Abstract: Determining an unknown step coverage of a thin film deposited on a 3D wafer includes exposing a planar wafer comprising a first film deposited thereon to X-ray radiation to create first fluorescent radiation; detecting the first fluorescent radiation; measuring a number of XRF counts on the planar wafer; creating an XRF model of the planar wafer; providing a portion of the 3D wafer comprising troughs and a second film deposited thereon; determining a multiplier factor between the portion of the 3D wafer and the planar wafer; exposing the portion of the 3D wafer to X-ray radiation to create second fluorescent radiation; detecting the second fluorescent radiation; measuring a number of XRF counts on the portion of the 3D wafer; calculating a step coverage of the portion of the 3D wafer; and determining a uniformity of the 3D wafer based on the step coverage of the portion of the 3D wafer.

Abstract: In a sample cell that is sealed with an X-ray transmission sheet after a sample such as a liquid fuel or the like is contained therein, when an internal pressure is increased, a cup end surface is deformed so as to increase an internal capacity of the sample cell before the X-ray transmission sheet serving as a window part is expanded. The cup end surface is formed by folding a film-like material and, when the internal pressure of the sample cell is increased, the cup end surface is unfolded outwardly of the sample cell to increase the internal capacity of the sample cell. The increase in pressure is relieved by the increase in capacity, and the expansion of the X-ray transmission sheet is thereby prevented.

Abstract: Provided is an X-ray analyzer that is capable of reducing measurement time necessary for mapping analysis by measuring only regions on a sample targeted by a measurer with minimal action. A superimposition process of a mapping image and image data of the sample is performed, and a position corresponding to an irradiation point is determined. Based on the result, the image is displayed, and measurement execution regions are designated on the displayed image and hence a sample moving mechanism moves at high speed in regions excluding the designated regions.

Abstract: A spectrometer includes a rigid body having a first planar face with an orientation and a second planar face with a different orientation than the first planar face. The first and second planar faces are configured to position Bragg diffraction elements, and the orientation of the first planar face and the different orientation of the second planar face are arranged to convey a predetermined spectral range of the electromagnetic radiation to non-overlapping regions of the sensor location via the diffraction elements.

Abstract: A method utilizing characteristic x-ray emission from a single thin film or multilayer thin film when an electron beam impinges at a grazing angle with respect to the surface of the sample to capture structural and physical properties of the layers such as layer thickness, interfacial roughness, and stoichiometry of the sample.

Abstract: A method of operating an x-ray fluorescence (XRF) analyzer to automatically suppress sum-peaks is disclosed. The method includes irradiating a sample to acquire an initial energy spectrum. The energy spectrum is processed to identify a sum-peak that interferes with a characteristic fluoresced peak of an element of interest. A filter is positioned in the emitted radiation path to attenuate radiation that contributes to the identified sum-peak, and a filtered energy spectrum is acquired. In certain embodiments, the filtered energy spectrum is acquired only when a limit of detection (LOD) of an element of interest calculated from the initial energy spectrum does not satisfy a targeted objective.

Abstract: A thermal shield for an XRF measurement tool is formed from a heat shield and a heat shield cowling. These components protect the X-ray head assembly that includes the x-ray generation and detection columns and the head control electronics, communications and cooling systems. The heat shield is directly below the X-ray head, parallel to the x-ray head plane and plane of the PV substrate, and perpendicular to the primary beam output from the x-ray head. The heat shield is fabricated of machined copper with several ports machined through the shield. These ports provide a path for primary beam x-rays through the heat shield and for the return of fluoresced X-rays from the PV substrate back to the detector in the X-ray head, while preventing damage to the X-ray head due to the heat emitted from the PV substrate.

Abstract: An analyzing apparatus of the present invention includes a cassette unit (20) for generating a cassette identification signal identifying a type of a cassette (21), a sample holder (8) having an insertion hole (83) and a ring shaped pedestal (82), a transport section (23) for transporting the sample (S), a sample holder identifying section (35) for generating a sample holder identification signal identifying the type of the sample holder appropriate to the diameter of the sample to be placed, and a determining section (40) for determining, based on the cassette identification signal and the sample holder identification signal, whether or not the diameter of the sample to be accommodated in the cassette (21) and the diameter of the sample to be placed on the pedestal of the sample holder (8) match with each other.

