Abstract: Exemplary embodiments include a sequential and concurrent status detection and evaluation method for multiple processor cores, including receiving data from a plurality of processor cores, for each of the plurality of processor cores, simultaneously running a built-in self test to determine if each of the plurality of cores has failed, checking the data for a dominant logic state and recording a subset of the plurality of processor cores that have failed.

Abstract: A method is for making an integrated circuit with built-in self-test. The method includes forming at least one nonvolatile read only memory (ROM) to store ROM code and forming a logic self-test circuit to verify a correct functioning of the at least one nonvolatile ROM. Moreover, the method includes defining, in the logic self-test circuit, a logic self-test core to process the ROM code and to generate a flag based upon a control signature and defining, in the logic self-test circuit, a nonvolatile storage block, coupled to the logic self-test core, to store the control signature. Furthermore, the method includes writing the ROM code to the at least one nonvolatile ROM and writing the control signature to the nonvolatile storage block, during a same fabrication step.

Abstract: A system receives serial messages from a device under test. The system includes a deserializer configured to i) receive the serial messages and, ii) based on the serial messages, form data frames. A frame sync module is configured to form Joint Task Action Group (JTAG) data bits based on the data frames. A plurality of virtual JTAG test access ports are configured to i) receive the JTAG data bits and ii) shift the JTAG data bits between the plurality of virtual JTAG test access ports.

Abstract: A BIOS refresh device includes a first socket, a second socket, and a jumper. The first socket includes a first elastic contact, a first voltage contact, and a first ground contact. The second socket includes a second elastic contact, a second voltage contact, and a second ground contact. The jumper includes a first pin, a second pin, a third pin, and a fourth pin. The first pin is electronically connected with the second elastic contact. The second pin is electronically connected with the first voltage contact or the second voltage contact. The third pin is electronically connected with the first elastic contact. The fourth pin is electronically connected with the second ground contact or the second ground contact.

Abstract: Provided is an apparatus that includes a processor comprising a plurality of processing cores and a corresponding plurality of LBIST modules, each LBIST module corresponding to one of the plurality of processing cores; a MISR read out connection, comprising a compare value register, a plurality of MISR registers equal in number to the plurality of cores, each MISR register corresponding to one of the plurality of processing cores and a corresponding plurality of XOR logic gates, each XOR logic gate coupled to the compare value register and a corresponding one of the MISR registers and configured to signal whether or not the event the compare value register and the corresponding MISR register match and logic, stored and executed on the processor, for transmitting the signals generated by the plurality of XOR logic gates.

Abstract: A latch circuit includes a first latch that stores data provided from a data input terminal when a clock is provided from a clock input terminal, and stores scan data provided from a scan data input terminal when a first scan clock is provided from a first scan clock input terminal, a logical circuit that performs a logical operation for a second scan clock provided from the second scan clock input terminal and for an operational mode signal provided from the operation mode input terminal, and generates an update clock and a second latch including an update input terminal connected to an output terminal of the first latch, and an update clock input terminal connected to an output terminal of the logical circuit, the second latch holds the data or the scan data provided from the update input terminal when the update clock is provided.

Abstract: An object of the present invention is to provide a simulator for verifying plural products with common hardware configuration, in which peripheral hardware that can be reused are constituted by hardware and other peripheral hardware is constituted by software simulator, and simulation method. A simulator comprises: a hardware section that includes a peripheral hardware configuration with a structure required for a CPU and OS to operate alone; a software section that simulates the operation of peripheral hardware other than hardware constituting the hardware section as a peripheral hardware model; and an interface board that connects the hardware section and software section.

Abstract: A test system includes a computer and an interface device for accessing a scan chain on an application specific integrated circuit (ASIC) under test. The computer includes a memory that contains application software that when executed by the computer quantifies soft errors and soft error rates (SER) in storage elements on the ASIC. The interface device receives commands and data from the computer, translates the commands and data from a first protocol to a second protocol and communicates the commands and data in the second protocol to the ASIC. A method for measuring SER in the ASIC includes baseline, comparison, and latch up accesses of data in a scan chain in the ASIC. Between accesses, the ASIC is exposed to a neutron flux that accelerates the occurrence of soft errors due to ionizing radiation upon the ASIC.

