Measuring Or Testing Of Superconducting Property Patents (Class 505/726)
  • Patent number: 7910155
    Abstract: A method for manufacturing a high-temperature superconducting conductor includes translating an elongated substrate through a reactor. Further, a high temperature superconducting layer is formed on the substrate translating through the reactor by deposition of a reaction product of metalorganic precursor materials onto the substrate. Further, partial pressure of oxygen is monitored to indirectly monitor supply of metalorganic precursors into the reactor.
    Type: Grant
    Filed: January 6, 2006
    Date of Patent: March 22, 2011
    Assignee: Superpower, Inc.
    Inventors: Hee-Gyoun Lee, Venkat Selvamanickam
  • Patent number: 7854057
    Abstract: A method of facilitating superconducting tape manufacturing is provided that includes forming a long-length superconducting tape having a layered structure, comprising a substrate having a dimension ratio not less than about 100, a buffer layer overlying the substrate, and a high temperature superconducting layer overlying the buffer layer. The method further includes characterizing the superconducting tape to create a data set having a plurality of values that are a function of length of the superconducting tape and distributing both the superconducting tape and the data set.
    Type: Grant
    Filed: December 28, 2005
    Date of Patent: December 21, 2010
    Assignee: SuperPower Inc.
    Inventors: Yi-Yuan Xie, Venkat Selvamanickam, Jason Madison Duval
  • Patent number: 7309511
    Abstract: The present invention provides an oxide superconductor thick film which is formed on a substrate or a board and has a high Jc and Ic and a method for manufacturing the same. Predetermined amounts of materials containing elements of Bi, Pb, Sr, Ca and Cu are weighed, mixed and subjected to steps of calcining, milling, and drying, and thereafter an organic binder and an organic vehicle are added thereto to prepare a (Bi, Pb)2+aSr2Ca2Cu3O2 superconductive paste, which is applied to the surface of a substrate or a board in a thickness of 260 ?m or more and dried. Thereafter, the paste is first subjected to burning at temperatures of 835° C. to 840° C. for 100 hours, then pressurization, and further burning at temperatures of 835° C. to 840° C. for 100 hours, thereby preparing an oxide superconductor thick film having a film thickness of 130 ?m or more having a high Jc and Ic.
    Type: Grant
    Filed: May 20, 2005
    Date of Patent: December 18, 2007
    Assignees: Dowa Electronics Materials Co., Ltd, Central Research Institute of Electric Power Industry
    Inventors: Masahiro Kojima, Masakazu Kawahara, Michiharu Ichikawa, Hiroyuki Kado, Masatoyo Shibuya
  • Patent number: 5936401
    Abstract: A device and process for determining the uniformity of a superconducting film's critical current density and transition temperature over a large area uses an array of ac coils placed in close proximity to a superconducting film. A variable ac current is passed through each coil which induces a proportional current in the superconducting film. A lock-in amplifier set to the third harmonic of the ac current is put in parallel with the ac current source. When the current in the film exceeds the critical density of the film then the third harmonic is picked up by the lock-in amplifier. In this way one can measure the critical current density of the film at each of the coils. The above coils are mounted within a flat plate (the film side of the substrate is placed against the plate). The entire assembly is cooled within a cryostat so that the temperature can be precisely controlled.
    Type: Grant
    Filed: September 19, 1996
    Date of Patent: August 10, 1999
    Assignee: The United States of America as represented by the Secretary of the Air Force
    Inventor: Alvin Drehman
  • Patent number: 5872368
    Abstract: The order parameter of a superconductor is reduced by injecting spin-polarized carriers into the superconductor. The reduction in the order parameter is used to modulate the critical current of the superconductor. In a typical embodiment, a current is caused to flow through a superconductor. Spin polarized electrons are then injected into the path of the current in the superconductor by biasing a magnetic metal with respect to a terminal of the superconductor. The bias current may be varied to modulate the injection and thus the flow of current through the superconductor.
    Type: Grant
    Filed: November 30, 1995
    Date of Patent: February 16, 1999
    Assignee: The United States of America as represented by the Secretary of the Navy
    Inventors: Michael Osofsky, Robert J. Soulen, Jr., Raymond Auyeung, James S. Horwitz, Doug B. Chrisey, Mark Johnson
  • Patent number: 5854492
    Abstract: A nondestructive inspection apparatus having a SQUID is made with compact configuration and is capable of detecting a metallic or non-metallic metal for defects, corrosion, and the like, by forming the SQUID and a magnetic field applying coil on the same substrate. The SQUID comprises two Josephson junctions, a washer coil connected to the Josephson junctions to form a superconducting loop, shunt resistors, a damping resistor, and a feedback modulation coil, all of which are formed from a superconducting thin film on a supporting substrate. A magnetic field applying coil is formed on the same supporting substrate with a superconducting thin film or a normal conducting metal thin film. The magnetic field applying coil, which generally has plural turns around the SQUID, applies a dc or ac magnetic field to a sample. The change in magnetic field caused by a defect in the sample is detected by the washer coil, and the position and size of the defect may thus be determined.
