Determination Of Inherent Thermal Property (e.g., Heat Flow Coefficient) Patents (Class 374/43)
  • Patent number: 6863437
    Abstract: The problem of the invention is to find a polymer mixture which forms an inter-polymer complex by being responsive to temperature even under neutral to alkaline conditions. According to the invention, a temperature responsive inter-polymer complex capable of showing thermal responsiveness in an aqueous solution, which contains a poly-N-acetylacrylamide or polyvinyl alcohol and polyethylene glycol, polyacrylamide or polymethacylamide, is applied to separating agents, immobilized enzymes, denatured protein modifiers, separation method or concentration of microorganisms, purification or concentration of nucleic acids, drug-releasing microcapsules and the like.
    Type: Grant
    Filed: August 20, 2001
    Date of Patent: March 8, 2005
    Assignees: National Institute of Advanced Industrial Science and Technology, Chisso Corporation
    Inventors: Noriyuki Ohnishi, Hirotaka Furukawa, Kazunori Kataoka, Katsuhiko Ueno
  • Patent number: 6860633
    Abstract: A method for determining the thermal expansion coefficient of a substance comprises, determining at each of two or more temperatures the absolute position of more than one resonant interference peaks of a Fabry-Perot etalon whose optical path is defined by said substance and calculating said coefficient from observed difference(s) in wavelength or frequency of said positions at said two or more temperatures.
    Type: Grant
    Filed: November 30, 2001
    Date of Patent: March 1, 2005
    Assignee: Schott Technologies, Inc.
    Inventors: Mark J. Davis, Joseph S. Hayden
  • Patent number: 6847010
    Abstract: Disclosed is a DC thermal energy generator for heating localized regions of an integrated circuit. The integrated circuit includes a pair of static circuits whose outputs are shorted, and are in contention. Contention causes current to flow through the circuits, generating heat. Integrated-circuit temperatures can be varied by turning on more or fewer thermals energy generators. The thermal resistance of a, packaged integrated circuit is computed using a well-known relationship integrated circuit's measured temperature, power consumption, and the ambient temperature.
    Type: Grant
    Filed: December 4, 2002
    Date of Patent: January 25, 2005
    Assignee: Xilinx, Inc.
    Inventors: Steven H. C. Hsieh, Siuki Chan
  • Patent number: 6831554
    Abstract: A general abnormal heating detection method in an electronic device is limited to an object to be monitored, and cannot cope with heating of an object of which overheating is unexpected. To correct this problem, temperature data are acquired from a plurality of temperature sensors distributed in the device to be protected, the parameter indicating temperature distribution pattern in the device is calculated on the basis of the acquired temperature data, and an alarm signal is output when the calculated parameter indicating temperature distribution pattern deviates from a predetermined reference.
    Type: Grant
    Filed: January 31, 2002
    Date of Patent: December 14, 2004
    Assignee: Canon Kabushiki Kaisha
    Inventor: Nobuyoshi Takehara
  • Patent number: 6827903
    Abstract: A single pass analyzer includes multiple infrared sensors, a catalytic converter, a scrubber and a thermal conductivity cell all coupled in series to provide a single pass (i.e., one sample) analyzer which allows for fast analysis, allows for the speciation of hydrogen samples, requires no purging between different sample types, utilizes a single carrier gas, and eliminates molecular sieves and Shutze converters. The resultant analyzer provides improved quicker results with less plumbing (i.e., gas conduits and valving) in a single instrument.
    Type: Grant
    Filed: October 26, 2001
    Date of Patent: December 7, 2004
    Assignee: Leco Corporation
    Inventor: Carlos Guerra
  • Publication number: 20040240512
    Abstract: A method for determining temperature of a material (32) comprising: measuring at least one of the real and imaginary part of the permittivity of the material (32) at each of at least one frequency (36) for which substantially only a single component of the material contributes to the dielectric permittivity of the material (32), for which known component the permittivity as a function of temperature is known; and using at least one of the determined real and imaginary part of the permittivity at each of the at least one frequency and the dependence of the permittivity of the known component on temperature to determine temperature of the known component and thereby of the material (32).
    Type: Application
    Filed: December 17, 2003
    Publication date: December 2, 2004
    Inventor: Benny Pesach
  • Patent number: 6824306
    Abstract: A test apparatus and method of its use for evaluating various performance aspects of a test specimen is disclosed. A chamber within a housing contains a cold mass tank with a contact surface in contact with a first surface of a test specimen. The first surface of the test specimen is spaced from the second surface of the test specimen by a thickness. The second surface of the test specimen is maintained at a desired warm temperature. The first surface is maintained at a constant temperature by a liquid disposed within the cold mass tank. A boil-off flow rate of the gas is monitored and provided to a processor along with the temperature of the first and second surfaces of the test specimen. The processor calculates thermal insulation values of the test specimen including comparative values for heat flux and apparent thermal conductivity (k-value). The test specimen may be placed in any vacuum pressure level ranging from about 0.01 millitorr to 1,000,000 millitorr with different residual gases as desired.
