Abstract: Evaluation methods that employ the near infrared spectrum have generally had a low specificity and in particular have encountered difficulty in the evaluation of trace components, and the accurate measurement of coating quantity by methods using the near infrared spectrum has been quite problematic. The quantity of coating applied to a coating target, such as granules or uncoated tablets, is measured based on the absorption or scattering of light in the 800 to 1100 nm wavelength region by an additive coated on the coating target. The use of polyethylene glycol or a long-chain hydrocarbyl-containing compound as the additive is preferred.

Abstract: A method for regeneration of internal conduit surfaces by thermal projection of metals, includes inserting a device including a vehicle having a rolling assembly to permit rolling of the vehicle and carrying a thermal projection system, through a manhole in a conduit installation, including the steps of inserting the device in a conduit with the rolling assembly in a retracted position, and expanding the rolling assembly inside the conduit until the device is centered in the conduit; inserting electrical, pneumatic and/or hydraulic conduits and conduits for supplying metal to be thermally projected, through the manhole, such that the conduits are connected with the vehicle; positioning a regeneration device including the thermal projection system connected with the vehicle by a remote-control pulling system in a particular position to be regenerated; thermally projecting metal from the regeneration device; advancing the vehicle and connected regeneration device to a new regeneration position.

Abstract: A vapor deposition device 100 for moving a sheet-like substrate 4 in a roll-to-roll system in a chamber 2 to continuously form a vapor deposition film on the substrate 4. The vapor deposition device 100 comprises an evaporation source 9 for evaporating a vapor-depositing material; a transportation section including first and second rolls 3 and 8 for holding the substrate 4 in the state of being wound therearound and a guide section for guiding the substrate 4; and a shielding section, located in a vapor deposition possible zone, for forming a shielded zone which is not reachable by the vapor-depositing material from the evaporation source 9.

Abstract: A method for accurately calculating the thickness of deposited thin film layers onto a piezoelectric crystal blank in which dissimilar materials can be utilized, enabling determinations for various applications employing exotic materials. Additionally, the specific acoustic impedance (or equivalent z-ratio) of an unknown deposited material can be determined. The exact analytical solution nearly eliminates thickness errors when several layers of different materials are sequentially deposited on the same monitor quartz crystal.

Abstract: A method of manufacturing a plurality of secondary containment panels and assembling and installing the panels in a secondary containment system of an above-ground liquid storage tank or other retention facility includes forming a plurality of flexible substrate pieces. A liquid impermeable coating is applied to the upper surface of each piece such that an edge segment of the piece remains uncoated. The coating is applied to the substrate piece in an indoor enclosure using a computer controlled robotic sprayer that applies a uniform coating. Metal plates are embedded in the floor used for quality control testing of the coating thickness using magnetic gauges. At least a pair of the pieces are juxtaposed relative to one another such that a first one of the pieces overlaps the uncoated segment of the second piece to form a seam.

Abstract: A technology which is capable of an accurate measurement of the film thickness even if an exfoliation occurs is provided. A difference frequency ?f0 is calculated from a resonance frequency f0 of a film thickness sensor at a current time a0 and a resonance frequency f1 at an immediate past time a1, and whether the exfoliation has occurred or not is detected from its sign and a comparison result relative to a reference value. When the exfoliation has occurred, a corrected film thickness value T? is obtained by adding the thickness ?t0 of the exfoliation film to an increased film thickness value T which is determined from a resonance frequency fx measured at a future time ax to be converted to the thickness of a film on a film forming object, and whether the formation of the film should be terminated is judged in comparison to an aimed value.

Abstract: The invention relates to a cathode for electrolytic processes provided with a catalytic coating based on ruthenium crystallites with highly controlled size falling in a range of 1-10 nm. The coating can be produced by physical vapour deposition of a ruthenium or ruthenium oxide layer.

Abstract: A method for manufacturing a corrosion sensor includes applying a first layer of non-conductive material to a substrate, writing a conductive material at discrete locations on the non-conductive material, and writing the conductive material at discrete locations on the previously written conductive material. The method further includes applying a second layer of non-conductive material over the conductive material and machining at least a portion of the second layer of non-conductive material to expose at least a portion of the conductive material.

Abstract: A method for manufacturing a corrosion sensor includes spraying a non-conductive material on a substrate and spraying a conductive material at discrete locations on the substrate or on the non-conductive material. The method further includes spraying the non-conductive material around the discrete locations of the conductive material.

