Abstract: Apparatus and methods for providing SRAM timing tracking cell circuits are disclosed. In an embodiment, an apparatus comprises an SRAM array comprising static random access memory cells arranged in rows and columns; a plurality of word lines each coupled to memory cells along one of the rows; a clock generation circuit for outputting clock signals; a word line generation circuit for generating a pulse on the plurality of word lines responsive to one of the clock signals and for ending the pulse responsive to one of the clock signals; and a tracking cell for receiving a clock signal and for outputting a word line pulse end signal to the clock generation circuit, following an SRAM tracking time; wherein the tracking cell further comprises SRAM tracking circuits positioned in the SRAM array and coupled in series to provide a signal indicating the SRAM tracking time. Methods for SRAM timing are disclosed.

Abstract: A semiconductor memory device includes a first internal clock generation circuit configured to generate a first internal clock by compensating an external clock signal for a transfer delay thereof in the semiconductor memory device, a control voltage generation circuit configured to generate a control voltage in response to a profile selection signal, a second internal clock generation circuit configured to generate a second internal clock signal by delaying the first internal clock signal by a time corresponding to the control voltage, a selection output circuit configured to select one of the first internal clock signal and the second internal clock signal in response to a path selection signal and output a selected signal as a synchronization clock signal, and a data output circuit configured to output a data in synchronization with the synchronization clock signal.

Abstract: Examples of command latency systems and methods are described. In some examples, phase information associated with a received command signal is stored, a received command signal is propagated through a reduced clock flip-flop pipeline and the delayed command signal is combined with the stored phase information. The reduced clock flip-flop pipeline may use a clock having a lower frequency than that used to issue the command signal. Accordingly, fewer flip-flops may be required.

Abstract: A clock control circuit includes a first clock buffer configured to toggle a first clock signal when a self-refresh exit command signal is inputted during a self-refresh operation; and a second clock buffer configured to toggle a second clock signal when the self-refresh operation is finished, the second clock being provided to internal circuits.

Abstract: A device and method to perform memory operations at a clock domain crossing is disclosed. In a particular embodiment, a method includes providing a first clock signal to a write clock input of a memory to write data to the memory. The data is read from the memory according to a second clock signal that is different from the first clock signal. A third clock signal is provided to a read clock input of the memory. The third clock signal has a frequency that is substantially an integer multiple of a frequency of the second clock signal. The integer multiple is greater than one.

Abstract: A latency circuit comprises a latency control block, an internal read command generator, and a latency signal generation unit. The latency control block generates a plurality of first control clocks by delaying a delay sync signal generated based on an external clock, and generates a second control clock having a margin with respect to a read command decoded based on the delay sync signal. The internal read command generator samples the second control clock using the decoded read command and generates an internal read command based on a sampled second control clock. The latency signal generation unit generates a latency signal based on a shifting operation performed on the internal read command using the plurality of first control clocks.

Abstract: A nonvolatile memory apparatus includes a memory device having a configuration information storage block for storing a first configuration data group and a second configuration data group having fewer bits than the first configuration data group and a configuration information processing circuit configured to determine a majority of the first configuration data group outputted from the memory device, during a first period of a power-up operation, and determine a majority of the second configuration data group outputted from the memory device, during a second period after the first period.

Abstract: A clock mode configuration circuit for a memory device is described. A memory system includes any number of memory devices serially connected to each other, where each memory device receives a clock signal. The clock signal can be provided either in parallel to all the memory devices or serially from memory device to memory device through a common clock input. The clock mode configuration circuit in each memory device is set to a parallel mode for receiving the parallel clock signal, and to a serial mode for receiving a source synchronous clock signal from a prior memory device. Depending on the set operating mode, the data input circuits will be configured for the corresponding data signal format, and the corresponding clock input circuits will be either enabled or disabled. The parallel mode and the serial mode is set by sensing a voltage level of a reference voltage provided to each memory device.

