Plural Diverse X-ray Analyses Patents (Class 378/46)
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Patent number: 11110844Abstract: A core analysis system having a trailer and an analysis assembly secured to the trailer. The analysis assembly includes an X-ray Fluorescence (XRF) detection subassembly defining a sample analysis area. The analysis assembly further includes a conveyor subassembly configured to selectively deliver one or more core samples to the sample analysis area of the XRF detection subassembly.Type: GrantFiled: September 6, 2019Date of Patent: September 7, 2021Assignee: BLY IP INC.Inventors: Peter Kanck, Ry Zawadzki
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Patent number: 10684378Abstract: An X-ray detector includes at least two X-ray detector modules which are articulately connected to one another; a drive mechanism configured to position the at least two articulately connected X-ray modules around the sample; a control unit configured to control the drive mechanism to move the at least two detector modules relative to one another such that the at least two detector modules are arranged around the sample along a pre-calculated curved line having a curvature that depends on a selected distance between the detector and the sample. Also provided is an X-ray analysis system comprising the above X-ray detector and a method of controlling the X-ray detector.Type: GrantFiled: June 26, 2018Date of Patent: June 16, 2020Assignee: Rigaku CorporationInventors: Damian Kucharczyk, Mathias Meyer
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Patent number: 10514346Abstract: Provided is an X-ray fluorescence spectrometer, which has a simple structure, and is capable of promptly performing high-accuracy analysis.Type: GrantFiled: November 21, 2017Date of Patent: December 24, 2019Assignee: RIGAKU CORPORATIONInventor: Yukio Sako
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Patent number: 10126256Abstract: Methods and arrangements identify crystalline phases in a polycrystalline sample by determining a normalized vector p(i) for the chemical composition of the expected crystal structure, at each measurement point of the sample, recording a spectrum by means of energy-dispersive X-ray spectroscopy and determining the chemical composition, and recording an electron diffraction image and determining of the diffraction bands. The methods and arrangements also determine a normalized vector v for the chemical composition, compare the normalized vector v with each of the normalized vectors p(i) of the expected crystal structures and outputting an evaluation factor s(i) for the similarity of the vectors in each case, compare the diffraction bands with those of the expected crystal structures and outputting an evaluation factor n(i), and determining an overall quality from the two evaluation factors and identifying the crystal structure with the highest overall quality as belonging to the measurement point.Type: GrantFiled: March 31, 2015Date of Patent: November 13, 2018Assignee: BRUKER NANO GMBHInventor: Thomas Schwager
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Patent number: 10046436Abstract: A polycrystalline diamond compact (PDC) is fabricated using a process of delayed diffusion (i.e., post-sintering) of a diffusion species (i.e., a metalloid) introduced from the back side of a carbide further away from the diamond grit or from the flank side of the carbide, as opposed to the side of the carbide adjacent to the diamond grit. The process of fabricating the PDC includes depositing, in a metal container, a synthetic diamond grit, a carbide, and a diffusion species, then applying a high pressure and high temperature (HPHT) to the contents of the metal container wherein (1) the carbide diffuses across the diamond grit, and (2) the diffusion species diffuses across the carbide followed by the diamond grit, thus providing a protective coating to the PDC.Type: GrantFiled: August 17, 2015Date of Patent: August 14, 2018Assignee: Diamond Innovations, Inc.Inventors: Gary Martin Flood, Joel Vaughn
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Patent number: 10018748Abstract: Systems and methods for determining characteristics of a fluid in a subterranean well include providing a production pipe extending into the subterranean well to convey the fluids from within the subterranean well to an earth's surface. An x-ray source is located on a first side of the production pipe. An x-ray beam is directed into the production pipe, into the fluids, and out of an opposite side of the production pipe as a resulting beam, with the x-ray source. A level of attenuation of the resulting beam is detected with an attenuation detector located on an opposite side of the production pipe. A fluorescence spectra of the resulting beam is detected with a scattered fluorescence detector located on the opposite side of the production pipe. A fluorescence peak of the resulting beam is detected with a peak fluorescence detector located on the opposite side of the production pipe.Type: GrantFiled: January 12, 2016Date of Patent: July 10, 2018Assignee: Saudi Arabian Oil CompanyInventors: Michael John Black, Talha Jamal Ahmad, Mohamed Nabil Noui-Mehidi
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Patent number: 9443042Abstract: Embodiments of systems and methods are disclosed for evaluating a superabrasive material by a three-dimensional model generated using a computed tomography scanner. The model is analyzed to identify a superabrasive matrix within the model and at least one performance characteristic of the superabrasive material is determined according to at least one property of the superabrasive matrix. Methods are also disclosed for characterizing crystal-to-crystal bonding regions and non-superabrasive material within an interstitial matrix of the superabrasive matrix.Type: GrantFiled: February 20, 2015Date of Patent: September 13, 2016Assignee: US SYNTHETIC CORPORATIONInventors: Craig H. Cooley, Debkumar Mukhopadhyay, Kenneth E. Bertagnolli