    Type: Grant
    Filed: October 29, 1996
    Date of Patent: December 29, 1998
    Assignee: Seiko Instruments Inc.
    Inventors: Kazuo Chinone, Toshimitsu Morooka, Satoshi Nakayama, Akikazu Odawara
  • Patent number: 5812042
    Abstract: A laminated superconducting magnet includes a multilayer short-circuit superconductor group 2 formed by uniting superposed hollow superconducting plates, and an exciting coil 3 for inducing a current from an external power source 4 to the multilayer short-circuit superconductor group 2 for operation in a permanent current mode. Even if some of the superconducting plates are quenched, the other normal superconducting plates share the excess current temporarily. Therefore, the entire superconducting magnet is not quenched.
    Type: Grant
    Filed: February 20, 1996
    Date of Patent: September 22, 1998
    Assignee: Hitachi, Ltd.
    Inventors: Naoki Maki, Nobuhiro Hara, Shigeru Kakugawa, Masayuki Shibata, Noriaki Hino, Kenichi Hattori
  • Patent number: 5781009
    Abstract: An improved two-coil apparatus for measuring the absolute value of magnetic penetration depth .lambda. of superconductor films which is capable of measuring the absolute value of magnetic penetration depth which is denoted as .lambda. of a large area high temperature superconductor film using a low frequency or a static weak magnetic field, which includes a drive coil that is designed to suppresses the screening current of the film at the film edge a receive coil opposingly spaced-apart from the drive coil; sample holders disposed at the left-and right-sides of the receive coil; a large area low temperature superconductor film attached on the sample holder between the drive coil and the receive coil; and a large area high temperature superconductor film mounted on the large area low temperature superconductor film between the drive coil and the receive coil.
    Type: Grant
    Filed: September 25, 1996
    Date of Patent: July 14, 1998
    Assignee: Korea Institute of Science and Technology
    Inventors: JuYoung Lee, Sang Sam Choi, Taek-Sang Hahn
  • Patent number: 5563505
    Abstract: A dielectric resonator apparatus for measuring the parameters of high temperature superconducting thin film is disclosed having improved means for positioning the dielectric and substrates, holding the resonator components in place during use, suppressing undesirable modes, adjusting the magnetic dipole coupling, and coupling to an electrical circuit.
    Type: Grant
    Filed: May 19, 1995
    Date of Patent: October 8, 1996
    Assignee: E. I. Du Pont de Nemours and Company
    Inventors: Robert G. Dorothy, Viet X. Nguyen, Zhi-Yuan Shen
  • Patent number: 5506497
    Abstract: A process for determining a surface resistance to microwave energy of a superconductive film provides a metallic cavity resonator whose resonator cavity is defined by metallic walls, and positioning a superconductive film whose microwave surface resistance is to be measured as at least part of a wall of the cavity. A dielectric body is applied to a surface of the film and microwave energy is coupled to the cavity through an input antenna and microwave energy is coupled out of the cavity by an output antenna at which signals are produced as a measure of the microwave surface resistance of the film.
    Type: Grant
    Filed: October 14, 1993
    Date of Patent: April 9, 1996
    Assignee: Forschungszentrum Julich GmbH
    Inventors: Norbert Klein, Ulrich Dahne, Norbert Tellmann
  • Patent number: 5283524
    Abstract: An improved AC susceptometer and methodology for its use which is particularly suitable for the characterization of the properties of superconducting materials. Added to the circuitry of a conventional AC susceptometer is frequency domain analytical equipment for measuring the induced magnetic response. The addition of frequency domain measuring equipment permits the determination of the harmonic components of the induced magnetic response. The measurement of the harmonic components of the response also provides novel methodology for studying the phenomena of flux penetration, flux pinning and movement and permits the measurement of parameters such as lower critical field, critical temperatures, and the irreversibility line.
