Abstract: A substance analyzer utilizing Prompt Gamma Neutron Activation Analysis for identifying characteristics of a substance and method of manufacturing the same are disclosed. The analyzer is small enough to be portable and to allow its use in many applications where current analyzers cannot be utilized. The analyzer uses a neutron radiation source and a gamma-ray detector to activate the sample material and detect the prompt gamma rays emitted by the sample material. A novel housing for such an analyzer and method for making the housing are also described. Novel methods of operating such an analyzer including via a communications network are also disclosed. Also disclosed are data analysis methods that improve the accuracy and sensitivity of the results of such material analysis.

Abstract: A method, a processor, and a system for identifying a substance are described. The method includes identifying a substance based on a plurality of integrated intensities of a plurality of X-ray diffraction profiles.

Abstract: The purpose of the current invention is to provide a bone strength diagnosing device and a bone strength diagnosing method capable of accurately diagnosing a bone strength of a bone. A longitudinal ultrasonic transducer and a transverse ultrasonic transducer radiate ultrasonic waves onto a bone front surface of a tibia from a predetermined angle to generate surface waves that propagate in the bone front surface in a longitudinal direction of the tibia and in a direction perpendicular to the longitudinal direction, respectively, and receive leaky waves leaking to the side of the soft tissues from the front surface waves. A speed-of-sound calculating module calculates speeds of sound of the surface waves in the transverse direction and the longitudinal direction based on a difference between course lengths of the ultrasonic waves and a difference between propagation times.

Abstract: An X-ray reflectometry apparatus comprises an X-ray source (1) configured to emit an incident X-ray beam directed onto a sample measuring position and an X-ray detector (2) configured to detect an X-ray beam (3) reflected from a surface of a selected sample (4) located in said sample measuring position and with a multiple sample holder (5) comprising an essentially horizontal one- or two-dimensional array of sample resting positions into which solid samples can be placed from above. A drive mechanism (6) moves the sample holder in one or two directions within a horizontal plane underneath the sample measuring position in order to place a selected sample (4) directly beneath the measuring position and a sample lift mechanism (7) has a vertically movable piston (8) located below the multiple sample holder (5) beneath the sample measuring position.

Abstract: Systems and methods for detecting an image of an object using an X-ray beam having a polychromatic energy distribution are disclosed. According to one aspect, a method can include detecting an image of an object. The method can include generating a first X-ray beam having a polychromatic energy distribution. Further, the method can include positioning a single monochromator crystal in a predetermined position to directly intercept the first X-ray beam such that a second X-ray beam having a predetermined energy level is produced. Further, an object can be positioned in the path of the second X-ray beam for transmission of the second X-ray beam through the object and emission from the object as a transmitted X-ray beam. The transmitted X-ray beam can be directed at an angle of incidence upon a crystal analyzer. Further, an image of the object can be detected from a beam diffracted from the analyzer crystal.

Abstract: A system and method for scanning objects using a non-translational x-ray diffraction (XRD) system is disclosed. The system includes a scanning area through which an object to be scanned traverses and a distributed x-ray source having a plurality of focal spot locations. The distributed x-ray source is affixed on the scanning area and is configured to emit x-rays towards the object as a series of parallel x-ray beams. A stationary detector arrangement is affixed on another side of the scanning area generally opposite the distributed x-ray source and is configured to measure a coherent scatter spectra of the x-rays after passing through the object. A data acquisition system (DAS) is connected to the detector arrangement and is configured to measure the coherent scatter spectra, which is utilized to generate XRD data and determine a material composition of at least a portion of the object from the XRD data.

Abstract: A method for reducing an artifact within an image of a substance is described. The method includes generating the image of the substance, and constraining a measured linear attenuation coefficient of a pixel of the image based on at least one of a measured diffraction profile, a measured effective atomic number, and a measured packing fraction of the substance.

Abstract: The present invention relates to a method for computing external crystal shapes from X-Ray Diffraction Data (XRD) of a substance. Each diffraction peak arises from a set of crystal planes and the peak width is related to the thickness of the crystal in a direction perpendicular to these set of planes. The crystal shape is actually given by the mathematical envelope of the pairs of planes corresponding to each diffraction peak.

