Abstract: A test probe guide device 10 for use with a conventional electrical test probe 100 and an electrical wire 200 wherein the guide device 10 includes a housing member 20 dimensioned to receive the test probe 100 and spring biased plunger disk 30 and further including a wire engaging unit 13 comprising a hook member 40 dimensioned to captively engage the electrical wire 200 to allow the test probe needle 102 to be electrically connected to the electrical wire 200.

Abstract: An improved test probe for use with a bed of nails type test fixture is disclosed. The test probe comprises a probe body having a test head at one end for contacting test points on a DUT placed in a test fixture and an annular ring disposed around the circumference thereof proximate the center of the probe. A nonconductive tubular sheath is disposed over the test head and affixed at one end to the test probe by the annular ring. The other end of the sheath extends beyond the test head such that the test head is recessed within the sheath a distance defined by component lead length and PCB thickness fault tolerances and acceptable float. In this manner, the test probe enables the detection of PCB faults caused by missing or improperly or incorrectly inserted plated through-hole mounted components.

Abstract: A tester having as an interconnect structure a pair of resilient, elastomeric, vise-like interconnect grips having conductive tracings thereon. This interconnect structure provides electrical conduction between the conductive tabs of an adapter card under test and the tester.

Abstract: A high-force spring probe comprises a hollow barrel, a plunger disposed for sliding axial travel within the barrel, a plunger tip outside of the barrel for contacting a unit under test, and a plunger bearing inside the plunger end of the barrel. The plunger includes an elongated intermediate section that extends between the tip and bearing section of the plunger. The barrel includes a crimped portion immediately inside the plunger end of the barrel that engages the bearing section, and retains the plunger in the barrel. A coil spring is disposed within the barrel between a terminal end of the barrel and the plunger bearing section. The spring has a diameter approximately matching equal to the inside diameter of the barrel. The plunger includes a reduced diameter spring control section that extends axially from the bearing section along the center of the spring. The spring control section of the plunger has an outside diameter that approximately matches an inside diameter of the spring.

Abstract: An emulator probe accelerates the efficiency of program debugging work with an emulator. The emulator probe includes an emulator coupling device in which lead terminals are soldered on string-like cut-out sections provided on the sides of a board having the same dimensions as a package molding portion of a microcomputer. As required, the emulator coupling device or a microcomputer is mounted on an IC socket provided on a target board.

Abstract: The invention presents a method and a correspondingly designed probe for achieving uniform stress distribution when experiencing deflection. The probe has a top edge, a bottom edge, a tip, and a beam portion defined by selecting an inflection point along the top edge, such that the beam portion is contained between the tip and the inflection point, and the bottom edge below the beam portion is approximately straight, while the curvature of the top edge of the beam portion is fitted to a parabola. The tip has an outer edge, an inner edge, and a point of contact at the location where the outer and inner edges join. The inner edge is approximately straight while the curvature of the outer edge is fitted to a second parabola. The probe is preferably mounted in a support structure having a groove for receiving the probe such that the beam portion is free to move vertically in the groove and constrained laterally to prevent side-buckling.

Abstract: A linear clamp for releasably engaging an electrical connector is provided. The clamp includes a housing having a hand grip portion and an elongated barrel portion having a longitudinal axis, a fixed jaw carried by the barrel portion, and a moveable member having a moveable jaw thereon axially aligned with and facing the fixed jaw, wherein the longitudinal axis passes through the jaws. The clamp further includes resilient means for urging the moveable jaw toward the fixed jaw, and a lever pivotally connected to the hand grip portion and coupled to the moveable member for linearly moving the moveable jaw along the longitudinal axis away from the fixed jaw.

Abstract: A probe adapter may comprise an elongate body having a nose section, a tail section, and a generally U-shaped elongate slot for receiving a probe. The U-shaped elongate slot has a front end that is located a space distance from the nose section of the elongate body. A probe tip assembly mounted to the nose section of the elongate body is adapted to engage the signal input terminal of the probe so that the signal input terminal of the probe is electrically connected to the probe tip assembly when the probe is positioned within the elongate slot.

