With Testing Or Adjusting Patents (Class 445/3)
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Publication number: 20090014731Abstract: A light emitting diode is disclosed, together with associated wafer structures, and fabrication and mapping techniques. The diode includes an active portion, a raised border on the top surface of the active portion and around the perimeter of the top surface of the active portion, a resin in the space defined by the border and the top surface of the active portion, and phosphor particles in the resin that convert the frequencies emitted by the active portion.Type: ApplicationFiled: July 11, 2007Publication date: January 15, 2009Inventors: Peter S. Andrews, Joshua J. Markle, Ronan P. Le Toquin
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Patent number: 7468584Abstract: Process for producing a discharge lamp having a silica discharge vessel with an emission space in which there is a pair of electrodes at least 0.15 mg/mm3 of mercury, argon (Ar), and halogen by measuring the relation b/a1 between the emission intensity a1 of argon (Ar) at a wavelength of 668 nm and the emission intensity b of OH radicals at a wavelength of 309 nm in a state of glow discharge of the discharge lamp; supplying hydrogen into the discharge vessel of the discharge lamp; measuring the relation c/a2 between the emission intensity a2 of argon (Ar) at a wavelength of 668 nm and the emission intensity c of OH radicals at a wavelength of 309 nm in the state of glow discharge of the discharge lamp; and fixing the difference c/a2?b/a1 at a value in the range of 0.001 to 15.Type: GrantFiled: March 29, 2006Date of Patent: December 23, 2008Assignee: Ushiodenki Kabushiki KaishaInventors: Takuya Tsukamoto, Noriko Nishiaki, Yoshihiro Horikawa, Senga Takehito
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Publication number: 20080258627Abstract: A plasma lamp is described with resonant frequency tuning capability and associated methods for tuning. One tuning method allows plasma lamp manufacturer to set the frequency of lamps to several discrete predetermined values. For example, most lamps that are near the center of a frequency distribution can be tuned to a nominal value such as 918.7 MHz. Other frequencies can also be tuned to increase manufacturing yield and improve lamp performance.Type: ApplicationFiled: February 7, 2008Publication date: October 23, 2008Inventors: Marc DeVincentis, Sandeep Mudunuri
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Patent number: 7432883Abstract: In a driving method for an electron-emitting device in which an electron-emitting member made of an aggregate of carbon fibers is made to emit electrons by a voltage being applied between a cathode electrode on which the electron-emitting member is formed and a counter electrode disposed in opposition to the cathode electrode, a driving voltage V smaller than a maximum applied voltage Vmax is applied between the cathode electrode and the counter electrode to drive the electron-emitting device, the maximum applied voltage Vmax being a maximum voltage applied between the cathode electrode and the counter electrode before the start of driving.Type: GrantFiled: January 27, 2004Date of Patent: October 7, 2008Assignee: Canon Kabushiki KaishaInventors: Kazunari Oyama, Masafumi Kyogaku, Takeo Tsukamoto
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Patent number: 7431624Abstract: A method of manufacturing an organic EL element includes applying a reverse bias to an organic EL element with an inverse layered structure until a current density of the organic EL element at an impressed voltage of 10 V reaches 0.075 mA/cm2 or more.Type: GrantFiled: November 2, 2005Date of Patent: October 7, 2008Assignees: Toshiba Matsushita Display Technology Co., Ltd.Inventors: Norihisa Maeda, Hirofumi Kubota, Hideyuki Murata
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Publication number: 20080237483Abstract: An electron gun, an electron source for an electron gun, an extractor for an electron gun, and a respective method for producing the electron gun, the electron source and the extractor are disclosed. Embodiments provide an electron source utilizing a carbon nanotube (CNT) bonded to a substrate for increased stability, reliability, and durability. An extractor with an aperture in a conductive material is used to extract electrons from the electron source, where the aperture may substantially align with the CNT of the electron source when the extractor and electron source are mated to form the electron gun. The electron source and extractor may have alignment features for aligning the electron source and the extractor, thereby bringing the aperture and CNT into substantial alignment when assembled. The alignment features may provide and maintain this alignment during operation to improve the field emission characteristics and overall system stability of the electron gun.Type: ApplicationFiled: June 11, 2007Publication date: October 2, 2008Inventors: Cattien V. Nguyen, Bryan P. Ribaya