Abstract: A semiconductor integrated circuit device includes a first clock domain having a plurality of first flip-flops which is configured to operate with a high-speed clock; a second clock domain having a plurality of second flip-flops, composed of a third flip-flop and a plurality of fourth flip-flops, which is configured to operate with a low-speed clock; and a test clock supplying section configured to supply, at a time of delay fault test for the second clock domain, a test clock based on the high-speed clock to the third flip-flop to which data from the first clock domain is input, and not to supply the test clock to the plurality of fourth flip-flops.

Abstract: A method for tracing thread bus transactions in a multiprocessor system comprises decoding, by a processor, a first thread instruction of a thread, the thread comprising an ordered series of thread instructions. In the event the first thread instruction is a set bus trace enable bit (BTEB) instruction, the processor sets a bus trace enable bit corresponding to the thread. In the event the BTEB is set, the processor determines whether the first thread instruction is a trace-eligible instruction and, in the event the first thread instruction is a trace-eligible instruction, and the BTEB is set, the processor sets a snoop tag trace enable bit (STTEB). A hardware trace monitor (HTM) monitors bus transactions, each bus transaction comprising a STTE. In the event a monitored bus transaction comprises a set STTEB, the HTM stores the bus transaction as trace data. In the event a monitored bus transaction comprises a reset STTEB, the HTM does not store the bus transaction as trace data.

Abstract: A mechanism is provided for internally controlling and enhancing advanced test and characterization in a multiple core microprocessor. To decrease the time needed to test a multiple core chip, the mechanism uses micro-architectural support that allows one core, a control core, to run a functional program to test the other cores. Any core on the chip can be designated to be the control core as long as it has already been tested for functionality at one safe frequency and voltage operating point. An external testing device loads a small program into the control core's dedicated memory. The program functionally running on the control core uses micro-architectural support for functional scan and external scan communication to independently test the other cores while adjusting the frequencies and/or voltages of the other cores until failure. The control core may independently test the other cores by starting, stopping, and determining pass/fail results.

Abstract: Embodiments of the present invention address deficiencies of the art in respect to IPsec SA recovery and provide a novel and non-obvious method, system and computer program product for selective IPsec SA recovery from security enforcement point outages. In one embodiment of the invention, a security enforcement point outage recovery method can be provided. The method can include compiling a listing of SAs for a security enforcement point and monitoring the security enforcement point for an outage. Responsive to detecting an outage in the security enforcement point, the listing can be pruned to include SAs that remain contextually valid or are utilized by the peer of the security enforcement point. Thereafter, only SAs in the pruned list can be re-established.

Abstract: A system and method for sharing a communications link between multiple protocols is described. A system includes a communications interface configured to exchange information with other systems using at least one of a plurality of protocols; a protocol select register that stores a value that selects a protocol from among the plurality of protocols to become an active protocol; and a state machine accessible to the communications interface, the state machine used to control the exchange of information through the communications interface according to the active protocol. The active protocol is used by the communications interface to exchange information while the remaining protocols of the plurality of protocols remain inactive. The state machine sequences through a series of states that cause the communications interface to operate according to the active protocol, and that are designated as inert sequences under the remaining protocols.

Abstract: A system for providing device diagnostics includes a surface interface operatively linked and in communication with a processor. The surface interface includes a multi-touch interface to detect multiple simultaneous inputs and an object recognition interface to communicate with a device upon the device being placed on the surface interface. The system further includes a memory operatively linked and in communication with the processor, wherein the memory includes a system application configured to: recognize a customer device when the customer device is placed on the surface interface, conduct a diagnostic test to determine whether the device is operating without error, and perform a corrective action if the diagnostic test detects an error.

Abstract: A method for identifying non stuck-at faults in a read-only memory (ROM) includes generating a golden value of a victim cell, providing a fault-specific pattern through an aggressor cell, generating a test reading of the victim cell in response to the provided fault-specific pattern, and determining whether the ROM has at least one non stuck-at fault. The determination is based on a comparison of the golden value and the test reading of the victim cell.

