Abstract: A system and method, including computer software, allows reading data from a flash memory cell. Voltages from a group of memory cells are detected. The group of memory cells have associated metadata for error detection, and each memory cell stores a voltage representing a data value selected from multiple possible data values. Each possible data value corresponds to one range of multiple non-overlapping ranges of analog voltages. Memory cells having uncertain data values are identified based on the detected voltages. Alternative data values for the memory cells having the uncertain data values are determined, and a combination of alternative data values is selected. An error detection test is performed using the metadata associated with the multiple memory cells and the selected combination of alternative data values.

Abstract: A fault location estimation device includes: a faulty scan chain identification unit that identifies a faulty scan chain and its fault type based on result of operation verification test; a faulty scan FF narrowing unit that compares test result of the faulty scan chain with simulation result for determining a faulty scan FF range beginning at the location of a scan FF where both results differ; and a path trace narrowing unit that references logic circuit configuration information, signal line expected value, a failure-observed scan FF, and test result of a defective circuit to extract a scan FF on the faulty scan chain, which may be reached from a failure-observed scan FF observed on a normal scan chain by tracing back a failure propagation path while performing implication procedure for an input side, and thereby further narrows the faulty scan FF range determined by the faulty scan FF narrowing unit.

Abstract: A system including a frame capture module, a serializer, and a deserializer. The frame capture module is configured to receive, from a device under test, data corresponding to test results, and package the data into first data frames. The serializer is configured serialize the first data frames to form serial messages that include serialized data. The serializer includes i) a first serial link configured to output the serial messages according to a first clock domain, and ii) a second serial link configured to output the serial messages according to a second clock domain. The deserializer is configured to deserialize the serial messages received on the first serial link and the second serial link to form second data frames.

Abstract: A system and method for sharing a communications link between multiple protocols is described. A system includes a communications interface configured to exchange information with other systems using at least one of a plurality of protocols; a protocol select register that stores a value that selects a protocol from among the plurality of protocols to become an active protocol; and a state machine accessible to the communications interface, the state machine used to control the exchange of information through the communications interface according to the active protocol. The active protocol is used by the communications interface to exchange information while the remaining protocols of the plurality of protocols remain inactive. The state machine sequences through a series of states that cause the communications interface to operate according to the active protocol, and that are designated as inert sequences under the remaining protocols.

Abstract: The same testing equipment can be used to test devices operating under different protocols. Where the testing protocol is slower than the native serial protocol of the high-speed serial link connecting the device processor to the component to be tested, the link may be adapted to carry the lower speed testing protocol. This may be accomplished by adding low-speed buffers to the circuits of the serial link, or the serial link may have a native low-speed protocol in addition to its high-speed protocol connections may be made to the pathways for the native low-speed protocol, or the testing protocol may be impressed on top of native low-speed protocol. Where the driver of the device being tested has limited number of pins, the test mode can be controlled by applying power to different power supply input pins.

Abstract: Testing of an electrical device is achieved by providing a test access mechanism within the device that can receive scan frames from an external tester. The received scan frames contain stimulus data to be applied to circuitry within the device to be tested, a command for enabling a test control operation, and a frame marker bit to indicate the end of the scan frame pattern. The inputting of scan frames can occur continuously and simultaneous with a commanded test control operation.

Abstract: A method for troubleshooting a set top box is disclosed and can include receiving a trouble ticket from a set top box and initiating a self test at the set top box. The method can also include receiving test results from the set top box and analyzing the test results to isolate a problem.

Abstract: An access pad is used to provide access to a functional block of an integrated circuit (IC) device. The access pad is formed using dummy metal in an open space in a metallization level that is between a top metallization level and a base level on which the functional block is formed in the IC device. The access pad at the metallization level provides a contact to access an underlying circuit of the functional block so that the functional integrity of the functional block of the IC device can be verified during probing.