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Patent number: 9176080Abstract: An X-ray fluorescence (XRF) instrument comprises a hand-held device housing which holds a radiation emitter configured to emit radiation directed at a test object and a radiation detector housed inside a chamber closed by a sealing window and configured to detect radiation of the test object, caused by the test object being exposed to the emitted radiation. A protective cover mechanism is affixed to the testing device and is configured to have a closed position which covers or blocks access to the sealing window to protect it from being broken or damaged by debris or other obstructions, and an open position which exposes the sealing window to allow the un-obstructed passage of radiation therethrough. The cover mechanism can be implemented variously, including by a pivotally mounted cover plate, an iris mechanism, a fan-like cover and the like. Debris can be detected variously, including by strain sensors, optical detectors and proximity sensors.Type: GrantFiled: July 17, 2012Date of Patent: November 3, 2015Assignee: Olympus NDT, Inc.Inventor: Michael Drummy
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Patent number: 9065432Abstract: A device that processes a signal delivered by a radiation detector includes a circuit that delivers a voltage pulse whose amplitude is proportional to a charge detected by the radiation detector. The device also includes an analog to digital converter to digitize the voltage pulse at a given sampling frequency and delivers a corresponding digital signal to a processing circuit. The processing circuit reads the digital signal, computes a temporal variation rate of the digital signal and captures the digital signal when the temporal variation reaches a threshold.Type: GrantFiled: October 27, 2010Date of Patent: June 23, 2015Assignee: Commissariat à l'énergie atomique et aux énergies alternativesInventors: Patrice Ouvrier-Buffet, Andrea Brambilla
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Patent number: 9036778Abstract: A Compton radiation detection device for determining of Compton radiation of iron, includes a sensor and a filter arrangement. The filter arrangement is adapted such that the radiation emitted by a test object due to Compton scattering passes a nickel layer and an iron layer before being detected by the sensor. A dispersive ionization chamber includes an ionization chamber having a plurality off ionization volumes and a window. Each ionization volume includes an electrode. Radiation can enter through the window. The ionization volumes are arranged in a beam propagation direction behind each other. Radiation having lower energy is statistically absorbed in ionization volumes located more proximal to the window. Radiation having higher energy is statistically absorbed in the ionization volumes located more distal from the window.Type: GrantFiled: June 26, 2012Date of Patent: May 19, 2015Assignee: Rayonic Sensor System GmbHInventors: Rigobert Olszewski, Peter Helbig, Hanns-Werner Ortner, Karl-Heinz Golz
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Patent number: 9031187Abstract: The invention provides an apparatus and a method of performing X-ray diffraction (XRD) and/or X-ray fluorescence (XRF) analysis of a sample, comprising: irradiating a sample with X-rays from an X-ray source; providing a combined XRD and XRF detection arrangement comprising a scanning wavelength selector and at least one X-ray detector for detecting X-rays selected by the wavelength selector; and performing XRD analysis of the sample by selecting at least one fixed wavelength of X-rays diffracted by the sample using the scanning wavelength selector and detecting X-rays of the selected fixed wavelength(s) at one or more values of the diffraction angle ? at the sample using the X-ray detector(s); and/or performing XRF analysis of the sample by scanning wavelengths of X-rays emitted by the sample using the scanning wavelength selector and detecting X-rays of the scanned wavelengths using the X-ray detector(s).Type: GrantFiled: December 13, 2010Date of Patent: May 12, 2015Assignee: Thermo Fisher Scientific (Ecublens) SARLInventors: Ravisekhar Yellepeddi, Pierre-Yves Negro
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Patent number: 9001960Abstract: A method for reconstructing an image of an object includes acquiring a set of measured projection data, reconstructing the measured projection data using a first algorithm to generate a first reconstructed image dataset, reconstructing the measured projection data using a second algorithm to generate a second reconstructed image dataset, the second algorithm being utilized to improve the temporal resolution of the second reconstructed image dataset, and generating a final image dataset using both the first and second image datasets.Type: GrantFiled: January 4, 2012Date of Patent: April 7, 2015Assignee: General Electric CompanyInventors: Brian Edward Nett, Bruno De Man, Jiang Hsieh, Jed Douglas Pack, Zhou Yu, Guangzhi Cao
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Patent number: 8989344Abstract: A system and a method for measuring an ash content and a calorific value of a coal are provided. The system comprises: an X ray device, disposed over the coal and configured to emit an X ray to the coal; at least one X ray measuring device, disposed over the coal and configured to measure an energy spectrum of an X ray reflected by the coal; a distance sensor, disposed over the coal and configured to measure a distance between the coal and the at least one X ray measuring device; and a computing device, configured to receive the energy spectrum and the distance from the at least one X ray measuring device and the distance sensor and to compute the ash content and the calorific value of the coal according to the energy spectrum and the distance.Type: GrantFiled: December 20, 2012Date of Patent: March 24, 2015Assignee: Tsinghua UniversityInventors: Hongchang Yi, Qian Lin, Jianping Cheng