    Type: Grant
    Filed: December 11, 2002
    Date of Patent: November 30, 2004
    Assignee: The United States of America as represented by the Administrator of the National Aeronautics and Space Administration
    Inventors: James E. Fesmire, Stanislaw D. Augustynowicz
  • Patent number: 6817761
    Abstract: A scanning heat flow probe for making quantitative measurements of heat flow through a device under test is provided. In one embodiment the scanning heat flow probe includes an electric current conductor in a cantilever beam connected to a probe tip and coupled to two voltmeter leads. The probe also includes two thermocouple junctions in the cantilever beam electrically isolated from the electric current conductor and the two voltmeter leads. Heat flow is derived quantitatively using only voltage and current measurements. In other forms, the invention relates to the calibration of scanning heat flow probes through a method involving interconnected probes, and relates to the minimization of heat flow measurement uncertainty by probe structure design practices.
    Type: Grant
    Filed: April 21, 2003
    Date of Patent: November 16, 2004
    Assignee: International Business Machines Corporation
    Inventors: Steven Alan Cordes, David R. DiMilia, James Patrick Doyle, Matthew James Farinelli, Snigdha Ghoshal, Uttam Shyamalindu Ghoshal, Chandler Todd McDowell, Li Shi
  • Patent number: 6804622
    Abstract: A method of quantitative non-destructive thermal inspection of an article having at least one internal cavity comprises the steps of inputting physical properties of the article, measuring thermal characteristics of the article, and calculating heat transfer coefficients of the internal cavity.
    Type: Grant
    Filed: September 4, 2001
    Date of Patent: October 12, 2004
    Assignee: General Electric Company
    Inventors: Ronald Scott Bunker, Nirm Velumylum Nirmalan, Louis Andrew Schick
  • Patent number: 6793388
    Abstract: A semiconductor laser having an S-ARROW structure confining a basic lateral mode light between a pair of guide layers extending with a gap therebetween, which increases a precision of a shape of a guide portion, and is capable of stably emitting a light in the basic lateral mode. In the semiconductor laser having an activation layer and a plurality of layers in parallel with the activation layer, a first groove penetrating through at least some of the layers is formed, and a pair of second grooves extending to predetermined positions toward both sides from the first groove are formed in a specified layer among the layers through which the first groove penetrates. Furthermore, a material having a refractive index higher than that of the specified layer is filled up in the second grooves, thus forming two portions having a high refractive index.
    Type: Grant
    Filed: June 5, 2001
    Date of Patent: September 21, 2004
    Assignee: Fuji Photo Film Co., Ltd.
    Inventor: Kenji Matsumoto
  • Publication number: 20040165645
    Abstract: The methodology disclosed permits the testing of fluids, solids, powders and pastes through the measurements of effusivity. Effusivity is a measurement that combines thermal conductivity, density, and heat capacity. Blend uniformity, homogeneity, miscibility, concentration, voiding\delamination, and moisture content are exemplary of the applications to which the present methodology is applicable. The method of monitoring homogeneity, miscibility, concentration, voiding\delamination, and moisture content in a material comprises the steps of measuring effusivity of a first portion of the material, measuring effusivity of a second portion of the_material, comparing each measurement. The caparison may be between the measurements themselves or to a predetermined range of values and indicating which portion has an out of range measurement.
    Type: Application
    Filed: December 22, 2003
    Publication date: August 26, 2004
    Inventor: Nancy Mathis
  • Patent number: 6773159
    Abstract: A non-invasive apparatus and method for measuring a temperature of a portion of a living body, includes a signal receiving unit receiving electromagnetic wave signals emitted from the portion of a living body to be measured, a signal processing unit processing the electromagnetic signals input from the signal receiving unit and outputting a radiation power signal, a medium characteristic measurement unit measuring a value of a conductivity or a permittivity of the portion of the living body to be measured and outputting the measured value, and a temperature conversion unit including a computer database storing a plurality of temperature conversion tables with respect to radiation power according to the conductivity or the permittivity of the portion of the living body and determining a corresponding temperature using the measured value of the conductivity or the permittivity of the portion of the living body and the radiation power signal of the signal processing unit.