Abstract: Debug circuitry is operated in a manner that facilitates debugging one or more hardware and/or software components that are included in a system that includes a system memory. The debug circuitry receives information from one of the hardware and/or software components and/or from the system memory, and ascertains whether the received information includes memory address parameters. If the received information includes memory address parameters, then the memory address parameters are used to retrieve data from the system memory. The retrieved data is supplied at an output port of the debug circuitry.

Abstract: In a sophisticated semiconductor device including a large memory portion, a built-in self-test circuitry comprises a failure capturing logic that allows the capturing of a bitmap at a given instant in time without being limited to specific operating conditions in view of interfacing with external test equipment. Thus, although pipeline processing may be required due to the high speed operation during the self-test, reliable capturing of the bitmap may be achieved while maintaining high fault coverage of the test algorithm under consideration.

Abstract: An apparatus for performing a screening test of a semiconductor integrated circuit is disclosed, the semiconductor integrated circuit comprising a plurality of processors each having an output signal for instruction execution information, and the processors being programmatically operable. The apparatus for performing a screening test of a semiconductor integrated circuit comprises: an instruction/data signal synchronization circuit for synchronizing the supplying of instructions to said respective processors and for synchronizing the supplying of data to said respective processors; and a trace comparison circuit for comparing instruction execution information that are output from the respective processors to determine whether or not any of said processors has output different instruction execution information.

Abstract: An active shield can be configured to receive a test signal, and configured to output a plurality of shield signals, derived from the test signal, via a plurality of signal paths. A compare logic can be configured to compare the test signal with each of the plurality of shield signals to provide at least two comparison signals indicating comparison results and can be configured to output the at least two comparison signals. A detection and decision logic can be configured to determine whether the active shield is subject to attack based on patterns of the at least two comparison signals.

Abstract: A method includes storing a first transaction entry to a first software configurable storage location, storing a second transaction entry to a second software configurable storage location, determining that a first transaction indicated by the first transaction entry has occurred, determining that a second transaction indicated by the second transaction entry has occurred subsequent to the first transaction, and, in response to determining that the first transaction occurred and the second transaction occurred, storing at least one transaction attribute captured during at least one clock cycle subsequent to the second transaction. The first and second software configurable storage locations may be located in a trace buffer, where the at least one transaction attribute is stored to the trace buffer and overwrites the first and second transaction attributes. Each transaction entry may include a dead cycle field, a consecutive transaction requirement field, and a last entry field.

Abstract: Some embodiments of the present invention provide a system that analyzes data from a computer system. During operation, the system obtains the sensor data from a component in the computer system using a set of sensors. Next, the system transmits the sensor data to a microcontroller unit (MCU) coupled to the sensors and stores the sensor data in internal memory of the MCU. Finally, the system assesses the integrity of the component by analyzing the sensor data using a pattern-recognition apparatus in the MCU.

Abstract: A semiconductor integrated circuit includes a scan chain which includes: first flip-flops contained in a first circuit and second flip-flops contained in a second circuit, wherein the first flip-flops and the second flip-flops are connected in a series connection in a scan path test mode to operate as a shift register, and a first selecting circuit configured to selectively output a test data in the scan path test mode and internal state data indicating an internal state of the first flip-flops and read from a memory circuit in a restoring operation in a normal mode to the series connection.

Abstract: This invention generates the random seed patterns using simple, low-area overhead digital circuitry on-chip. This circuit is implemented as a finite state machine whose states are the seeds as contrasted to storing the seeds in the prior art. These seeds are used to control pseudo-random pattern generation for built-in self-tests. This invention provides a large reduction in chip area in comparison with storing seeds on-chip or off-chip.

Abstract: An interface processes memory redundancy data on an application specific integrated circuit (ASIC) with self-repairing random access memory (RAM) devices. The interface includes a state machine, a counter, and an array of registers. The state machine is coupled to a redundancy chain. The redundancy chain includes coupled redundant elements of respective memory elements on the ASIC. In a shift-in mode, the interface shifts data from each of the elements in the redundancy chain and compresses the data in the array of registers. The interface communicates with a test access port coupled to one or more eFuse devices to store and retrieve the compressed data. In a shift-out mode, the interface decompresses the data stored in the array of registers and shifts the decompressed data to each unit in the redundancy chain. The interface functions absent knowledge of the number, bit size and type of self-repairing RAM devices in the redundancy chain.

