Area Patents (Class 356/628)
  • Patent number: 11336790
    Abstract: A scanner includes: a pulse generator that generates a pulse signal; a transmissive optical sensor including a photo transmitter that projects pulsed light in response to the pulse signal and a photo receiver facing the photo transmitter; a charge-discharge unit capable of storing an electric charge of the pulse signal and discharging the stored electric charge; and a controller that causes the charge-discharge unit to discharge the electric charge when the photo receiver receives the pulsed light, causes the charge-discharge unit to store the electric charge when the photo receiver does not receive the pulsed light, and that starts supply of power to a CPU when an amount of the electric charge is at or above a threshold.
    Type: Grant
    Filed: May 7, 2021
    Date of Patent: May 17, 2022
    Assignee: PFU LIMITED
    Inventor: Kyohei Oura
  • Patent number: 10964007
    Abstract: A method of inspecting cased goods includes advancing at least one case of goods on a conveyor, generating an illumination sheet of parallel illuminating rays with at least one electromagnetic source, and capturing an image, formed by the illumination sheet passing through a diffuser with at least one camera located so as to capture illumination from diffused parallel rays of the light sheet, where the image case embodies a goods image that is generated by the case goods moving between the light source and the at least one camera, where part of the parallel sheet of light is at least partially blocked by the case of goods, thus generating a gray level image.
    Type: Grant
    Filed: January 26, 2017
    Date of Patent: March 30, 2021
    Inventors: Marc Ducharme, Robert Jodoin, Benoit Larouche, Sylvain-Paul Morency, Christian Simon
  • Publication number: 20150009511
    Abstract: A monitoring device is provided that is used for the monitoring of an area of building or land, including an optical strand used as a sensor, one optical source for emitting an optical emission signal transmitted in the optical strand, and one optical analogue detector for detecting an intensity of an optical return signal corresponding to the optical emission signal returning from the optical strand. The monitoring device is arranged as a compact unit and includes a controller for alternately activating and deactivating the emission of the optical source so that a ratio between the non-emission duration and the emission duration is greater than 5000. A monitoring system is also provided including such a monitoring device, and a monitoring method carried out in the monitoring device.
    Type: Application
    Filed: February 9, 2012
    Publication date: January 8, 2015
    Inventor: Bernard Hodac
  • Publication number: 20140307267
    Abstract: A measuring device having a first set of illumination sources including respective first and second illumination sources for measuring a first distance; a second set of illumination sources including respective first and second illumination sources for measuring a second distance, a first support for the first set of illumination sources, a second support for the second set of illumination sources wherein defining a first distance with said first set of illumination sources defines a second distance with the second set of illumination sources.
    Type: Application
    Filed: April 8, 2014
    Publication date: October 16, 2014
    Applicant: H and S Industries
    Inventor: William Joseph Hoth, Jr.
  • Patent number: 8760668
    Abstract: Embodiments of methods are disclosed for characterizing a tested polycrystalline diamond (“PCD”) element, such as a PDC cutting element. In an embodiment, a method for characterizing a tested PCD element is disclosed. An initial volume of a PCD element is measured using a coordinate measuring machine (“CMM”). A workpiece is cut with the PCD element so that the PCD element develops a wear flat. A post-cut volume of the PCD element is measured after cutting the workpiece using the CMM. A wear volume of the PCD element is determined at least partially based on the post-cut volume and the initial volume of the PCD element.
    Type: Grant
    Filed: July 27, 2012
    Date of Patent: June 24, 2014
    Assignee: US Synthetic Corporation
    Inventors: Jason K. Wiggins, Richard B. Smith, Bryan H. Jansen
  • Publication number: 20140094106
    Abstract: Systems and methods for determining the area of a sash opening in a fume hood formed by at least one movable sash panel. An emitter and sensor panel is mounted in a fume hood enclosure space. The emitter and sensor panel comprises at least one light emitter mounted on one side of an optical sensor. The at least one light emitter is configured to illuminate the fume hood enclosure space. At least one reflective marker is mounted on one edge of the sash opening to reflect light from the at least one light emitter. Optical information detected at the optical sensor is used to determine a variable distance to the at least one reflective marker. The variable distance and known distance parameters are used to determine the area of the sash opening.
    Type: Application
    Filed: September 28, 2012
    Publication date: April 3, 2014
    Applicant: SIEMENS INDUSTRY, INC.