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Patent number: 8971483Abstract: There is provided an X-ray composite apparatus capable of performing, with one unit, X-ray CT and element analysis by fluorescent X-rays. The X-ray composite apparatus 100 includes an X-ray source 110 generating cone beam X-rays, a sample support 150 holding a sample S, collimator parts 130 and 140 capable of narrowing the cone beam X-rays to form parallel X-rays, depending on the intended use, between the X-ray source and the sample support 150, a two-dimensional detector 170 detecting the cone beam X-rays transmitted through the sample S, and a fluorescent X-ray detector 176 detecting fluorescent X-rays radiated from the sample S, and when the apparatus is used for X-ray CT, the apparatus irradiates the sample with the cone beam X-rays, while when the apparatus is used for fluorescent X-ray analysis, the apparatus irradiates the sample S with the parallel X-rays.Type: GrantFiled: March 12, 2013Date of Patent: March 3, 2015Assignee: Rigaku CorporationInventors: Katsunari Sasaki, Yukihiro Hara, Kiyoshi Akiyama
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Patent number: 8957894Abstract: A method for generating time-resolved 3D medical images of a subject by imparting temporal information from a time-series of 2D medical images into 3D images of the subject. Generally speaking, this is achieved by acquiring image data using a medical imaging system, generating a time-series of 2D images of a ROI from at least a portion of the acquired image data, reconstructing a 3D image substantially without temporal resolution from the acquired image data, and selectively combining the time series of 2D images with the 3D image.Type: GrantFiled: February 3, 2014Date of Patent: February 17, 2015Assignees: Mistretta Medical, LLC, CMS Medical, LLCInventors: Charles A. Mistretta, Charles M. Strother
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Patent number: 8933401Abstract: A scanning transmission electron microscopy (STEM) system is disclosed. The system may make use of an electron beam scanning system configured to generate a plurality of electron beam scans over substantially an entire sample, with each scan varying in electron-illumination intensity over a course of the scan. A signal acquisition system may be used for obtaining at least one of an image, a diffraction pattern, or a spectrum from the scans, the image, diffraction pattern, or spectrum representing only information from at least one of a select subplurality or linear combination of all pixel locations comprising the image. A dataset may be produced from the information. A subsystem may be used for mathematically analyzing the dataset to predict actual information that would have been produced by each pixel location of the image.Type: GrantFiled: October 25, 2013Date of Patent: January 13, 2015Assignee: Lawrence Livermore National Security, LLCInventor: Bryan W. Reed
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Patent number: 8903040Abstract: An X-ray multiple spectroscopic analyzer includes an X-ray source, an optical system inputting X-rays to a single-crystal sample, a sample stage supporting the single-crystal sample, an X-ray diffraction detector, a rotation driving system that changes the angle of the X-ray diffraction detector, an X-ray diffraction measurement data storage unit, a structural analysis data analyzing unit, an energy-dispersive X-ray fluorescence detector, an X-ray fluorescence measurement data storage unit, an X-ray fluorescence analyzing unit, an X-ray fluorescence analysis data storage unit, and X-ray fluorescence analysis data acquiring unit. The structural analysis data analyzing unit analyzes the data of the crystal structure further on the basis of the analysis data of the fluorescent X-rays output from the X-ray fluorescence analysis data acquiring unit.Type: GrantFiled: May 4, 2012Date of Patent: December 2, 2014Assignee: Rigaku CorporationInventors: Masataka Maeyama, Akihito Yamano
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Patent number: 8891729Abstract: An X-ray analyzer includes a transmission X-ray inspecting portion having a first X-ray source and a transmission X-ray detector for detecting a transmission X-ray that passed through a sample from the first X-ray source, and a fluorescent X-ray inspecting portion having a second X-ray source and a fluorescent X-ray detector for detecting a fluorescent X-ray output from the sample when the sample is irradiated with an X-ray from the second X-ray source. A movement mechanism moves a sample stage that supports the sample. A foreign matter position calculating unit calculates a position of foreign matter in the sample, and a movement mechanism control unit controls the movement mechanism so that the position of the foreign matter calculated by the foreign matter position calculating unit coincides with an optical axis of the second X-ray source.Type: GrantFiled: August 2, 2012Date of Patent: November 18, 2014Assignee: SII NanoTechnology Inc.Inventors: Yoshiki Matoba, Rintaro Nakatani, Tsuneo Sato
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Patent number: 8835857Abstract: A device for a radiation detector includes a main body, which includes a material G and is at least partially provided with a coating. The coating has at least a first layer with a material A1. The material G of the main body can be excited by a primary radiation impinging on the coating, so that an x-ray fluorescence radiation is produced with an x-ray fluorescence spectrum, which has a maximum MG at an energy EG. Furthermore, at an energy E1, the material A1 has an absorption edge. In this case, the material A1 is chosen such that the relationships E1<EG and EG?E1?4 keV apply. Also specified is a radiation detector, which has the device and a detector element, which is suitable for the detection of the primary radiation.Type: GrantFiled: August 9, 2012Date of Patent: September 16, 2014Assignee: Ketek GmbHInventor: Tobias Eggert
