Patents Represented by Attorney, Agent or Law Firm Adel A. Ahmed
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Patent number: 5800189Abstract: An automatic disconnector for a plug includes an ejector for ejecting the plug from an outlet socket; a sensor for sensing current flow through the plug and for sensing a substantial cessation of the current flow. Upon occurrence of a substantial cessation of current flow, the ejector operates to eject the plug from the outlet. The disconnector is optionally integrally formed with the plug or with the outlet socket. An optional keyed plug is utilizable for selectively enabling the disconnector.Type: GrantFiled: June 18, 1996Date of Patent: September 1, 1998Inventor: Samir Omar Ramsey Ahmed
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Patent number: 5780929Abstract: Deep submicran mosfets with defect enhanced CoSi2 formation and improved silicided junctions. A silicon wafer having a diffusion window is first precleaned with hydrofluoric acid. After the HF precleaning, the silicon wafer is transferred to a conventional cobalt sputtering tool where it is sputter cleaned by bombardment with low energy Ar+ions so as to form an ultra-shallow damage region. After the sputter cleaning, and without removing the wafer from the sputtering tool, Cobalt metal is deposited on the silicon wafer at room temperature and a CoSi2 layer is formed in the diffusion window.Type: GrantFiled: November 5, 1996Date of Patent: July 14, 1998Assignee: Siemens AktiengesellschaftInventors: Heinrich Zeininger, Christoph Zeller, Udo Schwalke, Uwe Doebler, Wilfried Haensch
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Patent number: 5721686Abstract: An improved system and method for scheduling a plurality of orders into a factory for processing by one or more of a plurality of machines located therein, based on the use of a Continuity Index job release strategy. The system and method is particularly addressed to the enhancement of such a job release strategy by introduction of Factory Profile and priority criteria and an algorithm for automatic determination of an optimum job release point based on such criteria.Type: GrantFiled: October 31, 1996Date of Patent: February 24, 1998Assignee: Siemens Corporate Research, Inc.Inventors: Maryam S. Shahraray, Khosrow Hadavi
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Patent number: 5684887Abstract: A process for background information recovery in an image including an image of a moving object, comprises the steps of identifying regions of moving objects relative to the background; deriving a moving constellation containing moving objects in a minimum circumscribing polygon; deriving partial background images associated with respective positions of the moving constellation; and combining ones of the partial background images.Type: GrantFiled: May 26, 1995Date of Patent: November 4, 1997Assignee: Siemens Corporate Research, Inc.Inventors: Cheoung N. Lee, Sumitro Samaddar
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Patent number: 5677219Abstract: An improved trench cell capacitor for a memory cell and process for fabricating the same. The process includes the steps of forming a trench within a semiconductor body; forming a dielectric layer peripherally within the trench and filling at least a portion of the trench by epitaxially growing semiconductor material therein. The epitaxially grown semiconductor material is void and seam-free, resulting in a robust trench cell that is highly reliable, thereby improving process yield.Type: GrantFiled: December 29, 1994Date of Patent: October 14, 1997Assignee: Siemens AktiengesellschaftInventors: Carlos A. Mazure, Christian G. Dieseldorff
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Patent number: 5675497Abstract: A method for detecting a departure from normal operation of an electric motor comprises the steps of modelling a set of normal current measurements and a set of operational current measurements for the motor being monitored. The modelling is carried out by a neural network auto-associator which is trained to reproduce its inputs on its output. A potential failure is indicated whenever the set of normal current measurements and the set of operational current measurements differ by more than a predetermined criterion.Type: GrantFiled: May 22, 1996Date of Patent: October 7, 1997Assignee: Siemens Corporate Research, Inc.Inventors: Thomas Petsche, Charles Garrett
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Patent number: 5663107Abstract: A method for globally planarizing an integrated circuit device wafer having a plurality of structures disposed on a surface thereof, the structures forming up and down features on the wafer's surface. The method involves depositing a fill layer over the surface of the wafer to cover the structures. Next, an etch mask layer is deposited over the fill layer. After the etch mask layer is fabricated, openings are formed in the etch mask layer to expose areas of the fill layer that are to be subsequently etched. This is accomplished in the first embodiment of the invention by creating self aligned openings in the etch mask layer using CMP if the gaps between the structures are only partially filled. If the gaps between the structures are completely filled, openings in the etch mask layer can be provided by patterning the etch mask layer using lithography and performing an optional spacer deposition and etching step as described in a second embodiment of the invention.Type: GrantFiled: December 22, 1994Date of Patent: September 2, 1997Assignee: Siemens AktiengesellschaftInventors: Matthias L. Peschke, Reinhard J. Stengl
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Patent number: 5646883Abstract: A memory system includes a plurality of gain memory cells connected via bit bits to sense amplifiers with each sense amplifier having at least two pairs of metal oxide semiconductor (MOS) transistors which have opposite conductivity types. Each gain memory cell has two serially connected n-channel MOS transistors with a diode connected between a gate of a first of the transistors and a source thereof. Three illustrative embodiments of sense amplifiers are used with the gain memory cells.Type: GrantFiled: September 5, 1996Date of Patent: July 8, 1997Assignee: Siemens AktiengesellschaftInventors: Wolfgang Krautschneider, Klaus J. Lau
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Patent number: 5642106Abstract: A visual gyroscope system for detecting turns and straight line travel of a vehicle includes a visual image detector mounted on the vehicle, for producing sequential and successive digitized image data strips containing information identifying scenery about the vehicle at associated successive locations along the route travelled, A processor is programmed to extract from image detector each successive pair of image data strips, and rotate the second occurring strip of each pair until it matches the first occurring strip to obtain the incremental rotation and direction of rotation of the vehicle in its travel between strips. The incremental rotations between strips are accumulated and summed to obtain the total rotation upon completion of a turn, and along with the direction of rotation, identification of a right turn, left turn, u-turn, or straight line travel.Type: GrantFiled: December 27, 1994Date of Patent: June 24, 1997Assignee: Siemens Corporate Research, Inc.Inventors: Thomas R. Hancock, Stephen J. Judd, Carol L. Novak, Scott T. Rickard, Jr.