Abstract: An apparatus and method for testing driver write-ability strength on an integrated circuit includes one or more drive detection units each including a number of drivers. At least some of the drivers may have a different drive strength and each may drive a voltage onto a respective driver output line. Each drive detection unit may include a number of keeper circuits, each coupled to a separate output line and configured to retain a given voltage on the output line to which it is coupled. Each detection unit may also include a number of detection circuits coupled to detect the drive voltage on each of the output lines. In one implementation, the drive voltage appearing at the output line of each driver may be indicative of that the driver was able to overdrive the voltage being retained on the output line to which it is coupled by the respective keeper circuits.

Abstract: A system and method, including computer software, allows reading data from a flash memory cell. Voltages from a group of memory cells are detected. The group of memory cells have associated metadata for error detection, and each memory cell stores a voltage representing a data value selected from multiple possible data values. Each possible data value corresponds to one range of multiple non-overlapping ranges of analog voltages. Memory cells having uncertain data values are identified based on the detected voltages. Alternative data values for the memory cells having the uncertain data values are determined, and a combination of alternative data values is selected. An error detection test is performed using the metadata associated with the multiple memory cells and the selected combination of alternative data values.

Abstract: An integrated circuit includes a memory array and an error correction code (ECC) circuit configured to provide a first signal indicating whether data read from the memory array has been corrected by the ECC circuit. The integrated circuit includes a mimic circuit configured to provide a second signal indicating whether the first signal is valid and a counter configured to increment in response to the second signal indicating the first signal is valid and the first signal indicating an error.

Abstract: An apparatus, system, and method are disclosed for rapidly grading the operating condition of computer storage. A storage log module 312 logs error information regarding any error in a storage subsystem 302 that occurs during normal operation. A storage test module 314 performs a cursory check 318 of the storage subsystem 302 as requested by a user. A storage diagnostic module 316 grades the storage subsystem 302 on an operating condition scale based at least in part upon the error information logged and upon results of the cursory check 318. In one embodiment, the storage subsystem 302 is graded as pristine if no error has been logged and no error was detected by the cursory check 318, as potentially failing if any error has been logged but no error was detected by the cursory check 318, and as failing if any error was detected by the cursory check 318.

Abstract: A method and apparatus for the detection and correction of soft errors existing within an integrated circuit (IC). Run-time check stops are utilized in conjunction with processor-based, hardware mechanisms to detect and correct soft errors. At run-time, each check stop facilitates a snap shot of the hardware and/or software state of the IC to be stored into hardware and/or software based memory. Should a soft error be detected, execution is halted and the executable state of the IC that conforms to a previous check-stop location may be re-established after the soft error(s) are optionally corrected. In alternate embodiments, hardware based mechanisms may be exclusively utilized to both detect and correct the soft errors.

Abstract: A processor core includes one or more cache memories and a repair unit. The repair unit may repair locations in the cache memories identified as having errors during an initialization sequence. The repair unit may further cause information corresponding to the repair locations to be stored within one or more storages. In response to initiation of a power-down state of a given processor core, the given processor core may execute microcode instructions that cause the information from the one or more storages to be saved to a memory unit. During a recovery of the given processor core from the power-down state, the processor core may execute additional microcode instructions that cause the information to be retrieved from the memory unit, and saved to the one or more storages. The repair unit may restore repairs to the locations in the cache memories using the information.

Abstract: The present invention is directed to methods of monitoring logic circuits for failures. In particular, the methods are directed toward establishing parallel logic cores where failures are detected by comparing the parallel paths for equivalence at key locations by a redundancy checker. Any mismatch will result in a predetermined failsafe operational mode. In addition, important techniques are applied to periodically exercise individual parallel paths to ensure that logic cores are verified in a way that does not disturb any process being monitored or controlled. This feature is important in some industries, such as the nuclear power industry, where safety critical operations require a high state of reliability on logic circuit blocks which may be infrequently utilized.

Abstract: A method for dynamically broadcasting configuration information to controllers connected in a scan topology in a target system is provided in which a selection event followed by the configuration information is received from a signal line at each of the controllers, wherein the plurality of controllers are connected in parallel to the signal line and the configuration information is stored within each controller that matches a selection criteria following the selection event when the selection event initiates a selection sequence.

