Flying Height Testers Patents (Class 356/243.3)
  • Patent number: 7820428
    Abstract: A field deployable optical assembly for use in testing a light-responsive sample is disclosed. The assembly includes a microfluidic device, a first optical package, and a second optical package. The first optical package includes a light emitting diode (LED), a first optical device, and a first light-path control, the first optical package configured to guide and focus light from the LED onto the sample. The microfluidic device includes a tethered control substance. In response to a substance within the sample being associated with, and attaching to, the tethered control, the sample emits light. The second optical package includes a photo sensor, a second optical device, and a second light-path control, the second optical package configured to guide and focus the light emitted from the sample onto the photo sensor.
    Type: Grant
    Filed: June 29, 2006
    Date of Patent: October 26, 2010
    Assignee: General Electric Company
    Inventors: Steven Tysoe, Eugene Barash, Thomas Stecher
  • Patent number: 7057719
    Abstract: A system and method are disclosed for calibrating a hard disc drive magnetic head flying height tester by a calibration standard, which includes a mock slider and mock disc, by optical interference techniques.
    Type: Grant
    Filed: August 26, 2003
    Date of Patent: June 6, 2006
    Assignee: SAE Magnetics (H.K.) Ltd.
    Inventors: Yu Li, Yuanzhan Hu
  • Patent number: 7057740
    Abstract: A system and method are disclosed for calibrating a hard disc drive magnetic head flying height tester by a calibration standard, which includes a mock slider and mock disc, by optical interference techniques.
    Type: Grant
    Filed: July 15, 2003
    Date of Patent: June 6, 2006
    Assignee: SAE Magnetics (H.K.) Ltd.
    Inventors: Yuanzhan Hu, Yu Li, Hong Tian
  • Patent number: 6836323
    Abstract: The present invention overcomes the disadvantages of the related art by providing a spatial reference system that includes at least one artifact assembly. The artifact assembly has a measuring bar assembly including an inner member with a proximate end and a distal end, an outer member with a proximate end and a distal end, and a compensating member with a proximate end and a distal end operatively disposed between said inner and said outer members. The distal end of the outer member is fixedly mounted to the distal end of the compensating member. The proximate end of the compensating member is fixedly mounted to the proximate end of the inner member.
    Type: Grant
    Filed: September 30, 2003
    Date of Patent: December 28, 2004
    Assignee: Metronom U.S., Inc.
    Inventor: Ingobert Schmadel
  • Patent number: 6704103
    Abstract: The present invention is a method for providing a disk of an optical tester. The disk comprises a transparent substrate that has a first surface and an opposite second surface. The disk also includes a coating on the first surface of the transparent substrate. An identical coating can be applied to the second surface of the transparent substrate. The coating can have multiple layers of thin films. The present invention provides a method to determine the required thickness of the coating to enhance the sensitivity of zero flying height measurement.
    Type: Grant
    Filed: August 23, 2001
    Date of Patent: March 9, 2004
    Assignee: KLA-Tencor Corporation
    Inventors: Rui-Fang Shi, Carlos A. Duran
  • Publication number: 20030043371
    Abstract: The present invention is a method for providing a disk of an optical tester. The disk comprises a transparent substrate that has a first surface and an opposite second surface. The disk also includes a coating on the first surface of the transparent substrate. An identical coating can be applied to the second surface of the transparent substrate. The coating can have multiple layers of thin films. The present invention provides a method to determine the required thickness of the coating to enhance the sensitivity of zero flying height measurement.
    Type: Application
    Filed: August 23, 2001
    Publication date: March 6, 2003
    Inventors: Rui-Fang Shi, Carlos A. Duran
  • Patent number: 6445447
    Abstract: An optical certifying head flies above a disc surface within an evanescent decay length of the disc surface. A light beam is focused through an objective lens, and further focused through a SIL. The SIL-focused light is coupled to the disc surface through near-field coupling. The light is reflected from the disc surface depending on a surface condition of the disc such that the surface condition can be determined.
    Type: Grant
    Filed: March 24, 1998
    Date of Patent: September 3, 2002
    Assignee: Seagate Technology LLC
    Inventors: Ling Wang, Li Li
  • Patent number: 6225136
    Abstract: A method of controllably adding at least one contaminant to a surface of a silicon wafer. The method includes providing a solution containing a known concentration of one or more contaminants and having a known pH. The solution is applied to a surface of a silicon wafer and allowed to remain there for a predetermined period of time so that the one or more contaminants adsorb to the wafer surface. The solution is then removed while leaving the adsorbed one or more contaminants on the surface.
    Type: Grant
    Filed: August 25, 1999
    Date of Patent: May 1, 2001
    Assignee: SEH America, Inc.
    Inventors: Justin R. Lydon, Brian L. Tansy