    Type: Grant
    Filed: March 18, 2003
    Date of Patent: August 10, 2004
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Tae-woo Kim, Sang-min Lee, Jeong-whan Lee, Sang-jin Eom, Wan-taek Han
  • Publication number: 20040114660
    Abstract: The invention involves the use of thermal imaging equipment to take infrared images of a steam turbine during start-up. The exterior temperatures developed from the infrared images are correlated with turbine vibration data to determine which insulation temperature patterns reflect insulation poor enough to cause packing seal teeth to rub and the turbine to vibrate during operation or shut-down. From the thermal images and vibration data, control limits are developed for insulation surface temperature. Insulation is added, before the steam turbine is shut down, in accordance with the obtained data and control limits.
    Type: Application
    Filed: December 13, 2002
    Publication date: June 17, 2004
    Inventors: David Forrest Loy, Daniel Gerard Menzel
  • Patent number: 6748350
    Abstract: A device and method identify and compensate for tensile and/or shear stress due to heat-caused expansion and contraction between an integrated heat spreader and thermal interface material. This device and method may change the shape of the integrated heat spreader based upon the identification of location(s) of high tensile and/or shear stress so that additional thermal interface material may be deposited between the integrated heat spreader and a die in corresponding locations. Utilizing this method and device, heat is efficiently transferred from the die to the integrated heat spreader.
    Type: Grant
    Filed: September 27, 2001
    Date of Patent: June 8, 2004
    Assignee: Intel Corporation
    Inventors: Christopher L. Rumer, Sabina J. Houle
  • Patent number: 6742926
    Abstract: The system and method for testing thermal insulation uses a cryostatic insulation tester having a vacuum chamber and a cold mass including a test chamber and upper and lower guard chambers adjacent thereto. The thermal insulation is positioned within the vacuum chamber and adjacent the cold mass. Cryogenic liquid is supplied to the test chamber, upper guard and lower guard to create a first gas layer in an upper portion of the lower guard chamber and a second gas layer in an upper portion of the test chamber. Temperatures are sensed within the vacuum chamber to test the thermal insulation.
    Type: Grant
    Filed: July 10, 2001
    Date of Patent: June 1, 2004
    Assignee: The United States of America as represented by the Administrator of the National Aeronautics and Space Administration
    Inventors: James E. Fesmire, Stanislaw D. Augustynowicz
  • Patent number: 6712503
    Abstract: A method to calculate a fuel driveability index (DI) value is provided from a sample of fuel in a container as tested by the industry standard ASTM D86 test providing particular temperature data at various percentages of evaporation as the container is heated. The particular temperature data provides a DI value. The same sample of fuel is tested on a sensor capable of retaining a predetermined volume of fuel. Temperature data is monitored at the same percentages of evaporation as the sensor is being heated. Correlation equations are mathematically calculated between the temperature data from the sensor relative to the particular temperature data from the ASTM D86 test and stored in the engine controller of a vehicle. The fuel from the fuel tank is tested by heating a similar on-board sensor having the predetermined volume of fuel and measuring the temperature data as a function of the remaining fuel in the sensor.
    Type: Grant
    Filed: April 8, 2002
    Date of Patent: March 30, 2004
    Assignee: Delphi Technologies, Inc.
    Inventors: Yingjie Lin, Han-Sheng Lee, Su-Chee Simon Wang
  • Publication number: 20040052292
    Abstract: A method and device for photothermal imaging tiny metal particles which are immersed in a given medium like a living cell. The given medium and immersed tiny metal particles are illuminated through separate phase reference laser beam and sensitive probe laser beam, with the sensitive probe laser beam undergoing through impingement on the given medium slight phase changes induced by photothermal effect due to a local heating thanks to a heating laser beam, in the absence of any substantial phase changes to the phase reference laser beam. Illuminating is performed by focusing the separate phase reference laser beam. The induced slight phase changes on the sensitive probe laser beam with reference to the phase reference laser beam are detected through differential phase interference contrast phenomenon so as to allow each of the tiny metal particles in the given medium to be imaged as an optical label.
    Type: Application
    Filed: March 13, 2003
    Publication date: March 18, 2004
    Inventors: Brahim Lounis, David Stephane Christophe Boyer, Philippe Tamarat, Abdelhamid Maali, Michel Alain Gaston Julien Orrit
  • Patent number: 6687626
    Abstract: A flux distribution measuring apparatus measures distribution of flow rates of a flowable medium. The measuring apparatus includes thin metal wire(s) for scanning a flowable medium and lead wires connected to the thin metal wire(s), wherein a voltage difference is detected between adjacent lead wires while the measuring apparatus scans the flowable medium in the direction perpendicular to a flow path of the flowable medium. The voltage differences are generated due to temperature changes in the thin metal wire(s) while scanning the flowable medium having different flow rates. The measuring apparatus visualizes the distribution of flow rates of a flowable medium using a computer which receives and processes the voltage differences detected.