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Patent number: 5640103Abstract: A method for detecting a departure from normal operation of an electric motor comprises obtaining a set of normal current measurements for a motor being monitored; forming clusters of the normal current measurements; training a neural network auto-associator using the set of normal current measurements; making current measurements for the motor in operation; comparing the input and output of the auto-associator; and indicating abnormal operation whenever the current measurements deviate more than a predetermined amount from the normal current measurements. The method models a set of normal current measurements for the motor being monitored, and indicates a potential failure whenever measurements from the motor deviate significantly from a model. The model takes the form of an neural network auto-associator which is "trained"--using clusters of current measurements collected while the motor is known to be in a normal operating condition--to reproduce the inputs on the output.Type: GrantFiled: May 22, 1996Date of Patent: June 17, 1997Assignee: Siemens Corporate Research, Inc.Inventors: Thomas Petsche, Charles Garrett
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Patent number: 5634230Abstract: An apparatus and associated method for removing microscopic particle contaminants from an object such as a photomask or a semiconductor wafer. The apparatus utilizes an inspection device to identify the position of any particle contaminants on the target object. Once the positions of the various particle contaminants has been identified, a probe is dispatched to the position of one of the particle contaminants. The probe removes the particle contaminant from the target object and moves to a cleaning compartment, wherein the particle contaminant is removed from the probe. The probe is then moved to the next subsequent particle contaminant until all the contaminants are removed from the target object. By removing particle contaminants one-by-one from the target object, the manufacturing yield of zero defect products is greatly increased.Type: GrantFiled: May 9, 1996Date of Patent: June 3, 1997Assignee: Siemens AktiengesellschaftInventor: Wilhelm Maurer
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Patent number: 5627092Abstract: A deep trench DRAM cell is formed on a silicon on isolator (SOI) substrate, with a buried strap formed by outdiffusion of dopant in associated trench node material, for providing an electrical connection between the trench node and the active area of a MOS transfer gate formed in the substrate adjacent the trench in an uppermost portion of the substrate.Type: GrantFiled: September 26, 1994Date of Patent: May 6, 1997Assignee: Siemens AktiengesellschaftInventors: Johann Alsmeier, Reinhard J. Stengl
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Patent number: 5612533Abstract: An omnidirectional light sensor is provided in a disk-like housing including a plurality of successive spaced apart individual radially directed capsules, each including a lens in a frontmost opening on a side edge of the housing, for focussing light rays from surrounding scenery into the interior of the capsule. A prism or reflecting mirror in each capsule receives the focussed light rays for directing them onto an associated photosensor located radially inward in the capsule, for converting the light rays into pixels representing the associated image portion. The pixels form a panoramic digital data strip from the received image portions.Type: GrantFiled: December 27, 1994Date of Patent: March 18, 1997Assignee: Siemens Corporate Research, Inc.Inventors: J. Stephen Judd, Barak P. Pearlmutter
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Patent number: 5610540Abstract: A low power sense amplifier to sense the output of any memory cell whose output may be ill-defined is especially suited for use with gain memory cells. The low power sense amplifier circuit is based on an inverter with a feedback loop with additional circuitry providing stability after signal sensing. The bit sense line is discharged before sensing and after sensing it is locked to either a logical "0" or a logical "1" corresponding to the logical value of the gain memory cell during a read cycle. The low power sense amplifier provides a logic output that is well defined with respect to the supply voltage and corresponds to the logic valve of gain memory cell. The low power sense amplifier has no bias current flow during signal sensing and no power consumption in the stand by mode. The present invention low power sense amplifier is capable of being shared by a first bit sense line and a second bit sense line.Type: GrantFiled: April 1, 1996Date of Patent: March 11, 1997Assignee: Siemens AktiengesellschaftInventors: Klaus Althoff, Wolfgang H. Krautschneider, Klaus J. Lau
