Tool, Workpiece, Or Mechanical Component Inspection Patents (Class 382/152)
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Patent number: 8792709Abstract: Systems and methods for transprojection of geometry data acquired by a coordinate measuring machine (CMM). The CMM acquires geometry data corresponding to 3D coordinate measurements collected by a measuring probe that are transformed into scaled 2D data that is transprojected upon various digital object image views captured by a camera. The transprojection process can utilize stored image and coordinate information or perform live transprojection viewing capabilities in both still image and video modes.Type: GrantFiled: June 21, 2012Date of Patent: July 29, 2014Assignee: Hexagon Metrology, Inc.Inventors: Sandeep Pulla, Homer Eaton
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Patent number: 8786848Abstract: An inspection system formed at least from an inspection system housing including at least one internal chamber that supports an extendible camera support shaft extending distally through a pilot nozzle port into a combustor of a gas turbine engine is disclosed. The inspection system may include a camera capable of capturing high quality images together with position coordinates. Thus, the inspection system enables images in a combustor of a gas turbine engine to be captured and recaptured at a subsequent outage so that the images may be analyzed and compared for preventive maintenance, troubleshooting, and the like. The inspection system may include three degrees of freedom for the camera mounted on the extendible camera support shaft.Type: GrantFiled: May 5, 2011Date of Patent: July 22, 2014Assignee: Siemens Energy, Inc.Inventors: Clifford Hatcher, Forrest R. Ruhge, Ian T. Doran, Robert G. Shannon, Dennis H. Lemieux
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Patent number: 8779943Abstract: The present invention relates to a method of monitoring the condition of structural components, in which an optical sensor in conjunction with a computing unit ascertains image deviations from successive images of the structural components to be monitored, and therefrom ascertains changes in shape of the structure. Robust three-dimensional scanning of the structural components is possible when using two or more sensors. The invention further relates to an apparatus for monitoring the condition of structural components having an optical sensor and an apparatus having two or more sensors. Finally the invention relates to an aircraft in which the methods or apparatuses according to the invention are used.Type: GrantFiled: May 9, 2007Date of Patent: July 15, 2014Assignee: Airbus Operations GmbHInventors: Piet Wölcken, Wolfgang Entelmann, Clemens Böckenheimer, Holger Speckmann
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Patent number: 8781208Abstract: The application relates to a method of inspecting an object and an inspection apparatus. The object has a plurality of features and the method includes the step of identifying a current primary feature on the object. Once the current primary feature has been selected, one or more additional features are selected, each of the one or more additional features selected having at least one common attribute with the current primary feature. The method also includes the step of capturing an image of the selected features on an image capture module.Type: GrantFiled: April 29, 2010Date of Patent: July 15, 2014Assignee: Wilcox Associates, Inc.Inventors: Marc Philip Stalker, Stevan Clee
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Patent number: 8768514Abstract: An image taking system including: (a) a lighting device capable of changing a light emission time to various time length values; (b) an image taking device configured to take an image of a subject portion while light is being emitted by the lighting device; (c) a subject-portion moving device configured to move the subject portion relative to the image taking device, and capable of changing a movement velocity of the subject portion relative to the image taking device, to various velocity values; and (d) a control device configured, during movement of the subject portion by the subject-portion moving device, to cause the lighting device to emit the light for one of the time length values as the light emission time and to cause the image taking device to take the image, and is configured to control the movement velocity, such that an amount of the movement of the subject portion for the above-described one of the time length values is not larger than a predetermined movement amount.Type: GrantFiled: April 26, 2010Date of Patent: July 1, 2014Assignee: Fuji Machine Mfg. Co., Ltd.Inventor: Kazumi Hoshikawa
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Patent number: 8768041Abstract: A method for inspecting surfaces including acquiring a surface image from a surface of a component; providing an image registration for the surface image; inspecting the component in response to the image registration to produce an input data set; creating an output data set in response to the input data set utilizing a fuzzy logic algorithm; and identifying a surface feature in response to the surface image and the output data set where acquiring the surface image further includes generating a radiation media; directing the radiation media at the component; detecting a responding radiation media in response to the directed radiation media and the component; creating the surface image in response to detecting the responding radiation media; and adjusting the generation of the radiation media in response to the surface image and a standard image.Type: GrantFiled: March 9, 2012Date of Patent: July 1, 2014Inventors: Amir Shirkhodaie, Kong Ma, Robert Moriarty