    Type: Grant
    Filed: February 19, 2002
    Date of Patent: February 3, 2004
    Assignee: Korea Research Institute of Standars and Science
    Inventors: Dae Jin Seong, Yong Hyeon Shin, Jung Hyung Kim, Jong Yeon Lim, Kwang Hwa Jung
  • Patent number: 6679626
    Abstract: A method for determining the thermal material properties of metal shaped parts from a model is disclosed, which describes the thermal material properties of the metal shaped part. At least one thermodynamic parameter (p) is formed as a linear combination consisting of at least one base function (hi) and of at least one weighting factor (gi), whereby the base function (hi) describes the thermal material properties, and the weighting factor (gi) takes the influence of the alloying elements on at least one thermodynamic parameter (p) into account. The method makes it possible to conduct a sufficiently precise determination of the thermal material properties with a smaller time requirement.
    Type: Grant
    Filed: February 28, 2003
    Date of Patent: January 20, 2004
    Assignee: Siemens Aktiengesellschaft
    Inventors: Otto Gramckow, Michael Jansen, Martin Post, Klaus Weinzierl
  • Patent number: 6679625
    Abstract: A scanning heat flow probe for making quantitative measurements of heat flow through a device under test is provided. In one embodiment the scanning heat flow probe includes an electric current conductor in a cantilever beam connected to a probe tip and coupled to two voltmeter leads. The probe also includes two thermocouple junctions in the cantilever beam electrically isolated from the electric current conductor and the two voltmeter leads. Heat flow is derived quantitatively using only voltage and current measurements. In other forms, the invention relates to the calibration of scanning heat flow probes through a method involving interconnected probes, and relates to the minimization of heat flow measurement uncertainty by probe structure design practices.
    Type: Grant
    Filed: December 17, 2001
    Date of Patent: January 20, 2004
    Assignee: International Business Machines Corporation
    Inventors: Steven Alan Cordes, David R. DiMilia, James Patrick Doyle, Matthew James Farinelli, Snigdha Ghoshal, Uttam Shyamalindu Ghoshal, Chandler Todd McDowell, Li Shi
  • Patent number: 6663278
    Abstract: A method for determining the thermal resistance constant of a modular heat sink. The method can be carried out by first providing a heat capacity tank formed of a high thermal conductivity metal. A modular heat sink is then mounted on top of the heat capacity tank and heated together with the tank to a temperature of at least 40° C. The heating is then stopped and the heat sink/heat capacity tank is allowed to cool for at least 30 seconds before the temperature and the cooling time of the heat capacity tank is monitored and recorded. The function of dT/dt is then calculated. The amount of heat dissipated is then calculated from the equation of Q=W·Cp·(dT/dt), while the thermal resistance constant is calculated by the equation of R=(T−Tamb)/Q.
    Type: Grant
    Filed: July 11, 2002
    Date of Patent: December 16, 2003
    Assignee: Industrial Technologies Research Institute
    Inventors: Heng Chieh Chien, Ming Hsi Tseng, Wen Wang Ke, Chih Yao Wang, Yi Shiau Chen
  • Publication number: 20030214995
    Abstract: The present invention involves identifying media type in a media processing device. A system according to one embodiment of the invention includes a thermal energy source and a thermal energy sensor. The thermal energy source and thermal energy sensor are arranged along a media feed path so as to accommodate transfer of thermal energy to the media by the thermal energy source, diffusion of such thermal energy, and subsequent sensing of such diffused thermal energy to determine a heat capacity of the media, such heat capacity being indicative of media type.
    Type: Application
    Filed: May 20, 2002
    Publication date: November 20, 2003
    Inventors: Phillip R. Luque, Jeffrey S. Weaver
  • Patent number: 6648504
    Abstract: A system and method for obtaining the contact thermal resistance for a sample and pan without a priori knowledge of the properties of either sample, by measuring the reversing heat capacity of a sample and its pan (or an empty pan on the reference side of the DSC) at a long period and a short period during a quasi-isothermal MDSC experiment and then finding the value of contact thermal resistance that makes the short and long period heat capacities match. Several different methods may be used to find the contact thermal resistance using quasi-isothermal MDSC with a long and a short period. Two methods are direct calculation methods that use the results from an MDSC experiment used with model equations to calculate the contact thermal resistance. A third method is another direct calculation method, based upon the phase angle between the heat flow and temperature signals. A fourth and fifth method use curve fitting of the apparent heat capacity for multiple values of pan contact thermal resistance.