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Publication number: 20080231169Abstract: By using a light emitting device including a substrate and a light emitting unit, the light emitting unit including: a plurality of light emitting elements that are mounted on substrate and electrically connected to external electrodes; a first sealing member layer containing a first fluorescent material, formed to cover light emitting elements; and a second sealing member layer containing a second fluorescent material, formed on first sealing member layer, as well as a method for manufacturing thereof, it becomes possible to provide a light emitting device capable of suppressing color shifts and the like by the fluorescent materials, and of being easily manufactured, as well as a method for manufacturing the same.Type: ApplicationFiled: March 19, 2008Publication date: September 25, 2008Applicant: SHARP KABUSHIKI KAISHAInventors: Toshio HATA, Masahiro Konishi, Makoto Agatani, Taiji Morimoto
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Publication number: 20080182475Abstract: Ribbons containing e.g. inorganic NMOS devices are assembled in electrical contact with ribbons containing e.g. PMOS devices (preferably organic) to enable flexible electronic textile circuits, e.g. displays, to be inexpensive and practical for a wide for a variety of functions. The use of ribbons provides flexibility, reduces costs, and allows testing during assembly and different processes to be efficiently used for different components. This is apparently the first time that ribbons (especially inorganic-device-containing ribbons) have been interconnected to form a flexible CMOS electronic textile.Type: ApplicationFiled: January 29, 2008Publication date: July 31, 2008Inventor: Bruce Gnade
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Publication number: 20080160864Abstract: A method for manufacturing an organic light emitting display. Pixel portions are formed on a mother substrate. A test wiring for testing pixel portions is formed at a peripheral portion of the mother substrate. A sealing material is formed at one surface of a sealing substrate to enclose the pixel portions, the sealing substrate being sealed to be spaced apart from the mother substrate. A spacer is formed at a side region of the one surface of the sealing substrate on which the sealing material is formed. The mother substrate and the sealing substrate are adhered to each other by the sealing material to seal the pixel portions within an enclosure formed by the mother substrate, sealing surface, and sealing material. A part of the sealing substrate is scribed and removed to expose the test wiring, the part of sealing substrate being arranged over a portion of the test wiring.Type: ApplicationFiled: August 23, 2007Publication date: July 3, 2008Inventors: Seung-yong Song, Young-seo Choi, Kwan-hee Lee, Sun-young Jung, Oh-june Kwon, Young-cheol Zu, Ji-hun Ryu
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Publication number: 20080139072Abstract: A pixel observation system includes a memory unit, a coordinate generation unit, and an observation unit. The memory unit is configured to store at least nozzle information indicative of discharge states of a liquid material in a plurality of nozzles and arrangement information indicative of an arrangement of each of the nozzles with respect to each of a plurality of pixel regions in relative movement of the nozzles and a substrate. The coordinate generation unit is configured to generate observation coordinates of observation regions on the substrate based on the nozzle information and the arrangement information, and to include coordinates of at least some of the pixel regions over which the nozzles scan through one cycle of the relative movement in the observation coordinates. The observation unit is configured and arranged to observe the pixel regions positioned at the observation coordinates generated by the coordinate generation unit.Type: ApplicationFiled: December 5, 2007Publication date: June 12, 2008Applicant: SEIKO EPSON CORPORATIONInventor: Toyotaro KINOSHITA
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Publication number: 20080100196Abstract: A light emission device, a method of manufacturing the same, and a display device using the same as a backlight unit. In one embodiment, a light emission device includes first and second substrates facing each other, a first electrode arranged on the first substrate in a first direction, a second electrode in a second direction crossing the first direction with an insulation layer interposed between the first and second electrodes, an electron emission region electrically connected to one of the first and second electrodes, and a phosphor layer formed on the second substrate, and an anode electrode formed on the phosphor layer. At least one of the first and second electrodes is divided into a plurality of sub-electrodes, first ends of which are for electrical interconnecting. A driving error electrode among the sub-electrodes is separated from the first ends of other normal electrodes.Type: ApplicationFiled: April 24, 2007Publication date: May 1, 2008Inventors: Su-Joung Kang, Sang-Jin Lee