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Patent number: 8759770Abstract: A system for qualifying usability risk associated with subsurface defects in a multilayer coating includes a component having a multilayer coating, an infrared detection device for capturing infrared images of the multilayered coating and a processing unit that is in electronic communication with the infrared detection device where the processing unit generates a subsurface defect map of the multilayer coating based on the infrared images. The system further includes a risk map of the component.Type: GrantFiled: April 8, 2013Date of Patent: June 24, 2014Assignee: General Electric CompanyInventors: Steven Charles Woods, James Carroll Baummer
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Publication number: 20140168414Abstract: Methods and systems for determining information about an object are described. In one aspect, a method includes illuminating an object with a plurality of lines of light, the lines being spaced-apart along an axis, and acquiring a sequence of images of the lines of light while rotating the object about the axis. The method further includes, for each image, determining a location of an extremum for each of the lines of light. Furthermore, the method includes establishing a reference line based on the location of the extrema for a first plurality of the lines, calculating a deviation between the extrema of a second plurality of the lines and the reference line, and determining information about the shape of the object based on the calculated deviations.Type: ApplicationFiled: December 19, 2012Publication date: June 19, 2014Applicant: TENARIS CONNECTIONS LIMITEDInventor: TENARIS CONNECTIONS LIMITED
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Patent number: 8755589Abstract: Tools for determining belt wear are provided. Specifically, non-contact based systems and processes are described which enable a quick and accurate measurement of belt wear. Based on the measurements of belt wear, a wear condition for the belt can be determined. Information regarding the wear condition can then be used to determine an appropriate remedial measure for responding to the determined wear condition.Type: GrantFiled: September 6, 2011Date of Patent: June 17, 2014Assignee: The Gates CorporationInventors: Flloyd M. Sobczak, James H. Sealey, Douglas R. Sedlacek, Mark E. Stuemky, Justin L. Aschenbrenner
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Publication number: 20140161344Abstract: In a preparation process, one workpiece W is photographed from a plurality of angles, the photographed image is segmented into patches to obtain a plurality of sample patch images, the sample patch images are classified, and each sample patch image is stored while being corresponded with a position information to a reference position of the workpiece W. Image recognition process obtains a reference position of the workpiece W in a patch image, by photographing piled-up workpieces W, segment the photographed image into patches to obtain a plurality of patch images, classify the patch images in same classification method of the sample patch images, accumulating a position information to the reference position of the workpiece W, which is stored while corresponded to the sample patch image of the same classification as the patch image for each patch image, and on the basis of the accumulated result.Type: ApplicationFiled: December 11, 2012Publication date: June 12, 2014Applicants: CARNEGIE MELLON UNIVERSITY, HONDA MOTOR CO., LTD.Inventors: Jose Jeronimo Rodriges, Jun-Sik Kim, Makoto Furukawa, Takeo Kanade
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Patent number: 8742287Abstract: Certain example embodiments of this invention relate to apparatuses for sealing the tips of pump-out tubes of vacuum insulating glass (VIG) units, and/or associated methods. In certain example embodiments, a laser source used in sealing the pump-out tube is thermally insulated from the VIG unit and emits a laser beam through one or more windows in an oven towards a mirror located therein. The mirror is located so as to redirect the laser beam onto the pump-out tube to thereby seal it. For instance, a substantially horizontal laser beam emitted from a laser source located outside the oven enters into the oven through one or more windows and is reflected by a mirror towards the pump-out tube to be sealed. The repositioning of the laser source advantageously can change its effective focal length and/or the location of the laser beam, e.g., because of the fixed location of the mirror.Type: GrantFiled: December 15, 2011Date of Patent: June 3, 2014Assignee: Guardian Industries Corp.Inventor: Ryan L. Dear
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Patent number: 8737717Abstract: A method of identifying defects including producing, with an imaging system, an original image of a fabricated article having a feature thereon, the feature having an intended height and extracting a contour image from the original image, the contour image having an outline of those portions of the feature having a height approximate to the intended height. The method also includes producing a simulated image of the article based upon the contour and creating a defect image based on the differences between the simulated image and the original image, the defect image including any portions of the feature having a height less than the intended height.Type: GrantFiled: April 25, 2012Date of Patent: May 27, 2014Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.Inventors: Mei-Chun Lin, Ching-Fang Yu, Ting-Hao Hsu, Sheng-Chi Chin