Abstract: Automatic process and installation for inspecting and/or sorting objects or articles belonging to at least two different categories, and made to advance approximately in a single layer, for example on a conveyor belt or a similar transport support. The process includes subjecting the advancing flow of objects or articles to at least two different types of contactless analysis by radiation, whose results are used in a combined manner for each object or article to perform a discrimination among these objects or articles and/or an evaluation of at least one characteristic of the latter, the analyses including at least one surface analysis process able to determine the physical and/or chemical composition of the outer layer of an object or article exposed to the radiation used in this process, and at least one volume analysis process able to determine the equivalent thickness of material of the same object or article.

Abstract: An X-ray intensity correction method makes the background uniform by adjusting a raster element and an X-ray diffractometer. An X-ray intensity correction method for correcting the intensity of diffracted X-rays includes the steps of focusing X-rays on a sample for correction placed at a gonio center, entering fluorescent X-rays excited by the focused X-rays into a raster element formed by polycapillaries and having a unique focal point, detecting the fluorescent X-rays having passed through the raster element; and adjusting the arrangement of the raster element so that the fluorescent X-rays can uniformly be detected regardless of the detecting position. Since fluorescent X-rays are used, it is possible to adjust the position of the raster element because if the focal point of the raster element coincides with the gonio center, the intensity becomes uniform regardless of the detected position.

Abstract: An apparatus and method are disclosed for localizing an element of interest in a sample by comparing XRF spectra acquired from at least two distinct but overlapping inspection volumes. The inspection volumes are varied by changing the geometry of the exciting x-ray and/or fluoresced x-ray beam(s), which may be accomplished by repositioning multi-apertured collimators. Comparison of the XRF spectra acquired from different inspection volumes provides an indication as to whether the element of interest (e.g., lead) is present in a coating layer, in the underlying bulk material, or in both.

Abstract: The present invention includes a method and apparatus for measuring the removal of analyte from a cell. One or more cells are provided, comprising at least 10 picograms of an analyte within a volume defined by the area of an x-ray excitation beam and a depth of a depth of five times the 1/e attenuation depth for at least one characteristic x-ray signal of the analyte as attenuated by water. At least a of portion of the analyte is removed from the cells; and the analyte is measured using x-ray fluorescence.

Abstract: An X-ray fluorescence analyzing method includes irradiating a liquid sample (3A) containing hydrogen and at least one element of carbon, oxygen and nitrogen with primary X-rays (2); measuring the intensity F of fluorescent X-rays (4) from each of elements in the sample (3A) and having the atomic number 9 to 20, and the intensity S of scattered X-rays (12) from the sample (3A) caused by continuous X-rays in the primary X-rays; and calculating the concentration of each of the elements, based on the ratio between the measured intensity F, and the measured intensity S. The wavelength of the scattered X-rays (12) is so chosen as to be shorter than that of the fluorescent X-rays (4) and is so set that the measured intensity S and the mass absorption coefficient thereof are inversely proportional to each other within the range of variation of a composition of the sample (3A).

Abstract: The X-ray fluorescence spectrometer of the present invention includes a sample table (8) for a sample (S) having a crystalline structure, an X-ray source (1), a detecting unit (7) for detecting secondary X-rays (4) from the sample (S), a rotating unit (11) for rotating the sample table (8), a parallel translating unit (12) for causing the sample table (8) to undergo a parallel translational movement, a selecting unit (17) for selecting three of circumvent angles, at which diffracted X-rays can be circumvented, based on a diffraction profile obtained from the angle of rotation of the sample (S) and the intensity of secondary X-rays (4), the interval between the neighboring circumvent angles being smaller than 180°, and a control unit (15) for controlling the rotating unit (11) so as to set the sample (S) at the circumvent angle at which the sample table (8) will not interfere with any other structures.