Abstract: In a low-power signaling system, an integrated circuit device includes an open loop-clock distribution circuit and a transmit circuit that cooperate to enable high-speed transmission of information-bearing symbols unaccompanied by source-synchronous timing references. The open-loop clock distribution circuit generates a transmit clock signal in response to an externally-supplied clock signal, and the transmit circuit outputs a sequence of symbols onto an external signal line in response to transitions of the transmit clock signal. Each of the symbols is valid at the output of the transmit circuit for a symbol time and a phase offset between the transmit clock signal and the externally-supplied clock signal is permitted to drift by at least the symbol time.

Abstract: A semiconductor memory device includes an internal clock signal generator configured to generate an internal clock signal by dividing a frequency of an external clock signal; a default latency determiner configured to determine a default latency in outputting a signal; and a latency reflector configured to, for each of consecutive commands, selectively add a half latency equal to a half cycle of the internal clock signal to the default latency in response to a half latency selection information signal.

Abstract: A data output control circuit controls a data output in a read operation. A data output control method includes a count shifting mode and a delay mode and can be used in low and high frequency operations, so that a data output can be stably controlled in a broad frequency range. The data output control circuit includes: a low frequency mode controller a high frequency mode controller and a selector selecting any one of first and second command signals through CAS latency information to be output as a data output control signal.

Abstract: A system and method for gate training in a memory system is disclosed. In one embodiment, in a method for calibrating read data strobe gating, a first read command is issued to a memory module. A first DQS gate signal is issued before the beginning of the preamble of a first DQS signal received from the memory module that corresponds to the first read command. A second read command is issued to the memory module such that the preamble of a second DQS signal received from the memory module that corresponds to the second read command is adjacent to the postamble of the first DQS signal. Then, a second DQS gate signal is issued at a preset time after the first DQS gate signal. The second DQS signal is sampled repeatedly to locate the preamble of the second DQS signal.

Abstract: A first clock is received by a memory macro. In response to a first clock transition of the first clock, a first transition of a second clock and of a third clock is generated. A tracking transition of a tracking signal is caused by the second clock. Based on a later transition of a second clock transition of the first clock and the tracking transition of the tracking signal, a second transition of the third clock is generated. The third clock is for use by an input-output of the memory macro.

Abstract: An output enable signal generation circuit includes a latency decoder, a latch unit, a latency multiplexer, and an enable setting unit. The latency decoder is configured to decode a mode register set code and generate first and second CAS latency information. The latch unit is configured to output the latched first and second latency information as first and second latency signals. The latency multiplexer is configured to output the first or second latency signal as an output CAS latency signal in response to a chip select signal. The enable setting unit is configured to set an enable timing of an output enable signal.

Abstract: A semiconductor system includes a first clock channel and a second clock channel. The first clock channel transmits a first clock signal from a controller to a memory. The second clock channel transmits a second clock signal with a phase difference of 90° from the first clock signal, from the controller to the memory.

Abstract: A semiconductor memory device using system clock with a high frequency can maintain a constant operation margin even in the change of operation environments including voltage level, temperature, and process. The semiconductor memory device includes an output control signal generator configured to be responsive to a read pulse that is activated in response to a read command, to generate an odd number of first output source signals corresponding to a rising edge of a system clock and a even number of second output source signals corresponding to a falling edge of the system clock, and an output enable signal generator configured to generate a first rising enable signal and a falling enable signal on the basis of the first output source signal and generate a second rising enable signal on the basis of the second output source signal, according to column address strobe (CAS) latencies, the first rising enable signal being activated earlier than the second rising enable signal by a half cycle of the system clock.

Abstract: An arrangement of memory devices and a controller is based on an interface with a reduced pin count relative to a known memory device and controller arrangement. Facilitating the reduced pin count interface the reduction of multiple strobe signal to a single strobe signal. In addition, a packet header transmitted on the data bus followed by a payload, includes an encoded indication of the type of the payload. Aspects of the present application relate to providing a traditional memory device with external logic devices, where the logic devices handle the single strobe and the packet header, thereby permitting single strobe operation.