Abstract: An IC socket is equipped with a plurality of elastic contact pins which are brought into contact with spherical bumps of an IC package. Each of the contact pins has at a foremost end thereof a contacting portion disposed opposite to a lower spherical surface of the spherical bump. The contacting portion has a relief portion which is kept in a non-contacting condition relative to a lower dead point portion on the lower spherical surface of the spherical bump, and a contacting end is brought into press contact at an area thereof around the relief portion with that area of the spherical surface of the spherical bump outwardly adjacent to the lower dead point.

Abstract: A socket for use in electrically measuring and testing a semiconductor device including a body portion having a guide for holding leads of the semiconductor device, and a cover with a plurality of probes for contacting with the leads of the semiconductor device. The cover has a plurality of out-leads respectively connected to the probes to communicate electrical signals from the probes to an exterior device. The guide of the body portion is provided with a plurality of lead guide holes, and a biasing member for urging the guide toward the cover to ensure consistent contact between each of the probes and a corresponding lead.

Abstract: An adapter for testing printed circuit boards which has a support plate and an advantageous fixation of exchangeable spring-loaded contact elements, also known as spring-loaded probe assemblies, therein for providing electrical contacts to a printed circuit board in predetermined contact locations. The support plate (2) is comprised of several layers (20, 21, 22), and the contact elements (4) are set into bores (3) and are removably held and axially locked into place in the bores (3) between two layers (20, 22) by a bead (51) formed on the contact elements, preferably in a vacuum-tight manner.

Abstract: A clip is used for receiving one of a plurality of wires of various sizes. The clip includes a non-movable portion including a wire receiving surface and a movable portion disposed at least partially externally of the non-movable portion. The movable portion includes a wire engaging surface disposed opposite and facing the wire receiving surface, with the surfaces defining wire receiving jaws operable between a closed jaw condition and an open jaw condition. A biasing element is coupled to the portions biasing the surfaces to the closed jaw condition. The movable portion is reciprocally movable from the closed jaw condition to the open jaw condition against the urging of the biasing element.

Abstract: In a rotary probe mounted on a circuit board and used to connect a circuit of the circuit board to an external device, an outer frame has a flange portion facing the circuit board. A first lead extends along the flange portion and has a signal input terminal and is supported so as to be rotatable with respect to the circuit board. The signal input terminal is connectable to parts of the circuit of the circuit board one by one by rotating the first lead. A probing jack is connected to the first lead, and is connectable to a corresponding terminal formed on the circuit board. A ground supply terminal projects from the outer frame and is connectable to a corresponding ground terminal formed on the circuit board.

Abstract: An emulator probe comprising a direction changing board 10 having a first connector 11 to be coupled to a relaying connector 9 set on one surface thereof and a second connector 12 set on the other surface thereof such that the direction of setting of the same is different from the direction of setting of the first connector 11 and adapted such that soldering to a microcomputer mounting foot pattern 3 is achieved not through a pin terminal but through a semicircular edge portion of a semicircular through hole 8a formed in the peripheral surface of a semicircular through-hole board 8, and therefore, the emulator can be mounted on a user target board 1 easily without the need to deform the emulator cable and, further, the area occupied by the microcomputer mounting foot pattern can be decreased.

Abstract: A wafer prober comprises a wafer chuck for chucking a wafer and a probe card holding section for holding two or more probe cards. The wafer prober further comprises a test section for simultaneously testing a plurality of chips among chips in one wafer, with use of the two or more probe cards, while respectively making probe sections included in the two or more probe cards be in contact with external terminal sections of the plurality of chips.

Abstract: The test probe for electrical measuring instruments, particularly for voltmeters, is characterized by an automatic holding device that automatically holds the test probe in a socket-outlet jack of any given design, which device comprises a contact spring at least partially adjacent to a contact pin and bilaterally bulging toward the tip of the contact pin. This results in a universally utilizable test probe that will hold automatically in any jack format of different socket-outlets, shock-hazard protection being ensured at all times.