Abstract: A method for inspection includes irradiating, with a focused beam, a feature formed on a semiconductor wafer, the feature including a volume containing a first material and a cap made of a second material, different from the first material, that is formed over the volume. One or more detectors positioned at different angles relative to the feature are used to detect X-ray fluorescent photons that are emitted by the first material in response to the irradiating beam and pass through the cap before striking the detectors. Signals output by the one or more detectors at the different angles in response to the detected photons are processed in order to assess a quality of the cap.

Abstract: The present invention discloses an apparatus and a method for detecting a mark as well as a semiconductor device processing system. In order to address the problem existing in the prior art that detection of a mark in a layer of a semiconductor device has a low accuracy, the present invention uses an X-ray emitter and an X-ray detector to image the mark contained in the layer of the semiconductor device supported on the supporting member. According to the present invention, due to the use of the X-ray, even if the mark is covered by multiple layers which are opaque to visible light, the mark may be clearly imaged.

Abstract: Systems and methods for characterizing films by X-ray photoelectron spectroscopy (XPS) are disclosed. For example, a system for characterizing a film may include an X-ray source for generating an X-ray beam having an energy below the k-edge of silicon. A sample holder may be included for positioning a sample in a pathway of the X-ray beam. A first detector may be included for collecting an XPS signal generated by bombarding the sample with the X-ray beam. A second detector may be included for collecting an X-ray fluorescence (XRF) signal generated by bombarding the sample with the X-ray beam. Monitoring/estimation of the primary X-ray flux at the analysis site may be provided by X-ray flux detectors near and at the analysis site. Both XRF and XPS signals may be normalized to the (estimated) primary X-ray flux to enable film thickness or dose measurement without the need to employ signal intensity ratios.

Abstract: An x-ray analysis system having an x-ray engine with an x-ray source for producing an x-ray excitation beam directed toward an x-ray analysis focal area; a sample chamber for presenting a sample stream to the x-ray analysis focal area, the analysis focal area disposed within a sample analysis area defined within the chamber; an x-ray detection path for collecting secondary x-rays and directing the x-rays toward a detector; an x-ray transparent barrier on a wall of the chamber through which the x-rays pass; and a blocking structure partially blocking the sample analysis area, for creating sample stream turbulence in the sample analysis area and over the barrier. The blocking structure may be disposed asymmetrically about a central axis of the x-ray analysis focal area and/or the sample analysis area; and may be a rounded pin. A heating element may be used to heat the sample stream for improving flow.

Abstract: Methods and systems for monitoring semiconductor fabrication processes are provided. A system may include a stage configured to support a specimen and coupled to a measurement device. The measurement device may include an illumination system and a detection system. The illumination system and the detection system may be configured such that the system may be configured to determine multiple properties of the specimen. For example, the system may be configured to determine multiple properties of a specimen including: but not limited to, critical dimension and overlay misregistration; defects and thin film characteristics; critical dimension and defects; critical dimension and thin film characteristics; critical dimension, thin film characteristics and defects; macro defects and micro defects; flatness, thin film characteristics and defects; overlay misregistration and flatness; an implant characteristic and defects; and adhesion and thickness.

Abstract: An X-ray analyzer (1) includes: a transmission X-ray inspecting portion (10) including: a first X-ray source (12); and a transmission X-ray detector (14) for detecting a transmission X-ray (12x) having passed through a sample (100) from the first X-ray source; a fluorescent X-ray inspecting portion (20) including: a second X-ray source (22); and a fluorescent X-ray detector (24) for detecting a fluorescent X-ray (22y) output from the sample when the sample is irradiated with an X-ray from the second X-ray source; a movement mechanism (30) for moving a sample stage (50); a foreign matter position calculating unit (60) for calculating a position of a foreign matter (101); and a movement mechanism control unit (61) for controlling the movement mechanism so that the position of the foreign matter calculated by the foreign matter position calculating unit coincides with an optical axis (22c) of the second X-ray source.

Abstract: An instrument is provided that can monitor nucleic acid sequence amplification reactions, for example, PCR amplification of DNA and DNA fragments. The instrument includes a multi-notch filter disposed along one or both of an excitation beam path and an emission beam path. Methods are also provided for monitoring nucleic acid sequence amplifications using an instrument that includes a multi-notch filter disposed along a beam path.