Abstract: A content addressable memory device capable of making simultaneous pursuit of low power consumption and speeding up is provided. A match amplifier A determines coincidence or non-coincidence of search data and data stored in a content addressable memory in an entry of a memory array A, according to a voltage of a match line MLA. A match amplifier B determines coincidence or non-coincidence of search data and data stored in a content addressable memory in an entry of a memory array B, according to a voltage of a match line MLB. A block-B control circuit directs to start searching in the memory array B after two cycles after searching has been started in the memory array A. A block-B activation control circuit directs to stop searching in the memory array B according to a voltage of the match line MLA after searching in the memory array A.

Abstract: A method and apparatus is provided for idling a clock synchronizing circuit during at least a portion of time during execution of a refresh operation in a memory device. In a memory device receiving an external clock signal, a method and apparatus for executing a refresh operation is provided that includes initiating at least one refresh operation in the memory device, and ceasing generation of an internal clock signal timed with respect to the external clock signal for at least a portion of the time in which at least one refresh operation takes to complete.

Abstract: A semiconductor device includes a selection circuit and a phase detector. The selection circuit, in response to a first selection signal output from a controller, outputs as a timing signal a first clock signal output from the controller or an output signal of a PLL using the first clock signal as a first input. The phase detector generates a voltage signal indicating a phase difference between a second clock signal output from the controller and the timing signal output from the selection circuit. The semiconductor device further includes a data port, a memory core storing data, and a serializer, in response to the timing signal output from the selection circuit, serializing data output from the memory core and outputting serialized data to the controller via the data port. The controller generates the first selection signal based on at least one of the voltage signal and the serialized data.

Abstract: The data access apparatus comprises a phase locked loop (PLL) and a data receiving circuit. The PLL provides a plurality of internal clocks and selecting a strobe clock from the plurality of internal clocks according to a phase selection signal. The data receiving circuit comprises a latching module, for latching of the data signal according to trigger of the strobe clock and a calibrating circuit, for generating the phase selection signal for matching the data with a predetermined data according to the plurality of internal clocks in a training mode and finally determining the phase selection signal corresponding to a preferred clock used in a normal mode.

Abstract: A controller for a DDR PSRAM is provided. The controller includes a single rate processing unit, a double rate processing unit and a selector. The signal rate processing unit obtains a single data rate data according to a first data and a first clock. The double rate processing unit obtains a double data rate data according to a second data and a second clock that is two times the frequency of the first clock. The selector selectively provides any of the single data rate data and the double data rate data to the DDR PSRAM via a common bus according to a control signal.

Abstract: A first timing control unit controls an active timing of a first control signal to output a first driving control signal. A first data input/output unit transmits write data from a data input/output buffer to a global input/output line or transmits read data from the global input/output line to the data input/output buffer, in response to the first driving control signal. A second timing control unit controls an active timing of a second control signal to output a second driving control signal. A second data input/output unit transmits the write data from the global input/output line to a local input/output line or transmits the read data from the local input/output line to the global input/output line, in response to the second driving control signal.

Abstract: An integrated circuit memory device, system and method embodiments decode interleaved row and column request packets transferred on an interconnect at a first clock frequency. Separate row decode logic and column decode logic, clocked at a relatively slower second clock frequency, output independent column and row control internal signals to a memory core in response to memory commands in the request packets. An integrated circuit memory device includes an interface having separate row and column decode logic circuits for providing independent sets of row and control signals. A row decode logic circuit includes a first row decode logic circuit that provides a first row control signal, such as a row address, and a second row decode logic circuit that provides a second row control signal. A column decode logic circuit includes a first column decode logic circuit that provides a first column control signal, such as a column address and a second column logic circuit that provides a second column control signal.