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Publication number: 20080072413Abstract: A method and clamp system for use on an ion implanter system for aligning a cathode and filament relative to one another in-situ are disclosed. The invention includes a clamp system having a clamp including a first clamp member separably coupled to a second clamp member, and an opening to a mount portion of one of the cathode and the filament in at least one of the clamp members. Each clamp member includes a surface to engage a mount portion of one of the cathode and the filament. The opening is adapted to receive a positioning tool to position the cathode and the filament relative to one another by moving the mount portion when the clamp is released. The mount portion may include a tool receiving member to facilitate accurate positioning.Type: ApplicationFiled: August 1, 2005Publication date: March 27, 2008Inventors: Stephen Krause, Eric R. Cobb, Russell Low
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Patent number: 7273403Abstract: In a method of a manufacturing flat display apparatuses by working flat substrates, a flat substrate is prepared having a first region which is used as a flat display apparatus and a second region outside the first region. After the first region is worked as desired, the second region is cut and separated from the flat substrate.Type: GrantFiled: June 25, 2004Date of Patent: September 25, 2007Assignee: Kabushiki Kaisha ToshibaInventors: Masahiro Yokota, Shigeo Takenaka
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Patent number: 7226331Abstract: In an electron source manufacturing apparatus, the quantity of heat generated from an electron source substrate is measured. A temperature of a support member for the electron source substrate is controlled based on the measured quantity of heat generated. A variation in performances of electron source substrates is suppressed, which increase their life.Type: GrantFiled: October 5, 2004Date of Patent: June 5, 2007Assignee: Canon Kabushiki KaishaInventors: Shigeto Kamata, Kazuhiro Oki, Akihiro Kimura, Kazumasa Takatsu
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Patent number: 7108573Abstract: In order to be capable of high-precision gas measurement and evaluating influences of a gas on an electron source, and to predict a life of an image display device with high precision for a short period of time, there is provided a sealed container which is capable of maintaining an inside thereof to a lower pressure than an atmospheric pressure, and is used for an image display device including in the inside: a phosphor; an electron-emitting device for causing the phosphor to emit light; and a getter, the sealed container including an exhaust pipe having a breakable vacuum isolating member on at least one side of the image display device.Type: GrantFiled: October 14, 2003Date of Patent: September 19, 2006Assignees: Canon Kabushiki Kaisha, Kabushiki Kaisha ToshibaInventors: Masaru Kamio, Yasue Sato, Kazuyuki Seino, Hiromasa Mitani
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Patent number: 7086919Abstract: A detection and repair system includes an optical microscope, an image-retrieving device, an emission detector, a data controller, and a laser beam generator. When detecting the location of a defect, the system charges a detected region of an organic electroluminescent device with a negative bias or low forward bias before the device is lighted on. Then, the emission detector detects the locations of defects, which generate emission such as photons, thermal or IR emission, in an enlarged image. The laser beam generator generates a laser beam, which is used to isolate one of the defects. Furthermore, this invention also discloses a method for detecting and repairing an organic electroluminescent device.Type: GrantFiled: May 21, 2003Date of Patent: August 8, 2006Assignee: RiTdisplay CorporationInventors: Meng-Chieh Liao, Jiun-Haw Lee, Chi-Chung Chen
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Patent number: 7048602Abstract: A method of making an OLED device that corrects for potential defect(s) identified in one processing station by adjusting a subsequent processing station includes processing an OLED substrate by adding at least one organic layer and measuring in-situ one or more parameters associated with such organic layer to produce a signal representative of potential defect(s) in a produced OLED device, and adjusting in a subsequent processing station in response to the signal to change the formation of a subsequent organic layer added to the OLED device to compensate for the potential defect(s).Type: GrantFiled: August 25, 2003Date of Patent: May 23, 2006Assignee: Eastman Kodak CompanyInventors: Giana M. Phelan, Michael L. Boroson, Lee W. Tutt
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Patent number: 7040943Abstract: A method for aging an organic electroluminescence display element where the integration value with respect to an applied voltage and a voltage application time in a reverse direction is at least twice as much as in a forward direction.Type: GrantFiled: November 10, 2003Date of Patent: May 9, 2006Assignee: OPTREX CorporationInventors: Akira Takahashi, Naoki Kato, Shinji Kobune
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Patent number: 6962516Abstract: A voltage applying apparatus including a holder, a probe and the like as voltage applying means enabling the application of a voltage to electrode wiring connected with electric conductors formed on a substrate on which the electrode wiring is formed. The apparatus is equipped with aligning means making the position of the probe follow to the changes of the position of the electrode wiring to coincide with them. The aligning means makes the position of the probe follow the position of the electrode wiring so that the probe aligns the electrode wiring by the thermal expansion of the holder.Type: GrantFiled: September 9, 2002Date of Patent: November 8, 2005Assignee: Canon Kabushiki KaishaInventors: Kazuhiro Ohki, Shigeto Kamata, Akihiro Kimura