Abstract: A method of manufacturing a mirror includes a first step of arranging, on a substrate, a shape adjusting layer having a layer thickness which changes by heat, a second step of arranging, on the shape adjusting layer, a reflection layer including a first layer, a second layer, and a barrier layer which is arranged between the first layer and the second layer, and prevents a diffusion of a material of the first layer and a material of the second layer, and a third step of bringing a shape of the reflection layer close to a target shape by changing a layer thickness profile of the shape adjusting layer after the second step, the third step including a process of partially annealing the shape adjusting layer.

Abstract: A gas injection system for a chemical vapor deposition system includes a gas manifold comprising a plurality of valves where each of the plurality of valves has an input that is coupled to a process gas source and an output for providing process gas. Each of a plurality of gas injectors has an input that is coupled to the output of one of the plurality of valves and an output that is positioned in one of a plurality of zones in a chemical vapor deposition reactor. A controller having a plurality of outputs where each of the plurality of outputs is coupled to a control input of one of the plurality of valves. The controller instructs at least some of the plurality of valves to open at predetermined times to provide a desired gas flow to each of the plurality of zones in the chemical vapor deposition reactor.

Abstract: A method for generating a motion path for a spray gun for coating a component is disclosed. Path templates for surface segments of the component are defined, the surface is analyzed, a first motion path is generated, a model of the spray profile is simulated, the coating thickness is simulated for the motion path based on the simulated model of the spray profile and the generated first motion path. The simulated coating thickness is compared with tolerances and when the simulated coating thickness does not achieve the tolerances, an adapted motion path is generated. The coating thickness is simulated for the motion path based on the simulated model of the spray profile and the generated adapted motion path. Repeating the comparing, the motion path generation, and the simulation of the coating thickness based on the generated adapted motion path until the simulated coating thickness achieves the tolerances.

Abstract: A coating apparatus to apply a coating solution onto a base material, including a first body portion, a second body portion spaced-apart by a gap from the first body portion, a coating solution inlet arranged in one region of the second body portion, a coating solution passage connecting the coating solution inlet to said gap, a coating solution outlet arranged at one end of the gap to discharge the coating solution supplied to the coating solution inlet and a gap adjusting arrangement including a plurality of gap adjusting portions arranged on the first body portion to adjust a size of the coating solution outlet, the plurality of gap adjusting portions being arranged in a width direction of the base material.

Abstract: In order to manufacture an epitaxial wafer having satisfactory flatness over its entire surface, epitaxial layers are experimentally grown upon actual wafer samples under various different layer formation conditions, the thickness profiles are measured over the entire surfaces of these wafers before and after growth of the layers, and, from the differences thereof, layer thickness profiles over the entire areas of the epitaxial layers under the various different layer formation conditions are ascertained and stored. Thereafter, the thickness profile of a substrate wafer is measured over its entire area, this is added to each of the layer thickness profiles under the various different layer formation conditions which have been stored, and the planarities of the manufactured wafers which would be manufactured under these various different layer formation conditions are predicted.

Abstract: A method for manufacturing thin film panels comprises providing a laser patterning system, depositing a base layer on a glass substrate, separating the base layer by scribing a plurality of separation lines corresponding with a predefined scribe pattern, depositing a functional layer on the base layer, determining a first base layer separation edge, moving the translation stage by a first distance, activating the laser array and moving the translation stage by a second distance, deactivating the laser array, determining subsequent separation edges of the base layer and scribing lines therein, depositing a top layer on the functional layer, determining a first functional layer separation edge, operating the stepper motor to move the translation stage by a third distance, activating the laser array and moving the translation stage by a fourth distance, deactivating the laser array, and determining subsequent separation edges of the functional layer and scribing lines therein.

Abstract: A method for forming a thin film by discharging a liquid including a material for forming the thin film, the material being dissolved or dispersed in a solvent, from a plurality of nozzles so as to dispose the liquid into a plurality of predetermined areas included in an effective area set on a substrate to form the thin film while the plurality of nozzles and the substrate are relatively scanned, includes: (a) forming a plurality of reception parts surrounded by a plurality of partitions and bottoms of the predetermined areas, the partitions being provided around the predetermined areas; and (b) forming a plurality of thin films by disposing the liquid from the nozzles into the reception parts. In step (a), a plan view area of at least one of the reception parts in a peripheral area of the effective area is made smaller than a plan view area of the reception part in a central area of the effective area.