Abstract: A method of manufacturing a semiconductor device includes placing a sample of a liquid chemical containing a contaminant on a substantially impurity-free surface of a substrate. The liquid chemical is evaporated, leaving the contaminant on the surface. The contaminant is concentrated in a scanning solution, which is then evaporated to form a residue. A concentration of the contaminant in the residue is determined.

Abstract: The invention provides a method of detecting neoplastic or neurological disorders comprising exposing skin or nails to X-ray diffraction and detecting changes in the ultrastructure of the skin or nails, and also provides an instrument when used in the method of detection.

Abstract: A device for X-ray analysis of a sample (1), including: a generation system for the generation of an X-ray beam to irradiate an analysis zone of the sample, said analysis zone defining a analysis mean plane, and the X-ray beam being emitted along a direction of incidence; a detection system for the detection, in at least one dimension, of X-rays diffracted by the irradiated analysis zone. An analyser system located between the sample and the detection system and includes an X-ray diffracting surface forming a partial surface of revolution about an axis of revolution being contained in the analysis mean plane, with the axis of revolution being distinct from the direction of incidence and passing through the centre of the analysis zone, and with the diffracting surface being oriented so as to diffract the X-rays toward the detection system.

Abstract: By performing x-ray analysis of stacked metallization layers on the basis of data reduction, the crystalline structure of individual metallization layers may be determined. Consequently, a relationship between electromigration and crystallinity, as well as a correlation between process parameters and materials and the finally obtained crystalline structures of metal lines, may be estimated in a highly efficient manner compared to measurement techniques based on charged particles.

Abstract: A method of analyzing patterns. The method comprises: receiving a first diffraction pattern; receiving a second diffraction pattern; receiving a third diffraction pattern; determining a similarity between the first and second diffraction patterns; determining a similarity between the first and third diffraction pattern; determining a similarity between the second and third diffraction pattern; and performing hierarchical cluster analysis on the first and second diffraction pattern based on the determined similarity.

Abstract: The adhesion between two layers, in particular two thin layers of a microelectronic device, is a data item of importance. It was found that the closure ratio of the interface could be used, in non-destructive manner, to determine a measurement of bond energy. A method and a device using a magnitude characteristic of this length are described, in particular using low incidence X-ray reflection and electronic density at the interface.

Abstract: Method and system for distinguishing a special nuclear material from a non-threat, high-density metal using X-ray Diffraction. In one embodiment, an X-ray image of an object is examined to detect those voxels having intense XRD profiles, indicating the presence of a high-Z metal. Second, the XRD profiles of such voxels are examined to find the widths and positions of any bands of momentum that are empty of Bragg diffraction peaks. If no such bands are found, then each XRD profile is uniformly populated with Bragg peaks; and it is determined that a special nuclear material is present. If such bands are found, then at least one XRD profile is not uniformly populated with Bragg peaks; and it is determined that a non-threat, high-Z metal is present.

Abstract: Process and device for fast or on-line determination of the components of a two-component or multiple-component system in which the elements which constitute the individual components differ by their atomic number. The following steps are carried out: the surface of the substance is irradiated with polychromatic X-ray or monochromatic gamma radiation, the X-ray radiation exhibiting in the energy range from 1 to 30 keV one or more peaks in the continuum. The spectrum of the radiation backscattered and emitted by the substance is measured in an energy range from 1 to 30 keV with a resolution of at least 250 eV. The spectrum is analysed in that at least the intensities of the elastically backscattered and inelastically backscattered peaks are separately determined and at least some Ka or La fluorescence peaks in the energy range from 1 to 30 keV are used in order to compensate for the influence of a fluctuating elemental composition within a component.

Abstract: A method of increasing consistency between separate parametric measurement readings that are taken with an electron beam imaging tool at different times within a period of time, by correcting drift in the imaging tool at a time frequency that is less than a time period during which the drift is anticipated to be undesirably large.