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Patent number: 6958578Abstract: The electron emission characteristics and adjustment times of a multi electron source are made approximately equal with simple processes.Type: GrantFiled: August 27, 2003Date of Patent: October 25, 2005Assignee: Canon Kabushiki KaishaInventors: Shuji Aoki, Takahiro Oguchi
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Patent number: 6955578Abstract: A method of varying a transmittance of a transparent conductive film includes forming the transparent conductive film on a substrate and injecting a high energy source into the transparent conductive film to vary the transmittance of the transparent conductive film.Type: GrantFiled: June 10, 2002Date of Patent: October 18, 2005Assignee: Samsung SDI Co., Ltd.Inventors: Sang-Il Park, Chang-Soo Kim
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Patent number: 6935913Abstract: A method of testing a light-emitting panel and the component parts therein including an assembled web containing light-emitting micro-components is disclosed. The method utilizes radiometric measuring devices disposed throughout a continuous fabrication process. Qualities of the components are measured so that product defects or process deficiencies can be corrected or eliminated.Type: GrantFiled: August 9, 2002Date of Patent: August 30, 2005Assignee: Science Applications International CorporationInventors: N. Convers Wyeth, Albert M. Green, E. Victor George
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Patent number: 6916221Abstract: A method of determining defects in OLED devices having a plurality of pixels, each with its own emissive layer, which are capable of being excited by input light to produce an output color light response, including illuminating one or more OLED devices or a portion of an OLED device with light in a predetermined portion of the spectrum so that the pixel emissive layers are excited to produce an output color response for each pixel, capturing an image of the output light produced by the excited pixels and converting such captured light into a digital image; and determining device pixel size, shape, location, and emitted light intensity from the digital image and comparing such size, shape, location, and emitted light intensity with predetermined acceptable size, shape, location, and emitted light intensity ranges to determine whether there is a defect in the OLED device(s).Type: GrantFiled: November 18, 2002Date of Patent: July 12, 2005Assignee: Eastman Kodak CompanyInventors: Thomas F. Kaltenbach, Paul J. Guiguizian, Donald A. Stephenson
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Patent number: 6893309Abstract: A seamless magnetic sheath is mounted on a funnel of a cathode ray tube, behind the deflection windings of a deflection yoke. Various combinations of magnetic poles are formed in the sheath magnetic ferrite material for varying the beam landing location of the screen of a cathode ray tube. The seamless magnetic sheath is formed by an extrusion or a molding fabrication process.Type: GrantFiled: January 13, 2004Date of Patent: May 17, 2005Assignee: Thomson Licensing S.A.Inventors: Anthony Stanley Baran, Richard William Collins
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Patent number: 6890229Abstract: A method for adjusting characteristics of an electron source having a plurality of electron-emitting devices, and a method for manufacturing the electron source include the step of applying a pulse of a voltage for adjustment to an electron-emitting device to be adjusted one or more times according to a characteristic of the electron-emitting device, wherein the voltage for adjustment is selected from a plurality of voltages having discrete values according to the characteristic of the electron-emitting device, and a number of applying times of the pulse is determined according to the characteristic of the electron-emitting device and the selected voltage.Type: GrantFiled: February 10, 2004Date of Patent: May 10, 2005Assignee: Canon Kabushiki KaishaInventors: Shuji Aoki, Takahiro Oguchi
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Patent number: 6863584Abstract: A method of producing an image display unit with improved handling of small LED pellets. The method includes an element formation step, a selective magnetization step, and a mounting step. The selective magnetization step and mounting step improves LED pellet placement as opposed to the typical mounting step, which includes using dielectric pads and conductive paste.Type: GrantFiled: August 13, 2001Date of Patent: March 8, 2005Assignee: Sony CorporationInventor: Takehisa Natori