Abstract: An X-ray fluorescence (XRF) instrument comprises a hand-held device housing which holds a radiation emitter configured to emit radiation directed at a test object and a radiation detector housed inside a chamber closed by a sealing window and configured to detect radiation of the test object, caused by the test object being exposed to the emitted radiation. A protective cover mechanism is affixed to the testing device and is configured to have a closed position which covers or blocks access to the sealing window to protect it from being broken or damaged by debris or other obstructions, and an open position which exposes the sealing window to allow the un-obstructed passage of radiation therethrough. The cover mechanism can be implemented variously, including by a pivotally mounted cover plate, an iris mechanism, a fan-like cover and the like. Debris can be detected variously, including by strain sensors, optical detectors and proximity sensors.

Abstract: To provide a method and device for testing the size and conductivity of a foreign material adhered to a substrate for a liquid crystal display device, there is provided a method of testing whether a foreign material including a metal element is adhered to a substrate for a liquid crystal display device, the method including a first test step of detecting the size and position of the foreign material adhered to the substrate and a next step of testing whether the foreign material includes the metal element at the position detected in the first test step.

Abstract: An apparatus to examine a target volume in a patient includes an x-ray source generating a first x-ray beam targeting the target volume, and a detector which is placed at an angle less than 180 degrees relative to a beam path of the first x-ray beam to receive a second x-ray beam generated from the first x-ray beam interacting with the target volume. A method to image a target volume in a patient includes directing a first x-ray beam generated from an x-ray source at the target volume, wherein a second x-ray beam is generated by an interaction of the first x-ray beam with the target volume, detecting the second x-ray beam using a detector that is placed at less than 180 degrees relative to a path of the first x-ray beam, and obtaining spatial and temporal information of the target volume using the detected second x-ray beam.

Abstract: An XRF analysis apparatus includes a housing with a source of penetrating radiation to be directed at a sample and a detector for detecting fluoresced radiation from the sample. A shield is attachable to the housing to protect the user from radiation and a safety interlock is configured to detect whether or not the shield is attached to the housing. A controller is responsive to the safety interlock, and configured to monitor usage of the source of radiation at or above a predetermined power level when the shield is not attached to the housing and provide an output signal when the monitored usage of the source of penetrating radiation at or above the predetermined power level without the shield attached to the housing exceeds one or more predetermined thresholds.

Abstract: An X-ray metrology system for a vacuum deposition chamber includes a vacuum interface assembly mounted through an aperture in the exterior wall of the chamber and extending into the interior of the chamber. The interface assembly is formed from a housing having side walls and a bottom forming an interior chamber, and an X-ray port mounted in an aperture in the bottom of the housing. The X-ray port has two apertures therethrough, with each aperture being covered by a window of beryllium. An X-ray metrology machine having a generator and detector is disposed within the housing, and the apertures in the X-ray port are arranged so that X-rays generated by the generator pass through one of the apertures, and X-rays fluorescing off of a substrate in the deposition chamber travel through the other aperture to the detector.

Abstract: An X-ray tube includes a cathode, an anode with an electron receiving surface, and a window facing the electron receiving surface of the anode. On the electron receiving surface of the anode it includes a layer of anode material. Deeper in the anode than the layer of anode material, there is a block of attenuator material. The atomic number of the attenuator material is less than one third of the atomic number of the anode material.

Abstract: The invention provides a method of performing X-ray diffraction (XRD) and/or X-ray fluorescence (XRF) analysis of a sample, comprising: irradiating a sample with X-rays from an X-ray source; providing a combined XRD and XRF detection arrangement comprising a scanning wavelength selector and at least one X-ray detector for detecting X-rays selected by the wavelength selector; and performing XRD analysis of the sample by selecting at least one fixed wavelength of X-rays diffracted by the sample using the scanning wavelength selector and detecting X-rays of the selected fixed wavelength(s) at one or more values of the diffraction angle cp at the sample using the X-ray detector(s); and/or performing XRF analysis of the sample by scanning wavelengths of X-rays emitted by the sample using the scanning wavelength selector and detecting X-rays of the scanned wavelengths using the X-ray detector(s).