    Inventor: Keith McIlhany
  • Publication number: 20130286409
    Abstract: The present invention determines the dimensions and volume of an object by using a novel 3-D camera that measures the distance to every reflective point in its field of view with a single pulse of light. The distance is computed by the time of flight of the pulse to each camera pixel. The accuracy of the measurement is augmented by capture of the laser pulse shape in each camera pixel. The camera can be used on an assembly line to develop quality control data for manufactured objects or on a moving or stationary system that weighs as well as dimensions the objects. The device can also ascertain the minimum size of a box required to enclose an object.
    Type: Application
    Filed: October 22, 2012
    Publication date: October 31, 2013
    Inventor: Roger STETTNER
  • Patent number: 8570538
    Abstract: A building surface area measurement system for efficiently measuring the surface area for a room. The building surface area measurement system generally includes a housing having a triangular shaped base, wherein the housing includes a first side positionable adjacent to a first wall and a second side positionable adjacent to a second wall in a corner, a first measuring unit within the housing directed parallel to the first wall to measure the width of the first wall, a second measuring unit within the housing directed parallel to the second wall to measure the width of the second wall, and an upper measuring unit directed upwardly parallel to the height of the walls. A control unit within the housing is in communication with the measuring units and utilizes the measurement data to calculate the total surface area of the room or the two walls. A display unit within the housing displays the calculated information.
    Type: Grant
    Filed: November 2, 2012
    Date of Patent: October 29, 2013
    Inventors: James A. Marable, Jr., Sharon L. Berry-Harper, Arthur Lee Berry
  • Patent number: 8125635
    Abstract: Apparatus for performing Raman analysis may include a laser source module, a beam delivery and signal collection module, a spectrum analysis module, and a digital signal processing module. The laser source module delivers a laser beam to the beam delivery and signal collection module. The beam delivery and signal collection module delivers the laser source beam to a sample, collects Raman scattered light scattered from the sample, and delivers the collected Raman scattered light to the spectrum analysis module. The spectrum analysis module demultiplexes the Raman scattered light into discrete Raman bands of interest, detects the presence of signal energy in each of the Raman bands, and produces a digital signal that is representative of the signal energy present in each of the Raman bands. The digital signal processing module is adapted to perform a Raman analysis of the sample.
    Type: Grant
    Filed: June 21, 2011
    Date of Patent: February 28, 2012
    Assignee: PD-LD, Inc.
    Inventors: Vladimir Sinisa Ban, Boris Leonidovich Volodin, Neal R. Stoker
  • Publication number: 20110199621
    Abstract: Disclosed herein are a system and method for three-dimensional imaging using a single transducer. A laser in a transmitter emits a sequence of short pulses, each of which is at a different center wavelength (frequency). A dispersive element in the transmitter spatially separates the pulses according to wavelength, with different pulses mapped to different spatial locations in a target volume via a lens. The pulses travel to the target, which scatters or back-reflects the pulses towards the dispersive element via the lens. The lens collects the returned pulses and transmits them to a single transducer via the dispersive element. The transducer measures the time of arrival for each returned pulse. Because the arrival time depends on the range to the object in the portion of the target illuminated by the corresponding emitted pulse, the measured arrival time can be used to reconstruct a 3D (angle-angle-range) image of the object.
    Type: Application
    Filed: February 16, 2010
    Publication date: August 18, 2011
    Applicant: Massachusetts Institute of Technology
    Inventors: BRYAN S. ROBINSON, Don M. Boroson, Marius A. Albota
  • Patent number: 7995199
    Abstract: Disclosed are methods and apparatus for inspecting a sub-resolution assist features (SRAF) on a reticle. A test flux measurement for a boundary area that encompasses a width and a length portion of a test SRAF is determined, and at least one reference flux measurement for one or more boundary areas of one or more reference SRAF's is determined. The test flux measurement is compared with the reference flux measurements. The comparison is used to then determine whether the test SRAF is undersized or oversized. If the test SRAF is determined to be oversized, it may then be determined whether the test SRAF is defective based on the comparison using a first threshold.
    Type: Grant
    Filed: April 21, 2009
    Date of Patent: August 9, 2011
    Assignee: KLA-Tencor Corporation
    Inventors: Carl E. Hess, Yalin Xiong
  • Publication number: 20110013201
    Abstract: A device for measuring a parking space as a vehicle drives past the parking space includes a depth-measuring line scan camera movable together with the vehicle for acquiring individual images of the environment surrounding the vehicle transverse to a longitudinal direction of the vehicle, an arrangement for acquiring the movement of the vehicle, and an evaluation device. The individual images of the environment surrounding the vehicle contain depth information that is resolvable in a vertical direction.