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Patent number: 6851995Abstract: It relates to a method of manufacturing an electron source. In an activation process, a set value of an activation gas partial pressure is switched at multi-stages and an application of a compensation voltage is not conducted for a predetermined period after switching of the set value. Alternatively, the activation is repeated plural times while a row wiring or a column wiring is switched, and the application of the compensation voltage is not conducted for the predetermined period after switching of the row wiring or the column wiring. Thus, activation processing can be uniformly performed for all electron emitting devices.Type: GrantFiled: September 26, 2002Date of Patent: February 8, 2005Assignee: Canon Kabushiki KaishaInventors: Tsuyoshi Takegami, Hisaaki Kawade, Takahiro Oguchi, Kazuhiro Jindai
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Patent number: 6848960Abstract: To provide a method for manufacturing a color selection electrode structure easily capable of measuring a tension amount of the color selection electrode in the process for manufacturing the color selection electrode structure and a color cathode ray tube using the color selection electrode structure. The color selection electrode is stretched with tension applied in the direction of the shorter axis thereof, and welded and fixed onto the top face that is curved inwardly in the direction of the longer axis of the longer side members. Thereafter, the weight is placed on the color selection electrode so as to allow the color selection electrode to deflect by the load due to the mass of the weight. The deflection amount of the color selection electrode may be measured by using a laser displacement meter and the measured deflection amount of the measured color selection electrode is converted into the tension amount by the correlation graph.Type: GrantFiled: June 21, 2002Date of Patent: February 1, 2005Assignee: Matsushita Electric Industrial Co., Ltd.Inventors: Go Minami, Shiro Kashihara, Shigenari Ohshima
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Patent number: 6837768Abstract: A method of fabricating an electron source includes the steps of fixing a first sealing member to a substrate disposed with an electroconductive member, the first sealing member surrounding the electroconductive member excepting a portion of the electroconductive member, abutting a chamber on the first sealing member to cover the electroconductive member excepting the portion of the electroconductive member and form a hermetically sealed atmosphere between the substrate and the chamber, supplying power to the portion of the electroconductive member to give part of the electroconductive member covered with the chamber an electron-emitting function, and removing the chamber from the substrate.Type: GrantFiled: March 4, 2002Date of Patent: January 4, 2005Assignee: Canon Kabushiki KaishaInventor: Junji Kawasaki
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Patent number: 6822397Abstract: The present invention relates to the adjustment of luminance. The present invention is a method of manufacturing image forming apparatus including a step of applying characteristic shift voltage comprising a plurality of pulses in which the amplitude of the pulse obtained from the look-up table has two or more values, to the emitter, the look-up table storing the amplitude of the pulse and the number of the pulse for shifting characteristic of emitters to a predetermined luminance target value on the basis of the measurement result of the luminance. Moreover, the present invention is a method of manufacturing image forming apparatus comprising a step of applying the second pulses of characteristic shift voltage having the amplitude which was determined in response to the measurement result of the luminance after the first characteristic shift voltage had been applied to the emitter.Type: GrantFiled: May 6, 2003Date of Patent: November 23, 2004Assignee: Canon Kabushiki KaishaInventors: Hideshi Kawasaki, Shuji Aoki, Izumi Tabata, Akihiko Yamano, Hisashi Sakata
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Publication number: 20040209542Abstract: An apparatus and method for warpage compensation of a display panel substrate assembly are described. A method and apparatus for warpage compensation of a display panel substrate assembly are described. In one embodiment, the method includes the selection of a substrate having a substrate warpage level exceeding a warpage tolerance level. Once selected, a plurality of conductive bumps are formed over an area of the selected substrate. Once formed, a thermal process is applied to the plurality of conductive bumps to obtain a virtual plane over the area of the selected substrate have a coplanarity level below a coplanarity specification level. As such, utilizing embodiments of the present invention, lower cost substrates with substandard warpage levels may be utilized to form OLED panel substrate assemblies when compensated utilizing embodiments of the present invention.Type: ApplicationFiled: May 7, 2004Publication date: October 21, 2004Inventor: Kenzo Ishida
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Publication number: 20040203311Abstract: A method of processing a composite material to tailor white light emission of the resulting composite during excitation. The composite material is irradiated with a predetermined power and for a predetermined time period to reduce the size of a plurality of nanocrystals and the number of a plurality of traps in the composite material. By this irradiation process, blue light contribution from the nanocrystals to the white light emission is intensified and red and green light contributions from the traps are decreased.Type: ApplicationFiled: April 30, 2004Publication date: October 14, 2004Inventors: Christine A. Smith, Howard W.H. Lee