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Patent number: 8808668Abstract: The present invention provides methods and compositions for modulating x-ray attenuation, where the x-ray attenuation compound can comprise a molecule having at least two conformational states, a first k-edge atom attached to the molecule at a first position, and a second k-edge atom attached to the molecule at a second position, where the molecule changes from a first conformational state to a second conformational state in response to an external stimulus. Additionally, a first interatom distance between the first k-edge atom and the second k-edge atom in the first conformational state can be within a first harmonic error of 0 to about 0.2, and a second interatom distance between the first k-edge atom and the second k-edge atom in the second conformational state can be within a second harmonic error of about 0.8 to 1.0.Type: GrantFiled: April 14, 2009Date of Patent: August 19, 2014Assignee: University of Utah Research FoundationInventors: Steven Poelzing, Rengasayee Veeraraghavan, Adam Smoot
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Patent number: 8767912Abstract: The system for the inspection and imaging of insulated pipes and vessels using backscattered gamma radiation and X-ray fluorescence includes a frame having a pair of coaxial rings adapted for coaxial mounting about the insulated pipe, vessel or the like. A pair of rotating supports are rotatably mounted within the pair rings for driven rotation thereof. A plurality of horizontal supports are secured to, and extend between, the pair of rotating supports such that each of the horizontal supports extends along a direction parallel to an axis of the insulated pipe. A plurality of inspection modules are slidably mounted to the horizontal supports. Each inspection module includes at least one radiation source, an X-ray fluorescence detector and a backscattered gamma radiation detector. The plurality of inspection modules are linearly translated along the axial direction of the pipe, and also circumferentially rotated therearound for simultaneous, three-dimensional inspection of the pipe body.Type: GrantFiled: April 9, 2013Date of Patent: July 1, 2014Assignee: King Abdulaziz UniversityInventor: Samir Abdul-Majid Alzaidi
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Patent number: 8744042Abstract: A detection apparatus for fine particles in a fluid includes: a flow cell which passes the fluid therein; an X-ray source which irradiates a side face of the flow cell with X-rays; an X-ray detector that detects the intensity of transmission X-rays that the X-rays which have been emitted from the X-ray source have been attenuated by due to the fine particles in the fluid; a fluorescent X-ray detector which detects fluorescent X-rays that are emitted by the fine particles in the fluid due to the X-rays which have been emitted from the X-ray source; and a data processing device which discriminates between fine particles and air bubbles in the fluid based on the fluctuation amount from each reference variable of the intensity of the transmission X-rays and the intensity of the fluorescent X-rays, and calculates the number and the particle diameter of the fine particles.Type: GrantFiled: January 14, 2011Date of Patent: June 3, 2014Assignee: Japan Atomic Energy AgencyInventors: Akira Ohzu, Fumitaka Esaka, Kenichiro Yasuda
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Patent number: 8653457Abstract: A method of examining a sample using a spectroscopic apparatus, comprising the following steps: Mounting the sample on a sample holder; Directing a focused input beam of radiation onto a location on the sample, thereby producing an interaction that causes a flux of stimulated photonic radiation to emanate from said location; Examining said flux using a multi-channel photon-counting detector, thus accruing a measured spectrum for said location; Automatically repeating said directing and examining steps for a series of successive locations on the sample, which method comprises the following steps: Choosing a beam parameter of the input beam that will influence a magnitude of said flux of stimulated photonic radiation; For each location within a first set of locations on the sample, accruing a spectrum using a first value of said beam parameter; For each location within a second set of locations on the sample, accruing a spectrum using a second value of said beam parameter, different from said first value.Type: GrantFiled: July 19, 2013Date of Patent: February 18, 2014Assignee: FEI CompanyInventor: Sander Richard Marie Stoks
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Patent number: 8644450Abstract: The X-ray fluorescence spectrometer of the present invention includes a sample table (8) for a sample (S) having a crystalline structure, an X-ray source (1), a detecting unit (7) for detecting secondary X-rays (4) from the sample (S), a rotating unit (11) for rotating the sample table (8), a parallel translating unit (12) for causing the sample table (8) to undergo a parallel translational movement, a selecting unit (17) for selecting three of circumvent angles, at which diffracted X-rays can be circumvented, based on a diffraction profile obtained from the angle of rotation of the sample (S) and the intensity of secondary X-rays (4), the interval between the neighboring circumvent angles being smaller than 180°, and a control unit (15) for controlling the rotating unit (11) so as to set the sample (S) at the circumvent angle at which the sample table (8) will not interfere with any other structures.Type: GrantFiled: April 21, 2011Date of Patent: February 4, 2014Assignee: Rigaku CorporationInventors: Hiroaki Kita, Hiroshi Kobayashi
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Patent number: 8625872Abstract: In a medical image processing apparatus according to an embodiment, an image inverting unit generates a first inverted image obtained by inverting a first medical image in a left-and-right direction of an examined subject and generates a second inverted image obtained by inverting a second medical image that is different from the first medical image in the left-and-right direction of the examined subject. A displacement detecting unit detects a displacement between the first medical image and the first inverted image. A registration unit generates, based on the displacement detected by the displacement detecting unit, a corrected image obtained by correcting the second medical image or a corrected inverted image obtained by correcting the second inverted image. A difference image generating unit generates a difference image between the second inverted image and the corrected image or a difference image between the second medical image and the corrected inverted image.Type: GrantFiled: November 27, 2012Date of Patent: January 7, 2014Assignees: Kabushiki Kaisha Toshiba, Toshiba Medical Systems CorporationInventor: Satoru Ohishi