Abstract: In general, techniques are described for hardware-based detection and automatic restoration of a computing device from a compromised state. Moreover, the techniques provide for automatic, hardware-based restoration of selective software components from a trusted repository. The hardware-based detection and automatic restoration techniques may be integrated within a boot sequence of a computing device so as to efficiently and cleanly replace only any infected software component.

Abstract: Methods and apparatuses for synthesizing and/or implementing an augmented multimode compactor are described.

Abstract: Techniques and systems for analysis, diagnosis and debugging fabricated hardware designs at a Hardware Description Language (HDL) level are described. In particular, the techniques and systems relate to design instrumentation circuitry that facilitates the analysis, diagnosis and debugging of the hardware designs. A HDL design instrumentation circuitry embedded within an electronic system comprises one or more probe circuits to allow storage of signal values of the electronic system upon predetermined events, one or more breakpoint registers to specify the predetermined events, and one or more trigger processing units to control the storage of signal values upon the detection of the predetermined events by the breaking registers. The present design instrumentation circuitry permits monitoring the electronic system at speed, facilitating the analysis diagnosis and debugging by giving detailed and accurate information about the operation of the electronic system.

Abstract: Disclosed are a method, system and computer program product for determining hardware diagnostics during initial program loading (IPL). A space is allocated for a diagnostics hardware table storing hardware identifications corresponding to hardware to be tested. A hardware monitor function detects new and/or defective hardware. Hardware can be manually selected. A runtime diagnostics detects defective hardware. The hardware identifications corresponding to the new, failing, and/or selected hardware are added to the diagnostics hardware table. The hardware identification to be tested is acquired during the building of a system Hardware Objects Model (HOM). A diagnostics flag is set within HOM according to the diagnostics hardware table. Diagnostics are performed per HOM diagnostics flag indication. The diagnostics table is cleared, and the operating system is run. At system runtime, diagnostics code monitors for runtime error.

Abstract: Apparatus having corresponding methods and computer programs comprise: a processor; a test interface that is in communication with the processor only when the test interface is enabled; a first memory to store firmware for the processor; and a second memory to store boot code for the processor, wherein when the processor is booted, the boot code causes the processor to read a portion of the firmware from a predetermined location in the first memory; wherein the test interface is enabled only when the portion of the firmware has a predetermined value.

Abstract: Methods and apparatus are provided for determining whether a built-in-test fault code (BITFC) data sequence generated by a built-in-test (BIT) of a particular module of a complex system is indicative of an actual fault condition. A regression function is generated for the particular module based on stored BITFC data sequences generated by the BIT and stored repair data for that module from a fault history database. Later, during operation of the particular module, the BIT generates a new BITFC data sequence. A processor can then load the new BITFC data sequence and execute the regression function with respect to the new BITFC data sequence to determine whether the new BITFC data sequence is indicative of an actual fault condition at the particular module or is indicative of a false fault condition at the particular module.

Abstract: A method and/or a system of a processor-agnostic encoded debug architecture in a pipelined environment is disclosed. In one embodiment, a method of a processor includes processing an event specified by a data processing system coupled to the processor to determine a boundary of the event, generating a matrix having combinations of the event and other events occurring simultaneously in the processor, capturing an output data of observed ones of the event and other events, and applying the matrix to generate an encoded debug data of the output data. The method may also include determining which of the combinations are valid based on an architecture of the processor. The event may be a trace-worthy event whose output value cannot be reliably predicted in an executable file in the data processing system and/or a sync event that is specified by a user of the data processing system.

Abstract: A new method and apparatus have been taught for storing error information used for debugging as generated by the initial and subsequent error occurrences. In this invention, a register with several bit ranges is used to store error information. The first bit-range is allocated to the initial error information. If the total number of the errors exceeds the capacity of the register, the last error is kept in a last bit-range. This way, precious initial error information (as well as the last error information) will be available for debugging.

Abstract: An RS-485 port test apparatus includes an RS-485 connector, a micro control unit (MCU), a multiprotocol transceiver, and a display. The RS-485 connector receives a first test code signal from a test RS-485 port of an electronic device. The multiprotocol transceiver receives the first test code signal from the RS-485 connector, converts the first test code signal to a second test code signal which can be identified by the MCU, and transmits the second signal to the MCU. The MCU receives the second test code signal and displays the second test code signal by the display. The MCU sends back the second test code signal to the multiprotocol transceiver. The multiprotocol transceiver converts the second test code signal to the first test code and transmits the first test code to the test RS-485 port of the electronic device through the RS-485 connector.