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Publication number: 20040185740Abstract: A method of making an electron emissive material using combinatorial chemistry techniques is provided. The method includes providing a plurality of pixels of the electron emissive material, each pixel having at least one different characteristic from any other one of the plurality of pixels, and measuring at least one property of each pixel. The measurement may include a measurement of the electron emissive material work function using a Kelvin probe or other work function measurement systems.Type: ApplicationFiled: January 27, 2004Publication date: September 23, 2004Inventors: Sung Su Han, Sylvain Simon Coulombe
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Publication number: 20040180602Abstract: A light-emitting device is produced at a decreased cost by inspecting defects in the pixels in the step of fabrication. TFTs possessed by the pixels on the element substrate and TFTs possessed by the peripheral drive circuits are inspected by using the inspection device to detect defects in a step in a process for finishing the light-emitting device. This makes it possible to decrease the loss that results when the defective products are processed through up to the final step, and to improve the yield by repairing the defective products in a step of repairing.Type: ApplicationFiled: March 29, 2004Publication date: September 16, 2004Applicant: Semiconductor Energy Laboratory Co., Ltd.Inventor: Masaaki Hiroki
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Patent number: 6786791Abstract: A quartz arc tube for a metal halide lamps and its method of making are described. The quartz arc tube has a cylindrical design which promotes a nearly symmetric longitudinal surface temperature profile during operation. The profile has a maximum temperature of about 900° C. which allows for longer operating life at high average wall loadings.Type: GrantFiled: September 23, 2003Date of Patent: September 7, 2004Assignee: Osram Sylvania Inc.Inventors: William D. Koenigsberg, Miguel Galvez, Gregory Zaslavsky, Zeya Krasko, Joseph V. Lima
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Publication number: 20040147195Abstract: A seamless magnetic sheath is mounted on a funnel of a cathode ray tube, behind the deflection windings of a deflection yoke. Various combinations of magnetic poles are formed in the sheath magnetic ferrite material for varying the beam landing location of the screen of a cathode ray tube. The seamless magnetic sheath is formed by an extrusion or a molding fabrication process.Type: ApplicationFiled: January 13, 2004Publication date: July 29, 2004Inventors: Anthony Stanley Baran, Richard William Collins
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Patent number: 6743066Abstract: In an electron source manufacturing method and apparatus, a plurality of electron-emitting devices are commonly connected to a first wiring and to a plurality of second wirings, respectively. A voltage V1 is applied to the plurality of devices connected to the first wiring by the difference between potentials applied to the first wiring and the plurality of second wirings.Type: GrantFiled: February 24, 2000Date of Patent: June 1, 2004Assignee: Canon Kabushiki KaishaInventors: Takahiro Oguchi, Noritake Suzuki
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Patent number: 6739927Abstract: A position of an inner surface of a panel (10) is measured with the panel being held, and a position of a main surface of a color selection electrode (30) is measured with a color selection electrode frame (40) being held, so that the measured positional data provide a measured value corresponding to a spacing between the panel inner surface and the main surface of the color selection electrode. In a state that the engaging holes of the supporting members are engaged with dummy pins (200) arranged in a predetermined positional relationship to the panel pins (20) on the condition that the panel is held, the position of the main surface of the color selection electrode is adjusted with respect to engaging holes on the basis of the predetermined positional relationship and the measured value, and supporting members are fixed by welding to the color selection electrode frame.Type: GrantFiled: December 5, 2002Date of Patent: May 25, 2004Assignee: Matsushita Electric Industrial Co., Ltd.Inventors: Masayuki Tsuruha, Kenichi Satoh, Kazuya Aoyama, Osamu Hirota