Abstract: The invention concerns a measuring system for optical monitoring of coating processes in a vacuum chamber, in which the light source is arranged inside the vacuum chamber between the substrate carrier and a shutter is arranged beneath the substrate carrier and the light-receiving unit is arranged outside the vacuum chamber in the optical path of the light source. The substrate carrier is designed to accept at least one substrate, and it can move across the coasting source in the vacuum chamber, preferably revolving about an axis, whereby the substrate or substrates cross(es) the optical path between the light source and the light-receiving unit for transmission measurement, and the shutter shades a measurement area across the coating source.

Abstract: Thin film processing systems and methods are provided having a moving deposition sensor capable of translation and/or rotation in a manner that exposes the sensor to thin film deposition environments in a flux region substantially the same as the deposition environments experienced by one or more moveable substrates during a selected deposition period. In one embodiment, a thin film monitoring and control system is provided wherein one or more moveable substrates and a moveable deposition sensor are moved along substantially coincident trajectories in a flux region of a thin film deposition system for a selected deposition period. Systems and methods of the present invention may include SC-cut quartz crystal microbalance sensors capable of excitation of at least two different resonant modes.

Abstract: Provided is a vacuum vapor deposition system including: a vapor depositing source; a film thickness sensor for monitoring; and a film thickness sensor for calibration, in which a distance L1 from a center of an opening of the vapor depositing source to the film thickness sensor for calibration and a distance L2 from the center to the film thickness sensor for monitoring satisfy a relationship of L1?L2, and angle ?1 formed by a perpendicular line from the center of the opening of the vapor deposition source to a film formation surface of the substrate and a straight line connecting the center of the opening of the vapor depositing source to the film thickness sensor for calibration, and angle ?2 formed by the perpendicular line and a straight line connecting the center of the opening of the vapor depositing source to the film thickness sensor for monitoring satisfy a relationship of ?1??2.

Abstract: Provided are a film formation apparatus and a film formation method which may control with accuracy the thickness of a thin film formed on the film formation object. A film formation apparatus includes a moving part (film formation source unit) for moving a film formation source between a predetermined film formation waiting position and a predetermined film forming position is provided, and the moving part holds a quartz oscillator for measurement and a quartz oscillator for calibration so that their relative positions with respect to the film formation source are maintained. And a calibration step for calibrating a monitored value of the quartz oscillator for measurement, using a monitored value of the quartz oscillator for calibration, is performed in a middle of the film forming step of forming the film on the film formation object.

Abstract: A film formation apparatus includes a film formation source, a quartz oscillator for measurement, and a quartz oscillator for calibration. When a thin film of a film forming material is formed on a film formation object, the film forming material is heated in the film formation source to release vapors thereof. The quartz oscillator for measurement measures the amount of the film forming material formed on the film formation object, while the quartz oscillator for calibration calibrates the quartz oscillator for measurement. In the film formation apparatus, there are further provided a moving part for moving the film formation source between a predetermined film formation waiting position and a predetermined film forming position with respect to the film formation object and a temperature control part for controlling a temperature of the quartz oscillator for measurement and a temperature of the quartz oscillator for calibration to be substantially the same.

Abstract: Provided is a vacuum vapor deposition system, which enables a vapor deposition rate to be measured accurately and a film thickness to be controlled with higher accuracy. The vacuum vapor deposition system includes: a vacuum chamber; a substrate holding mechanism; a vapor depositing source; a film thickness sensor for monitoring; a control system including a temperature controller and a film thickness controller; and a film thickness sensor for calibration, in which a distance from one film thickness sensor whose measurement accuracy is to be enhanced, out of the film thickness sensor for monitoring and the film thickness sensor for calibration, to a center of the opening of the vapor depositing source, is smaller than a distance from another film thickness sensor to the center of the opening of the vapor depositing source.

Abstract: A method for determining the thickness of a film on a substrate is described. The substrate has a first major surface opposite a second major surface, and the film covers a portion of the first major surface. During a first measurement step, a first measuring beam is used to determine the distance from a first reference point to a portion of the first major surface of the substrate that is not covered with the film, and a second measuring beam is used to determine the distance from a second reference point to a portion of the second major surface of the substrate that is not covered with film. During a second measurement step the first measuring beam is used to determine the distance from the first reference point to the film, and the second measuring beam is used to determine the distance from the second reference point to a portion of the second major surface of the substrate that is not covered with film.

Abstract: An instrument is described for measuring the thickness of a paint coating on a rotating roll of a roll coating applicator roll for determination of the thickness of a paint coating to be applied to a moving substrate comprising: sensor means arranged for emitting and detecting signals reflected from the surface of the paint coating on at least one roll of the roll coating applicator to generate data indicative of the position of the surface of the paint on the roll, the sensor means being distanced from the paint coating for the emission and detection of the signals; and processing means for processing the data generated by the sensor means to determine the thickness of the paint coating to be applied to the substrate.