    Type: Grant
    Filed: March 1, 2002
    Date of Patent: November 18, 2003
    Assignee: Waters Investment Limited
    Inventor: Robert L. Danley
  • Patent number: 6641300
    Abstract: A method for calibrating thermal resistance and thermal capacitance parameters characterizing a DSC cell, and then calculating the heat flow to the sample based upon the results of the calibration. The method is applied in a conventional heat flux calorimeter, to obtain thermal analysis data having improved baseline and resolution. A first embodiment is based upon a model of a calorimeter in which there is no cross-talk between the sample and reference sides of a DSC cell. The thermal resistance and thermal capacitance parameters are calculated by carrying out a sequential series of calibration measurements with an empty DSC cell, materials on the reference side and materials on both the sample and reference sides. Another embodiment takes the existence of cross-talk between the sample and reference sides of the calorimeter into account.
    Type: Grant
    Filed: January 29, 2002
    Date of Patent: November 4, 2003
    Assignee: Waters Investment, Ltd.
    Inventors: Andrew Lacey, Michael Reading
  • Publication number: 20030187606
    Abstract: A combustionless BTU meter utilizes Nuclear Magnetic Resonance (NMR) spectroscopy to measure the concentrations of the component parts of a heterogeneous gas. Measurement of the gas component concentrations allow for subsequent calculations of British Thermal Unit/Cubic Foot (BTU/CF) from the measured component parts. Static pressure and temperature are also measured. Gas concentrations are preferably combined with static pressure and temperature, to calculate other characteristics of British Thermal Unit/Pound (BTU/lb), molar mass, relative density, and absolute gas density. A method for measuring heat production is also disclosed.
    Type: Application
    Filed: December 5, 2002
    Publication date: October 2, 2003
    Inventor: Jimmie L. Curry
  • Publication number: 20030156618
    Abstract: The problem of the invention is to find a polymer mixture which forms an inter-polymer complex by being responsive to temperature even under neutral to alkaline conditions.
    Type: Application
    Filed: February 21, 2003
    Publication date: August 21, 2003
    Inventors: Noriyuki Ohnishi, Hirotaka Furukawa, Kazunori Kataoka, Katsuhiko Ueno
  • Patent number: 6595005
    Abstract: A method and apparatus for measuring the cooling efficacy of air comprising coupling a resistive element to a temperature sensing element, applying a voltage across the resistive element, adjusting the voltage across the resistive element so that the temperature indicated by the temperature sensing element is nearly proportional to the temperature of a locally disposed heat sensitive component for a change in environmental parameters, and coupling the output of the temperature sensing element to a control circuit wherein the control circuit controls a space cooling element.
    Type: Grant
    Filed: September 29, 2000
    Date of Patent: July 22, 2003
    Assignee: InFocus Corporation
    Inventor: Eric Immel
  • Patent number: 6595685
    Abstract: An apparatus and method for measuring thermophysical property value of a specimen. The apparatus includes a heating laser and probe laser for measuring at least one characteristic on the surface of the specimen. A detector detects the reflected probe laser beam, and a computer calculates the thermophysical property value of the specimen based on the reflected probe laser beam.
    Type: Grant
    Filed: October 13, 1999
    Date of Patent: July 22, 2003
    Assignees: National Research Laboratory of Metrology, Kabushiki Kaisha Bethel
    Inventors: Tetsuya Baba, Naoyuki Taketoshi, Kimihito Hatori, Tetsuya Otsuki
  • Patent number: 6593760
    Abstract: An apparatus for measuring thermal properties and making thermomechanical modifications on a material surface using a junction of different metallic wires. The junction of different metallic wires, defined as a Peltier tip, is distinguished from a conventional thermocouple by the fact that it works as a point heat source and as a point temperature sensor simultaneously when an electric current flows into the tip. This novel functionality of the Peltier tip offers a way to thermally characterize a material surface with submicron-scale spatial resolution and high sensitivity, while providing high spatial resolution and speed for thermal modifications since both heating and cooling are possible at the Peltier tip.