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Patent number: 5609148Abstract: A method and apparatus for dicing a semiconductor wafer in which the wafer is bowed or bent by forcing it into contact with a spherical surface having parallel grooves therein and in which an array of parallel wire saws that are in registration with the grooves is forced against the wafer for sawing parallel channels therethrough. A second array of parallel wire saws that are orthogonal to the wires of the first array is provided spaced therefrom for sawing parallel channels through the wafer that are orthogonal to the channels produced by the first array of parallel wire saws.Type: GrantFiled: March 31, 1995Date of Patent: March 11, 1997Assignees: Siemens Aktiengesellschaft, Kabushiki Kaisha ToshibaInventors: Alexander Mitwalsky, Katsuya Okumura
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Patent number: 5606655Abstract: A computer implemented method provides a representative frame (Rframe) for a group of frames in a video sequence. The method comprises selecting a reference frame from the group of frames and storing the reference frame in a computer memory. The method defines a peripheral motion tracking region along an edge of the reference frame and successively tracks movement of boundary pixels in the tracking region, symbolizing any of the length of the shot and the presence of any caption.Type: GrantFiled: March 31, 1994Date of Patent: February 25, 1997Assignee: Siemens Corporate Research, Inc.Inventors: Farshid Arman, Arding Hsu, Ming-Yee Chiu
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Patent number: 5591301Abstract: A method of plasma etching a gate stack on silicon with a chlorine-containing plasma precursor gas in a vacuum chamber fitted with an electrically conductive planar coil disposed outside the chamber and adjacent to a dielectric window mounted in a wall of the chamber, the conductive planar coil coupled to a first radiofrequency source that matches the impedance of the source to the coil, and a second radiofrequency source coupled to a substrate support mounted in the chamber in a direction parallel to the planar coil which comprises limiting the power during etching to 0-200 watts from the first radiofrequency source and to 50-200 watts from the second radiofrequency source. The resultant etch is anisotropic, and avoids charging of the substrate to be etched. When the gate stack comprises conductive polysilicon, the preferred plasma precursor etch gas is a mixture of hydrogen chloride and chlorine, when a highly selective etch is obtained.Type: GrantFiled: December 22, 1994Date of Patent: January 7, 1997Assignee: Siemens AktiengesellschaftInventor: Virinder S. Grewal
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Patent number: 5576947Abstract: A vehicle is guided along a hall by obtaining distances between it and the nearest objects along a plurality of directions, fitting straight lines through the distances to define the walls of the hall, determining its distance from the center of the hall and its angular orientation with respect thereto and directing it to a given point on the center or other line with an angular rotation so that it faces along the center line.Type: GrantFiled: June 30, 1994Date of Patent: November 19, 1996Assignee: Siemens Corporate Research, Inc.Inventor: Uwe Wienkop
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Patent number: 5576632Abstract: A method for detecting a departure from normal operation of an electric motor comprises obtaining a set of normal current measurements for a motor being monitored; training a neural network auto-associator using the set of normal current measurements; making current measurements for the motor in operation; comparing the current measurements with the normal current measurements; and indicating abnormal operation whenever the current measurements deviate more than a predetermined amount from the normal current measurements. The method models a set of normal current measurements for the motor being monitored, and indicates a potential failure whenever measurements from the motor deviate significantly from a model. The model takes the form of an neural network auto-associator which is "trained"--using current measurements collected while the motor is known to be in a normal operating condition--to reproduce the inputs on the output.Type: GrantFiled: June 30, 1994Date of Patent: November 19, 1996Assignee: Siemens Corporate Research, Inc.Inventors: Thomas Petsche, Stephen J. Hanson
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Patent number: 5576223Abstract: In a method of determining the possible formation of crystalline defects in a body of a semiconductor material during the process of fabricating integrated circuits in the body, at least one body is subjected to a full fabrication process to form completed integrated circuits in the body which can be electrically tested to determine whether the operation of the integrated circuit is adversely affected by the formation of crystalline defects. Test structures, each of which is only a portion of the complete integrated circuit, are formed during the formation of the complete circuit but are fabricated using only a group of a limited number of the steps of the fabrication process used to fabricate the complete integrated circuit with various ones of the test structures being subjected to different ones of the steps of the group of steps. The test structures may be formed on the same body as the complete circuit or on additional bodies.Type: GrantFiled: October 3, 1994Date of Patent: November 19, 1996Assignee: Siemens AktiengesellschaftInventors: Heinz Zeininger, Werner M. Klingenstein