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Patent number: 8718352Abstract: A computer-aided method, system and computer program product are provided for optical testing of a rope. Such method includes: providing an image data set for at least one portion of the rope; providing target values of a pictorial longitudinal extension of the representation of wires relative to a pictorial longitudinal extension of the rope in the image data set; determining a pictorial longitudinal extension of the wires in the image data set, including adapting an estimated longitudinal extension to the image data set; determining at least one quality value using a quality norm as a function of the determined pictorial longitudinal extension of the wires and the target values of the pictorial longitudinal extension of the wires; discriminating pictorial positions within the image data set of the rope, where at least one quality value exceeds or falls below a predetermined, assigned quality threshold value; and providing the discriminated pictorial positions.Type: GrantFiled: April 27, 2011Date of Patent: May 6, 2014Assignee: Winspect GmbHInventors: Sven Winter, Dirk Moll, Ralf Eisinger, Konstantin Kuehner, Egon Guttengeber, Andreas Proehl, Markus Eichinger
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Patent number: 8712009Abstract: A method of determining integrity of a can seam including disposing the can seam between an X-ray source and an X-ray detector, exposing an overlap region of the can seam to radiation from the source, and determining an indication of integrity of the overlap region from a measure of variation in radiation intensity readings taken by the detector over a series of circumferential intervals of the can seam.Type: GrantFiled: January 20, 2009Date of Patent: April 29, 2014Inventor: Johannes Albertus Zandhuis
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Patent number: 8699083Abstract: An image processing device includes a screen processing unit and a correction processing unit. The screen processing unit executes screen processing for an image to be processed. The correction processing unit performs correction processing of correcting a distortion of an output image from an original image, based on the amount of the distortion, for (i) the image before the screen processing and (ii) the image after the screen processing. The correction amount relating to the correction processing for the image after the screen processing is a small value as compared with the correction amount relating to the correction processing for the image before the screen processing.Type: GrantFiled: December 14, 2010Date of Patent: April 15, 2014Assignee: Fuji Xerox Co., Ltd.Inventors: Keiichi Okada, Kaoru Yamauchi, Noribumi Sato, Mitsuru Iioka, Jun Koyatsu, Hatsuho Ajima
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Patent number: 8693763Abstract: The present invention relates to a method for determining preferred alignments of a treatment beam generator, which is suitable for irradiating an object, relative to a body, wherein the visibility of the object in at least one image is taken into account when determining the preferred alignments, wherein the image is obtained by means of at least one imaging device, the position of which relative to the treatment beam generator is known and invariable.Type: GrantFiled: April 29, 2010Date of Patent: April 8, 2014Assignee: Brainlab AGInventors: Kajetan Berlinger, Stephan Froehlich
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Patent number: 8682465Abstract: A measurement method for thread parameters for a threaded object (3), by means of a measurement device (1) defining a spatial reference system (X, Y, Z) incorporating an optical sensor (5) to retrieve the shape of the threaded object, and defining a spatial reference system (X?, Y?, Z?), the measurement device (1) having a computer to assemble a first matrix that describes the quadratic form representing the threaded object in the spatial reference system (X, Y, Z), thus providing the relationship between the two spatial reference systems.Type: GrantFiled: December 3, 2009Date of Patent: March 25, 2014Assignee: Tenaris Connections LimitedInventors: Nicolás Hernán Bonadeo, Sebastián Berra, Javier Ignacio Etcheverry
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Patent number: 8675950Abstract: An image processing apparatus includes: an image extracting section that extracts a template image from blade images which form a streaming video obtained by capturing blades periodically arrayed in a jet engine; an image comparing section that compares the blade images with the template image; an image selecting section that selects an image as a record image from the blade images based on a result of the image comparison of the image comparing section; and a display section that displays the surface shape of the blade calculated based on the record image.Type: GrantFiled: July 30, 2010Date of Patent: March 18, 2014Assignee: Olympus CorporationInventor: Fumio Hori
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Publication number: 20140056507Abstract: Methods and systems for inspecting a workpiece are provided. The method includes storing model data associated with the workpiece in an inspection system, determining a relative position of a depth sensing device relative to the workpiece, and calibrating a pose view for the inspection system relative to the model based on the position of the depth sensing device relative to the workpiece. The method further includes measuring actual depth distance data of at least one pixel of the depth sensing device relative to the workpiece and determining, based on the actual depth distance data, if the workpiece satisfies predetermined inspection criteria.Type: ApplicationFiled: August 27, 2012Publication date: February 27, 2014Inventors: Joseph D. Doyle, Paul R. Davies