    Type: Grant
    Filed: May 9, 2001
    Date of Patent: July 15, 2003
    Assignee: Pohang University of Science and Technology Foundation
    Inventors: Yoon-Hee Jeong, Dae-Hwa Jung, Il-Kwon Moon
  • Patent number: 6592252
    Abstract: A non-metal film whose thermophysical properties are unknown is disposed between a first metal film and a second metal film, thereby forming a sample having a three-layer structure. The metal films have predetermined known thermophysical properties, belong to the same sort of substance and have the same thickness. The three-layer substance is disposed on a transparent substrate and is heated from below the second metal film, using a picosecond light pulse coming from below and passing through the transparent substrate. The light pulse used in the irradiation is converted into heat in the second metal film during only one picosecond, with such heat diffusing through interface/non-metal film layer/interface and thus arriving at the first metal film. By measuring a temperature change on the surface of the first metal film, it is possible to perform correct measurement by using the thermoreflectance method formerly suggested in a patent application by the inventors of the present invention.
    Type: Grant
    Filed: October 17, 2001
    Date of Patent: July 15, 2003
    Assignee: National Institute of Advanced Industrial Science and Technology
    Inventor: Tetsuya Baba
  • Patent number: 6585408
    Abstract: An apparatus and method for measuring local heat transfer distribution of an object surface. The apparatus includes a heater element for providing heat flux, a member disposed on a surface of the heater element for receiving impinging cooling air. A liquid crystal element is provided on a side of the heater element remote from the surface, and an insulating material is disposed adjacent to the liquid crystal element and remote from the heater element. The apparatus further includes means for determining heat transfer distribution coefficients from the liquid crystal element.
    Type: Grant
    Filed: July 30, 2001
    Date of Patent: July 1, 2003
    Assignee: General Electric Company
    Inventors: Lamyaa Abdel Alle El-Gabry, Steven J. Brzozowski, Nirm V. Nirmalan
  • Patent number: 6584429
    Abstract: The operation of a fossil-fueled thermal system is quantified by obtaining an unusually accurate boiler efficiency. Such a boiler efficiency is dependent on the calorimetric temperature at which the fuel's heating value is determined. This dependency affects the major thermodynamic terms comprising boiler efficiency.
    Type: Grant
    Filed: August 2, 2000
    Date of Patent: June 24, 2003
    Assignee: Exergetic Systems LLC
    Inventor: Fred D. Lang
  • Patent number: 6579731
    Abstract: A temperature measuring method for a target substrate to be thermally processed in a semiconductor processing apparatus under a predetermined process condition is provided. This method includes the steps of detecting a heat flux supplied from at least part of the target substrate and detecting a temperature of a sensor by using the sensor facing the target substrate, and calculating a temperature of the target substrate from a parameter, including a thermal resistance between the sensor and the target substrate under the predetermined process condition, the detected heat flux, and the temperature of the sensor. The sensor is arranged opposite to heating means, through the target substrate, which heats the target substrate. The parameter may be obtained in advance by calibration.
    Type: Grant
    Filed: November 29, 2001
    Date of Patent: June 17, 2003
    Assignee: Tokyo Electron Limited
    Inventor: Mo Yun
  • Patent number: 6554922
    Abstract: Method and apparatus for determining the cooling action of a flowing gas atmosphere on workpieces by a measuring body with at least on temperature sensor and heated to workpiece temperature and is exposed to the gas atmosphere. The method and apparatus are particularly useful in hardening steel.
    Type: Grant
    Filed: May 31, 2001
    Date of Patent: April 29, 2003
    Assignee: Ald Vacuum Technologies AG
    Inventor: Kalus Loeser
  • Publication number: 20030072349
    Abstract: A method of measuring a thermal resistance of laminated resin sandwiched by a first member and a second member according to the present invention includes measuring, as thermal resistance of resin, a sum of thermal resistance of an interface between the resin and the first member, thermal restistance of an interface between the resin and the second member, and thermal resistance caused by conduction of heat through the resin.
    Type: Application
    Filed: October 7, 2002
    Publication date: April 17, 2003
    Inventors: Yasuo Osone, Norio Nakazato, Takashi Kubo, Masaki Asagai, Hiroshi Kikuchi
  • Publication number: 20030039299
    Abstract: New sensors and methods for qualitative and quantitative analysis of multiple gaseous substances simultaneously with both high selectivity and high sensitivity are provided. The new sensors rely on a characteristic difference in energy between the interaction of a particular substance with a catalyst coated heat transfer device (HTD) and a non-catalyst coated (or one coated with a different catalyst) reference HTD. Molecular detection is achieved by an exothermic or endothermic chemical or physical reaction between the catalytic surface of the sensor and the molecule, tending to induce a temperature change of the sensor. Both high temperature and non-destructive low temperature detection are possible. The magnitude and rate of endothermic or exothermic heat transfer from a specific molecule-catalyst interaction is related to molecular concentration.