Abstract: A cathode terminal, to be mounted on a bulb socket, comprising a first connection strip which is elastically connected with the cathode of a mouth piece of a bulb; and a second connection strip to be connected with a connector. The cathode terminal has a covering portion formed at the leading end thereof by bending said cathode terminal so as to cover the upper end of said opening of said terminal inserting groove. Therefore, the pin of the bulb cannot be inserted into the cathode terminal inserting groove.

Abstract: A stage 130 includes a metal base and an anti-metal contamination film formed on the metal base a semi-conductor wafer 120. The anti-metal contamination film is constructed of a material selected from the group consisting of a semi-conductor film, a semi-conductor oxide film, a semi-conductor nitride film, a semi-conductor carbide film, and a polytetrafluoroethylene film. The rear face of the semi-conductor wafer 120 mounted on the stage 130 is in direct contact with the anti-metal contamination film but not with the metal surface. The anti-metal contamination film, which does not contain simple substances of metals, effectively protects the rear face of the semi-conductor wafer 120 from contamination metal.

Abstract: A probe pin for inspection composing a unit to inspect a printed circuit is formed with a conductive metallic tube into which a plunger is inserted with a spring. The plunger is slidably projected from the top end of the conductive metallic tube and a plurality of hollow salients are formed symmetrically on outer surface of the conductive metallic tube to extend in the axial direction so that the conductive metallic tube is easily pushed into a plurality of holding openings formed on an insulated holding plate. Thus, the probe pins come in contact with each contact on the printed circuit without coming off, slanting or bending of the conductive metallic tube or further without breaking the salients or without deviating the installation of the conductive metallic tube from the holding openings on the holding plate, and a slip-on socket is provided to mate with the probe pin for inspection.

Abstract: A quick-connect terminal and receptacle for electrical spring test probes used in the printed circuit testing industry has a tubular receptacle having an inner bore with an entrance for inserting a wire terminal. The terminal has an open end receiving a base end of a wire. A barb cut from the terminal wall extends angularly into the terminal bore and away from the open end. The barb has an edge for gripping the wire end and preventing easy pullout. The wire extends to circuit testers which execute a testing routine upon the printed circuit board. The receptacles contain removable and replaceable spring probes and the quick-connect terminal and receptacle assembly provides speed and ease of probe replacement. Sealing rings can extend between the terminal and receptacle to maintain vacuum for use of the arrangement in vacuum actuated test fixtures.

Abstract: A holder (16) for releasably holding needle electrodes (18). The holder (16) includes a body (26) having a base slidably mounted within the body. Depressing the base into the body (26) releases a gripping assembly (50) located within the body (26) allowing a needle electrode (18) inserted into the holder to be removed. Releasing the base (24) causes the gripping assembly to engage a needle electrode inserted into the holder. The gripping mechanism (50) includes a chuck (60) having an opening sized to receive the needle electrode (18). The chuck engages a ferrule (73) that depresses the jaws (70) of the chuck (68) radially inwardly with respect to each other to reduce the size of the opening in the chuck thus holding a needle electrode (18) inserted into the chuck (68).

Abstract: An electrical test device for use by an electrician in testing circuits. The device includes a voltage sensor, display, voltage transducer and steady current source. The voltage sensor measures the voltage between two conductors and provides a signal to the display, which responsively displays the voltage. The steady current source is in series with the voltage transducer, so that the voltage sensor may respond to a broad range of voltages while only a limited amount of current flows through the voltage transducer. Consequently, lower cost components may be used in the voltage transducer.

Abstract: A test fixture is provided for testing the resistance associated contamination material on the surface of electrical contacts mounted to a printed circuit board. An elongated probe is provided which has an axis perpendicular to X and Y planes. A mechanism is provided for maintaining the probe in a precise perpendicular orientation to the X and Y planes while permitting movement of the probe along its axis in the Z plane to engage an aligned contact. A predetermined bias force is exerted by the probe along its axis while engaging the contact to be tested.

Abstract: An assembly suitable for use as an overclamp assembly is provided. The assembly includes a base having a shaft inserted therethrough. The shaft rotates about an axis relative to the base. A center block is pivotably coupled to the shaft for arcuate movement about the axis and relative to the base. A longitudinal drive assembly is inserted into the center block and coupled to the shaft. Rotation of the shaft causes the longitudinal drive assembly to traverse a longitudinal path and an arcuate path about the axis. The longitudinal drive assembly includes a holder which is suitable for attachment to a probe arm.