Abstract: A method for assisting a person performing a minimally invasive intervention with a catheter involving a puncture of a septum, in particular of a heart, is proposed. A three-dimensional image data record is recorded showing an anatomical structure in the region of the septum. An item of septum information showing the position of the septum is determined in the image data record and additional information is derived from the position of the anatomical structure influencing or showing the selection of a puncture site. During the intervention, the fluoroscopic images of the region are continuously recorded and a current fluoroscopic image is displayed and superimposed with the septum information and/or the additional information based on a registration of the image data record with the fluoroscopic images.

Abstract: An apparatus and method are disclosed for localizing an element of interest in a sample by comparing XRF spectra acquired from at least two distinct but overlapping inspection volumes. The inspection volumes are varied by changing the geometry of the exciting x-ray and/or fluoresced x-ray beam(s), which may be accomplished by repositioning multi-apertured collimators. Comparison of the XRF spectra acquired from different inspection volumes provides an indication as to whether the element of interest (e.g., lead) is present in a coating layer, in the underlying bulk material, or in both.

Abstract: Provided is an X-ray analyzer that is capable of reducing measurement time necessary for mapping analysis by measuring only regions on a sample targeted by a measurer with minimal action. A superimposition process of a mapping image and image data of the sample is performed, and a position corresponding to an irradiation point is determined. Based on the result, the image is displayed, and measurement execution regions are designated on the displayed image and hence a sample moving mechanism moves at high speed in regions excluding the designated regions.

Abstract: A method for quantitatively testing a radiation shielding garment to determine its radiation shielding integrity, utilizing a fluoroscopic system, the method comprising measuring the amount of radiation passing through the garment at a particular location believed to be possibly damaged; measuring the amount of radiation at one or more locations of the garment believed to be intact; determining the average undamaged transmission if more than one location is tested; and comparing the two values of transmitted radiation to determine whether the first location was damaged beyond an acceptable degree.

Abstract: A method of fluorescence imaging is provided. The method provides for simultaneously acquiring image data at a plurality of phases and a plurality of frequencies from a region of interest, identifying at least one desired signal and at least one background signal in the acquired image data associated with the region of interest, constructing a digital filter based upon the at least one desired signal and the at least one background signal, wherein the digital filter is configured to enhance image contrast and applying the digital filter to the acquired image data associated with the region of interest to enhance image contrast in the acquired image data. Systems and computer programs that afford functionality of the type defined by this method are also provided.

Abstract: A dental fluoroscopic imaging system includes a flat panel detector comprising a converter, a plate, a collector, a processing unit, and a transmitter suitable for 2D, intraoral dental fluoroscopy and for 3D extraoral dental fluoroscopy. The converter contains a material capable of transforming low dose radiation received from an emitter after going through the dental examination area into electrical signals. The plate transmits the electric signals to a collector, which amplifies the signals. The processing unit processes the signals into digital images, and the transmitter transfers digital images sequentially to a host computer having software that acquires, processes, transforms, records, freezes, and enhances 2D and 3D images, and compiles videos having video frame rates of between 3 and 100 frames per second. Two dimensional images and video are obtained using a single flat panel detector, while three dimensional images and video are obtained using two flat panel detectors.

Abstract: The present invention includes an apparatus for preparing samples for measurement by x-ray fluorescence spectrometry. The apparatus comprises a plate having one or more holes passing through the plate. The holes are covered by a film on one side of the plate. The holes are less than 500 micrometers across in one dimension where the film covers the holes. The film is translucent to x-rays. The present invention also includes an apparatus for preparing samples for measurement by x-ray fluorescence spectrometry. The apparatus comprises a plate having one or more holes passing through the plate. The holes are covered on one side of the plate by a detachable cover forming a water-tight seal against the plate. The cover is substantially free of the elements osmium, yttrium, iridium, phosphorus, zirconium, platinum, gold, niobium, mercury, thallium, molybdenum, sulfur, lead, bismuth, technetium, ruthenium, chlorine, rhodium, palladium, argon, silver, and thorium.

