Patents Represented by Attorney, Agent or Law Firm Antonio R. Durando
-
Patent number: 7956630Abstract: An error correction for effective-wavelength variations is implemented by adjusting the filter parameters of the quadrature demodulation algorithm of a high definition vertical scanning process using a phase step that accounts for phase-step changes associated with variations in the effective wavelength irradiating the sample when the surface is curved. The nominal phase step is replaced in the filter with an actual phase step size that includes a phase parameter generated for each pixel by calibration or modeling of a specific type of surface. This substitution eliminates all errors produced by surface-dependent variations in the effective wavelength of the irradiating light.Type: GrantFiled: April 23, 2010Date of Patent: June 7, 2011Assignee: Veeco Instruments, Inc.Inventor: Dong Chen
-
Patent number: 7924505Abstract: A reflective surface and a beamsplitting surface are optically coupled to a mirror and to phase optics arranged in interleaver configuration so as to either reflect all light to a single output in an all-pass mode of operation, or to split the incoming beam and produce odd and even channel outputs in an interleaver mode of operation. The direction of the incoming beam is switched hitlessly between the reflective and beamsplitting surfaces by passing the incoming beam through a transparent slab coupled to a rotating mechanism.Type: GrantFiled: August 8, 2009Date of Patent: April 12, 2011Assignee: Optoplex CorporationInventor: Yung-Chieh Hsieh
-
Patent number: 7898672Abstract: An error correction for scanner position is implemented by adjusting the filter parameters of the quadrature demodulation module of an HDVSI algorithm using a reference signal from an independent position measurement device (PMD). The step size generated by the PMD at each scanner step is substituted for the nominal scanner step in the quadrature demodulation algorithm calculating phase and in the coherent envelope algorithm calculating peak. This substitution eliminates all errors produced by scanner nonlinearities. Furthermore, over the large number of steps carried out during a normal scanning range, random scanner-position errors (such as produced by vibration and other system noise) are automatically corrected by integration over their normal distribution around the noise-free position value. Therefore, a complete correction of scanner-position error may be achieved using the reference signal.Type: GrantFiled: April 15, 2008Date of Patent: March 1, 2011Assignee: Veeco Instruments, Inc.Inventor: Dong Chen
-
Patent number: 7885448Abstract: A microscope array with staggered rows of magnifying imaging systems is used to scan a biological tissue sample in a single linear pass to produce an image and corresponding optical-density data. A conventional computerized algorithm is used to identify, isolate and produce segmented images of nuclei contained in the image. The OD values corresponding to nuclear chromatin are used to identify numerical patterns known to have statistical significance in relation to the health condition of the biological tissue. These patterns are analyzed to detect pre-neoplastic changes in histologically normal-appearing tissue that suggest a risk for the development of a pre-malignant and a potentially malignant lesion. This information is then converted to a visually perceptible form incorporated into the image of the tissue sample and is displayed for qualitative analysis by a pathologist.Type: GrantFiled: February 27, 2007Date of Patent: February 8, 2011Assignee: DMetrix, Inc.Inventor: Peter H. Bartels
-
Patent number: 7864369Abstract: An imaging apparatus consists of multiple miniaturized microscopes arranged into an array capable of simultaneously imaging respective portions of an object. A continuous linear translation approach is followed to scan the object and generate multiple image swaths of the object. In order to improve the quality of the composite image produced by concatenation of the image swaths, the performance of each microscope is normalized to the same base reference for each relevant optical-system property. Correction factors are developed through calibration to equalize the spectral response measured at each detector, to similarly balance the gains and offsets of the detector/light-source combinations associated with the various objectives, to correct for geometric misalignments between microscopes, and to correct optical and chromatic aberrations in each objective.Type: GrantFiled: December 14, 2007Date of Patent: January 4, 2011Assignee: Dmetrix, Inc.Inventors: Artur G. Olszak, Chen Liang
-
Patent number: 7864433Abstract: An exemplary optical hybrid includes a 50/50 un-polarized beam splitter, a folding prism, a beam shifter, a spacer and a phase shifter such that from an input S-beam (signal) and an L-beam (reference), four outputs, S+L, S?L, S+jL and S?jL, are produced. The phase difference between the two components of each output beam produced by the S and L beams in the optical hybrid is ?+0, ?+90, ?+180, or ?+270 degrees, where ? is the phase difference of the signal beam with respect to the reference beam. In an alternative embodiment, the phase difference between the two components of each output beam produced by the S and L beams in the optical hybrid is ?+0, ?+X, ?+180, or ?+180+X degrees, where X is an arbitrary number of degrees greater than 0 and smaller than 180.Type: GrantFiled: July 7, 2009Date of Patent: January 4, 2011Assignee: Optoplex CorporationInventor: Yung-Chieh Hsieh
-
Patent number: 7864379Abstract: An array microscope scans a slide in rapid sequence at different wavelengths to record multiple spectral images of the sample. Full spatial resolution of the image sensor is realized at each color because pixels are not shared between spectral bands. The object and detector are placed at conjugate distances selected to produce substantially equal magnification with minimum chromatic aberration at all wavelengths to ensure registration of all images. Spectral analysis is carried out by combining the images captured at each wavelength. The greater-than-RGB spectral resolution provided by the combination of images enables the isolation and display of the effects produced by the contemporaneous use of more than two stains on a tissue for improved pathological analysis.Type: GrantFiled: December 23, 2006Date of Patent: January 4, 2011Assignee: DMetrix, Inc.Inventors: Artur G. Olszak, Chen Liang
-