Abstract: Apparatus, systems, and methods are disclosed that operate to generate a clock signal in a die in a stack and to receive the clock signal in another die in the stack. Additional apparatus, systems, and methods are disclosed.

Abstract: Disclosed herein is a clock generator that comprises a master or first oscillator having an output terminal which provides a master clock signal and at least one slave or second oscillator having an output terminal which provides a slave clock signal, the master and slave oscillators comprising respective time delay stages and latches, the slave oscillator also comprising logic gates connected to the outputs of the latches and configured to logically combine said outputs to generate a slave clock signal having a different phase with respect to a master clock signal.

Abstract: A method for determining a temperature in a circuit comprises receiving a periodic signal. A frequency of the periodic signal is an increasing function of temperature. A number of oscillations of the periodic signal is determined during a time interval. A length of the time interval is an increasing function of temperature. The temperature is based on the determined number of oscillations.

Abstract: A semiconductor memory includes a plurality of memory cells, a refresh request generator circuit for generating a refresh request signal to refresh the plurality of memory cells based on a number of clock cycles elapsed in a clock signal, a clock cycle detector circuit for detecting the clock cycle of the clock signal, and a refresh controller circuit for controlling a number of memory cells to refresh from among the plurality of memory cells, in accordance with the detected clock cycle.

Abstract: In a signal calibration scheme, a desired phase relationship is maintained between a set of signals. For example, in some aspects the desired phase of a clock tree generated from a high speed reference clock signal may be maintained by detecting phase differences between a low speed reference clock signal and low speed clock signals associated with different phases of the clock tree. In some aspects, the desired phase of a clock tree may be maintained by detecting framing offsets that occur through the use of the clock tree.

Abstract: To improve the speed of accessing a low-speed circuit block from a high-speed circuit block without significantly increasing power consumption.

Abstract: A semiconductor memory device includes a count clock generation unit for generating a count clock in response to a clock signal and a dummy count clock, a column address generation unit for generating a column address in response to the count clock, and a Y decoder for sending data, stored in a page buffer unit, to a data line in response to the column address.

Abstract: A semiconductor memory device includes a clock synchronizing unit for receiving a first power voltage through a first power voltage terminal, and an additional power voltage providing unit for additionally providing a second power voltage to the first power voltage terminal for a predetermined period after leaving a power down mode.

Abstract: Apparatuses and methods for dual channel memory architecture with reduced interface pin requirements are presented. One memory architecture includes a memory controller, a first memory device coupled to the memory controller by a shared address bus and a first clock signal, and a second memory device coupled to the memory controller by the shared address bus and a second clock signal, where the polarity of the second clock signal is opposite of the first clock signal. A method for performing data transactions is presented. The method includes providing addressing signals over a shared address bus to a first memory device and a second memory device, providing clock signals to the memory devices which are reversed in polarity, where the clock signals are derived from a common clock signal, and transferring data to the memory devices over separate narrow data buses in an alternating manner based upon the clock signals.

Abstract: Examples described include memory units coupled to a controller using a daisy chain wiring configuration. A filter located between a first memory unit and the controller attenuates a particular frequency, which may improve ringback in a signal received at the memory units. In some examples, a quarter-wavelength stub is used to implement the filter. In some examples, signal components at 800 MHz may be attenuated by a stub, which may improve ringback.

Abstract: A multi-die memory device includes a first die of a first type and configured to electrically interface with an external processor via a first synchronous interface operating at a first clock rate, and at least one second die of a second type and configured for data storage. Each second die transacts data with the first die via a second synchronous interface operating at a second clock rate, where the first clock rate is an integer multiple of the second clock rate, and where a timing reference associated with the second synchronous interface is transmitted by the first die to the second die.