Abstract: An apparatus and method are disclosed for localizing an element of interest in a sample by comparing XRF spectra acquired from at least two distinct but overlapping inspection volumes. The inspection volumes are varied by changing the geometry of the exciting x-ray and/or fluoresced x-ray beam(s), which may be accomplished by repositioning multi-apertured collimators. Comparison of the XRF spectra acquired from different inspection volumes provides an indication as to whether the element of interest (e.g., lead) is present in a coating layer, in the underlying bulk material, or in both.

Abstract: When a reception unit in an X-ray image reception system receives an image and additional information for the image from an X-ray image transmission system, the received additional information is sent to a resend setting determination unit. The resend setting determination unit determines a resend setting based on the received additional information and information acquired from a database and transmits the result to a reception completion determination unit. A packet loss determination unit determines packet loss in data received from the reception unit and transmits the result to the reception completion determination unit. The reception determination completion unit sends the results to the resent setting determination unit and the packet loss determination unit to the resend request unit. The resend request unit sends a resend request to the X-ray image transmission system based on the information from the reception unit and the result determined by the reception completion determination unit.

Abstract: A system for processing real-time fluoroscopy image sequences. A first image frame is loaded into an upper level memory of a hierarchical memory system that is coupled to at least one processing core. The first image frame is processed with an object detection filter to form a likelihood image frame. The first image frame and the likelihood image frame is spatially filtered using a spatial filter look up table (LUT) stored in an L1 level memory of the processing core. The likelihood image frame is temporally filtering using a temporal filter LUT stored in the L1 level memory.

Abstract: A method and system for reducing scintillator afterglow. Methods for reducing afterglow include conditioning a scintillator by exposing it to high flux densities of ionizing radiation. One technique includes operating an x-ray tube at elevated amperage.

Abstract: An X-ray imaging apparatus according to one embodiment captures an X-ray image by irradiating a subject with X-rays from an X-ray generating means, and detecting X-rays that have penetrated the subject with an X-ray detecting means, and includes a working-state detecting means and an X-ray dosage control means. The working-state detecting means detects a plurality of types of working-state information related to the working state of the operator performing surgery on the subject. The X-ray dosage control means, based on the plurality of types of detection results detected by the working-state detecting means, controls the X-ray dosage irradiated from the X-ray generating means.

Abstract: Sample cup holding devices including a base member with a top side, a bottom side, and one or more apertures extending from the top side to the bottom side, each of the one or more apertures for receiving a sample cup and maintaining the sample cup in a substantially vertical position, and a method for using same are provided.

Abstract: An apparatus for analyzing bacteria is described that includes an analytic sample preparation section for preparing an analytic sample by treating a specimen so as to generate a morphological difference between Gram-negative bacteria and Gram-positive bacteria, a detector for detecting optical information from each particle contained in the analytic sample and an analyzing section for detecting Gram-positive bacteria contained on the basis of the detected optical information. A method for analyzing bacteria is also described.

Abstract: A device for X-ray analysis of a sample (1), including: a generation system for the generation of an X-ray beam to irradiate an analysis zone of the sample, said analysis zone defining a analysis mean plane, and the X-ray beam being emitted along a direction of incidence; a detection system for the detection, in at least one dimension, of X-rays diffracted by the irradiated analysis zone. An analyser system located between the sample and the detection system and includes an X-ray diffracting surface forming a partial surface of revolution about an axis of revolution being contained in the analysis mean plane, with the axis of revolution being distinct from the direction of incidence and passing through the centre of the analysis zone, and with the diffracting surface being oriented so as to diffract the X-rays toward the detection system.

Abstract: A device, system and method for nondestructively obtaining qualitative and/or quantitative information relating to the material properties of a region in a diamond body comprises directing x-rays onto the body. The body can comprise sintered or unsintered diamond. The body can ultimately be in the form of a cutting element used with a subterranean drill bit. The x-rays penetrate the body and cause a target element within the desired region including the same to emit x-ray fluorescence. The emitted x-ray fluorescence is received and information relating to content, location, and/or distribution of the target element in the region within the body is determined therefrom. The measured region can extend axially or radially from a surface of the body, and the target elements are nondiamond materials that can be constituents of a substrate attached to the body, or of a container used during HPHT sintering of the body.