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Patent number: 8659654Abstract: Comparing a sample image to a reference image. Differences between the color channel values of the pixels in the sample image and the corresponding color channel values for the corresponding pixels in the reference image are calculated and compared to predefined tolerances. Based on the comparisons, a pixel status for the pixels in the sample image is defined. An image status indicating whether the sample image differs from the reference image is defined based on the defined pixel status.Type: GrantFiled: October 11, 2006Date of Patent: February 25, 2014Assignee: Microsoft CorporationInventors: Michael Y. Tsang, Xu Yang
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Patent number: 8655470Abstract: A computer implemented method for evaluating quality control data of a product manufactured by a partially automated manufacturing process. In the method, a database is generated which includes design specifications for the product. Manufacturing data generated from inspection of the product at each stage of the partially automated process is then received. The manufacturing data is then compared with the design specifications to determine whether the manufacturing data meets the design specifications. In one embodiment, the product is an induction coil used in electric motors.Type: GrantFiled: January 7, 2011Date of Patent: February 18, 2014Assignee: Siemens Industry, Inc.Inventors: Nicholas G. Lang, Sumit Singhal
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Patent number: 8655094Abstract: A photogrammetry system and method provide for determining the relative position between two objects. The system utilizes one or more imaging devices, such as high speed cameras, that are mounted on a first body, and three or more photogrammetry targets of a known location on a second body. The system and method can be utilized with cameras having fish-eye, hyperbolic, omnidirectional, or other lenses. The system and method do not require overlapping fields-of-view if two or more cameras are utilized. The system and method derive relative orientation by equally weighting information from an arbitrary number of heterogeneous cameras, all with non-overlapping fields-of-view. Furthermore, the system can make the measurements with arbitrary wide-angle lenses on the cameras.Type: GrantFiled: May 11, 2011Date of Patent: February 18, 2014Assignee: The United States of America as represented by the Administrator of the National Aeronautics and Space AdministrationInventors: Samuel A Miller, Kurt Severance
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Patent number: 8644591Abstract: An alignment method for assembling substrates without fiducial mark is provided and has steps of: pre-defining at least two partially standard character regions; capturing at least two partially actual images of a first substrate; comparing to obtain at least two partially actual character regions; building an actual coordinate system of the first substrate; comparing the actual coordinate system with a coordinate system of a second substrate to obtain three types of offset values; moving the first substrate to a correct waiting position based on the offset values; ensuring if the first substrate is disposed at the correct waiting position; and stacking the first substrate with the second substrate to finish the alignment and installation. Thus, the alignment method of the present invention can be applied to to-be-installed substrates without any fiducial mark for alignment.Type: GrantFiled: January 17, 2012Date of Patent: February 4, 2014Assignee: Metal Industries Research & Development CentreInventors: Chorng-tyan Lin, Chih-chin Wen, Chun-ming Yang, Jwu-jiun Yang
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Patent number: 8638984Abstract: A gesture detection device detects a gesture of a user, which is a movement which is carried out by a hand or by both hands of the user on an existing example of the work piece, or on an image of an existing example of the work piece. An identification device identifies the gesture as a predefined gesture, which represents a symbol. A selection device selects a measurement result in dependence on the identified gesture. The measurement result can then be displayed or marked.Type: GrantFiled: April 2, 2009Date of Patent: January 28, 2014Assignee: Carl Zeiss Industrielle Messtechnik GmbHInventor: Robert Roithmeier
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Publication number: 20140016855Abstract: The thermal image smoothing method, which is a method for smoothing thermal images produced on the basis of thermal image values measured with a work that has been coated with a black body coating, is provided with a removal process wherein estimated thermal image values are set as values on respective line segments between maximum points and thermal image values that are smaller than the estimated thermal image values are removed from the thermal image values as anomalous thermal image values.Type: ApplicationFiled: April 6, 2011Publication date: January 16, 2014Applicant: TOYOTA JIDOSHA KABUSHIKI KAISHAInventor: Kento Seki
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Patent number: 8620060Abstract: The present invention provides a model image acquisition support apparatus, a model image acquisition support method, and a model image acquisition support program that can easily and swiftly obtain an optimum model image for an image processing apparatus that performs matching processing based on a model image set in advance with respect to a measurement image that is obtained by imaging an object. A plurality of model image candidates, serving as candidates for model image, are extracted from a reference image obtained by imaging an object which can be a model. Matching processing with the plurality of extracted model images is executed on measurement images actually obtained by a visual sensor, so that trial results are obtained. A trial result is generated upon evaluating each of the trial results of the matching processing with the model image. An optimum model image is determined based on the evaluation result.Type: GrantFiled: February 24, 2010Date of Patent: December 31, 2013Assignee: Omron CorporationInventors: Masahiro Takayama, Daisuke Mitani