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Patent number: 8611494Abstract: In the present disclosure, before disassembly of liquid crystal module (1) having liquid crystal panel (2) and a back light, irradiation is performed with X-rays (13) from the front surface side of liquid crystal panel (2) of liquid crystal module (1). By this irradiation with X-rays (13), generated fluorescent X-rays (14) are detected to analyze an element contained in liquid crystal panel (2), while X-rays (17) backscattered or transmitted to the rear surface side of liquid crystal module (1) are detected to determine a type and a state of the back light. Then, based on the determined type and state of the back light, liquid crystal module (1) is disassembled.Type: GrantFiled: March 8, 2013Date of Patent: December 17, 2013Assignee: Panasonic CorporationInventor: Hiroshi Iwamoto
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Patent number: 8592764Abstract: Multiple detectors arranged in a ring within a specimen chamber provide a large solid angle of collection. The detectors preferably include a shutter and a cold shield that reduce ice formation on the detector. By providing detectors surrounding the sample, a large solid angle is provided for improved detection and x-rays are detected regardless of the direction of sample tilt.Type: GrantFiled: April 2, 2013Date of Patent: November 26, 2013Assignee: FEI CompanyInventors: Hanno Sebastian von Harrach, Bert Henning Freitag, Pleun Dona
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Publication number: 20130279653Abstract: Methods and apparatus are provided for performing back-reflection energy-dispersive X-ray diffraction (XRD). This exhibits extremely low sensitivity to the morphology of the sample under investigation. As a consequence of this insensitivity, unprepared samples can be analyzed using this method. For example, in a geological context, whole rock samples become amenable to analysis. Modifications of the technique are described to suppress fluorescence signals that would otherwise obscure the diffraction signals.Type: ApplicationFiled: April 19, 2012Publication date: October 24, 2013Inventor: Graeme Mark Hansford
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Patent number: 8550710Abstract: In a sample cell that is sealed with an X-ray transmission sheet after a sample such as a liquid fuel or the like is contained therein, when an internal pressure is increased, a cup end surface is deformed so as to increase an internal capacity of the sample cell before the X-ray transmission sheet serving as a window part is expanded. The cup end surface is formed by folding a film-like material and, when the internal pressure of the sample cell is increased, the cup end surface is unfolded outwardly of the sample cell to increase the internal capacity of the sample cell. The increase in pressure is relieved by the increase in capacity, and the expansion of the X-ray transmission sheet is thereby prevented.Type: GrantFiled: October 7, 2010Date of Patent: October 8, 2013Assignee: Horiba, Ltd.Inventors: Mayuko Kishida, Shintaro Komatani, Sumito Ohzawa, Takuji Kurozumi, Satoru Goto, Takashi Kinba, Kimihiko Arimoto
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Publication number: 20130170613Abstract: An X-ray fluorescence spectrometer irradiates a measurement sample 1 with primary X rays from an X-ray source, and excites an element in the sample 1 to emit fluorescence X rays and scattered X rays from the sample 1. A spectroscopic system is placed so that a first spectroscopic unit, a second spectroscopic unit, and a single X-ray detector form an optimized optical system. The first spectroscopic unit disperses the fluorescence X rays to collect the resultant X rays onto the X-ray detector. The second spectroscopic unit disperses the scattered X rays to collect the resultant X rays onto the X-ray detector. In this manner, the spectroscopic system disperses the fluorescence X rays and the scattered X rays so that the intensity of the fluorescence X rays and the intensity of the scattered X rays can be detected by the single X-ray detector 24.Type: ApplicationFiled: December 21, 2012Publication date: July 4, 2013Inventors: Techno-X Co., Ltd., Mizuyo UTAKA
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Patent number: 8433035Abstract: An X-ray fluorescence analyzing method includes irradiating a liquid sample (3A) containing hydrogen and at least one element of carbon, oxygen and nitrogen with primary X-rays (2); measuring the intensity F of fluorescent X-rays (4) from each of elements in the sample (3A) and having the atomic number 9 to 20, and the intensity S of scattered X-rays (12) from the sample (3A) caused by continuous X-rays in the primary X-rays; and calculating the concentration of each of the elements, based on the ratio between the measured intensity F, and the measured intensity S. The wavelength of the scattered X-rays (12) is so chosen as to be shorter than that of the fluorescent X-rays (4) and is so set that the measured intensity S and the mass absorption coefficient thereof are inversely proportional to each other within the range of variation of a composition of the sample (3A).Type: GrantFiled: July 1, 2010Date of Patent: April 30, 2013Assignee: Rigaku CorporationInventors: Kenji Watanabe, Yoshiyuki Kataoka, Yasujiro Yamada, Atsushi Morikawa