Abstract: Techniques pertaining the designs of memory controller are disclosed. According to one aspect of the present invention, a memory controller reduces delays in a data strobe signal of a DDR memory relative to a clock signal of a memory controller thereof. In one embodiment, the memory controller employs four IO ports, two inverters, six edge triggers and a multiplexer. By feeding back an inverted clock signal and utilizing the rising and filing edges of the clock signal, the delays in a data strobe signal of a DDR memory relative to a clock signal of a memory controller are considerably reduced or minimized.

Abstract: A semiconductor device including a plurality of memory cells arranged in a matrix pattern, a write amplifier which writes write data to the memory cell in synchronization with a clock, a sense amplifier which reads out the write data written in the memory cell in synchronization with the clock, a plurality of column select switches which connect the plurality of the memory cells with the sense amplifier and the write amplifier, a column address decoder which makes the column select switch corresponding to one column among the plurality of the memory cells a conductive state based on a column address, a row address decoder which activates the memory cell of one row based on a row address, and a test write circuit which writes data corresponding to a logical level of a test signal to the memory cell based on a test mode signal.

Abstract: A semiconductor device includes a system clock input unit configured to receive a system clock for synchronizing input times of an address signal and a command signal from a memory controller, a data clock input unit configured to receive first and second data clocks for synchronizing an input/output time of a data signal from the memory controller, wherein a phase of the second data clock is shifted according to a training information signal, and the second data clock having the shifted phase is inputted to the data clock input unit, and a phase detection unit configured to detect a logic level of the second data clock based on an edge of the first data clock, and generate the training information signal to transmit the generated signal to the memory controller according to the detected logic level.

Abstract: A semiconductor device includes a system clock input unit configured to receive a system clock for synchronizing input times of an address signal and a command signal from a memory controller, a data clock input unit configured to receive first and second data clocks for synchronizing an input/output time of a data signal from the memory controller, wherein a phase of the second data clock is shifted according to a training information signal, and the second data clock having the shifted phase is inputted to the data clock input unit, and a phase detection unit configured to detect a logic level of the second data clock based on an edge of the first data clock, and generate the training information signal to transmit the generated signal to the memory controller according to the detected logic level.

Abstract: A processor including a cache memory, a decoder, a precharge circuit, a control module, and an amplifier module. The decoder generates a first word line signal to access first instructions stored in a first word line, and (ii) generates a second word line signal to access second instructions stored in the first word line or a second word line. The precharge circuit (i) precharges first bit lines connected to the first word line prior to accessing each of the first and second instructions. The control module adjusts a rate of a clock signal from a first rate to a second rate. The amplifier module accesses the first instructions based on (i) the first word line signal and (ii) the clock signal at the first rate, and accesses the second instructions based on (i) the second word line signal and (ii) the clock signal at the second rate.

Abstract: A clock buffer includes a reference enable signal generator configured to generate a reference enable signal enabled in synchronization with a rising edge of a first period of a second clock after a clock enable signal is enabled, a delay enable signal generator configured to generate a delayed enable signal enabled in synchronization with a rising edge of a second period of a first clock after the reference enable signal is enabled, a first output unit configured to receive the reference enable signal and the first clock to generate a first internal clock, and a second output unit configured to receive the delayed enable signal and the second clock to generate a second internal clock.

Abstract: A delay locked loop and method and electronic device including the delay locked loop are provided. In one embodiment, the delay locked loop includes a first delay locked loop and a second delay locked loop. The first delay locked loop receives a data signal and a plurality of first clock signals, generates a plurality of second clock signals based on interpolation on the plurality of first clock signals, selects and outputs one of the second clock signals from among the plurality of second clock signals based on a locking operation on the plurality of second clock signals and the data signal, and generates a plurality of phase resolution control signals.