    Type: Application
    Filed: November 11, 2008
    Publication date: January 20, 2011
    Inventors: Michael Scherl, Uwe Zimmermann
  • Patent number: 7869059
    Abstract: A height-limited-area-information creating device creates a clip plane on a base plane of a printed circuit board, and sets a view so that an image faces the base plane and a normal to the base plane represents a depth direction of the image. According to the view, a three-dimensional image of a chassis-side component is created. The base plane is divided into unit areas, and one of the unit areas is selected. Coordinates of vertices of the selected unit area are transformed to screen coordinates to acquire a component and a polygon at the position of the screen coordinates. Distances from respective four vertices to the polygon are calculated as height, and a minimum value is determined as a maximum height for the unit area.
    Type: Grant
    Filed: January 30, 2007
    Date of Patent: January 11, 2011
    Assignee: Fujitsu Limited
    Inventor: Naoyuki Nozaki
  • Publication number: 20100208039
    Abstract: The present invention determines the dimensions and volume of an object by using a novel 3-D camera that measures the distance to every reflective point in its field of view with a single pulse of light. The distance is computed by the time of flight of the pulse to each camera pixel. The accuracy of the measurement is augmented by capture of the laser pulse shape in each camera pixel. The camera can be used on an assembly line to develop quality control data for manufactured objects or on a moving or stationary system that weighs as well as dimensions the objects. The device can also ascertain the minimum size of a box required to enclose an object.
    Type: Application
    Filed: October 1, 2009
    Publication date: August 19, 2010
    Inventor: Roger STETTNER
  • Patent number: 7659988
    Abstract: To inspect all portions of the substrate the substrate table can be moved rotationally and linearly. Furthermore the detector can be moved rotationally. This enables all portions of a surface of the substrate to be inspected from all angles in a plane parallel to the substrate. Less linear motion is needed, so the apparatus occupies a smaller volume and generates smaller vibrations.
    Type: Grant
    Filed: February 9, 2007
    Date of Patent: February 9, 2010
    Assignee: ASML Netherlands B.V.
    Inventors: Martinus Joseph Kok, Reinder Teun Plug, Sander Kerssemakers
  • Patent number: 7430050
    Abstract: A stage apparatus (100) includes a stage glass (210) having on an upper surface a stage surface (211) of a substantially flat plane on which a predetermined workpiece (W) is set, a plane light emitter (220) with a flat plane, which is provided to substantially all over a lower surface of the stage glass (210) and illuminates the workpiece (W) with contour illumination through the stage glass (210), and a supporting section (300), which supports at plurality of points on a lower face side of the plane light emitter (220) and adjusts the flatness of the stage surface (211) by adjusting the height at a plurality of supporting points.
    Type: Grant
    Filed: June 8, 2005
    Date of Patent: September 30, 2008
    Assignee: Mitutoyo Corporation
    Inventors: Shuichi Kamiyama, Yutaka Nishitsuji
  • Patent number: 7397252
    Abstract: A method for accurately measuring feature sizes and quantifying the beam spot size in a CDSEM at real time is provided. The inventive method is based on a scanning microscope and it works on both conductive and non-conductive features. The measurement of conductive feature includes first providing a conductive feature on a surface of a substrate (the substrate maybe an insulator, a semiconductor or a material stack thereof). The conductive feature is then connected to ground and thereafter an electron beam probe raster scans the sample. When the electron beam probe hits the conductive feature the spot will have a negative potential. The potential difference between the spot and the ground will induce an electrical current flow. When the electrical beam is off the conductive feature, there will be no current flow. Therefore, by measuring the current response to the location of the beam spot, the dimension of the conductive feature can be derived.
    Type: Grant
    Filed: July 31, 2006
    Date of Patent: July 8, 2008
    Assignee: International Business Machines Corporation
    Inventors: Lin Zhou, Eric P. Solecky
  • Patent number: 7379194
    Abstract: A method of measuring a mailpiece includes deflecting a laser beam through an arc, determining an angle at which the laser beam is currently directed, and calculating a dimension of the mailpiece based at least in part on the determined angle.
    Type: Grant
    Filed: October 11, 2005
    Date of Patent: May 27, 2008
    Assignee: Pitney Bowes Inc.