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Patent number: 8620064Abstract: A method is provided for imaging a workpiece by capturing successive frames of an elongate stationary field of view transverse to a workpiece transit path of a robot, while the workpiece is transported by the robot. The robot transit path is illuminated with an elongate illumination pattern transverse to the transit path to obtain a workpiece image of successive frames. Motion-induced image distortion is prevented or reduced adjusting the camera frame rate in real time in proportion to changes in robot velocity profile of the workpiece along the transit path.Type: GrantFiled: February 17, 2010Date of Patent: December 31, 2013Assignee: Applied Materials, Inc.Inventors: Abraham Ravid, Todd Egan, Karen Lingel
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Publication number: 20130343633Abstract: A bearing (X) inside which a lubricant is able to be sealed is provided with: a rotary motion body (X2) that moves when a rotation drive force is applied; and a rotation angle indicator (X6) that is provided on the rotary motion body (X2) and that is moved, in conjunction with the movement of the rotary motion body (X2), to a position that corresponds to the rotation angle of the rotary motion body (X2).Type: ApplicationFiled: March 9, 2012Publication date: December 26, 2013Inventors: Takehisa Takano, Hiroyuki Nose, Akira Ito
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Publication number: 20130336576Abstract: A quantitative metallographic method to measure pore sizes and pore distributions in cast aluminum components. An image of a location of interest in a cast component sample is first obtained using an image analyzer. Spacing criteria, such as a measure of the secondary dendrite arm spacing, may be used with the received image to provide evidence of pore clustering. This allows the system to performing calculations to determine if multiple pores can be clustered or grouped together as a single pore in three-dimensional space. From this, the total area of the pores in each of these groups or clusters is calculated and used as a representation of the pore area for that cluster. In general, pore size and pore distribution measurements in cast components achieved by the present invention show accurate predictions of pore size and spacing, and in particular evidence a reduced tendency to under-predict the size and distribution of actual pores.Type: ApplicationFiled: May 10, 2013Publication date: December 19, 2013Applicant: GM Global Technology Operations LLCInventors: James W. Knight, Qigui Wang
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Patent number: 8611672Abstract: A work piece shape estimation device that includes an image information obtaining unit that obtains image information by sensing multiple randomly accumulated work pieces having an identical shape; an edge detection processor that performs an edge detection on the image information obtained by the image information obtaining processor; a separating processor that separates the work pieces into partial images based on the image information obtained by the edge detection processor; a work piece categorization processor that categorizes the separated partial images of the work pieces; and an estimated work piece shape generation processor that generates an estimated shape of the work piece by complementing an information of the partial images of the work pieces categorized by the work piece categorization processor.Type: GrantFiled: September 4, 2009Date of Patent: December 17, 2013Assignee: Honda Motor Co., Ltd.Inventor: Makoto Furukawa
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Patent number: 8594365Abstract: A method of reading a gauge may include capturing a digital image of the gauge with a gauge reading device attached to the gauge, the digital image comprising a plurality of pixels; determining an angle of a gauge feature based on positions of predetermined pixels of the digital image; and converting the angle into a gauge reading. Gauge reader devices and network based systems are also disclosed.Type: GrantFiled: January 30, 2009Date of Patent: November 26, 2013Assignee: Cypress Envirosystems, Inc.Inventors: Moses Derkalousdian, Harry Sim, Sundaram Nagaraj, Marcus Kramer
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Patent number: 8594417Abstract: Systems and methods for inspecting anodes, and smelting management based thereon are provided. In one embodiment, a system includes an imaging device configured to obtain images of at least one anode assembly, an image processor configured to producing imaging data based on the images, and a data analyzer configured to produce anode characteristic data based on the imaging data. In one embodiment, a method includes the steps of obtaining at least one image of at least a portion of an anode assembly, producing imaging data based on the at least one image, and deriving anode characteristic data based, at least in part, on the imaging data.Type: GrantFiled: November 27, 2007Date of Patent: November 26, 2013Assignee: ALCOA Inc.Inventors: Jean-Pierre Gagné, Gilles Dufour
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Patent number: 8581975Abstract: A pulsed thermography defect detection apparatus including active and passive infrared (IR) thermography for non-destructive testing (NDT) of powdermetallic (P/M) components for on-line and off-line inspection.Type: GrantFiled: June 18, 2007Date of Patent: November 12, 2013Assignee: Worcester Polytechnic InstituteInventors: Souheil Benzerrouk, Reinhold Ludwig, Diran Apelian