Abstract: A new X-ray diffraction (XRD) method is provided to acquire XY mapping of the distribution of single crystals, poly-crystals, and twin defects across an entire wafer of rhombohedral super-hetero-epitaxial semiconductor material. In one embodiment, the method is performed with a point or line X-ray source with an X-ray incidence angle approximating a normal angle close to 90°, and in which the beam mask is preferably replaced with a crossed slit. While the wafer moves in the X and Y direction, a narrowly defined X-ray source illuminates the sample and the diffracted X-ray beam is monitored by the detector at a predefined angle. Preferably, the untilted, asymmetric scans are of {440} peaks, for twin defect characterization.

Abstract: A method and a measurement system are disclosed for the noninvasive determination of properties of an object to be examined and to the use of a contrast medium for X-ray phase-contrast measurement. in at least one embodiment of the invention, a mixture (suspension) consisting of a base liquid and a multiplicity of particles contained therein is used, the refractive index of the base liquid being different to the refractive index of the particles.

Abstract: An ultra-small angle X-ray scattering measuring apparatus includes a detector for detecting X-rays emitted from a sample, an X-ray collimating mirror arranged between the X-ray real focus and the sample, a monochromator arranged between the X-ray collimating mirror and the sample and an analyzer arranged between the sample and the detector. The X-ray collimating mirror includes a pair of X-ray mirrors that are arranged orthogonally relative to each other. The X-ray mirrors are multilayer film mirrors and their X-ray reflection surfaces are paraboloidal. The interplanar spacing of lattice planes of each of the multilayer films is continuously changed along the paraboloid so as to meet the Bragg's condition. The monochromator and the analyzer are formed by using a channel-cut crystal. The analyzer is driven to rotate for scanning around a 2?-axial line and diffracted rays reduced to a spectrum by the analyzer are detected by the detector.

Abstract: An optical metrology model for the structure is obtained. The optical metrology model comprising one or more profile parameters, one or more process parameters, and a dispersion. A dispersion function that relates the dispersion to at least one of the one or more process parameters is obtained. A simulated diffraction signal is generated using the optical metrology model and a value for the at least one of the process parameters and a value for the dispersion. The value for the dispersion is calculated using the value for the at least one of the process parameter and the dispersion function. A measured diffraction signal of the structure is obtained using an optical metrology tool. The measured diffraction signal is compared to the simulated diffraction signal to determine one or more profile parameters of the structure. The fabrication tool is controlled based on the determined one or more profile parameters of the structure.

Abstract: The present invention discloses an XRD means for identifying the content of a volume of interest (VOI) and a method thereof. A remote XRD means is comprised inter alia of a plurality of x-ray sources target toward the VOI. A plurality of x-ray detectors adapted to receive diffracted X-rays. A processor adapted to measure the diffracted x-ray patterns. A database comprising records of patterns parameters; and, an alerting means adapted for identifying material as one of the predetermined groups in the record. This invention also discloses a method of acquiring XRD image of a material in a VOI, comprised of receiving VOI coordinates; irradiating the material in the VOI; acquiring, extracting and converting of XRD patterns of the VOI to standard powder X-ray diffraction spectrum; matching records in a database for material identification; and alerting when the material is in a matching predetermined record.

Abstract: A pore- or particle-size distribution measurement apparatus is provided. When the size of a pore existing in a porous insulator film or the size of a particle in a thin film is measured, a specimen having the insulator film on the surface of a substrate is irradiated, from the surface side thereof, with X-rays at a specified incident angle larger than the total reflection critical angle of the insulator film but less than 1.3 times the total reflection critical angle of the substrate. In the irradiated X-rays, among components exiting from the insulator film without entering the pore and scattering of reflection component of the X-rays reflected on the surface of the substrate after having entered the insulator film, the scattered component whose exit angle is larger than that of a component of the reflection component which exits from the insulator film without entering the pore is detected.