Abstract: A test vector decode circuit includes a lockout circuit to prevent inadvertent latching of output vectors. The test vector decode circuit is driven by an additional output vector from the test vector decode circuit. The additional output vector, as well as the other output vectors, undergo at least one latching. A signal transmitted by the additional output vector as a result of the final latching activates the lockout circuit. The test vector decode circuit also receives a supervoltage signal. Only by turning off the supervoltage signal can all of the output test vectors be reset, including the additional output vector.

Abstract: Mechanisms are provided for use with a microprocessor chip, for storing selected reliability information in an on-chip non-volatile storage device. An on-chip reliability controller coupled to one or more on-chip resources of the microprocessor chip, collects raw reliability information from the one or more on-chip resources of the microprocessor chip. The on-chip reliability controller analyzes the raw reliability information to identify selected reliability information for the one or more resources of the microprocessor chip. The on-chip reliability controller stores the selected reliability information in the on-chip non-volatile storage device. The on-chip non-volatile storage device stores the selected reliability information even in the event of an overall failure of the microprocessor chip in which the microprocessor chip loses power.

Abstract: A Test Access Mechanism (TAM) architecture for facilitating testing of IP blocks integrated on a System on a Chip (SoC). The TAM architecture includes a Test Controller and one or more Test Wrappers that are integrated on the SoC proximate to IP blocks. Test data and commands corresponding to input from an external tester are packaged by the Test Controller and sent to the Test Wrappers via an interconnect fabric. The Test Wrappers employ one or more test ports to provide test data, control, and/or stimulus signals to the IP block to facilitate circuit-level testing of the IP block. Test results for the circuit-level tests are returned to the Test Controller via the fabric. Test Wrappers may be configured to pass through interconnect signals, enabling functional testing of IP blocks to be facilitated via test packages and test results transmitted between the Test Controller and the IP blocks via the fabric.

Abstract: An apparatus and method for flexible visibility in an integrated circuit are disclosed. As one example, an apparatus for flexible visibility in an integrated circuit is disclosed. The apparatus includes a switch unit disposed in the integrated circuit, the switch unit configured to receive a plurality of signals associated with a plurality of visibility points in the integrated circuit, and output the received plurality of signals in a serial form. Also, the apparatus includes a formatter unit disposed in the integrated circuit and coupled to the switch unit, the formatter unit configured to receive the plurality of signals in the serial form, and output a plurality of formatted signals including the received plurality of signals.

Abstract: A built-in self-test (BIST) diagnostic system tests the execution of a processor. The processor is arranged to execute a normal application for controlling a process that is external to the processor. The normal execution is executed in normal execution timeslots that have idle timeslots that are interspersed in time between the normal execution timeslots. A BIST controller is arranged to detect the presence of an idle timeslot in the execution of the processor and to use a scan chain to scan-in a first test pattern for a test application for testing the processor. The first test pattern is executed by the processor during the detected idle timeslot and a first result pattern generated by the execution of the first test pattern is scanned-out. The scanned-out first test pattern is evaluated to determine the presence of an error. The first test pattern application is conditionally interruptible.

Abstract: Dynamically replicated memory is usable to allocate new memory space from failed memory pages by pairing compatible failed memory pages to reuse otherwise unusable failed memory pages. Dynamically replicating memory involves detecting and recording memory faults, reclaiming failed memory pages for later use, recovering from detected memory faults, and scheduling access to replicated memory pages.

Abstract: A method for dynamically operating a multi-core processor system is provided. The method involves ascertaining currently active processor cores, identifying a currently active processor core having a lowest operating frequency, and adjusting at least one operational parameter according to voltage-frequency characteristics corresponding to the identified processor core to fulfill a predefined functional mode, e.g. power optimization mode, performance optimization mode and mixed mode.