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Patent number: 8576278Abstract: The present invention discloses a system for monitoring dynamic stability of micro machine is provided in this invention, wherein an image-capturing device and an analytic device are included. The image-capturing device captures an image on a surface of a work piece milled by the micro machine. The analytic device comprises an image input interface, means for gray-scaling an image, means for analyzing abnormal gray-scaled value of the gray-scaled image, and means for analyzing numbers of veins of the gray-scaled image. This invention also provides a method for monitoring dynamic stability of micro machine.Type: GrantFiled: January 14, 2010Date of Patent: November 5, 2013Assignee: Chung Yuan Christian UniversityInventors: Shih-Ming Wang, Chia-You Chung, Chih-Chun Lin
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Patent number: 8565557Abstract: The claimed subject matter relates to an architecture that can facilitate more efficient free view generation in Ray-Space by way of a Radon transform. The architecture can render virtual views based upon original image data by employing Ray-Space interpolation techniques. In particular, the architecture can apply the Radon transform to a feature epipolar plane image (FEPI) to extract more suitable slope or direction candidates. In addition, the architecture can facilitate improved block-based matching techniques in order to determine an optimal linear interpretation direction.Type: GrantFiled: March 9, 2012Date of Patent: October 22, 2013Assignee: Kiu Sha Management Limited Liability CompanyInventors: Oscar Chi Lim Au, Ling Hou
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Publication number: 20130265411Abstract: A system for inspecting a scraped surface of a workpiece performs steps of: a) capturing an image of the scraped surface to obtain a original image section; b) removing high point regions whose areas are outside of a predetermined area range to obtain a base image; c) processing pixels of the base image using a first imaging mask to generate a judgment image; d) determining whether uniformity of the high point regions in the base image conforms a standard; e) determining whether a number of the high point regions in the base image falls within a predetermined number range; and f) evaluating whether or not a portion of the scraped surface conforms with the standard based on results of determinations made in steps d) and e).Type: ApplicationFiled: April 9, 2012Publication date: October 10, 2013Applicants: The Department of Electrical Engineering, National Chang-Hua University of Education, Buffalo Machinery Company LimitedInventors: Ching-Wei Wu, Ying-Shing Shiao, Chia-Hui Tang, Paul Chang
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Publication number: 20130251239Abstract: The amount of elongation of a workpiece during forging can be determined by image processing to calculate the total amount of horizontal movement of marked patterns such as forging scale on the ends of the workpiece which move away from a forging bite during the forging blow. Images of marked patterns before and after a forging blow on both sides of the bite of a forging die are compared to determine the movement of the marked patterns and thus the movement of the ends of the workpiece. A method and system of determining the elongation and vertical displacement of a workpiece during forging is disclosed.Type: ApplicationFiled: March 23, 2012Publication date: September 26, 2013Applicant: Specialty Minerals (Michigan) Inc.Inventor: Stefan Kirchhoff
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Publication number: 20130223724Abstract: The present invention relates to a method for classifying a multitude of images recorded by a camera observing a processing area of a workpiece processed by a processing beam, comprising the steps of: recording a first pixel image and a multitude of subsequent pixel images by the camera during a processing operation; detecting mismatches of a position and orientation of a keyhole generated by the processing beam in the workpiece within an image plane of the subsequent pixel images in comparison to the first pixel image; compensating the mismatches of the position and orientation of the respective keyholes in the subsequent pixel images with regard to the first pixel image, to produce a set of pixel images having each a normalized keyhole position and orientation; classifying the set of normalized pixel images into at least two classes by means of a classifier.Type: ApplicationFiled: June 28, 2011Publication date: August 29, 2013Applicants: PRECITEC ITM GMBH, PRECITEC KGInventors: Ingo Stork Genannt Wersborg, Stefan Müller-Meerkatz
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Patent number: 8520077Abstract: A color-unevenness inspection apparatus includes: an image pickup section picking up an image of an inspection target for a color-unevenness inspection; an image generation section generating an uneven-color image by determining one or more uneven-color regions existing in the picked-up image of the inspection target obtained by the image pickup section, and by classifying unit regions included in each of the uneven-color regions into a plurality of color groups; a calculation section calculating, on the uneven-color regions in the uneven-color image, an evaluation parameter to be used in the color-unevenness inspection; a correction section making a correction to the calculated evaluation parameter in consideration of a difference of color-unevenness visibility between the color groups; and an inspection section performing the color-unevenness inspection, based on a resultant evaluation parameter obtained by the correction.Type: GrantFiled: October 18, 2010Date of Patent: August 27, 2013Assignee: Sony CorporationInventors: Kunihiko Nagamine, Satoshi Tomioka