Abstract: A method of manufacturing a magnetic recording medium with high recording density and enabling stable flight of a magnetic head, with high manufacturing yields, is provided. The method includes layering a magnetic layer, a protective layer, and a lubricating layer in order on a substrate, and forming a medium for transfer. The method further includes transferring a magnetic pattern to the medium for transfer, and flattening a surface of the lubricating layer of the medium for transfer for which the magnetic pattern transferring is completed. The surface of the lubricating layer is flattened either by wiping the surface of the lubricating layer using a member without a cutting effect, or by heating the surface of the lubricating layer.

Abstract: A manufacturing method and apparatus of an organic resin coated metal sheet is provided. Temperatures of edge portions of the metal sheet and a temperature of an approximately central portion of the metal sheet are respectively measured using a metal-sheet temperature measuring device arranged directly upstream of lamination rolls. Respectively measured temperature values are inputted to a heating temperature controller, and output values calculated by the heating temperature controllers are inputted to a metal sheet center portion heater and the metal sheet center portion heater, respectively, to control the heating of a widthwise approximately center portion and edge portion, respectively, to a first and second temperature, respectively, the second temperature being higher than the first. A resin film is extruded to pre-rolls and is sandwiched and pressure-bonding to the metal sheet between a pair of lamination rolls. Resin portions projecting from both edge portions are then removed.

Abstract: An arrangement for measurement of temperature and thickness growth of silicon rods in a silicon deposition reactor employs a temperature measurement device located outside the reactor. Continuous temperature measurement and measurement of the thickness growth throughout the entire deposition process is achieved with a contactlessly operating temperature measurement device arranged outside the silicon deposition reactor in front of a viewing window. The temperature measurement device can be pivoted horizontally about a rotation axis by a rotating drive. The pivoting axis runs parallel to a longitudinal axis of the silicon rod, and the central axis of the temperature measurement device runs through the pivoting axis.

Abstract: A method is provided for producing a wide range of high quality coated recyclable paper or paperboard for use in a variety of applications. In accordance with the process, paper or paperboard is coated with a polymer emulsion in one or more coating stations which are off-line from a paper or paperboard machine. The process provides coated paper or paperboard products with enhanced barrier properties.

Abstract: A machine and a method of applying a non-Newtonian liquid composition onto a surface in a controlled manner. The composition is held in a chamber at a controlled variable pressure and is dispensed through a slit die nozzle as controlled by a valve. Characteristics of the composition are empirically developed and provided to a logic control circuit to assure that the composition is dispensed on either the entire surface or in one or more precise locations.

Abstract: An vapor deposition control system includes a multi-level control scheme.

Abstract: Techniques for temperature-controlled ion implantation are disclosed. In one particular exemplary embodiment, the techniques may be realized as an apparatus for temperature-controlled ion implantation. The apparatus may comprise at least one thermal sensor adapted to measure a temperature of a wafer during an ion implantation process inside an end station of an ion implanter. The apparatus may also comprise a thermal conditioning unit coupled to the end station. The apparatus may further comprise a controller in communication with the thermal sensor and the thermal conditioning unit, wherein the controller compares the measured temperature to a desired wafer temperature and causes the thermal conditioning unit to adjust the temperature of the wafer based upon the comparison.

Abstract: A method for the thermographic inspection of nonmetallic materials, particularly coated nonmetallic materials, is provided. The method includes heating at least one part of the surface of the nonmetallic material, preferably a part of the surface furnished with a nonmetallic coating, by a short energy pulse, preferably a light pulse, or by periodic input of heat, and recording the temporal and spatial temperature profile at least at a plurality of successive time points.

Abstract: An apparatus and method for coating a functional layer on a current collector with an active material layer thereon, the apparatus including a first roll and a second roll, the first roll and second roll being for advancing the current collector; a gravure roll, the gravure roll being configured to coat the functional layer on the active material layer; a thickness measurer, the thickness measurer being configured to measure at least one of a thickness of the active material layer and a sum thickness of the active material layer and the functional layer; and a controller, the controller being in communication with the thickness measurer and being configured to control a rotation speed of the gravure roll.

