Abstract: A USB integrated circuit (IC), a testing platform and an operating method for USB integrated circuit are provided. The USB integrated circuit includes a USB port physical layer (PHY) circuit, a first lane adapter, a second lane adapter, a routing circuit, and a USB transport layer circuit. The USB PHY circuit is configured to transmit a differential signal between the USB integrated circuit and an outside device. When the USB integrated circuit operates in a testing mode, the routing circuit electrically connects the first lane adapter to the USB PHY circuit. When the USB integrated circuit operates in a working mode, the routing circuit electrically connects the second lane adapter to the USB PHY circuit. The USB transport layer circuit is coupled to the first lane adapter and the second lane adapter.

Abstract: A storage system includes a controller; a first storage device including a first ready/busy pin and a second storage device including a second ready/busy pin; a first data bus communicatively coupled between the controller, the first storage device, and the second storage device; and a first shared ready/busy signal channel communicatively coupled to the first ready/busy pin of the first storage device, the second ready/busy pin of the second storage device, and the controller according to a wire-sharing protocol, wherein the first storage device is configured to send the first device ID and status information associated with the first storage device to the controller via the first shared ready/busy signal channel and the second storage device is configured to send the second device ID and status information associated with the second storage device to the controller via the first shared ready/busy signal channel.

Abstract: In accordance with an embodiment, a method includes determining whether a frame received from a communication bus is encoded according to a particular communication protocol and is addressed to a particular electronic device; increasing a frame count value when the frame is encoded according to the particular communication protocol and is addressed to the particular electronic device based on the determination, wherein increasing the frame count value comprises increasing a count of a modular arithmetic counter circuit having a first bit depth, and the frame count value is constrained to a modulus value of the modular arithmetic counter circuit; setting a frame count status bit based on comparing the frame count value to threshold values, and transmitting a frame comprising the frame counter status bit over the communication bus, and resetting the frame count value at an end of a monitoring time interval.

Abstract: A semiconductor memory apparatus including a test circuit configured for generating compressed data by comparing and compressing data stored in a plurality of memory cells inside a memory bank during a first test mode, and configured for outputting the compressed data as test data to an input/output pad through one selected global line during the first test mode, and the test circuit is configured for transmitting the compressed data to a plurality of global lines during a second test mode, combining the compressed data loaded in the respective global lines during the second test mode, and outputting the combination result as the test data to the input/output pad during the second test mode.

Abstract: A memory system includes a memory controller with a plurality N of memory-controller blocks, each of which conveys independent transaction requests over external request ports. The request ports are coupled, via point-to-point connections, to from one to N memory devices, each of which includes N independently addressable memory blocks. All of the external request ports are connected to respective external request ports on the memory device or devices used in a given configuration. The number of request ports per memory device and the data width of each memory device changes with the number of memory devices such that the ratio of the request-access granularity to the data granularity remains constant irrespective of the number of memory devices.

Abstract: In various embodiments, apparatus and systems, as well as methods, may include an enhanced register to provide actuator signals to a memory array, the enhanced register including a first memory device including an first enable input, a first data input coupled to a register data input, and first memory device output, the first memory device output to couple to the memory array, and the enhances register to include a second memory device including a second enable input, a second data input coupled to the register data input, and a second memory device output, wherein the second memory device output provides a first output signal indicating when one or more of the actuator signals from the first memory device output are to be coupled to the register data input.

Abstract: The present application describes a method and system for testing the compliance of a PCIE expansion system to verify that data signals transmitted through multiple data lanes in the expansion system comply with the PCIE requirements. The method for testing a PCIE expansion system comprises delivering the data signals from the data lanes to a compliance board that is configured to loop back at least a first portion of the data signals and transmit a complementary second portion of the data signals to a testing device, and testing a compliance of the second portion of the data signals with the PCIE requirements. The first portion of the data signals is then tested through a second compliance board that is configured to loop back the second portion of the data signals and transmit the first portion of the data signals to the testing device.