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Patent number: 8520930Abstract: The present invention relates to a method for improving the efficiency of dimensional acquisition of an object by a dimensional measurement device directed over the object, comprising the steps: a) directing the measurement device over the object to acquire its dimensions, b) providing an indication of the resolution of the acquired regions, c) re-directing the measurement device over at least part of the acquired regions indicating insufficient resolution according to predetermined criteria, d) updating the indication of the resolution of the acquired regions, and e) repeating steps c) and d) until sufficient resolution is indicated according to the predetermined criteria, thereby efficiently acquiring the dimensions of the object at sufficient resolution. It also relates to a computer program therefor.Type: GrantFiled: April 2, 2009Date of Patent: August 27, 2013Assignee: 3D Scanners Ltd.Inventor: Bart Van Coppenolle
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Publication number: 20130212051Abstract: A method of examining a cellular structure includes the steps of providing an inspecting device, a neural network and a target cellular structure that includes a plurality of target cells extending therethrough and further includes a target face exposing an arrangement of the target cells; inspecting the arrangement of cells on the face of the target cellular structure using the inspecting device; representing the arrangement of cells with numerically defined target cell parameters; inputting the target cell parameters into the neural network; and generating an output from the neural network based on the target cell parameters, the output being indicative of a strength of the target cellular structure.Type: ApplicationFiled: February 10, 2012Publication date: August 15, 2013Inventors: Alan Thomas Stephens, II, Leon Robert Zoeller, III
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Patent number: 8503757Abstract: Present invention is an image measurement device capable of easily identifying a degree of disagreement between contours for a plurality of workpieces, and including: an edge extraction unit that extracts an edge line from a workpiece image; an image comparison unit that compares the workpiece image with the previously held master image, an error calculation unit that calculates, based on the comparison result, an error indicating an amount of displacement between an edge position of the workpiece image and a position of the master image corresponding to this edge position; a statistical information calculation unit that calculates statistical information of the calculated error for a plurality of workpiece images and for each edge position; a statistical information display unit that displays the statistical information along the edge line extracted from the workpiece image or the master image in a display mode suitable for the values of the statistical information.Type: GrantFiled: July 14, 2011Date of Patent: August 6, 2013Assignee: Keyence CorporationInventors: Takashi Naruse, Yasutaka Kawa, Hayato Oba
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Patent number: 8503758Abstract: An image measurement device capable of recognizing a relative position and easily identifying a measurement result is provided, the device including: a measurement configuration data storage section that holds characteristic amount information, information for portions to be measured, and setting value information; a placement state detection section that detects a position and a posture of each workpiece; an edge detection section that detects an edge of portions to be measured; a pass-fail determination section that calculates size values of the portions to be measured and performs pass-fail determination of the portions to be measured and the workpiece; a measurement result display section that displays a result of the pass-fail determination of the workpiece over the workpiece image; and a workpiece selection section for selecting any of the workpieces. The measurement result display section displays the result of the pass-fail determination for the portions to be measured of the selected workpiece.Type: GrantFiled: July 14, 2011Date of Patent: August 6, 2013Assignee: Keyence CorporationInventor: Takashi Naruse
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Patent number: 8493558Abstract: A surface inspection apparatus includes an irradiating unit that has a plurality of light sources that respectively emit a plurality of illumination light beams having different wavelength ranges, and irradiates an inspection surface as a surface of a body to be inspected with the illumination light beams, in a condition where the light sources are located adjacent to each other and arranged in a given order along the inspection surface, an imaging unit that images reflected light when the illumination light beams are reflected by the inspection surface, so as to obtain a plurality of items of image data corresponding to the respective wavelength ranges, and a control unit that detects a detection object on the inspection surface, based on the items of image data corresponding to the respective wavelength ranges which are obtained by the imaging unit.Type: GrantFiled: October 8, 2009Date of Patent: July 23, 2013Assignee: Toyota Jidosha Kabushiki KaishaInventors: Yasunori Asada, Norio Miyazato, Eiji Yamazaki