Abstract: A remote sensing device for detecting materials of varying atomic numbers and systems and methods relating thereto. A system for identifying a material includes a photon beam flux monitor for resolving a high-energy beam. A method for identifying a material includes casting an incident photon beam on the material and detecting an emerging photon beam with an array of fission-fragment detectors, a first set of scintillator paddles, and a second set of scintillator paddles.

Abstract: Systems for improving a spatial resolution of an image are described. One of the systems includes an X-ray source configured to generate X-rays, a transmission detector configured to detect the X-rays to output a plurality of electrical signals, and a plate configured to improve the spatial resolution upon receiving the X-rays. The plate is configured to output a fan-beam upon receiving the X-rays.

Abstract: A method for determining a type of a substance is described. The method includes determining a packing fraction of the substance from a molecular interference function.

Abstract: “Super-hetero-epitaxial” combinations comprise epitaxial growth of one material on a different material with different crystal structure. Compatible crystal structures may be identified using a “Tri-Unity” system. New bandgap engineering diagrams are provided for each class of combination, based on determination of hybrid lattice constants for the constituent materials in accordance with lattice-matching equations. Using known bandgap figures for previously tested materials, new materials with lattice constants that match desired substrates and have the desired bandgap properties may be formulated by reference to the diagrams and lattice matching equations. In one embodiment, this analysis makes it possible to formulate new super-hetero-epitaxial semiconductor systems, such as systems based on group IV alloys on c-plane LaF3; group IV alloys on c-plane langasite; Group III-V alloys on c-plane langasite; and group II-VI alloys on c-plane sapphire.

Abstract: An apparatus for analyzing bacteria is described that includes an analyte sample preparing section for preparing an analyte sample from a specimen; a detector for detecting optical information from each particle in the analyte sample; and a controller for detecting non-fermentative bacteria on the basis of the detected optical information. A method for analyzing bacteria is also described.

Abstract: An x-ray imaging system includes an optical device having at least one point-focusing, curved monochromating optic for directing x-rays from an x-ray source towards a focal point. The at least one point-focusing, curved monochromating optic provides a focused monochromatic x-ray beam directed towards the focal point, and a detector is aligned with the focused monochromatic x-ray beam. The optical device facilitates x-ray imaging of an object when the object is located between the optical device and the detector within the focused monochromatic x-ray beam. In various embodiments: each point-focusing, curved monochromatic optic has an optical surface that is doubly-curved; the optical device facilitates passive image demagnification or magnification depending upon placement of the object and detector relative to the focal point; and at least one second point-focusing, curved monochromatic optic can be employed to facilitate refractive index or polarized beam imaging of the object.

Abstract: An approach for the selection of Compton camera shapes, configurations, positions, orientations, trajectory paths, and detector element sets is provided for collecting data for analysis using the surface integral and integral-of-line-integral methods of reconstruction Compton data. Methods are introduced for (1) selecting one or more imaging lines through a radioactive distribution for which approximations of integrals of radioactivity are to be derived, (2) selecting and using Compton camera relative positions, relative orientations, and detector element sets that “correspond to” the selected imaging lines to collect the needed data; and (3) deriving approximations of integrals of radioactivity along those imaging lines. This methodological approach is used to reconstruct line integrals, cross-sections, local volumes, parallel projections, and cone-beam projections of radioactive distributions.

Abstract: A tomographic energy dispersive diffraction imaging apparatus comprises a radiation source for directing incident radiation (1, 3) at a sample (4) mounted on a support, and detection means (9, 10) mounted for detecting radiation transmitted through the sample (4) at a given angle to the direction of incidence of the radiation. The detection means comprises an array of energy dispersive detectors (9) and an array of collimators (10), such that each energy dispersive detector (9) has a respective collimator (10) associated therewith. Each collimator of the collimator array may comprise a plurality of collimator plates with apertures formed therein which are spaced apart along a direction of the transmitted radiation.

Abstract: Methods for screening and preparing solid forms are described herein. Such methods comprise sonicating a solid paste to provide a sonicated paste. The sonicated paste may be analyzed for the presence of solid forms.