Abstract: A test probe including a flexible membrane (12) having an array of test probe contacts (14) capable of softly and gently contacting pads on a device under test is provided with a structure that effectively applies tension to the membrane while at the same time automatically leveling the membrane and removing distortions. A small pressure plate (30) is bonded to the inner surface of the membrane behind the test probe contacts. A pressure post (58) having a pointed or rounded end (64) is pressed against the pressure plate (30a) and makes pivotal contact with the plate. A spring (50) including an adjustment screw (56) that axially adjusts the compression of the spring, applies pressure through the pivot point to the pressure plate and thus to the membrane at its test probe contacts.

Abstract: Disclosed is a tester for testing a connector provided with at least one axial terminal hole and at least one terminal which is correspondingly fitted into said at least one terminal hole, the tester having at least one probe unit which is moved with a movable body and adapted for corresponding introduction into said at least one terminal hole for testing fitting of the terminal.

Abstract: The invention relates to an instrument for testing and/or measuring electric magnitudes, in particular voltages and/or resistances. The instrument consists of two handle parts (10, 12), which are connected by a flexible cable (14), and which each have a contact point (16, 18). In addition to the contact point (16, 18), the handle parts (10, 12) each have a receptacle for the contact point (18, 16) of the other handle part (12, 10). The handle parts (10, 12) can be plugged together in such a way that their contact points (16, 18) each are pluggable into the receptacle of the other handle part (12, 10) nonparallel with the contact point (18, 16) of such other handle part. The contact point (16) and the receptacle of the one handle part (10) are arranged in a down-folding point part (22), so that the instrument, in the plugged-together condition, can be folded together for convenient, safe and space-saving storage.

Abstract: A semiconductor apparatus for functionally inspecting semiconductor devices is designed to prevent contact failure, deformation, and the like caused by solder transferred from external leads of semiconductor devices and deposited on contact terminals of the inspection apparatus. A sheet having metal-film patterns corresponding to an array of external leads of a semiconductor device is interposed between the external leads and the contact terminals to electrically connect the external leads to the contact terminals. The semiconductor device is inspected and the sheet is changed at a suitable time when it is contaminated with solder.

Abstract: A connector system having an electrical switch capability for connecting a first electrical conductor to a second electrical conductor is provided and includes a spring biased contact element having a first portion for making electrical contact with the first electrical conductor, a second tapered contact portion for mating with a conductive rim of a hole of the second conductor, and a spring portion for biasing the tapered contact portion in the closed position where the second tapered contact portion mates with the conductive rim, and an actuation member for bringing the tapered contact portion into the open position. The actuation member may be a plunger or the like which enters the hole with which the tapered contact portion is mated from the rear side and pushes the tapered contact portion out of contact.

Abstract: A device for detecting the presence of an electric current in a conductor having a elongate hollow tubular body defining a handle, an electrically conductive blade having a sharpened edge attached to and extending from one end of the handle, an electric lamp visibly housed within the handle and electrically connected to the blade and a ground wire electrically connected to the lamp and including a clamp for secured attachment to a ground. The sharpened edge of the blade is specifically structured and disposed for cutting through the insulation of a wire conductor for conductive contact therewith whereupon the presence of an electric current through the conductor will illuminate the lamp in the handle of the device.

Abstract: A double-headed spring contact probe for loaded board testing including a barrel having a hollow interior and opposite plungers which slide axially in the barrel is described. The plungers have outer portions which extend through the opposite open ends of the barrel, each terminating in a contact tip outside the barrel for contacting a test point on a circuit board. One of the plungers has a hollow receptacle extending into the barrel with a rectangular or notched keyway opening into the receptacle. The keyway is disposed at an angle of about 6.degree. to the longitudinal axis thereof. The other plunger has a twisted guide member extending through the barrel into the keyway of the other plunger whereby axial translation of the plungers relative to each other causes a rotation thereof and the keyway rides in the groove for electrical contact as translational movement occurs.