    Inventors: Frederick W Ryan, Jr., Ronald P Sansone
  • Patent number: 7345773
    Abstract: In a flatness measurement apparatus, a sensor unit having a flatness-detection sensor is slidable along the linear guide rail. A support system supports the linear guide rail such that the linear guide rail is rotatable in a horizontal plane, whereby a surface of a wafer stage to be measured is scanned all over with the sensor unit having the flatness-detection sensor so as to ensure a flatness measurement of the whole surface of the wafer stage.
    Type: Grant
    Filed: October 12, 2005
    Date of Patent: March 18, 2008
    Assignee: NEC Electronics Corporation
    Inventor: Katsuhiro Yano
  • Patent number: 7315384
    Abstract: An inspection apparatus, comprising; an illumination system configured to provide an illumination beam for irradiating a target; a first detection system configured to detect radiation scattered from the target in a non-zero order diffraction direction; and the detection system comprises a dispersive element for dispersion of the radiation scattered from the target in the non-zero order diffraction direction and a radiation sensitive device constructed and arranged to measure the intensity of the radiation dispersed by the dispersive element.
    Type: Grant
    Filed: May 10, 2005
    Date of Patent: January 1, 2008
    Assignee: ASML Netherlands B.V.
    Inventors: Arie Jeffrey Den Boef, Mircea Dusa
  • Patent number: 7276380
    Abstract: The present invention provides a transparent liquid inspection apparatus capable of identifying a boundary between a transparent liquid applied on a base material which provides a multi-piece product and the base material, and automatically inspecting an applied condition of the transparent liquid without influence of a background of the base material. A projected image of an illumination source (2) is reflected on a surface of the transparent liquid as a mirror, the projected image is picked up by cameras (41 to 44), and the image is analyzed by an image processing unit (8), thereby inspecting an amount of displacement of the transparent liquid from a predetermined application position and expansion of the surface of the transparent liquid.
    Type: Grant
    Filed: July 30, 2001
    Date of Patent: October 2, 2007
    Assignee: Matsushita Electric Industrial Co., Ltd.
    Inventor: Teruaki Fukuyama
  • Patent number: 7145664
    Abstract: A method for modeling samples includes the use of control points to define lines profiles and other geometric shapes. Each control point used within a model influences a shape within the model. Typically, the control points are used in a connect-the-dots fashion where a set of dots defines the outline or profile of a shape. The layers within the sample are typically modeled independently of the shape defined using the control points. The overall result is to minimize the number of parameters used to model shapes while maintaining the accuracy of the resulting scatterometry models.
    Type: Grant
    Filed: February 23, 2004
    Date of Patent: December 5, 2006
    Assignee: Therma-Wave, Inc.
    Inventors: Jon Opsal, Hanyou Chu, Xuelong Cao, Youxian Wen
  • Patent number: 7099017
    Abstract: A method and apparatus for measuring an opening defined within object using an optical sensor system is provided. The method includes positioning an illumination source adjacent the opening, illuminating a perimeter circumscribing the opening, receiving an image of the illuminated boundary, and calculating an area within the received boundary. The system includes a light source oriented to project a first sheet of light intersected by a first portion of the opening perimeter, the light source projecting a second sheet of light intersected by a second portion of the opening perimeter, a light detector receiving a portion of the sheet of light intersected by the object opening perimeter and reflected toward the light detector, and an image processor communicatively coupled to the light detector, the image processor programmed to sample an image from the detector and programmed determine the dimensions of the object opening from the sampled image.
    Type: Grant
    Filed: May 28, 2003
    Date of Patent: August 29, 2006
    Assignee: General Electric Company
    Inventors: Kevin George Harding, Francis Howard Little, Joseph Benjamin Ross, Jeffery John Reverman
  • Patent number: 6919964
    Abstract: A method for modeling diffraction includes constructing a theoretical model of the subject. A numerical method is then used to predict the output field that is created when an incident field is diffracted by the subject. The numerical method begins by computing the output field at the upper boundary of the substrate and then iterates upward through each of the subject's layers. Structurally simple layers are evaluated directly. More complex layers are discretized into slices. A finite difference scheme is performed for these layers using a recursive expansion of the field-current ratio that starts (or has a base case) at the lowermost slice. The combined evaluation, through all layers, creates a scattering matrix that is evaluated to determine the output field for the subject.
    Type: Grant
    Filed: January 16, 2003
    Date of Patent: July 19, 2005
    Assignee: Therma-Wave, Inc.
    Inventor: Hanyou Chu
  • Patent number: 6806905
    Abstract: A digital camera is provided with a display for displaying an image of an object and a specifying unit for specifying a plurality of measuring points on the display. An actual area of a region surrounded by the plurality of measuring points specified by the specifying unit are calculated by a calculator.