Abstract: A system and methods for characterizing an unknown substance is described. One of the methods include determining an effective atomic number of the unknown substance as a first function of a first gradient of a first line.

Abstract: Apparatus for analysis of a sample includes a radiation source, which is adapted to direct a first, converging beam of X-rays toward a surface of the sample and to direct a second, collimated beam of the X-rays toward the surface of the sample. A motion assembly moves the radiation source between a first source position, in which the X-rays are directed toward the surface of the sample at a grazing angle, and a second source position, in which the X-rays are directed toward the surface in a vicinity of a Bragg angle of the sample. A detector assembly senses the X-rays scattered from the sample as a function of angle while the radiation source is in either of the first and second source configurations and in either of the first and second source positions. A signal processor receives and processes output signals from the detector assembly so as to determine a characteristic of the sample.

Abstract: The present invention describes apparatus for penetrating radiation measurements on a biological tissue sample, the apparatus comprising: a tissue sample locator; a source of penetrating radiation; a collimator to direct, in use, radiation from the source into a beam directed at the tissue sample locator; and at least two detectors for detecting radiation from the sample; the at least two detectors being configured to detect radiation from the sample at respective different angles. The present invention also describes analogous apparatus for penetrating radiation measurements on biological tissue samples.

Abstract: An X-ray optical system provides selectively a linear X-ray beam and a point X-ray beam while using an X-ray source which generates an X-ray beam having a linear section. When the point X-ray beam is selected, an X-ray intensity per unit area becomes higher. The X-ray optical system has an X-ray source, a parabolic multilayer mirror to which an aperture slit plate is attached, an optical-path selection slit device, a polycapillary optics and an exit-width restriction slit. The polycapillary optics and the exit-width restriction slit are detachably inserted into a path of a parallel beam coming from the parabolic multilayer mirror, and thus they can be removed from the path and a Soller slit and a divergence slit can be inserted instead.

Abstract: Method and apparatus are provided for combining information obtained from CT and Coherent Scatter Computed Tomography to better determine whether there are dangerous materials in the baggage or not. Hence, the attenuation coefficient and the diffraction pattern of the item of baggage are used to determine whether the baggage should be cleared.

Abstract: A method for iteratively identifying a substance is described. The method includes determining whether a function of a difference between an updated diffraction profile and an original diffraction profile of the substance exceeds a parameter.

Abstract: A technique for establishing texture metrics and bone mineral density (BMD) within an anatomical region of interest. A digital imaging system is used to acquire a standard digital X-ray image with a wide field of view. The standard digital X-ray image is used to guide the imaging system to obtain an image of a region of interest. The standard digital X-ray image is used to calculate various texture metrics, such as a length of a fracture. A dual-energy digital X-ray image of the region of interest is acquired. The dual-energy digital X-ray image is corrected for scatter. The BMD of the region of interest may be established from the scatter-corrected dual-energy digital X-ray image. The BMD, the texture metrics, and/or the scatter-corrected dual-energy X-ray image may be displayed on the standard digital X-ray image.

Abstract: An electron probe microanalysis (EPMA) system includes a graded multilayer diffractor for tightly focusing output x-rays onto an x-ray detector. The graded multilayer construction of the diffractor allows a high x-ray flux to be generated in a small measurement spot, which results in a high measurement throughput. The enhanced measurement efficiency provided by the graded multilayer diffractor can allow an EPMA system to be used as an in-line monitoring tool. The graded multilayer diffractor can include multiple reflecting surfaces. Multiple graded multilayer diffractors can also be used.

Abstract: A method and apparatus for constructing a 3-dimensional image of the internal organs invisible by the conventional method is provided.

Abstract: A system for observing the internal features of an object, such that the object's internal absorption, refraction, reflection and/or scattering properties are visualized, is disclosed. An embodiment may include one or more beams of penetrating radiation, an object with internal features to be imaged, a single or an array of radiation optics, and a detection system for capturing the resultant shadowgraph images. The beam(s) of radiation transmitted through the object typically originate from a line-shaped source(s), which has high spatial purity along the narrow axis, and low spatial purity in the perpendicular, long axis. In the long axis, radiation optic(s) capture and focus diverging rays exiting from the object to form a high resolution image of the object, without which optic(s) the shadowgraph would have blurring in this axis.