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Patent number: 8479394Abstract: A method of assembling parts to form an aircraft component, in which a first surface of a first part (for example a wing skin) is to be positioned in the assembly adjacent to a second surface of a second part (for example a rib foot). The method comprises the steps of taking measurements of the first part, taking measurements of the second part with a laser, and calculating the size and shape of the space that will be generated when the first and second parts are assembled. A shim of varying thickness in dependence upon the results of the calculating step is manufactured, for example by stereolithography, and the first and second parts are assembled with the shim positioned between the first and second parts, the varying thickness of the shim compensating for a varying spacing of the first and second surfaces.Type: GrantFiled: September 21, 2006Date of Patent: July 9, 2013Assignee: Airbus Operations LimitedInventor: Christopher John Glazebrook
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Patent number: 8478022Abstract: A failure analysis method for a semiconductor integrated circuit includes deriving a coordinate in a device coordinate system in analysis data for abnormal signal data included in the analysis data of a semiconductor integrated circuit, deriving a correspondence between a coordinate in the device coordinate system and a coordinate in a design coordinate system in design data of the semiconductor integrated circuit for a plurality of reference points in the semiconductor integrated circuit, deriving a coordinate conversion formula between the device coordinate system and the design coordinate system, deriving a position error between a coordinate in the device coordinate system converted by the coordinate conversion formula and a coordinate in the design coordinate system, and extracting a circuit related to an abnormal signal in the design data based on coordinates of the abnormal signal in the device coordinate system using the coordinate conversion formula and the position error.Type: GrantFiled: February 16, 2010Date of Patent: July 2, 2013Assignee: Renesas Electronics CorporationInventor: Masafumi Nikaido
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Publication number: 20130162806Abstract: A method for operating an edge focus tool to focus the optics of a machine vision inspection system proximate to an edge adjacent to a beveled surface feature is provided. The method comprises defining a region of interest (ROI) including the edge in a field of view of the machine vision inspection system; acquiring an image stack of the ROI over a Z range including the edge; generating a point cloud including a Z height for a plurality of points in the ROI, based on determining a best focus Z height measurement for the plurality of points; defining a proximate subset of the point cloud comprising points proximate to the beveled surface feature and corresponding to the shape of the beveled surface feature; defining a Z-extremum subset of the proximate subset of the point cloud; and focusing the optics at a Z height corresponding to the Z-extremum subset.Type: ApplicationFiled: December 23, 2011Publication date: June 27, 2013Applicant: MITUTOYO CORPORATIONInventors: Yuhua Ding, Shannon Roy Campbell, Mark Lawrence Delaney, Robert Kamil Bryll
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Patent number: 8467592Abstract: Embodiments described herein are directed to detecting and/or measuring distortions of substrate media that can occur during a printing process. The distortion can be detected and/or measured using a composite image generated from a reference image having a first periodic pattern and print image, disposed on a test substrate media, having a second periodic pattern. The first and second periodic patterns are specified so that the composite image includes a moiré pattern having moiré fringes resulting from interference between the first periodic pattern associated with the reference image and the second periodic pattern associated with the print image. The moiré fringes can be used to detect and calculate an amount of distortion of the test substrate media.Type: GrantFiled: December 23, 2009Date of Patent: June 18, 2013Assignee: Xerox CorporationInventors: Shen-ge Wang, Beilei Xu, Robert P. Loce
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Patent number: 8463017Abstract: The present invention discloses a method for mapping and controlling the three-dimensional shrinkage and warpage occurring in rotomoulding applications.Type: GrantFiled: June 6, 2008Date of Patent: June 11, 2013Assignee: Total Petrochemicals Research FeluyInventor: Eric Maziers
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Patent number: RE44353Abstract: This invention provides a system and method for automating the setup of Locators and Detectors within an image view of an object on the HMI of a vision detector by determining detectable edges and best fitting the Locators and Detectors to a location on the object image view following the establishment of an user selected operating point on the image view, such as by clicking a GUI cursor. In this manner, the initial placement and sizing of the graphical elements for Locator and Detector ROIs are relatively optimized without excessive adjustment by the user. Locators can be selected for direction, including machine or line-movement direction, cross direction or angled direction transverse to cross direction and movement direction. Detectors can be selected based upon particular analysis tools, including brightness tools, contrast tools and trained templates.Type: GrantFiled: December 22, 2010Date of Patent: July 9, 2013Assignee: Cognex Technology and Investment CorporationInventors: Brian V. Mirtich, Andrew Eames, Brian S. Phillips, Robert J. Tremblay, II, John F. Keating, Steven Whitman