    Type: Grant
    Filed: February 25, 2000
    Date of Patent: October 19, 2004
    Assignee: Minolta Co., Ltd.
    Inventors: Yasuhiro Morimoto, Masahito Niikawa
  • Patent number: 6760117
    Abstract: Measurement apparatus for measuring at least one of a length, surface area or volume of an object (or portion thereof) or area (22) (or portion thereof). The apparatus includes means for creating a three-dimensional map of an object or area to be measured and a touch-sensitive screen (16) for displaying the mapped image of the object or area. The user can select the area (22) of interest by drawing around it on the screen to create an outline of its shape and the apparatus then creates a virtual shape (20) which matches the outline and maps it onto the image. The user can alter the size, angle, pitch, etc. of the virtual shape (20) until it matches the area (22) exactly and the apparatus then determines the length, surface area and/or volume of the area (22), as required.
    Type: Grant
    Filed: January 30, 2002
    Date of Patent: July 6, 2004
    Assignee: Hewlett-Packard Development Company, L.P.
    Inventor: David Neil Slatter
  • Patent number: 6738134
    Abstract: An inspection method and an inspection system of a terminal metal fitting which can securely judge the good or bad of the fastening condition of an electric wire by a crimping piece of the terminal metal fitting is provided. The inspection system 1 of the terminal metal fitting has an illuminating lamp 4, a CCD camera 5, a dark box 6, and a control unit 7. The CCD camera 5 is arranged at a position of the light thrown from the illuminating lamp 4 and reflected by crimping pieces 212a,212b of a pressure welding terminal 200 not entering the CCD camera 5. The dark box 6 covers the illuminating lamp 4, an object side 5a of the CCD camera 5, and the pressure welding terminal 200. The control unit 7 makes a binary processing on an image of a wire connecting portion 204 taken by the CCD camera 5.
    Type: Grant
    Filed: September 27, 2001
    Date of Patent: May 18, 2004
    Assignee: Yazaki Corporation
    Inventor: Tatsuya Maeda
  • Patent number: 6672778
    Abstract: At least two (groups of) sensors forming an insertion detection sensor are offset from each other in the conveyance direction of a photosensitive material. An insertion speed, which is different for each manual insertion event, is obtained based on the time difference when sensors that have been offset from each other detect the leading end of the photosensitive material. The length of the photosensitive material in the conveyance direction thereof is accurately computed based on the insertion speed and other information. By correcting the errors due to the changeable insertion state of the photosensitive material caused by manual insertion by the operator, the process area of the photosensitive material, required for calculating the amount of replenisher to be replenished, is accurately obtained. Therefore, the amount of the replenisher is appropriately determined and the process capacity of the developer or the fixing solution can constantly be maintained at the satisfactory level.
    Type: Grant
    Filed: September 24, 2002
    Date of Patent: January 6, 2004
    Assignee: Fuji Photo Film Co., Ltd.
    Inventors: Tsukasa Sato, Yoko Usui
  • Patent number: 6583884
    Abstract: One aspect of the present invention includes a novel method of providing a set of vertices representative of the outline of an opaque object so that an outline of the object can be made from the set of vertices. The method includes the step of casting a shadow of the object onto a detector while the object is held at an angle and then detecting at least one edge of the shadow image. Once at least one of the edges in the shadow image is known, a data pair formed by the at least one shadow edge and its corresponding angle is preferably stored. The steps of casting and detecting are repeated until a plurality of data pairs is stored. Finally, a set of vertices is computed from the plurality of data pairs. An outline of the object can be made by plotting the set of vertices, for example, for use in viewing an outline of the object.
    Type: Grant
    Filed: April 8, 2002
    Date of Patent: June 24, 2003
    Assignee: CyberOptics Corporation
    Inventors: Eric P. Rudd, Steven K. Case
  • Publication number: 20030104642
    Abstract: In order to provide a method of detecting protrusion of an inspection object from a palette improved to be capable of making highly precise detection and reducing a socket breakage ratio, an inspection object is introduced into each of a plurality of pockets provided on the surface of a palette, which in turn is transported. A reflection level of the inspection object stored in each of the plurality of pockets is measured every palette with a reflection type photoelectric sensor. The maximum value and the minimum value of the reflection level are obtained from data of every palette, for calculating a dispersion width defined by the difference between the maximum value and the minimum value. The dispersion width is compared with a previously set determination threshold, for determining whether or not the dispersion width is greater than the determination threshold.