Abstract: A heat-sensitive transfer sheet containing a base film, a dye layer formed over one surface of the base film and containing a heat-transferable dye and a resin, and a heat-resistant lubricating layer formed over the other surface of the base film and containing a lubricant and a resin, wherein the heat-resistant lubricating layer contains a specific phosphate ester as the lubricant, and the maximum value of the following characteristic X-ray intensities is at least 5 times the minimum value thereof: characteristic X-ray intensities obtained by radiating an electron beam which is accelerated to 20 kV and has a beam diameter of 1 ?m or less onto plural positions of the heat-sensitive transfer sheet from the heat-resistant lubricating layer side of this sheet, and measuring the resultant characteristic X-rays originating from the K-line of the phosphorus element in the heat-resistant lubricating layer by an energy dispersive X-ray spectrometer.

Abstract: A heat-sensitive transfer image-receiving sheet having at least one receptor layer and at least one heat insulation layer on a support, wherein a Vickers hardness of the heat insulation layer is in the range of from 2 to 20, and a moisture content of the heat-sensitive transfer image-receiving sheet is in the range of from 5% by mass to 8% by mass.

Abstract: A system may include emission of megavoltage radiation from a megavoltage radiation source, acquisition of a first image using an imaging device while first megavoltage radiation is emitted from the megavoltage radiation source and while a plurality of elements is between the megavoltage radiation source and the imaging device, and determination of an amount of scatter radiation based at least on areas of the acquired image corresponding to the plurality of elements. In some aspects, at least one of the plurality of elements is substantially pointed toward a focal spot of the megavoltage radiation source.

Abstract: A focus-detector arrangement includes a radiation source with a focus, arranged on a first side of the subject, for generating a fan-shaped or conical beam of rays; at least one X-ray optical grating arranged in the beam path, with at least one phase grating arranged on the opposite second side of the subject in the beam path generating an interference pattern of the X-radiation preferably, in a particular energy range; and an analysis-detector system which detects at least the interference pattern generated by the phase grating in respect of its phase shift with position resolution. According to at least one embodiment of the invention, at least one X-ray optical grating including bars which are free from overhangs form shadows in the beam path of the fan-shaped or conical beam of rays.

Abstract: A method for inspection includes directing a beam of X-rays to impinge upon an area of a sample containing first and second features formed respectively in first and second thin film layers, which are overlaid on a surface of the sample. A pattern of the X-rays diffracted from the first and second features is detected and analyzed in order to assess an alignment of the first and second features.

Abstract: A diffractometer, having variable center and suitable for performing analysis on hidden or hardly accessible bodies or specimens is described. Said variable center diffractometer is equipped with an analytical unit that comprises: a circle arc structure, called Euler cradle; a radiation beam source and a detector of the said radiation beam; devices for the pointing of the analytical unit; devices for the movements of said analytical unit in the space; devices for rotation of said source and detector along the Euler cradle; characterized by the fact that it comprises also: devices able to rotate said source and detector with respect to an orthogonal axis to the plane containing the Euler cradle; collimators or deflectors firmly placed on the said radiation source and detector.

Abstract: X-ray apparatus 10 includes an X-ray source (22), an X-ray detector (28) facing the X-ray source. Inlet (6) accepts a stream of particles and a guide system (18) guides the stream of particles (16) in free space between the X-ray source (22) and detector (28) so that X-ray analysis can be carried out on the particles in the stream (16) in a sample region (21) between the source (22) and the detector (28).

Abstract: A method for inspection of a sample includes irradiating the sample with a beam of X-rays and measuring a distribution of the X-rays that are emitted from the sample responsively to the beam, thereby generating an X-ray spectrum. An assessment is made of an effect on the spectrum of a non-uniformity of the beam, and the spectrum is corrected responsively to the effect.