Abstract: A transmission wire connector assembly incorporating a live contact test access position comprises a recess within the body of the assembly into which a connector extends, the recess being arranged to contain a non-conductive elastic self-healing sealant gel for providing a seal of the live connector with respect to the environment; and an electrically conductive contact member arranged to be disposed at least partially within the recess but normally held separated from the live connector and therefore non-live; the contact member being so disposed and arranged that upon applying a test probe thereto the contact member is moved into contact with the live connector to enable testing thereof to take place, the contact member being so arranged that upon removal of the probe the contact member returns to its normal position separated from the live connector.

Abstract: An electrical connector for being electrically coupled to at least one electrical conductor. The connector includes a housing and at least one contact positioned therein and including a tip portion which protrudes from the housing to engage the conductor. Significantly, the contact, initially of a non-stressed configuration, is preloaded within the housing to assume a curved configuration and to engage the respective conductor in such a manner that sound, positive engagement occurs in a substantially non-wiping manner. The housing may thus be stationarily positioned relative to the circuit member, the circuit member able to thus press against the tip portion of the contact to complete coupling. The remaining part of the invention may be electrically coupled to an external conductor, e.g., a cable.

Abstract: An electrical continuity tester employing two test probe assemblies (10) (12), one of which employs a conductive brush tip (26) at one end and a solid pointed tip (14) at the other. The brush tip of the probe allows rapid localization of continuity by sweeping the area to be tested with the brush tip of the probe until an audible tone or visual indication occurs. Conducting a point-to-point search within the area previously identified by the brush tip identifies the actual point of continuity. The solid pointed tip of the same probe accomplishes this task. To reduce risk of damage to the circuit under test, the tester applies less than 1 volt through the test probes. The tester employs a pulse stretching circuit to electrically stretch the pulse generated by a successful continuity event to a minimum duration so that even very brief contact duration made by the probes between two points of electrical continuity will result in a clearly audible tone or visual indication.

Abstract: A transmission power testing bar of a cable television system is coupled to the test hole of a main line distributor and provided with an inner sleeve having therein a test set member comprising a test point, an attenuation line, and an insertion hole. The inner sleeve is provided at one end thereof with a spring for providing the test set member with an elastic force enabling the test point to urge intimately the center point of the test hole of the main line distributor. The testing bar further comprises an outer sleeve and a copper connection head. The outer sleeve is fitted over the inner sleeve and the spring such that the outer sleeve can be caused to move axially. The copper connection head is fastened at one end thereof with the inner sleeve and at another end thereof with a signal gauge for measuring the transmission power value of a coaxial cable.

Abstract: An apparatus for directly positioning a hand-held electrical test probe onto leads of a surface mounted integrated circuit, IC, device has a housing with a central bore therethrough for receiving the probing tip of the test probe, which is coupled to compensation circuitry in the probing head. One end of the housing which is normal to the central bore has at least four teeth extending therefrom defining slots for engaging the leads of the IC. The central bore is exposed in the central slot of the housing for exposing the probing tip therein for providing an electrical connection between one of the leads on the IC and the electrical circuitry of the probing head.

Abstract: There is disclosed a high density electronic connector assembly (system) having a first insulating portion and a second insulating portion adapted to be mated together and held in precise dimensional relation to each other with a suitable steady force. There are a plurality of contact members projecting down beneath the first portion on very close centers. There is a like plurality of socket holes in the second portion, with a respective printed-circuit (conductor) land at the bottom of each hole. Each land is adapted to act as a spring element to establish a minimum normal contact force. Seated in each hole is a small metal ball. Each ball is adapted to press against a respective contact member of the first portion when the upper and lower portions are fully mated. There is also disclosed a method of seating and re-flow soldering the balls to the respective lands in the socket holes.