Abstract: A device for manufacturing a display device includes a deposition source; a deposition thickness calculator for calculating a deposition thickness of a deposition material deposited on a substrate; and a controller for controlling a power of a heater which heats the deposition source by comparing the deposition thickness calculated with a reference thickness. The controller controls the power of the heater either at least one time for each substrate on which the thin film is to be deposited or at regular intervals while the deposition material is deposited. Influence of measurement noise that is included in a quartz crystal sensor for measuring a deposition speed may be minimized, and distribution of deposition thickness of an organic light emitting material may be reduced, thereby increasing the yield of the deposition process and producing quality display devices.

Abstract: Methods and apparatus for coating a major surface of a strip article advancing past and in contact with an applicator roll by supplying coating material to the applicator roll for transfer to the strip surface while urging a metering roll against the applicator roll to impart a coating profile to the coating material on the applicator roll before the coating material having that profile is transferred to the strip surface, wherein the metering roll is subjected to a force for bending the axis of the metering roll convexly toward the applicator roll, thereby to compensate for deflection of the metering roll that would otherwise tend to cause nonuniformity of applied coating weight across the width of the strip.

Abstract: The present invention provides a method for estimating an amount of immobilized probes, including the successive steps of: providing a sample on a substrate to form one or more spots of the sample on the substrate, the sample containing particulate substances and probes in a predetermined ratio, the probes being reactive with a predetermined target; measuring the number of the particulate substances contained in at least one of the spots; and estimating the amount of the probes contained in the at least one of the spots from the thus measured number of the particulate substances.

Abstract: The invention provides, in preferred embodiments, methods, systems, and devices arising therefrom for making battery electrodes, in particular, for lithium-ion batteries. Unlike conventional slurry coating methods that use mechanical means to coat thick pastes of active material, other materials, and solvent(s) onto a substrate, the invention provides for a method to produce electrode coatings onto support in a multi-layer approach to provide highly uniform distribution of materials within the electrode. Problems of differential sedimentation of particles in slurries found in conventional methods are minimized with the methods of the present invention. Also included are systems for producing in large-scale the battery electrodes of the invention. Further included are electrodes produced by the methods and systems described herein.

Abstract: The invention relates to a multilayer composite film which is substantially free from polyvinyl chloride and polyolefins. In particular, the layers of the film may include an ABS material, a polystyrene material, and/or a polyester material. The material composition and thickness of composite film are such that the maximum tensile force generated when a test body including the composite film is subjected to a specified single-axis tensile testing procedure ranges between 30 Newtons and 280 Newtons.

Abstract: A continuous vapor deposition system for coating an elongate, uncoated conductive element with a substantially continuous barrier layer. The system comprises an internal deposition chamber configured to have a section of the conductive element extend there through; a vapor supply system connected to the internal deposition chamber configured to provide a barrier material to the internal deposition chamber, wherein the barrier material is deposited on the section of the conductive within the internal deposition chamber to form a substantially continuous barrier layer; and a guide system positioned adjacent to the first deposition chamber configured to maintain tension in the section of the conductive element in the internal deposition chamber to control movement of the conductive element through the internal deposition chamber.

Abstract: The present invention provides a heating system, a heating method and a program, which can readily control processing temperature. A temperature calculating computer 4 of the heating system includes a device DB 42. The device DB 42 stores therein a temperature correcting table indicative of a relationship between an accumulated film thickness of extraneous matter attached to the interior of each heating apparatus and a temperature correcting amount, with respect to each heating apparatus, for each temperature (processing temperature) in the heating apparatus. Thus, the temperature correcting amount can be specified based on the temperature correcting table, the processing temperature and the accumulated film thickness, so that an optimized value can be calculated from the specified temperature correcting amount.

Abstract: Methods allowing for visual inspection of a coated component for erosion damage involving providing a component, and applying a plurality of layers of an erosion system to at least a portion of the component to produce the coated component where each layer of the erosion system comprises a different color that becomes visible as the layer is eroded.

Abstract: Thin film processing systems and methods are provided having a moving deposition sensor capable of translation and/or rotation in a manner that exposes the sensor to thin film deposition environments in a flux region substantially the same as the deposition environments experienced by one or more moveable substrates during a selected deposition period. In one embodiment, a thin film monitoring and control system is provided wherein one or more moveable substrates and a moveable deposition sensor are moved along substantially coincident trajectories in a flux region of a thin film deposition system for a selected deposition period. Systems and methods of the present invention may include SC-cut quartz crystal microbalance sensors capable of excitation of at least two different resonant modes.