    Type: Application
    Filed: May 15, 2002
    Publication date: June 5, 2003
    Applicant: Mitsubishi Denki Kabushiki Kaisha
    Inventors: Toshiya Ijichi, Shinji Semba
  • Patent number: 6521907
    Abstract: A low profile, low volume smoke chamber displaces a light source, such as a light emitting diode or laser diode, and a sensor, such as photodiode or phototransistor, to the exterior of the sensing volume. A symmetrical sensing volume results which can be coupled to symmetrical input/output ports via a generally U-shaped flow path. A two part sensing chamber housing is formed with a lower cylindrical base portion and an upper cylindrical cover portion which slideably engage one another. At least the upper cylindrical portion carries a plurality of grooves for suppression of reflections and collection of dust. An exterior end of the upper portion carries a plurality of spaced apart openings which can be filled with a screen. A reduced sensing volume in combination with a selected screen size produces an acceptable signal to noise ratio and response rate while still excluding insects and other non-smoke related particulate matter.
    Type: Grant
    Filed: April 24, 2000
    Date of Patent: February 18, 2003
    Assignee: Pittway Corporation
    Inventors: Thomas W. Shoaff, Kalvin Watson, Dragan Petrovic, George A. Schoenfelder, Frederick J. Conforti, James F. Wiemeyer
  • Patent number: 6490048
    Abstract: One aspect of the present invention includes a novel method of providing a set of vertices representative of the outline of an opaque object so that an outline of the object can be made from the set of vertices. The method includes the step of casting a shadow of the object onto a detector while the object is held at an angle and then detecting at least one edge of the shadow image. Once at least one of the edges in the shadow image is known, a data pair formed by the at least one shadow edge and its corresponding angle is preferably stored. The steps of casting and detecting are repeated until a plurality of data pairs is stored. Finally, a set of vertices is computed from the plurality of data pairs. An outline of the object can be made by plotting the set of vertices, for example, for use in viewing an outline of the object.
    Type: Grant
    Filed: November 3, 1999
    Date of Patent: December 3, 2002
    Assignee: CyberOptics Corporation
    Inventors: Eric P. Rudd, Steven K. Case
  • Patent number: 6480290
    Abstract: An apparatus for determining a cross-sectional area of an object. The apparatus includes a plurality of radiant energy sources, a plurality of radiant energy detectors oriented to receive radiant energy emitted by the plurality of radiant energy sources, a strobing module in communication with the plurality of radiant energy sources for strobing the plurality of light sources, and a profile determination module in communication with the plurality of radiant energy sources and the strobing module for determining the cross-sectional area of an object disposed between the plurality of radiant energy sources and the plurality of radiant energy detectors.
    Type: Grant
    Filed: January 31, 2000
    Date of Patent: November 12, 2002
    Assignee: Carnegie Mellon University
    Inventors: Sanjiv Singh, Bruce Digney, Herman Herman, Michael Joseph Rondinelli
  • Patent number: 6473190
    Abstract: An optical sensor for measuring the volume of an object, the object having a top and a side. The optical sensor comprises a source of light and a light sensor adapted to measure the amount of light reflected off the side and off the top of the object, wherein the measured amount of the light reflected off the side and the top of the object correlates to a height and a diameter of the object. At least one optical device is adapted to direct light reflected off the side of the object to the light sensor, and at least one optical device is adapted to direct light reflected off the top of the object to the light sensor.
    Type: Grant
    Filed: March 13, 2000
    Date of Patent: October 29, 2002
    Assignee: Bayer Corporation
    Inventor: Andrew J. Dosmann
  • Patent number: 6369892
    Abstract: A conveying system for multiple product units conveyed on two parallel conveyors past a sensing section. The sensing section includes multiple line scan sensors which each receive input from both conveyors and a calibration standard object in a thin line scan across the conveyors. Optics include an objective lens and a 1X relay lens divided in two and including a prism between halves. The exit pupil of the objective lens is imaged onto the entrance pupil of the 1X relay lens where a slit is positioned to define an image of the thin portion of the product unit in the sensing area. The optics spread the spectrum perpendicularly to the spatial direction to define a grid received by a CCD camera. The CCD camera and associated CPU operate on the data to bin attenuated pixels, train for filtering by spectral range and employ that training to subsequently train for the establishment of algorithms which sense differences in the filter data between product units of different attributes.
    Type: Grant
    Filed: January 18, 2001
    Date of Patent: April 9, 2002
    Inventor: Gerald R. Richert