Abstract: A system on a chip (SoC) device verification system comprises: an SoC device model including one or more IPs and a memory controller; an external IP verification model receiving an instruction from the SoC device model and verifying operation of the one or more IPs included in the SoC device model; and a bus select model selecting one of the external IP verification model and an external device in response to a memory control signal received from the memory controller of the SoC device model.

Abstract: A data processing apparatus for performing data processing operations in response to execution of program instructions and debug circuitry for performing operations. The data processing apparatus includes a data store for storing a current debug exception mask value. The data processing circuitry is configured to set the mask value to a first value in the data store in response to executing critical code and on termination of execution of the critical code to reset the mask value to not store the first value. The data processing circuitry is configured, in response to receipt of a control signal indicating a debug exception is to be taken, to allow the exception to be taken if the mask value is not set to the first value and not to allow said exception to be taken if the mask value is set to the first value.

Abstract: A built-in self test circuit includes a pattern generator, an elastic buffer, a symbol detector, and a comparison unit. A pattern generator generates a first test pattern to test a port under test and then a result pattern is gotten and stored in the elastic buffer. The symbol detector detects if a starting symbol exists in the test result pattern. If it exists, a second test pattern is generated to be compared with the test result pattern. As a result, a reliability of data transmission of the port under test is determined.

Abstract: A device with controllable mechanical characteristics makes available a list of controllable characteristics for use by a controller or host computer. The list may include not only controllable characteristics but also the available range for each control, the impact of each adjustment, or both. The host computer can evaluate an operating state of the computer or electronic device and determine how best to set the device for compatible operation with the operating state. When controllable characteristics have multiple effects and/or interact with other controllable characteristics, macros may be developed to perform multiple settings as a group to achieve the desired outcome. The list may also be downloaded from a web service.

Abstract: A test controller switches the operation of output stages in an integrated circuit between a normal operation mode and a test mode. The output stages are respectively connected to switch elements. A level shifter generates a switch signal for controlling activation and deactivation of the switch elements in accordance with the normal operation mode and the test mode.

Abstract: This document relates to apparatus and methods to store and retrieve trace information in on-chip system memory of microcontrollers. A microcontroller comprises a microprocessor and a memory device accessible through a data bus and an address bus coupled to the microprocessor. The microcontroller includes on-chip debug logic coupled to the microprocessor. Trace data can be retrieved from system memory using a debug port of the debug logic. A system in accordance with the present invention will lower the cost of implementation of trace features in microcontrollers, and strongly reduce the cost of supporting such features in debug tools.

Abstract: A method comprises performing at least one zero-bit scan across an interface link. The at least one zero-bit scan defines a command window. The method further comprises an interface adapter counting a number of inert scans in the command window, and the number of inert scans defines a particular command or data. An inert scan results in no data being moved into or out of the interface adapter.

Abstract: Methods and apparatuses are disclosed for testing multicore processors. In some embodiments, the tested multicore processor may include at least a first core and a second core, a data input coupled to a first scan chain in the first core and a second scan chain in the second core, and a multiplexer including at least a first input and a second input, the first input coupled with a data output of the first scan chain and the second input coupled with a data output of the second scan chain, the multiplexer further including an output that couples to one or more pins on a package of the processor, the multiplexer further including a select signal that couples to the one or more pins on the package of the processor, and wherein the data input couples to the one or more pins on the package of the processor.

Abstract: A system and method is disclosed for testing emulation boards in a hardware emulation environment. In one embodiment, test files can be maintained that identify a list of test commands. Such a list can be easily changed without recompiling. In another embodiment, the list of commands can be read by a first server. The commands can be passed (e.g., sequentially) to a second server associated with one or more emulator boards. The second server can ensure that the commands are executed on the specified emulator boards for testing the emulator boards. In yet another embodiment, a user can request a series of tests to be executed. The tests can be included in a list of test names. Each test name can correspond to a list of test commands associated with the test name. Thus, a first server can read a test name, read a file of test commands associated with the test name and pass the test commands to a second server to ensure the test commands are executed.