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Publication number: 20040097160Abstract: A method of determining defects in OLED devices having a plurality of pixels, each with its own emissive layer, which are capable of being excited by input light to produce an output color light response, including illuminating one or more OLED devices or a portion of an OLED device with light in a predetermined portion of the spectrum so that the pixel emissive layers are excited to produce an output color response for each pixel, capturing an image of the output light produced by the excited pixels and converting such captured light into a digital image; and determining device pixel size, shape, location, and emitted light intensity from the digital image and comparing such size, shape, location, and emitted light intensity with predetermined acceptable size, shape, location, and emitted light intensity ranges to determine whether there is a defect in the OLED device(s).Type: ApplicationFiled: November 18, 2002Publication date: May 20, 2004Applicant: Eastman Kodak CompanyInventors: Thomas F. Kaltenbach, Paul J. Guiguizian, Donald A. Stephenson
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Patent number: 6729922Abstract: A light-emitting device is produced at a decreased cost by inspecting defects in the pixels in the step of fabrication. TFTs possessed by the pixels on the element substrate and TFTs possessed by the peripheral drive circuits are inspected by using the inspection device to detect defects in a step in a process for finishing the light-emitting device. This makes it possible to decrease the loss that results when the defective products are processed through up to the final step, and to improve the yield by repairing the defective products in a step of repairing.Type: GrantFiled: May 30, 2001Date of Patent: May 4, 2004Assignee: Semiconductor Energy Laboratory Co., Ltd.Inventor: Masaaki Hiroki
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Patent number: 6722184Abstract: An apparatus and method for testing one or more glass light bulbs assembled into a sub-assembly for cracks. The apparatus comprises a chamber having an enclosed hollow interior and a door that is adapted to open and close to either allow access to the hollow interior or to seal the hollow interior; a test tray assembly having a plurality of compartments for receiving and holding a plurality of glass light bulbs and sub-assemblies to be tested, said tray assembly adapted and dimensioned to be placed into and enclosed by said chamber; a control assembly for controlling the introduction of oxygen into said chamber; and a source of pressurized oxygen connected to said chamber to supply oxygen under pressure to said chamber under the control of said control assembly.Type: GrantFiled: September 10, 2002Date of Patent: April 20, 2004Assignee: Guide CorporationInventors: Bradford A. Bennett, Nicholas A. Skwiat, Paul L. Geise
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Patent number: 6712660Abstract: A method for adjusting characteristics of an electron source having a plurality of electron-emitting devices, and a method for manufacturing the electron source include the step of applying a pulse of a voltage for adjustment to an electron-emitting device to be adjusted one or more times according to a characteristic of the electron-emitting device, wherein the voltage for adjustment is selected from a plurality of voltages having discrete values according to the characteristic of the electron-emitting device, and a number of applying times of the pulse is determined according to the characteristic of the electron-emitting device and the selected voltage.Type: GrantFiled: August 2, 2002Date of Patent: March 30, 2004Assignee: Canon Kabushiki KaishaInventors: Shuji Aoki, Takahiro Oguchi
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Patent number: 6685522Abstract: Disclosed is a product quality test in a winding step of the entire manufacturing process of a deflection yoke, which is a core part of a display device employing a cathode ray tube such as a color TV or a monitor, and in particular, a winding zig for measuring magnetic fields of a deflection yoke and a magnetic field measuring system of a deflection yoke using the winding zig.Type: GrantFiled: June 8, 2001Date of Patent: February 3, 2004Assignee: Samsung Electro-Mechanics Co., Ltd.Inventors: In Jung Yun, Ho Jin Cho, Bong Woo Lee, Byung Hoon Kang, Kwang Yun Choi
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Patent number: 6686679Abstract: A field electron emission material has a substrate with an electrically conductive surface. Electron emission sites on the conductive surface each include a layer of electrically insulating material to define a primary interface region between the conductive surface and the insulating layer, and a secondary interface region between the insulating layer and the vacuum environment,. Each primary interface region is treated or created so as to enhance the probability of electron injection form the conductive surface into the insulating layer. Each primary interface region after such treatment or creation is either an insulator or graded from conducting adjacent the conductive surface to insulating adjacent the insulating layer.Type: GrantFiled: January 30, 2001Date of Patent: February 3, 2004Assignee: Printable Field Emitter LimitedInventors: Richard Allan Tuck, Hugh Edward Bishop
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Patent number: 6682381Abstract: A method of analyzing a first gas in a lamp, including: cooling at least a first portion of a lamp below the condensation temperature of the first gas contained in the lamp while operating the lamp; maintaining the temperature of the first portion below the condensation temperature of the first gas until essentially all the available first gas contained in the lamp condenses on the surface of at least the first portion of the lamp; removing a second portion of the lamp, the second portion containing the condensed first gas; and analyzing at least one of the condensed first gas or the remaining bound gas.Type: GrantFiled: July 31, 2000Date of Patent: January 27, 2004Assignee: General Electric CompanyInventor: Joseph Darryl Michael