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Patent number: 8410439Abstract: Multiple detectors arranged in a ring within a specimen chamber provide a large solid angle of collection. The detectors preferably include a shutter and a cold shield that reduce ice formation on the detector. By providing detectors surrounding the sample, a large solid angle is provided for improved detection and x-rays are detected regardless of the direction of sample tilt.Type: GrantFiled: December 6, 2011Date of Patent: April 2, 2013Assignee: PEI CompanyInventors: Hanno Sebastian Von Harrach, Bert Freitag, Pleun Dona
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Publication number: 20130022167Abstract: A reel-like format for transporting devices under test (DUT) into low power x-ray inspection system allows for high speed transportation and inspection that is several orders of magnitude faster than conventional systems. The system can be configured with a conveyor belt for handling of non-reel suitable DUTs. A stabilizing control mechanism precisely and accurately brings the tape (with components) into the x-raying window, that allows spatial displacement of a portion of the to-be-viewed tape.Type: ApplicationFiled: July 23, 2012Publication date: January 24, 2013Applicant: CREATIVE ELECTRON, INC.Inventors: Guilherme Cardoso, Marcos Turqueti, Griffin Lemaster, Shawn Linden, Justin White
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Patent number: 8350852Abstract: In a device and associated method for reconstruction and visualization of projection data, projection data are stored per slice and are subjected to an image reconstruction procedure in parallel within arbitrary slice planes in a processor-controlled filtering process that is executed n times, wherein volume data that are created can already be made available (loaded) for a direct visualization.Type: GrantFiled: October 20, 2009Date of Patent: January 8, 2013Assignee: Siemens AktiengesellschaftInventors: Karl Barth, Wolfgang Haerer, Thomas Mertelmeier, Karl Wiesent
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Patent number: 8346521Abstract: A method of determining the feasibility of a proposed structure analysis process is disclosed. The process involved the electron beam excitation of x-rays from a multi-layered structure. The method comprises generating predicted x-ray data represents the x-ray excitation response of the multi-layered structure according to one or more sets of process conditions. The x-ray data are generated using structure data defining the structure and composition of the layers. The effects upon the x-ray data of changes to the structure data are then analyzed in accordance with one or more predetermined feasibility criteria, so as to determine the feasibility of performing the proposed structure analysis process upon the multi-layered structure.Type: GrantFiled: May 16, 2007Date of Patent: January 1, 2013Assignee: Oxford Instruments Nanotechnology Tools LimitedInventors: Peter John Statham, Charles Penman
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Patent number: 8340382Abstract: In a medical image processing apparatus according to an embodiment, an image inverting unit generates a first inverted image obtained by inverting a first medical image in a left-and-right direction of an examined subject and generates a second inverted image obtained by inverting a second medical image that is different from the first medical image in the left-and-right direction of the examined subject. A displacement detecting unit detects a displacement between the first medical image and the first inverted image. A registration unit generates, based on the displacement detected by the displacement detecting unit, a corrected image obtained by correcting the second medical image or a corrected inverted image obtained by correcting the second inverted image. A difference image generating unit generates a difference image between the second inverted image and the corrected image or a difference image between the second medical image and the corrected inverted image.Type: GrantFiled: December 7, 2010Date of Patent: December 25, 2012Assignees: Kabushiki Kaisha Toshiba, Toshiba Medical Systems CorporationInventor: Satoru Ohishi
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Publication number: 20120288058Abstract: An X-ray multiple spectroscopic analyzer includes an X-ray source, an optical system inputting X-rays to a single-crystal sample, a sample stage supporting the single-crystal sample, an X-ray diffraction detector, a rotation driving system that changes the angle of the X-ray diffraction detector, an X-ray diffraction measurement data storage unit, a structural analysis data analyzing unit, an energy-dispersive X-ray fluorescence detector, an X-ray fluorescence measurement data storage unit, an X-ray fluorescence analyzing unit, an X-ray fluorescence analysis data storage unit, and X-ray fluorescence analysis data acquiring unit. The structural analysis data analyzing unit analyzes the data of the crystal structure further on the basis of the analysis data of the fluorescent X-rays output from the X-ray fluorescence analysis data acquiring unit.Type: ApplicationFiled: May 4, 2012Publication date: November 15, 2012Applicant: RIGAKU CORPORATIONInventors: Masataka MAEYAMA, Akihito YAMANO
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Patent number: 8306188Abstract: A method for the online determination of the ash content of a substance conveyed on a conveying device, includes a first measurement for determining the mass per unit area of the substance and a second measurement for determining the mean atomic number of the atoms present in the substance. An additional X-ray fluorescence measurement is carried out.Type: GrantFiled: April 26, 2006Date of Patent: November 6, 2012Inventor: Albert Klein