Abstract: An integrated circuit carries an intellectual property core. The intellectual property core includes a test access port 39 with test data input leads 15, test data output leads 13, control leads 17 and an external register present, ERP lead 37. A scan register 25 encompasses the intellectual property core and ERP lead 37 carries a signal indicating the presence of the scan register.

Abstract: A test device for an SoC test architecture has a test input port, a test output port, a plurality of cores, a register, and a plurality of user defined logics. The register has a plurality of bits corresponding to the cores. Each of the user defined logics is connected to a corresponding bit of the register and a corresponding one of the cores. Each of the user defined logic receives a plurality of test control signals, and receives the corresponding bit of the register to change values of the test control signals. Outputs of each of the user defined logics are connected to the corresponding core to determine whether a test instruction of the corresponding core is or is not needed to be updated.

Abstract: Embodiments include methods for performing various operations in a computing system that includes an electronic module and a debug circuit. The method includes programming the debug circuit to monitor for pre-selected triggers produced by the computing system, and to perform actions in response to detecting the pre-select triggers. For example, in response to various pre-selected triggers, the debug circuit may, among other things: perform state transitions and log information indicating whether or not the state transitions were performed; monitor various signals when the debug circuit has determined that a test escape has occurred; and/or perform one or more actions that initiate stopping one or more clocks in response to certain pre-selected triggers.

Abstract: A method utilizes a virtual flight recorder to harvest a subset of events being collected by an active system tracing facility during operation of a computer system. The virtual flight recorder is “virtual” from the sense that it is not specifically instrumented into a component with which the virtual flight recorder is associated, which eliminates the burden on developers to specifically instrument components of interest, and minimizes the impact on system performance as a result of performance metric collection.

Abstract: A data processing system having debug message generation uses processor circuitry to perform a plurality of processor operations. Global control circuitry is coupled to the processor circuitry. Debug circuitry is coupled to the global control circuitry for generating debug messages corresponding to predetermined processor operations. Message generation logic provides debug messages which selectively include a timestamp field providing information as to when a debug message is generated. Debug control circuitry is coupled to the global control circuitry and the message generation logic and has a timestamp control register. For each of a plurality of debug message types, the timestamp control register selectively enables or disables appending a timestamp to the debug message for that type of debug message. Enable logic is coupled to the timestamp control register for enabling or disabling the timestamp control register based on detecting a selected event in the data processing system.

Abstract: An apparatus and method for a processor-memory unit for use in system-in-package (SiP) and system-in-package (SiP) integrated circuit devices. The apparatus includes a processing module, a memory module and a programmable system module. The programmable system module is configured to function as an interface between the memory module and the processing module, or as an interface between the memory module and a testing device. The invention facilitates integration and testing of processor-memory units including functional components having different communication protocols.

Abstract: A debug circuit of a microcomputer, providing an on-chip debug function, is provided as a measurement permission circuit for outputting a measurement permission signal to a timer that measures, as a measurement object, a time period between two events in a program execution period of the CPU, according to a user-specified condition. The measurement permission circuit includes an interrupt level register for setting an interrupt level that either permits or prohibits a time measurement operation of the timer, and a comparator for determining by comparison a high-low relationship between an interrupt level of an interrupt process executed by the CPU and an interrupt level set in the interrupt level register, and a determination result of the comparator is specified as the measurement permission signal.

Abstract: A test device for a hierarchical test architecture is disclosed. The architecture includes cores for plural test layers, a top-level data register, and a top-level test controller. Cores for each test layer are hierarchical test circuits. The top-level test controller retrieves plural control signals, controls the top-level data register based on first type control signals in the control signals, and controls each core based on second type control signals in the control signals.

Abstract: A SRAM (Static Random Access Memory) macro test flop circuit includes a flip-flop circuit, a scan control circuit, and an output buffer circuit. The flip-flop circuit includes a master latch circuit and a slave latch circuit. The master latch circuit includes a master feed-back circuit including a master storage node and a master feed-forward circuit. The slave latch circuit includes a slave feed-back circuit including a slave storage node and a slave feed-forward circuit driven from the master latch. The scan control circuit includes a scan slave feed-forward circuit, a scan latch circuit, and a scan driver circuit driven by the scan feed-back circuit. The scan latch circuit includes a scan feed-back circuit comprising a scan storage node and a scan feed-forward circuit driven from the slave latch. The output buffer circuit includes a master driver driven from master latch circuit and a slave driver driven from slave latch circuit.