Abstract: An input buffer circuit includes a logic unit, a clock enable buffer, and a clock buffer. The logic unit is configured to receive a clock signal and a clock enable signal, and to output a decision signal indicative of whether the clock signal is normally input, where the decision signal is activated when the clock signal is normally input. The clock enable buffer is configured to buffer the clock enable signal and to activate an internal clock enable signal, in response to an activation of the decision signal. The clock buffer is configured to buffer the clock signal and to output an internal clock signal, in response to an activation of the internal clock enable signal.

Abstract: A gate driving circuit that may be capable of improving driving margin and maintaining reliability even after long use, and a display device having the gate driving circuit. The gate driving circuit includes a shift register having a plurality of stages dependently connected to one another, wherein each stage includes a pull-up unit outputting a first clock signal as a gate signal in response to a signal of a first node, to which a first input signal is applied, a pull-down unit discharging the gate signal to a gate-off voltage in response to a second input signal, a discharging unit discharging the signal of the first node to the gate-off voltage in response to the second input signal, and a holding unit maintaining the signal of the first node at the gate-off voltage in response to a delay signal of the first clock signal.

Abstract: A device includes a first clock generation circuit that receives an external clock signal supplied to the device, delays the external clock signal to output a first clock signal synchronized with the external clock signal, and a circuit that generates a control signal to control output of data, based on second clock signals obtained by dividing an internal clock signal generated from the external clock signal, and third clock signals obtained by dividing the first clock signal.

Abstract: A system is provided with clock skew measurement and correction technology. A first circuit or memory controller 4 includes measuring circuits to measure relative timing or phase offsets of multiple clock signals of a second circuit or memory 6. One measuring circuit is configured for incremental changing of the phase of a transmitted test data sequence to measure and correct timing of a memory receiver circuit's quadrature clocks based on results of a data comparison of transmitted and received test data. Another measuring circuit is configured to scan a received test data sequence for data transitions to measure and correct timing of a memory transmitter circuit's quadrature clocks based on spacing or timing between detected transitions. Individual memory clock generators 30 are controlled with adjustable delay circuits 47 for changing phase of different clock signals of the memory to set the clock signals based on the measurements of the controller.

Abstract: A communication apparatus including a clock generation circuit outputting a plurality of clocks, each clock having a different phase from the other, a synchronization detection block receiving a sync word and a payload having a predetermined length after receiving the payload, sampling the sync word by using each of the plurality of clocks and to output a first signal indicating a clock or clocks capable of sampling the sync word successfully, the synchronization detection block being capable of sampling the payload by using a clock or clocks, a clock phase selection block coupled to the synchronization detection block to receive the first signal, and a clock gate unit to receive each of the plurality of clocks and the second signal to output the selected one of the plurality of clocks, and not to output a rest of the plurality of the clocks based on the second signal.

Abstract: A semiconductor memory device includes a latency controller which provides a power-saving effect. The latency controller includes a first-in first-out (FIFO) register. After a read command is applied, when a precharge command or power-down command is applied, the latency controller outputs a latency signal corresponding to the applied read command and blocks application of sampling and transmission clock signals to the FIFO register.

Abstract: Disclosed is a method for tuning control signals associated with one or more memory devices. The method includes performing a number of memory access operations on at least one memory device and recording results of the memory access operations. Specifically, the memory access operations are performed with different time delays for a first edge of a control signal. The control signal used for capturing data is provided by the at least one memory device. The method further includes selecting a time delay from the time delays used in the memory access operations. Moreover, the method includes utilizing the selected time delay in performing subsequent memory access operations on the at least one memory device. Also disclosed is a system including at least one memory device and an integrated circuit operatively coupled to the at least one memory device. The system incorporates the method for tuning control signals.

Abstract: The present invention relates to a synchronous semiconductor memory device with double data rate, and more particularly, to a synchronous semiconductor memory device for inputting and outputting data using a free-running clock and inserting a preamble indicative of start of data into the outputted data. A semiconductor memory device of the present invention receives a data read command from the exterior of the memory device in response to a predetermined clock signal inputted from the exterior, and outputting data including a preamble in response to the clock signal.