    Type: Grant
    Filed: November 19, 1991
    Date of Patent: February 1, 1994
    Assignee: U.S. Philips Corporation
    Inventors: Avner A. Shaulov, Rameshwar N. Bhargava, Donald R. Dorman
  • Patent number: 5280240
    Abstract: An improved AC susceptometer and methodology for its use which is particularly suitable for the characterization of the properties of superconducting materials. Added to the circuitry of a conventional AC susceptometer is frequency domain analytical equipment for measuring the induced magnetic response. The addition of frequency domain measuring equipment permits the determination of the harmonic components of the induced magnetic response. The measurement of the harmonic components of the response also provides novel methodology for studying the phenomena of flux penetration, flux pinning and movement and permits the measurement of parameters such as lower critical field, critical temperatures, and the irreversibility line.
    Type: Grant
    Filed: November 19, 1991
    Date of Patent: January 18, 1994
    Assignee: North American Philips Corporation
    Inventors: Avner A. Shaulov, Rameshwar N. Bhargava, Donald R. Dorman
  • Patent number: 5270291
    Abstract: Magnetic shielding currents having a critical current density, Jc, at a superconducting temperature are stabilized by reducing the temperature of the superconducting body after a steady state or persistent current is established. The current density of the current at the reduced temperature is below the critical current density for the material at the reduced temperature. Decay of the magnetic shielding current at the reduced temperature is significantly reduced.
    Type: Grant
    Filed: November 19, 1990
    Date of Patent: December 14, 1993
    Assignee: The Board of Trustees of the Leland Stanford Junior University
    Inventors: Jonathan Z. Sun, Theodore H. Geballe, Bruce Lairson
  • Patent number: 5218296
    Abstract: Disclosed are apparatus and method for measuring a characteristic of a film comprised of a material that is a superconductor below a critical temperature. The apparatus includes a magnetic circuit for inducing an alternating magnetic flux at a localized region of a surface of the film. The circuit includes a magnetic core (42) having a gap (44) made therein and a drive winding (46) coupled thereto. A current source (50) is coupled to the drive winding for passing an alternating current therethrough for inducing an alternating magnetic flux within the gap. Measurement circuitry (54, 56) is responsive to a current induced within the film by an entry of the magnetic flux into the film. A processor (60) is coupled to the measurement circuitry and determines a critical current density of the superconducting film within the localized region.
    Type: Grant
    Filed: February 7, 1992
    Date of Patent: June 8, 1993
    Assignee: International Business Machines Corporation
    Inventors: Subhash L. Shinde, Thomas K. Worthington
  • Patent number: 5140266
    Abstract: An apparatus and method is disclosed for evaluating the superconducting quality of superconducting materials. The materials are wound on a bifilar spool and tested in a cryogenic atmosphere to determine when the material quenches. During the testing procedure, the electro-magnetic field, current and temperature imposed on the material are varied and the test results are compared with known results to determine if the material is superconductive. In this way, large samples can be tested in a non-destructive manner.
    Type: Grant
    Filed: June 5, 1991
    Date of Patent: August 18, 1992
    Assignee: General Electric Company
    Inventors: Bizhan Dorri, Bu-Xin Xu
  • Patent number: 5132279
    Abstract: A contact-less method for determining transport critical current density and flux penetration depth in bulk superconductor material. A compressor having a hollow interior and a plunger for selectively reducing the free space area for distribution of the magnetic flux therein are formed of superconductor material. Analytical relationships, based upon the critical state model, Maxwell's equations and geometrical relationships define transport critical current density and flux penetration depth in terms of the initial trapped magnetic flux density and the ratio between initial and final magnetic flux densities whereby data may be reliably determined by means of the simple test apparatus for evaluating the current density and flux penetration depth.
    Type: Grant
    Filed: August 22, 1990
    Date of Patent: July 21, 1992
    Assignee: California Institute of Technology
    Inventors: Ulf E. Israelsson, Donald M. Strayer
  • Patent number: 5113135
    Abstract: The area of a loop made of superconducting material is decreased to incre the magnetic field on the surface of a test piece adjacent the loop for determining the critical field, H.sub.c, of the test piece. A loop with a gap having a temporary plug placed therein in which a persistent current is established has a nozzle forming the gap thereon for receiving a test piece. The test piece then completes the circuit permitting removal of the temporary plug. The area of the loop is then decreased resulting in an increase in magnetic field at the surface of the test piece. When the critical field of the test piece is reached, magnetic flux will leak from the internal area of the loop, thereby determining the critical field of the test piece. A continuous length of superconducting material can be tested for discontinuities or spots of low critical field, H.sub.c.