Abstract: A hard disk drive with a disk that has a plurality of data bits. The drive includes a circuit that reads each data bit n times and selects a value for the bit based on a reliability factor. The circuit may select a bit based at least in part on the most frequent occurrence of one of a plurality of values. For example, if more 0s occurred than 1s the bit would be set to 0. The reliability factor may be a ratio of the occurrence of 0s to the occurrence of 1s. A bit can be not selected or deselected if the reliability factor exceeds a threshold value.

Abstract: An arbiter facility is provided that operates to control the flow of processes that form a test script. The control of the processes that are performed are based on explicit rules or conditions. The rules implemented by the arbiter facility result in different processes within the test script being performed based on data processed by the arbiter facility. Moreover, the arbiter facility implement rules which explicitly express, within the test case, the value of individual operations. In the exemplary embodiment, the value of one or more individual operations are explicitly expressed by the rules that are imposed on the results returned to the arbiter facility by the various verification points within the test script. Accordingly and advantageously, analysis on the value of a verification point may be performed prior to implementing or executing a test script. This analysis may then be reflected in the rule implemented in the arbiter facility.

Abstract: An integrated circuit includes an embedded processor. An embedded in-circuit emulator is located within the embedded processor. The embedded in-circuit emulator performs a test on the integrated circuit. The embedded in-circuit emulator generates a testing result based on the test on the integrated circuit. Trace logic to generate trace data based on the testing result, the trace data being in a parallel format. A serializer is located on the integrated circuit. The serializer converts the parallel format of the trace data into a serial format. The serializer serially outputs the trace data in the serial format from the integrated circuit.

Abstract: A high integration integrated circuit may comprise a plurality of processing cores, a graphics processing unit, and an uncore area coupled to an interface structure such as a ring structure. A generic debug external connection (GDXC) logic may be provisioned proximate to the end point of the ring structure. The GDXC logic may receive internal signals occurring in the uncore area, within the ring structure and on the interfaces provisioned between the plurality of cores and the ring structure. The GDXC logic may comprise a qualifier to selectively control the entry of the packets comprising information of the internal signals into the queue. The GDXC logic may then transfer the packets stored in the queues to a port provisioned on the surface of the integrated circuit packaging to provide an external interface to the analysis tools.

Abstract: A semiconductor device includes a CPU, a memory, a memory BIST circuit, a first selector that selects and outputs an address and control signal from the memory BIST circuit, when performing a test using the memory BIST circuit, and selects and outputs an address and control signal of the CPU when not performing a test using the memory BIST circuit, a second selector that selects and outputs write data from the memory BIST circuit when performing a test using the memory BIST circuit, and selects and outputs write data of the CPU when not performing a test using the memory BIST circuit, a first flip-flop that samples an output of the first selector (11) and a second flip-flop that samples an output of the second selector. An address and control signal and write data output from the first and second flip-flops are supplied to an address and control terminal and a write data terminal of the memory.

Abstract: A method and apparatus for evaluating and optimizing a signaling system is described. A pattern of test information is generated in a transmit circuit of the system and is transmitted to a receive circuit. A similar pattern of information is generated in the receive circuit and used as a reference. The receive circuit compares the patterns. Any differences between the patterns are observable. In one embodiment, a linear feedback shift register (LFSR) is implemented to produce patterns. An embodiment of the present disclosure may be practiced with various types of signaling systems, including those with single-ended signals and those with differential signals. An embodiment of the present disclosure may be applied to systems communicating a single bit of information on a single conductor at a given time and to systems communicating multiple bits of information on a single conductor simultaneously.

Abstract: A system-on-chip (SoC) includes a core, a plurality of power domain blocks, and a power control circuit including a debug circuit. The power control circuit is configured to control power supplied to the core and each of the power domain blocks, and the debug circuit is configured to debug the power control circuit.

Abstract: A client server and a test monitoring method for the client server include receiving a customization Intelligent Platform Management Interface (IPMI) from the monitor server and parsing the customization IPMI command to be a command suitable for the client server. The monitor method further includes obtaining a test result of the customization IPMI command and transmitting a determined IPMI return value corresponding to the test result to the monitor server, with the monitor server recording a test of the customization IPMI command.