Abstract: A hybrid wafer probe (10) for probing metallized areas (12) on a substrate (14), such as a semiconductor wafer, includes an insulative member (16) having a ground plane (21) on at least one of its major surfaces. Embedded within the insulative member (16) is a plurality of wires (24) each having a first end (26) protruding beyond the member for connection to a testing machine. Each wire has a second end (28) provided with a sharp tip (30) that protrudes through the member (16) in a region spaced from the ground plane (21) so as to depend below the member for making contact with the metallized areas on the substrate to be probed. By displacing the member (16) relative to the substrate (14) while the tips (30) of the wires 24 are in contact with the metallized area, the tips can scratch the surface of the metallized areas to make a reliable electrical connection therewith.

Abstract: A test fixture for facilitating connection between the test leads of a diagnostic device and a pin grid array, dispersion via, or other multi-leaded electronic components mounted on a printed circuit boards. A base is provided of a nonconductive material having holes for spring loaded test pins. In the center of the fixture is a threaded rod which attaches the fixture onto a small threaded stud attached to the printed circuit board. The screw attachment is designed so that the fixture first screws onto the metal stud with light finger pressure. A nested screw arrangement utilizing a left hand threaded part then presses the fixture against the printed circuit board, compressing the test pins for good contact.

Abstract: A connector for a leadless IC package having contacts to be pressure contacted with conductive pads arranged on a lower surface of a leadless IC, wherein each of the contacts is formed of a spring element, the connector including a contact holding portion in which the spring element is implanted, a contact braking portion disposed above the contact holding portion, and a contact operating portion laterally movably disposed between the contact braking portion and the contact holding portion, the spring element extending through a contact operating through-hole formed in the operating portion, a distal end of the spring element being received in a contact braking through-hole formed in the braking portion, the spring element being sidewardly pressurized by an inner wall of the contact operating through-hole when the operating portion is moved in one direction, so that the spring element is bent and displaced, the spring element being restored to its original state when the operating portion is laterally moved i

Abstract: A return line for a probe station includes a sheet-like conductive strap having a first end connected electrically to a first probe and a self-coiling second end connected automatically detachably to a second probe, as by insertion of the second probe centrally within the coils of the second end. If the spacing between the probes exceeds a maximum distance, the strap harmlessly disconnects. The flat central portion of the strap automatically tracks any reductions in the spacing between the probes, which enables fast probe travel and minimizes noise pickup. Preferably a spindle rotatably engages the coiled probe and has a post member that carries the second end of the strap to a far side of the probe to improve tip visibility and electrical connection during close-in probing.

Abstract: A switch probe includes an electrically conductive tubular outer receptacle and a tubular barrel in the receptacle. The barrel has a conductive inside surface and an insulative coating on its outside surface in contact with the inside of the receptacle to isolate the barrel from the receptacle. A terminal disposed in the receptacle has a conductive bearing affixed to the conductive inside of the barrel and a conductive terminal pin extending through the receptacle. An insulative coating on the surface of the terminal contacting the inside of the receptacle electrically isolates the terminal from the receptacle. A conductive plunger travels axially in the barrel against a biasing spring which retains the plunger in a normally open position. A stop in the wall of the barrel engages the plunger to retain it at a critical distance travel spaced from the receptacle. Two parallel electrically conductive paths, electrically isolated from each other, are formed axially.

Abstract: A test connector for connection to two test inputs of a trip device. The test connector includes a fixed component made of electrically insulating material, wherein the fixed component includes a sleeve defining an inner space. A movable component is provided within the inner space and is axially movable therein. The movable component includes a protruding portion which extends from the fixed component. A spring is provided between the movable component and the fixed component to provide a biasing force to urge the movable component in an outward axial direction. Two testing needles are housed within two longitudinal passages within the movable component. Upon insertion of the test connector into a recessed portion of a face of an electronic trip device, the movable component is urged rearwardly to expose the two testing needles which pass through orifices int he recessed portion to contact the two test inputs of the trip device.

Abstract: A double-headed spring contact probe for loaded board testing includes a barrel having a hollow interior and opposite plungers which slide axially in the barrel. The plungers have outer portions which extend through opposite open ends of the barrel, each terminating in a contact tip outside the barrel for contacting a test point on a circuit board. One of the plungers has a hollow receptacle extending into the barrel with a rectangular or notched keyway opening into the receptacle. The other plunger has a twisted guide member extending through the barrel into the keyway of the other plunger whereby axial translation of the plungers relative to each other causes a rotation thereof. A spring engages opposite collar portions of the plungers to bias the plungers outwardly against opposite ends of the barrel. Necked portions of the barrel limit travel of the plungers out from the barrel.