    Type: Grant
    Filed: March 22, 1991
    Date of Patent: May 12, 1992
    Assignee: The United States of America as represented by the Secretary of the Army
    Inventor: Herbert A. Leupold
  • Patent number: 5053705
    Abstract: A read/write head particularly suitable for mapping the superconductive properties of a sample of superconducting material. The head is arranged so that the reading and writing gaps are coaxial. Although the gaps are coaxial, the reading gap and the writing gap may be optimized in length and width to provide efficient reading and writing performance. The coaxial disposition of the heads eliminates parallax error to permit detailed mapping of the properties of the surface of a sample of superconductive material.
    Type: Grant
    Filed: December 27, 1989
    Date of Patent: October 1, 1991
    Assignee: North American Philips Corp.
    Inventor: Samuel P. Herko
  • Patent number: 5039944
    Abstract: The invention relates to an apparatus and method to detect a magnetic field by measuring the magnetically modulated resistance of a superconductor maintained at its phase transition temperature (T.sub.c).
    Type: Grant
    Filed: November 17, 1989
    Date of Patent: August 13, 1991
    Assignee: The Johns Hopkins University
    Inventors: Boris F. Kim, Joseph Bohandy, Frank J. Adrian, Kishin Moorjani
  • Patent number: 5030912
    Abstract: Apparatus and methodology for mapping the superconductive properties of a sample of superconducting material. The material is cooled so that it is a mixed state and an alternating magnetic field is induced in a portion of the sample to be tested. The harmonic component of the induced alternating magnetic response is measured at a location proximate to the point of induction. As the inducing and measuring devices are displaced relative to the sample the measured amplitude of the harmonic component is stored in suitable storage means as a function of location in the sample. Thus, a map of the superconducting properties of the sample may be generated.
    Type: Grant
    Filed: December 21, 1989
    Date of Patent: July 9, 1991
    Assignee: North American Philips Corp.
    Inventors: Samuel P. Herko, Rameshwar N. Bhargava, Avner A. Shaulov
  • Patent number: 5004726
    Abstract: Apparatus and methodology for the rapid and inexpensive characterization of superconducting materials. The method and apparatus induces an alternating magnetic field in the sample to be tested. If the material is a superconductor odd harmonics are generated in the alternating magnetic response of the material near the transition temperature. The superconducting transitions are manifested by a peak or peaks in the odd harmonic components of the alternating magnetic response as a function of temperature. The peaks of the harmonic components are detected to indicate the presence and number of superconducting transitions.
    Type: Grant
    Filed: July 14, 1989
    Date of Patent: April 2, 1991
    Assignee: North American Philips Corp.
    Inventors: Avner A. Shaulov, Samuel P. Herko, Donald R. Dorman, Rameshwar N. Bhargava
  • Patent number: 4996472
    Abstract: The present invention provides a passive superconducting sensor for quench detection in a superconducting coil. The sensor consists of a first circuit electrically connected to two voltage taps of a superconducting coil. The first circuit uses nonsuperconducting components and preferably contains a resistive element. The first circuit is magnetically coupled to a second circuit by a hybrid transformer. The second circuit is superconducting and contains a readout coil and preferably a second hybrid transformer. The second hybrid transformer is magnetically coupled to a sense coil which detects flux changes in the superconducting coil. The readout coil is coupled to a readout device which measures changes in the current through the readout coil. The current in the readout coil can be made a function only of the resistance of the superconducting coil between the voltage turns and thus can be used to detect a quench.
    Type: Grant
    Filed: August 31, 1989
    Date of Patent: February 26, 1991
    Assignee: Westinghouse Electric Corp.
    Inventor: George T. Mallick, Jr.
  • Patent number: 4939458
    Abstract: The invention relates to a novel apparatus for detecting as well as quantifying superconductivity characterized by a rigid-stemmed pendulum used to support the superconductive sample for free-swinging movement about a low-friction fulcrum in a magnetic field effective to swing the pendulum to one side, connecting both a first mechanism to the pendulum operative to sense the movement of the pendulum and generate a signal proportional thereto along with a second mechanism effective to receive such a signal from the first mechanism and react thereto in a manner to null the movement of the pendulum along with the sample suspended therefrom, and, finally, connecting a signal processing mechanism into the system whereby the signal generated by the first mechanism is quantified as a measure of the superconductive properties of the sample.
    Type: Grant
    Filed: February 8, 1988
    Date of Patent: July 3, 1990
    Assignee: Colorado School of Mines
    Inventors: Baki Yarar, Herbert R. Bird