Abstract: Described here are embodiments of processes and systems for the continuous manufacturing of implantable continuous analyte sensors. In some embodiments, a method is provided for sequentially advancing an elongated conductive body through a plurality of stations, each configured to treat the elongated conductive body. In some of these embodiments, one or more of the stations is configured to coat the elongated conductive body using a meniscus coating process, whereby a solution formed of a polymer and a solvent is prepared, the solution is continuously circulated to provide a meniscus on a top portion of a vessel holding the solution, and the elongated conductive body is advanced through the meniscus. The method may also comprise the step of removing excess coating material from the elongated conductive body by advancing the elongated conductive body through a die orifice.

Abstract: Upon a substrate subsequent layers of elastic ink are jetted using an ink jet printing system. Each layer is immobilised by a immobilisation step before jetting the following layer. A printing relief is gradually formed to obtain a flexographic printing plate allowing accurate control over the relief and slopes of the printing plates. Use can be made of different inks or immobilisation step to obtain different layer characteristics. Inks can be immobilised using UV curing. The recorded relief of the layers can be measured and corrections can be applied using a feed-back loop. A rejuvenation process for printing plates can be constructed using the described method. An elastic base layer can be provided on the substrate to provide better plate characteristics.

Abstract: A method for layerwise production of a tangible object comprises repeatedly performing method cycles. Each method cycle comprises the steps of solidifying a predetermined area of an uppermost liquid layer (10) of a liquid (3) in a reservoir (2), so as to obtain a solid layer of the tangible object, and creating, above, parallel and adjacent to the solid layer, a successive uppermost liquid layer of the liquid. Said creating of the successive liquid layer is carried out by spraying such liquid onto upper parts of the contents in the reservoir. A height distribution over at least part of the surface of the uppermost liquid layer is measured by means of a measuring device (6). Based on the measured height distribution, the solidifying is carried out to compensate for unflatness of the measured height distribution.

Abstract: In a previous experiment of a deposition work of depositing a film with a uniform thickness on a long strip base material in the longitudinal direction thereof, an elapsed time from the start of the deposition work and an output of a power supply at the elapsed time are measured. The resulting relation between the elapsed time and the output is stored in a storage device. Subsequent deposition on a long strip base material is performed by a method in which first, the output of the power supply is controlled to be stabilized at a desired value using a crystal oscillator thickness gauge in a pre-heating step before the start of the deposition work, and then, a base material transport device is driven to start the deposition work on the long strip base material after a desired deposition rate is obtained. After the start of the deposition work, the output of the power supply is controlled to coincide with the output at the elapsed time stored in the storage device.

Abstract: A method for manufacturing a magnetic recording medium with high reliability is provided, which can form a thin magnetic layer having a dry film thickness of, for example, 60 nm or less while the occurrence of defects on the surface is suppressed. In this method, a magnetic paint having a solid concentration NV (mass %) of 3?NV?8 is applied to a non-magnetic underlayer formed over a non-magnetic support to a wet film thickness Tw in a range of ?2300 (nm).

Abstract: A method for intermittently applying thin-film coatings is realized, by which a coating of extremely thin film reduced to 20 ?m or less in thickness is deposited intermittently with high productivity and at the same time, the trailing coating edge of the thin film is formed in a highly accurate shape having good linearity. This is achieved as follows. A band-shaped substrate (1) traveling in one direction is kept looped over a stationary reference-roller (4) and a movable actuation roller (7), and is brought into contact with an application roller (19) which carries a coating agent (18) on its circumferential surface and rotates in a direction opposite to the direction of travel of the substrate (1). The actuation roller (7) is moved to come into or out of contact with the substrate (1) with a predetermined timing.

Abstract: An apparatus for performing a coating weight control calculation and an apparatus for generating an activation timing of each process in coating weight control are separately managed. A strip welding point pass event, a completion event of scan measurement of a steel strip in a width direction by a coating weight gauge, and a constant period event are related respectively to activation timings of preset control, feedback control and feedforward control respectively of a coating weight. In a coating weight control apparatus and method, the activation timing generation apparatus is equipped with a function of calculating a timing of changing a pressure reference avoiding insufficient coating in accordance with response characteristics of a pressure as an operation terminal, and if a target coating weight is changed from thin coating to thick coating, generating a preset control activation reference in accordance with the calculation result.

Abstract: A method of measuring a coating deposits a layer of coating on an object. A laser beam is projected on the layer of the coating. A reflection of the project laser beam is received by the laser sensor. From this information, the thickness of the layer of the coating on the object is determined. A value related to the thickness of the layer of the coating may then be compared to a desired value.