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Patent number: 6679744Abstract: Disclosed is an electron gun assembling method used for assembling a first electrode having a plurality of beam apertures as opposed to one cathode used as an electron beam emitting source with a cathode structure having the cathode. The method includes: a first step of rotating the cathode structure on its axis in a state in which the cathode structure is opposed to the first electrode, and measuring, during rotation of the cathode structure, a distance between each of the beam apertures of the first electrode and a beam emission plane of the cathode; and a second step of setting a rotational position of the cathode structure on the basis of the result measured in the first step. In the second step, particularly, the rotational position of the cathode structure may be set under a condition that the maximum one of the differences between the distances from the beam apertures of the first electrode to the beam emission plane of the cathode is minimized.Type: GrantFiled: March 2, 2001Date of Patent: January 20, 2004Assignee: Sony CorporationInventor: Izuho Hatada
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Patent number: 6661179Abstract: A method for adjusting electron emitting characteristics of a multi-electron source having plural electron emitting devices disposed on a substrate. The method comprises measuring electron emission characteristics of the devices and setting a characteristic adjustment target value. Plural characteristic shift voltages having discrete values are applied to some of the devices, electron emission characteristics of each of these devices are measured, and a characteristic adjustment table is generated for each characteristics shift voltage value according to change rates of these measured characteristics. A predetermined characteristics shift voltage value is selected based on the corresponding table, and that voltage is applied to the devices to cause their characteristics to shift towards the target value. A change in the electron emission characteristics is monitored to revise the characteristics shift condition.Type: GrantFiled: August 26, 2002Date of Patent: December 9, 2003Assignee: Canon Kabushiki KaishaInventors: Shuji Aoki, Takahiro Oguchi
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Patent number: 6648708Abstract: An apparatus (20) for measuring alignment and tilt of a CRT neck (14) attached to a recycled CRT funnel portion (11) includes a support structure (21) that engages and supports a seal edge (24) of the CRT funnel portion (11), and a plurality of stopper pads (28-30) which engage respective alignment stoppers (34-36) molded on the CRT funnel portion (11). Distance measuring gauges (45-48) contact lower and upper points on two sides of the CRT neck (14). The alignment of the CRT neck (14) is determined by readings from the lower gauges (45, 47) on the first and second sides of the CRT neck (14). The tilt of the CRT neck (14) is measured by comparing the readings from the lower and upper gauges (45-48) on each of the first and second sides of the CRT neck. The stopper pads (28-30) on the support structure (21) can be changed to accommodate different sizes of CRT funnel portions (11, 11′).Type: GrantFiled: June 13, 2001Date of Patent: November 18, 2003Assignees: Sony Corporation, Sony Electronics Inc.Inventor: Christopher Monks
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Patent number: 6648709Abstract: An alignment tool (300) designed to replace a high-powered lamp with a low-powered lamp to facilitate safe alignment of a projector lamp console. The alignment tool (300) comprised of a cathode portion (302) and an anode portion (304) connected by one or more rods (306). The alignment tool holds a light source such as a flashlight (324) having an exposed bulb (320) in the approximate location of the arc of the high-powered lamp. The cathode and anode sockets and the reflector of the projector lamp console are adjusted until the exposed bulb (320) is at the F1 focal point of the reflector and the optical axis of the alignment tool is the optical axis of the reflector.Type: GrantFiled: December 21, 2000Date of Patent: November 18, 2003Assignee: Texas Instruments IncorporatedInventors: Bryan R. Teichgraeber, Steven P. Krycho
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Publication number: 20030207643Abstract: A method of testing a light-emitting panel and the component parts therein including an assembled web containing light-emitting micro-components is disclosed. The method utilizes radiometric measuring devices disposed throughout a continuous fabrication process. Qualities of the components are measured so that product defects or process deficiencies can be corrected or eliminated.Type: ApplicationFiled: August 9, 2002Publication date: November 6, 2003Inventors: N. Convers Wyeth, Albert M. Green, E. Victor George