    Type: Application
    Filed: July 9, 2002
    Publication date: February 27, 2003
    Inventors: Michael L. Horovitz, Karl F. Anderson
  • Patent number: 6517238
    Abstract: A system and method for determining lateral thermal diffusivity of a material sample using a heat pulse; a sample oriented within an orthogonal coordinate system; an infrared camera; and a computer that has a digital frame grabber, and data acquisition and processing software. The mathematical model used within the data processing software is capable of determining the lateral thermal diffusivity of a sample of finite boundaries. The system and method may also be used as a nondestructive method for detecting and locating cracks within the material sample.
    Type: Grant
    Filed: January 18, 2001
    Date of Patent: February 11, 2003
    Assignee: The United States of America as represented by the United States Department of Energy
    Inventors: Jiangang Sun, Chris Deemer
  • Publication number: 20030021329
    Abstract: An apparatus and method for measuring local heat transfer distribution of an object surface. The apparatus includes a heater element for providing heat flux, a member disposed on a surface of the heater element for receiving impinging cooling air. A liquid crystal element is provided on a side of the heater element remote from the surface, and an insulating material is disposed adjacent to the liquid crystal element and remote from the heater element. The apparatus further includes means for determining heat transfer distribution coefficients from the liquid crystal element.
    Type: Application
    Filed: July 30, 2001
    Publication date: January 30, 2003
    Inventors: Lamyaa Abdel Alle El-Gabry, Steven J. Brzozowski, Nirm V. Nirmalan
  • Patent number: 6502983
    Abstract: A micro-machined thermal conductivity detector for a portable gas chromatograph. The detector is highly sensitive and has fast response time to enable detection of the small size gas samples in a portable gas chromatograph which are in the order of nanoliters. The high sensitivity and fast response time are achieved through micro-machined devices composed of a nickel wire, for example, on a silicon nitride window formed in a silicon member and about a millimeter square in size. In addition to operating as a thermal conductivity detector, the silicon nitride window with a micro-machined wire therein of the device can be utilized for a fast response heater for PCR applications.
    Type: Grant
    Filed: March 30, 1999
    Date of Patent: January 7, 2003
    Assignee: The Regents of the University of California
    Inventor: Conrad Yu
  • Publication number: 20020196835
    Abstract: A system and method for evaluating the thermal bond between a heat-producing device and a heat-absorbing apparatus. The heat-producing device may be a CPU, such as an INTEL PENTIUM microprocessor, and the heat-absorbing apparatus may be a heat sink. The two may be joined with a heat-conducting substance such as thermal grease or adhesive. In one exemplary embodiment, the heat-producing device is operated at a first power level, a first temperature measurement is then taken, the device is operated at a second power level, and then a second temperature measurement is then taken. The thermal resistance is then calculated, which may involve subtracting the second temperature from the first, and may involve dividing by the power level. The first power level may be full power, and the second power level may be near zero.
    Type: Application
    Filed: June 25, 2001
    Publication date: December 26, 2002
    Inventors: Peter Schonath, Steven A. Weller
  • Publication number: 20020191669
    Abstract: A thermal manikin has a closed perforated rigid frame covered by a breathable fabric extending over the frame and forming arms and legs. Water passages and a pump inside the manikin direct water around the manikin to simulate natural blood flow. The manikin is provided with a controller and sensor for measuring conditions inside and outside the manikin that enables simultaneous determination of Clo (thermal resistance of clothing placed on the manikin) and Im (the permeability index of the clothing).
    Type: Application
    Filed: March 20, 2001
    Publication date: December 19, 2002
    Inventors: Jintu Fan, Yi-song Chen
  • Patent number: 6491425
    Abstract: A platinum/Rhodium resistance thermal probe is used as an active device which acts both as a highly localized heat source and as a detector to perform localized differential calorimetry, by thermally inducing and detecting events such as glass transitions, meltings, recystallizations and thermal decomposition within volumes of material estimated at a few &mgr;m3. Furthermore, the probe is used to image variations in thermal conductivity and diffusivity, to perform depth profiling and sub-surface imaging. The maximum depth of the sample that is imaged is controlled by generating and detecting evanescent temperature waves in the sample.
    Type: Grant
    Filed: June 1, 2000
    Date of Patent: December 10, 2002
    Assignee: TA Instruments, Inc.
    Inventors: Azzedine Hammiche, Hubert Murray Montagu-Pollock, Michael Reading, Mo Song
  • Patent number: 6467951
    Abstract: A method and apparatus for measuring and characterizing microscopic thermoelectric material samples using scanning microscopes. The method relies on concurrent thermal and electrical measurements using scanning thermal probes, and extends the applicability of scanning thermal microscopes (SThMs) to the characterization of thermoelectric materials. The probe makes use of two thermocouples to measure voltages at the tip and base of a cone tip of the probe. From these voltages, and from a voltage measured across the sample material, the Seebeck coefficient, thermal conductivity and resistance of the sample material can be accurately determined.
