a pair of crossing trajectories through a spectrometer, where each trace is associated with a delay between the unknown pulse and the reference pulse. Each trace is spatially filtered to generate a plurality of spatially filtered electric field measurements, which are temporally filtered to generate a plurality of temporally filtered electric field measurements. The plurality of temporally filtered electric field measurements are concatenated based at least in part upon the delay associated with the corresponding trace to generate a concatenated wave form corresponding to the unknown pulse.
    Type: Application
    Filed: March 29, 2011
    Publication date: October 4, 2012
    Applicant: GEORGIA TECH RESEARCH CORPORATION
    Inventors: Jacob Cohen, Pamela Bowlan, Rick Trebino
  • Publication number: 20120250025
    Abstract: A system for grading an agricultural product employing hyper-spectral imaging and analysis. The system includes at least one light source for providing a beam of light, an interferometer or a prism array for dispersing electromagnetic radiation emitted from said agricultural product into a corresponding spectral image, a light measuring device for detecting component wavelengths within the corresponding spectral image and a processor operable to compare the detected component wavelengths to a database of previously graded agricultural products to identify and select a grade for the agricultural product. A method for grading an agricultural product via hyper-spectral imaging and analysis is also provided.
    Type: Application
    Filed: September 2, 2010
    Publication date: October 4, 2012
    Inventors: Danny S. Moshe, Henry M. Dante, Seetharama C. Deevi, Curtis M. Hinton
  • Publication number: 20120242997
    Abstract: In cavity ring-down spectroscopy (CRDS), scattering into the backward mode of a traveling wave ring-down cavity can degrade conventional CRDS performance. We have found that this performance degradation can be alleviated by measuring the backward mode signal emitted from the ring-down cavity, and using this signal to improve the processing for extracting ring-down times from the measured data. For example, fitting an exponential to the sum of the intensities of the forward and backward signals often provides substantially better results for the ring-down time than fitting an exponential to the forward signal alone. Other possibilities include extracting cavity eigenmode signals from the forward and backward signals and performing separate exponential fits to the eigenmode signals.
    Type: Application
    Filed: March 18, 2011
    Publication date: September 27, 2012
    Inventors: Yonggang He, Sze Meng Tan, Bruce A. Richman
  • Patent number: 8269974
    Abstract: The device is a gas/vapor/aerosol/particulate sensor with a receiver/transmitter option. This optical MEMS device is designed to be a self-contained optical bench, integrating of an entire interferometer into a MOEMS ‘optical bench’ system-on-a-chip, and includes multiplexed optical path sensors. The sensing structures consist of laser sources, semiconductor photo detectors, refractive/reflective optical elements, and specialized optical transmission paths. Each individual laser source and photodiode is an optical path sensor with a particular ‘functionalization.’ These sensing arm functionalizations are sensitive to unique chemical signatures and as a result can recognize and report various chemical agents present in the ambient environment.
    Type: Grant
    Filed: June 22, 2009
    Date of Patent: September 18, 2012
    Assignee: University of South Florida
    Inventor: William M. Ash, III
  • Publication number: 20120212731
    Abstract: Described are methods for multi-wavelength cavity ring-down spectroscopy; comprising simultaneously and continuously irradiating an optical cavity with light at two or more different wavelengths, each light being intensity-modulated at a different modulation frequency, detecting the light of two or more wavelengths after the light has travelled through the optical cavity; measuring an optical loss of each detected light; and determining a characteristic of the optical cavity from the optical loss of each detected light. Also described are apparatus and systems for multi-wavelength cavity ring-down spectroscopy.
    Type: Application
    Filed: February 22, 2012
    Publication date: August 23, 2012
    Inventors: Hans-Peter Loock, Helen Waechter
  • Publication number: 20120194822
    Abstract: A four port scanning Michelson interferometer suppresses self-emission by using either a beamsplitter that is uncoated or a beamsplitter that has reflection enhancing dielectric coatings in the splitting and combining areas of the substrate on opposite sides of the substrate. Both beamsplitters are fabricated from infrared optical materials that have a predetermined absorptivity in a predetermined wavelength interval which is from 2 ?m (5000 cm?1) to 13 ?m (770 cm?1) in the infrared. The optical materials of the uncoated beamsplitter are selected from a group of materials made up of ZnSe, ZnS, CdS, CdTe, Silicon, Germanium or Diamond. The optical materials of the other beamsplitter are selected from a group of materials made up of KBr, KCl, NaCl, CsI, BaF, CaF and the like.
    Type: Application
    Filed: January 30, 2012
    Publication date: August 2, 2012
    Applicant: ABB BOMEM INC.