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Patent number: 8259900Abstract: A method for detecting nuclear species in a sample by adaptive scanning using nuclear resonance fluorescence may comprise illuminating the target sample with photons from a source; detecting a signal in an energy channel; determining a scan evaluation parameter using the signal detected; determining whether the scan evaluation parameter meets a detection efficiency criterion; adjusting one or more system parameters such that the scan evaluation parameter meets the detection efficiency criterion; and comparing the signal in an energy channel to a predetermined species detection criterion to identify a species detection event. In another embodiment, detecting a signal in an energy channel may further comprise detecting photons scattered from the target sample. In another embodiment, detecting a signal in an energy channel may further comprise detecting photons transmitted through the target sample and scattered from at least one reference scatterer.Type: GrantFiled: August 28, 2006Date of Patent: September 4, 2012Assignee: Passport Systems, Inc.Inventors: Robert J. Ledoux, William Bertozzi
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Methods and systems for computer tomography of nuclear isotopes using nuclear resonance fluorescence
Patent number: 8180019Abstract: The transmission of photons through a target produces “holes” in the transmitted energy spectrum that are characteristic of the NRF energies of the nuclear isotopes in the target. Measuring the absorption via the transmission of these photons through a target allows the production of tomographic images that are associated with specific nuclear isotopes. Thus three-dimensional density patterns are generated for the elements in a container. The process is very much like standard X-ray tomography but it identifies specific nuclear isotopes as well as their densities.Type: GrantFiled: December 1, 2010Date of Patent: May 15, 2012Assignee: Passport Systems, Inc.Inventors: William Bertozzi, Robert J. Ledoux -
Patent number: 8155268Abstract: A method is provided for screening lead concentration compliance of objects, particularly consumer products such as toys, using x-ray fluorescence (XRF) analysis. The measured intensity ratio of the characteristic L? and L? x-rays of lead provides an indication of whether the lead is located primarily in a coating (e.g., paint) layer on the object, or in a thin or thick bulk material. If the intensity ratio indicates that the lead is located in a coating layer or distributed in a thin bulk material, an areal density of lead is determined from at least one of the characteristic x-ray intensities, and the measured areal density is compared to specified lower and upper limits to determine whether the object is unambiguously compliant, unambiguously non-compliant, or indeterminate.Type: GrantFiled: April 23, 2010Date of Patent: April 10, 2012Assignee: Thermo Niton Analyzers LLCInventors: John Pesce, Lee Grodzins
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Patent number: 8065094Abstract: A method is provided of calculating the structure of an inhomogeneous sample in which an electron beam is used to cause excitation of x-rays from the sample under known conditions of beam energy and geometry with respect to the sample. Notably the beam current is unknown. Measured x-ray intensity data for the sample corresponding to one or more sets of beam conditions and beam currents are firstly obtained, together with comparative x-ray intensity data for samples having known structures. A beam current factor for each beam condition is estimated and effective x-ray intensity data for each of the sets of conditions are then calculated using the measured and comparative x-ray intensity data and the beam current factor. The structure of the sample is then calculated for each of the sets of conditions using the effective x-ray intensity data. Predicting x-ray intensity data are produced corresponding to the calculated structure and compared with the effective x-ray intensity data.Type: GrantFiled: July 30, 2008Date of Patent: November 22, 2011Assignee: Oxford Instruments Nonotechnology Tools UnlimitedInventor: Peter John Statham
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Publication number: 20110243301Abstract: An X-ray fluorescence analyzing method includes irradiating a liquid sample (3A) containing hydrogen and at least one element of carbon, oxygen and nitrogen with primary X-rays (2); measuring the intensity F of fluorescent X-rays (4) from each of elements in the sample (3A) and having the atomic number 9 to 20, and the intensity S of scattered X-rays (12) from the sample (3A) caused by continuous X-rays in the primary X-rays; and calculating the concentration of each of the elements, based on the ratio between the measured intensity F, and the measured intensity S. The wavelength of the scattered X-rays (12) is so chosen as to be shorter than that of the fluorescent X-rays (4) and is so set that the measured intensity S and the mass absorption coefficient thereof are inversely proportional to each other within the range of variation of a composition of the sample (3A).Type: ApplicationFiled: July 1, 2010Publication date: October 6, 2011Applicant: RIGAKU CORPORATIONInventors: Kenji Watanabe, Yoshiyuki Kataoka, Yasujiro Yamada, Atsushi Morikawa
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Patent number: 8014492Abstract: A method for nondestructively obtaining measurement information of a region within one or more ultra-hard polycrystalline constructions comprises conducting a first measurement using x-ray fluorescence by directing x-rays onto a surface of the diamond body, receiving x-ray fluorescence from the diamond body, and deriving measurement information regarding the region therefrom. A second method can be used on the same or other ultra-hard polycrystalline constructions to obtain measurement information regarding the region in a manner that is relatively more time efficient than the first method to facilitate use of the measurement method on a large number of constructions. The second measurement can be selected from the group including beta backscatter, x-ray radioscopy, eddy current, magnetic induction, and microresistance. In an example embodiment, the method is used to determine the thickness of a region within the diamond body that comprises less catalyst material than another region within the body.Type: GrantFiled: November 9, 2009Date of Patent: September 6, 2011Assignee: Smith International, Inc.Inventors: Loel Gene Corbett, Nephi Mourik