Abstract: Electronic apparatus, systems, and methods of operating and constructing the electronic apparatus and/or systems include an embedded processor disposed in a logic chip to direct, among other functions, self-testing of an electronic device structure in conjunction with a pattern buffer disposed in the logic chip, when the electronic device structure is coupled to the logic chip. Additional apparatus, systems, and methods are disclosed.

Abstract: The present invention provides embodiments of an apparatus used to implement a pipelined serial ring bus. One embodiment of the apparatus includes one or more ring buses configured to communicatively couple registers associated with logical elements in a processor. The ring bus(s) are configured to concurrently convey information associated with a plurality of load or store operations.

Abstract: A method for controlling an operating mechanism using a manipulation unit, in which the operating mechanism includes at least one microcontroller, at least one memory with a plurality of memory cells, and at least one debug interface, and the debug interface presents a monitoring functionality for monitoring memory content and using the debug interface a first timepoint of the operating mechanism is detected for writing into a first memory cell and, using the information transmitted by the debug interface for the first timepoint to the manipulation unit, a trigger timepoint results for a processing routine through the manipulation unit (IN) and using the processing routine a second value is written by the manipulation unit using the debug interface for a second timepoint in the first memory cell before the first memory cell is read by the operating mechanism for a third timepoint.

Abstract: A device and method for outputting BIOS POST code, applied to a computer system. The device includes a basic input output system (BIOS), a transfer module and a video graphics array (VGA) connector. The BIOS generates a power-on self-test (POST) code using a low pin count (LPC) interface format. The transfer module receives the POST code and transfers the format of the POST code to a system management bus (SMBus) format. The VGA connector receives and outputs the POST code transmitted from the transfer module.

Abstract: Debugging operations on individual client sessions for a remotely executed shared application are enabled to be performed as the client requests are processed on the executing server without disrupting execution of other client sessions. A remote debugging client may connect to a debugging engine executed on the server allowing the debugging client to view source code, set breakpoints, view client connections, and receive callbacks or notifications when a breakpoint is hit by the client session being debugged. The debugging client may also control execution by stepping through client code enabling debugging of multiple clients simultaneously.

Abstract: A method for diagnosing hardware failures in a data processing system includes a configuring a portion of a programmable logic device to create a state machine. The state machine tests a communication bus and a plurality of component devices connected by the communication bus and identifies the test failures. The state machine communicates the test information to external test equipment. The communication bus is used in the operation of the data processing system and the testing includes tests at full clock speed of the data processing system.

Abstract: A method for controlling an operating mechanism using a manipulation unit, in which the operating mechanism includes at least one microcontroller, at least one memory with a plurality of memory cells and at least one first value in a first memory cell and at least one debug interface, and the debug interface exhibits a monitoring functionality for monitoring a program code executed by the operating mechanism and using the debug interface a first pre-set timepoint is detected when processing the program code and, using the information transmitted by the debug interface for the first timepoint to the manipulation unit, a trigger timepoint results for a processing routine through the manipulation unit (IN) and a second value is written using the debug interface by the manipulation unit using the processing routine for a second timepoint in the first memory cell before the first memory cell is read by the operating mechanism for a third timepoint.

Abstract: A method and apparatus for implementing integrated circuit security features are provided to selectively disable testability features on an integrated circuit chip. A test disable logic circuit receives a test enable signal and responsive to the test enable signal set for a test mode, establishes a test mode and disables ASIC signals. Responsive to the test enable signal not being set, the ASIC signals are enabled for a functional mode and the testability features on the integrated circuit chip are disabled. When the functional mode is enabled, the test disable logic circuit prevents the test mode from being established while the integrated circuit chip is powered up.