    Inventor: Henry L. Buijs
  • Publication number: 20120194821
    Abstract: A colorimetric sensor includes an etalon including a first substrate, a second substrate facing the first substrate, a fixed mirror formed on a surface of the first substrate facing the second substrate, and a movable mirror formed on the second substrate so as to face the fixed mirror with a prescribed gap therebetween, a light receiving element that receives a test subject light having passed through the etalon, and a holding member holding the etalon. The etalon includes a light interference area facing the first and second substrates in a plan view as seen in a thickness direction of the substrate, and a protruding area protruding from the light interference area. The holding member holds the etalon at one end side of the protruding area opposite to the light interference area.
    Type: Application
    Filed: January 25, 2012
    Publication date: August 2, 2012
    Applicant: SEIKO EPSON CORPORATION
    Inventor: Takeshi NOZAWA
  • Publication number: 20120188552
    Abstract: A variable wavelength interference filter includes a fixed substrate having a fixed reflecting film, a movable substrate having a movable reflecting film, and an electrostatic actuator including a fixed electrode and a movable electrode. The fixed electrode includes first and second fixed partial electrodes electrically isolated from each other. First and second extraction electrodes extending from the first and second fixed partial electrodes, respectively, are formed on the fixed substrate. The movable electrode is formed in a ring shape covering first and second facing regions facing the first and second fixed partial electrodes, respectively.
    Type: Application
    Filed: January 19, 2012
    Publication date: July 26, 2012
    Applicant: SEIKO EPSON CORPORATION
    Inventor: Nozomu HIROKUBO
  • Publication number: 20120182560
    Abstract: The invention relates to optical low-coherence reflectometry with spectral reception and may be used for obtaining images without coherent noise caused by self-interference of the radiation scattered from the studied object and by spurious reflections in the optical path of the system. Two or more consecutive measurements of the interference spectrum are made. During at least one measurement of the interference spectrum by means of the interference control unit the phase between the interfering parts of the radiation is modulated by a certain law during exposure, which results in averaging and, hence, zeroing of the cross-correlation (useful) component of the registered spectrum, and during at least one additional measurement of the interference spectrum, the phase between the interfering parts of the radiation is not modulated during exposure. The phase between the interfering parts of the radiation may be set to be different in additional measurements of the interference spectrum.
    Type: Application
    Filed: January 17, 2012
    Publication date: July 19, 2012
    Applicant: Limited Liability Company "Biomedical technologies"
    Inventors: Grigory Valentinovich Gelikonov, Valentin Mikhailovich Gelikonov, Pavel Andreevich Shilyagin
  • Patent number: 8213008
    Abstract: Systems and methods for performing spectral-spatial mapping in (one and two dimensions) and coded spectroscopy are described. At least one embodiment includes a system for performing spectral-spatial mapping and coded spectroscopy comprising a cylindrical beam volume hologram (CBVH), the CBVH configured to receive input beams and generate diffracted beams in a first direction to perform spectral-spatial mapping, the CBVH further configured to allow input beams to pass in a second direction orthogonal to the first direction unaffected. The system further comprises a first lens configured to receive the diffracted beams and perform a Fourier transform on the input beams in the first direction, a second lens configured to receive the diffracted beams and focus the beams in the second direction to generate output beams, and a charged coupled device (CCD) configured to receive the outputs beams, the output beams used to provide spectral analysis of the input beams.
    Type: Grant
    Filed: July 31, 2007
    Date of Patent: July 3, 2012
    Assignee: Georgia Tech Research Corporation
    Inventors: Omid Momtahan, Chao Ray Hsieh, Ali Adibi
  • Patent number: RE44007
    Abstract: A spectroscopic ellipsometer comprising a light source (1) emitting a light beam, a polarizer (2) placed on the path of the light beam emitted by the light source, a sample support (9) receiving the light beam output from the polarizer, a polarization analyzer (3) for passing the beam reflected by the sample to be analyzed, a detection assembly which receives the beam from the analyzer and which comprises a monochromator (5) and a photodetector (4), and signal processor means (6) for processing the signal output from said detection assembly, and including counting electronics (13). Cooling means (12) keep the detection assembly at a temperature below ambient temperature, thereby minimizing detector noise so as to remain permanently under minimum photon noise conditions. It is shown that the optimum condition for ellipsometric measurement is obtained by minimizing all of the sources of noise (lamps, detection, ambient).
    Type: Grant
    Filed: June 8, 2001
    Date of Patent: February 19, 2013
    Assignee: Fahrenheit Thermoscope LLC
    Inventor: Frederic Ferrieu