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Patent number: 8000439Abstract: An X-ray tube which irradiates a primary X-ray to an irradiation point on a sample, an X-ray detector which detects a characteristic X-ray and a scattered X-ray emitted from the sample and outputs a signal including energy information of the characteristic X-ray and scattered X-ray, an analyzer which analyzes the signal, a first observation system which optically observes a surface of the sample in order to determine the irradiation point, and a second observation system which has a smaller depth of field than the first observation system, optically observes a narrow region, and measures the distance from the determined irradiation point by focus adjustment are included.Type: GrantFiled: August 20, 2009Date of Patent: August 16, 2011Assignee: SII NanoTechnology Inc.Inventor: Yoshiki Matoba
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Patent number: 7991109Abstract: An X-ray multichannel spectrometer comprising a polychromatic source (2), a holding means (3) for holding a sample (1), a fluorescence channel (4) that selects X-ray beams of a special wavelength and energy, and a detector (5) for measuring the selected X-ray beams, a diffractometry channel (6) that selects, by means of a monochromator (7), an X-ray beam wavelength of the source subsequent to diffraction of the X-ray beams by the sample, and a detector (8) for measuring the selected X-ray beams, is characterized in that a single slit device (9) is provided between the source and the sample, which can be moved transversely with respect to the direction of the beam from the source, and the monochromator of the diffractometry channel is stationarily disposed with respect to the source and the sample and has an entry single slit (10) which defines, together with the movable single slit device and the sample position, the characteristic diffraction angle 2? of a predetermined crystal structure of the polycrystalliType: GrantFiled: January 27, 2010Date of Patent: August 2, 2011Assignee: Bruker AXS GmbHInventor: Rainer Golenhofen
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Patent number: 7970101Abstract: An X-ray tube which irradiates a primary X-ray to an irradiation point on a sample, an X-ray detector which detects a characteristic X-ray and a scattered X-ray emitted from the sample and outputs a signal including energy information on the characteristic X-ray and scattered X-ray, an analyzer which analyzes the signal, a sample stage on which the sample is placed, a moving mechanism which moves the sample on the sample stage, the X-ray tube, and the X-ray detector relative to each other, a height measuring mechanism which measures a maximum height of the sample, and a control unit which adjusts the distance between the sample and the X-ray tube and the distance between the sample and the X-ray detector by controlling the moving mechanism on the basis of the measured maximum height of the sample, are included.Type: GrantFiled: August 20, 2009Date of Patent: June 28, 2011Assignee: SII Nanotechnology Inc.Inventors: Noriaki Sakai, Toshiyuki Takahara, Yoshiki Matoba
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Patent number: 7873143Abstract: A sample cell insertion and removal apparatus for an analysis instrument, including a horizontally sliding frame; a sample cell carriage movably mounted to the sliding frame, the sample cell carriage including an area to hold a sample cell; wherein upon sliding into and out of the instrument, the sample cell carriage is moved horizontally and vertically into and out of an analysis position. This instrument may include a radiation shielded enclosure into and out of which the apparatus slides, and an x-ray analysis engine which transmits x-rays upwards towards the sample cell which projects from a bottom of the apparatus. The disclosed sample cell is especially suited for an x-ray analysis engine having a focal spot requiring alignment with the sample in the sample cell.Type: GrantFiled: December 2, 2008Date of Patent: January 18, 2011Assignee: X-Ray Optical Systems, Inc.Inventors: Daniel L. Dunham, James B. Quinn, Brian W. Gallagher
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Publication number: 20110007869Abstract: An X-ray diffraction and X-ray fluorescence instrument for analyzing samples having no sample preparation includes a X-ray source configured to output a collimated X-ray beam comprising a continuum spectrum of X-rays to a predetermined coordinate and a photon-counting X-ray imaging spectrometer disposed to receive X-rays output from an unprepared sample disposed at the predetermined coordinate upon exposure of the unprepared sample to the collimated X-ray beam. The X-ray source and the photon-counting X-ray imaging spectrometer are arranged in a reflection geometry relative to the predetermined coordinate.Type: ApplicationFiled: August 6, 2010Publication date: January 13, 2011Applicant: UNIVERSITY OF MARYLAND, BALTIMORE COUNTYInventors: KEITH GENDREAU, Jose Vanderlei Martins, Zaven Arzoumanian
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Patent number: 7864920Abstract: A system and methods for identifying contents of an enclosure such as an air cargo container. A three-dimensional image indicative of at least one of the CT number and the density of contents of the enclosure is obtained using penetrating radiation such as x-rays. If one or more suspect regions are identified among contents of the enclosure, a collimated neutron beam is activated to traverse each suspect region and fluorescent emission from the suspect region is detected, allowing material within the suspect region to be characterized based at least on the detected fluorescent emission. Additionally, the collimated neutron beam may be employed for neutron imaging of the contents of the enclosure.Type: GrantFiled: May 20, 2009Date of Patent: January 4, 2011Assignee: American Science and Engineering, Inc.Inventor: Peter J. Rothschild