Abstract: Active optics apparatus and method for aligning active optics are provided for a high-resolution, active optic fluorescence analyzer combining a large acceptance solid angle with wide energy tunability. A plurality of rows of correctors selectively controlled to bend an elongated strip of single crystal material like Si (400) into substantially any precisely defined shape. A pair of pushers engages opposite ends of the silicon crystal strip exert only a force along the long axis of the crystal strip, and does not induce additional bending moments which would result in a torsion of the crystal.

Abstract: The X-ray fluorescence analyzer (100) includes: an enclosure (10); a door (20) for putting the sample into and out of the enclosure; a height measurement mechanism (7) capable of measuring a height at the irradiation point; a moving mechanism control unit (9) for adjusting a distance between the sample and the radiation source as well as the X-ray detector based on the measured height at the irradiation point; a laser unit (7) for irradiating the irradiation point with a visible light laser beam; a laser start control unit (9) for irradiating the visible light laser beam by the laser unit (7) when the door is open state; and a height measurement mechanism start control unit (9) for starting the height measurement mechanism to measure the height at the irradiation point when the door is opened.

Abstract: This invention relates to the use of thick target materials 50 microns and thicker for an x-ray transmission tube; to possible target material compositions including various elements and their alloys, eutectic alloys, compounds, or intermetallic compounds; and applications for utilizing such thick target transmission x-ray tubes. The target comprises at lease one portion of the target with a thickness of 50 microns or greater. The target can be optionally attached to a substrate end-window essentially transparent to x-rays or be thick enough so that no such substrate is required. Applications include producing a high percentage of monochromatic line mission x-rays of said thick target for use in reduced dose medical imaging and other non-destructive testing applications.

Abstract: A hand-held XRF analyzer including an x-ray source for emitting x-rays through a window to a sample. A detector behind the window is responsive to x-rays irradiated by the sample. A controlled volume about the x-ray source and the detector is maintained in a vacuum or a predetermined purge condition for a predetermined amount of time for increasing the sensitivity of the analyzer. A processor is responsive to the detector for analyzing the spectrum of irradiated x-rays and responsive to a pressure sensor for detecting a pressure change inside the controlled volume. The processor is configured to detect if the vacuum or the predetermined purge condition has been compromised.

Abstract: A method is provided of calculating the structure of an inhomogeneous sample in which an electron beam is used to cause excitation of x-rays from the sample under known conditions of beam energy and geometry with respect to the sample. Notably the beam current is unknown. Measured x-ray intensity data for the sample corresponding to one or more sets of beam conditions and beam currents are firstly obtained, together with comparative x-ray intensity data for samples having known structures. A beam current factor for each beam condition is estimated and effective x-ray intensity data for each of the sets of conditions are then calculated using the measured and comparative x-ray intensity data and the beam current factor. The structure of the sample is then calculated for each of the sets of conditions using the effective x-ray intensity data. Predicting x-ray intensity data are produced corresponding to the calculated structure and compared with the effective x-ray intensity data.

Abstract: An imaging system for imaging an object, including: a support member adapted to receive the object in an immobilized state; a removable phosphor plate assembly adapted to respond to ionizing radiation by emitting visible light; first imaging means for imaging the immobilized object in a first imaging mode to capture a first image; second imaging means for imaging the immobilized object in a second imaging mode, different from the first imaging mode, to capture a second image; and third imaging means for imaging the immobilized object in a third imaging mode, different from the first and second imaging modes, to capture a third image, wherein the first imaging mode uses the phosphor plate assembly and is selected from the group: x-ray mode and low energy radio isotope mode; the second imaging mode uses the phosphor plate assembly and a high energy radio isotope mode, and the third imaging mode is selected from the group: bright-field mode, fluorescence mode and luminescence mode.