Abstract: An identification (ID) process comprises in each of a plurality of bit times, a debug test system asserting a control signal at a predefined state to a plurality of target systems, and each target system, having a bit pattern and the bit patterns being different among the target systems, outputting a bit from its bit pattern on the control signal. The process further comprises each target system comparing the resulting state of the control signal to that target system's output bit. If the target system's output bit differs from the resulting control signal state, the target system ceases participating in the ID process or, if the target system's output bit matches the resulting control signal state, the target system continues to participate in the ID process.

Abstract: A semiconductor IC capable of debugging two or more processors at the same time using a single debugger and a semiconductor IC test system. The semiconductor IC includes processors operating at different frequencies, a trigger circuit which causes all of the processors to be in a debugging state when one of the processors is in the debugging state, and a JTAG circuit applying a boundary scan operation to the processors connected to a JTAG pin in series.

Abstract: An access pad is used to provide access to a functional block of an integrated circuit (IC) device. The access pad is formed using dummy metal in an open space in a metallization level that is between a top metallization level and a base level on which the functional block is formed in the IC device. The access pad at the metallization level provides a contact to access an underlying circuit of the functional block so that the functional integrity of the functional block of the IC device can be verified during probing.

Abstract: Example embodiments relate to a method and system of testing a memory module having the process of receiving single ended input signals via differential input terminals through which differential pairs of packet signals may be received from a testing equipment, wherein a number of terminals of the testing equipment may be different from a number of terminals of the memory module, and testing memory chips of the memory module based on the single ended input signals.

Abstract: A method for safeguarding data stored in a memory of a data storage system includes monitoring values of a subset of environmental variables associated with the data-storage system and updating a portion of a table containing values of environmental variables associated with the data-storage system. The table includes values for environmental variables that are not in the subset of environmental variables monitored. The values of the environmental variables are then inspected. On the basis of the inspection, a condition in which there exists a high-risk of data loss is determined.

Abstract: A built-in self test circuit includes a pattern generator, an elastic buffer, a symbol detector, and a comparison unit. A pattern generator generates a first test pattern to test a port under test and then a result pattern is gotten and stored in the elastic buffer. The symbol detector detects if a starting symbol exists in the test result pattern. If it exists, a second test pattern is generated to be compared with the test result pattern. As a result, a reliability of data transmission of the port under test is determined.

Abstract: Disclosed are methods, systems and devices, such as a device including a data location, a quantizing circuit coupled to the data location, and a test module coupled to the quantizing circuit. The quantizing circuit may include an analog-to-digital converter, a switch coupled to the memory element and a feedback signal path coupled to the output of the analog-to-digital converter and to the switch.

Abstract: A computer-based system for testing a circuit design for implementation within an integrated circuit device can include a design application (205) providing simulation instructions for testing a circuit design and a simulation driver (225) receiving the simulation instructions and translating the simulation instructions into control protocol instructions specifying operations of an integrated circuit control protocol. The system can include a simulation environment (240). The simulation environment can include a communication module (245) communicating with the simulation driver, a simulation cable driver (250) receiving the control protocol instructions from the simulation driver via the communication module, and a control module (255). The simulation cable driver further can translate the control protocol instructions into signaling information corresponding to the integrated circuit control protocol.

Abstract: A method comprises performing at least one zero-bit scan across an interface. The at least one zero-bit scan defines a command window. Further, the method implements one of a selectable plurality of control levels in the command window based on the number of the at least one zero-bit scans.

Abstract: Provided are a conversion device and the like for converting a initial test pattern given in advance into a test pattern of a bit constitution of different logic values, without losing the fault coverage of transition delay fault which can be detected by the constitution element of the initial test pattern. The conversion device converts an initial test pattern 100a given in advance for a logic circuit into an intermediate test pattern 100b of a bit constitution of different logic values, where the constitution elements of the initial test pattern 100a are at least two test vectors applied in succession. The conversion device includes a decision means for deciding a combination of logic values in the initial test pattern 100a which meet a detection condition of faults of the logic circuit which can be detected by applying the constitution elements.