Abstract: A switch probe, generally for use in testing cable harnesses, is for placement within a standard probe receptacle and can be removed and replaced as necessary. The switch probe includes a conductive barrel with a front open end and a rear closed end. A conductive first switch portion is received within the barrel at the rear closed end and includes a first shaft projecting forwardly. A conductive second switch portion is received within the barrel and has an engagement tip positioned forwardly of the barrel open end for electrical contact with a test site. A second shaft extends rearwardly and into axially spaced relation to the first shaft. An elongate hollow insulator extends fully between and provides a guideway for reciprocatory contact between the first and second shafts and fully shields the second shaft from electrical leakage prior to conductive contact of the second shaft with the first shaft.

Abstract: A high-speed, low-profile logic analyzer test probe has a body of insulating material molded directly onto a narrow elongate substrate having electrical circuitry disposed thereon. The molded insulating material has a notch formed therein for exposing a conductive surface formed on the substrate. The exposed conductive surface is used for making a ground connection between the substrate and the ground of a device under test. The probe may be adapted for use in probe holder for multichannel probing wherein the probe holder has an electrically conductive chip disposed within the probe holder housing for providing the shortest possible ground connections between the ground pins on the device under test and the ground connections on the probes.

Abstract: A test probe assembly including a plurality of electrically conductive probe arms each of which is secured to a substrate and electrically coupled to one of electrically conductive lines provided on the substrate. An intermediate portion of the arm is arranged to be resiliently deformable when a probe point which extends therefrom comes into contact with a terminal of the electronic device under test. A guide is provided on the structure on which the arms are mounted, for guiding the probe point so that movement other than reciprocation is either prevented or arrested. The resilient portion is arranged with respect to the probe point so that generation of motion other than reciprocation of the probe point is attenuated.

Abstract: A test fixture with a single vacuum well and two vacuum chambers for use in the automatic testing of printed circuit boards is connected to an electronic circuit tester for performing high speed testing of circuits on the board. The fixture includes a vacuum well, two vacuum chambers formed by gaskets, a movable top plate for moving the circuit board and a stripper plate between two positions, and ar array of test probes disposed in the vacuum well for access to the circuit board. The board under test is placed on the test fixture and a first vacuum is drawn from the first vacuum chamber to move the plate, thereby engaging a first plurality of test probes with the board for performing functional tests. A second vacuum is drawn from the second vacuum chamber to move the printed circuit board to engage a second set of test probes. A second set of electrical test signals is communicated to both sets of test probes for a second in-circuit test.

Abstract: A module attachment for testing a linear high density array of test sites on a printed circuit board having such circuit test sites where an integrated circuit chip (IC) is to be mounted. Present IC's may have wire lead spacings as close as 0.010 inch with integrated chip development utilizing even more compact and close center pad spacing, such as 0.004 inch. This spacing is too close to use even the thinnest of spring contact probes. The module carries an array of densely packed thin wires embedded in a small matrix block mounted on spaced supports, which may be conventional, large diameter spring contact probes. Electrical connection to the array of wires in the module is done by each wire being connected to a separate wire lead with the wires bundled and routed to a test computer. In its closest wire spacings, the module permits testing of the densest IC's and in wider spacings, provides a low cost alternative to spring contact probes.

Abstract: An improved spring loaded contact probe for testing printed circuit boards, electronic components, and substrates includes a center conductor, or wire, at least one outer layer of dielectric material surrounding the wire, a conductive layer surrounding the conductive layer, and a dielectric material surrounding the conductive layer, all in turn surrounded by a non-conductive bushing slidably mounted within a conductive tube and loaded by a compression spring with respect to the tube. One end of the tube has an end cap that contains and holds in place the compression spring. At the end of the center conductor, extending from the tube end opposite to the cap end, a conductive contact head is attached to center conductor, makes for making physical and electrical contact with the electronic component.