    Type: Grant
    Filed: August 18, 2000
    Date of Patent: October 22, 2002
    Assignee: International Business Machines Corporation
    Inventor: Uttam Shyamalindu Ghoshal
  • Publication number: 20020126730
    Abstract: A system and method for determining lateral thermal diffusivity of a material sample using a heat pulse; a sample oriented within an orthogonal coordinate system; an infrared camera; and a computer that has a digital frame grabber, and data acquisition and processing software. The mathematical model used within the data processing software is capable of determining the lateral thermal diffusivity of a sample of finite boundaries. The system and method may also be used as a nondestructive method for detecting and locating cracks within the material sample.
    Type: Application
    Filed: January 18, 2001
    Publication date: September 12, 2002
    Inventors: Jiangang Sun, Chris Deemer
  • Patent number: 6439765
    Abstract: Provided are mass and heat flow measurement sensors comprising a microresonator, such as a quartz crystal microbalance; a heat flow sensor; and a heat sink coupled thermally to the heat flow sensor. The sensors may be used to measure changes in mass due to a sample on a surface of the microresonator and also to measure heat flow from the sample on the surface of the microresonator by utilizing the heat flow sensor, which is coupled thermally to the microresonator. Also provided are methods for measuring the mass of a sample, such as a gas, and the flow of heat from the sample to the heat sink by utilizing such mass and heat flow measurement sensors.
    Type: Grant
    Filed: January 23, 2001
    Date of Patent: August 27, 2002
    Inventor: Allan L. Smith
  • Patent number: 6438504
    Abstract: The thermal resistance of an entire semiconductor package with a semiconductor chip and radiation fins is calculated based on thermal resistance of resin between the semiconductor chip and case, thermal resistance of the radiation fins, and thermal resistance of three heat radiation paths in the semiconductor package. One of said three heat radiation paths is passing through the bottom surface of the case. The other of said three radiation paths is passing through the leadframe. The other of three radiation paths is passing through sides of the case other than the leadframe.
    Type: Grant
    Filed: March 28, 2001
    Date of Patent: August 20, 2002
    Assignee: NEC Corporation
    Inventors: Kazuyuki Mikubo, Sakae Kitajo
  • Patent number: 6431749
    Abstract: In a method and a device for the measurement of the mean temperature of components, a sequence of test pulses of increasing duration is applied to the component, the power of the pulses representing a state of operation of the component, a measurement of junction temperature being performed at the end of each pulse to obtain a curve representing the progress of the junction temperature of the component as a function of time on the basis of the temperature measurement points obtained at the end of each pulse. The disclosed method and device can be applied especially to determine the junction temperature of microwave electronic components working in continuous mode or in pulsed mode.
    Type: Grant
    Filed: November 24, 2000
    Date of Patent: August 13, 2002
    Assignee: Thomson-CSF
    Inventors: Clément Tolant, Joël Cordier, Philippe Eudeline, Patrick Servain
  • Publication number: 20020098592
    Abstract: Apparatus and methods for performing calorimetry. The apparatus include optical devices for detecting thermal processes and multiwell sample plates for supporting samples for use with such optical devices. The methods include measurement strategies and data processing techniques for reducing noise in measurements of thermal processes. The apparatus and methods may be particularly suitable for extracting thermal data from small differential measurements made using an infrared camera and for monitoring chemical and physiological processes.
    Type: Application
    Filed: February 5, 2001
    Publication date: July 25, 2002
    Applicant: FLIR Systems Boston, Inc.
    Inventors: Andy C. Neilson, Jay S. Teich
  • Patent number: 6422743
    Abstract: A method by which the heat transfer quality of a cooled gas engine component can be quantified for inspection purposes. A system is utilized to determine the heat transfer performance of an internally cooled structure, by analyzing the transient thermal response of the structure based upon a full field surface temperature measurement using an infrared thermal imaging system.
    Type: Grant
    Filed: March 26, 2000
    Date of Patent: July 23, 2002
    Assignee: Allison Advanced Development Company
    Inventors: Nirm V. Nirmalan, Jeffery F. Rhodes
  • Publication number: 20020080850
    Abstract: An object of the invention is to make it possible to correctly and easily measure a thermal diffusivity within a three-layer substance containing an non-metal substance.
    Type: Application
    Filed: October 17, 2001
    Publication date: June 27, 2002
    Applicant: Nat'l Inst. of Advanced Industrial Sci. and Tech
    Inventor: Tetsuya Baba