Patent number: 7864430Abstract: In an optical etalon with a fixed FSR determined by the cavity length, the time delay is adjusted by an etalon surface coating. The proper cavity length is chosen to achieve a desired FSR, and the coating is independently selected to obtain a desired time delay.Type: GrantFiled: July 16, 2008Date of Patent: January 4, 2011Assignee: Optoplex CorporationInventor: Yung-Chieh Hsieh
-
Patent number: 7864327Abstract: Sinusoidal in-phase and in-quadrature signals at a given spatial frequency are combined with the irradiance signals generating a correlogram of interest and integrated over the length of the correlogram data-acquisition scan. The integration outputs are then used to calculate the amplitude and the phase of the correlogram signal at the selected spatial frequency, thereby producing targeted spectral information. The signal generator used to generate the in-phase and in-quadrature sinusoidal signals may be scanned advantageously through any desired range of spatial frequencies, thereby producing corresponding amplitude and phase spectral information for the correlogram. Because the procedure produces spectral information independently of the number of data frames acquired during the interferometric scan, it is materially more rapid than conventional FFT analysis.Type: GrantFiled: January 9, 2009Date of Patent: January 4, 2011Assignee: Veeco Instruments, Inc.Inventor: Dong Chen
-
Patent number: 7864380Abstract: In a scanning microscope, slides are fed automatically from a magazine to the imaging system. Each slide is labeled in some fashion with information for selecting the appropriate modality of operation of the scanner for that slide and the modality is implemented automatically. The information is preferably tied to and defined by a laboratory information system (LIS). For example, the instructions may regard the type of microscopy (i.e., trans- or epi-illumination), multi-spectral imaging with particular spectral bands combined with a particular set of z-positions, alternative filters, settings for the numerical aperture of the condenser, alternative detector operation for different resolutions, and alternative post-scan analyses of the data, as deemed optimal for the scan. The label may also contain the slide's identity, a pathologist's name, desired post-scan handling protocol, etc. The preferred array microscope to carry out the invention is also described.Type: GrantFiled: February 27, 2007Date of Patent: January 4, 2011Assignee: DMetrix, Inc.Inventors: Michael R. Descour, Artur G. Olszak, Andrew Lowe
-
Patent number: 7808715Abstract: An interferometer includes a means for splitting, at a splitting location, an input light beam into a first beam and a second beam; and means for recombining, at a recombination location, the first beam and the second beam. The interferometer is designed such that the first beam will travel a first optical path length (OPL) from the splitting location to the recombination location, and the second beam will travel a second OPL from the splitting location to the recombination location and such that when the input light beam has bean modulated at a data rate comprising a time interval, then the difference in optical path lengths between the first OPL and the second OPL is about equal to the time interval multiplied by the speed of light.Type: GrantFiled: March 11, 2009Date of Patent: October 5, 2010Assignee: Optoplex CorporationInventor: Yung-Chieh Hsieh
-
Patent number: 7808652Abstract: An explicit relationship is developed between the ratio of average interferometric modulation produced by diamond-like carbon (DLC)-coated magnetic-head surfaces and the thickness of the DLC layer. Accordingly, the thickness of the DLC layer is calculated in various manners from modulation data acquired for the system using object surfaces of known optical parameters.Type: GrantFiled: January 18, 2008Date of Patent: October 5, 2010Assignee: Veeco Instruments, Inc.Inventors: Florin Munteanu, Dong Chen, Erik Novak, G. Lawrence Best
-
Patent number: 7807232Abstract: In a continuous in-vacuum process for the manufacture of a film metallized with aluminum, the aluminum layer is exposed to a passivating agent, inline, immediately after deposition and prior to rewinding of the film onto a take-up roller. Passivation is carried out by plasma treatment in an oxidizing atmosphere (oxygen, nitrogen or others). The resulting product exhibits no peel-off problems during unwinding of the take-up roller and greatly improved corrosion resistance.Type: GrantFiled: October 25, 2006Date of Patent: October 5, 2010Assignee: Sigma Laboratories of Arizona, LLCInventors: Angelo Yializis, Michael Mikhael
-
Patent number: 7781034Abstract: A composite multi-layer barrier is produced by first vapor depositing a barrier under vacuum over a substrate and then depositing an additional barrier at atmospheric pressure in a preferably thermoplastic layer. The resulting multi-layer barrier is used to coat an article in a lamination process wherein the thermoplastic layer is fused onto itself and the surface of the article. The vacuum-deposited barrier may include of a first leveling polymer layer followed by an inorganic barrier material sputtered over the leveling layer and of an additional polymeric layer flash evaporated, deposited, and cured under vacuum. The thermoplastic polymeric layer is then deposited by extrusion, drawdown or roll coating at atmospheric pressure. The resulting multi-layer barrier may be stacked using the thermoplastic layer as bonding agent. Nano-particles may be included in the thermoplastic layer to improve barrier properties. A desiccant material may also be included or added as a separate layer.Type: GrantFiled: May 4, 2004Date of Patent: August 24, 2010Assignee: Sigma Laboratories of Arizona, LLCInventors: Angelo Yializis, Michael G. Mikhael
-
Patent number: 7777895Abstract: A phase-difference sensor measures the spatially resolved difference in phase between orthogonally polarized reference and test wavefronts. The sensor is constructed as a linear-carrier phase-mask aligned to and imaged on a linear-carrier detector array. Each adjacent element of the phase-mask measures a predetermined relative phase shift between the orthogonally polarized reference and test beams. Thus, multiple phase-shifted interferograms can be synthesized at the same time by combining pixels with identical phase-shifts. The multiple phase-shifted interferograms can be combined to calculate standard parameters such as modulation index or average phase step. Any configuration of interferometer that produces orthogonally polarized reference and object beams may be combined with the phase-difference sensor of the invention to provide single-shot, simultaneous phase-shifting measurements.Type: GrantFiled: May 8, 2007Date of Patent: August 17, 2010Assignee: 4D Technology CorporationInventors: Brian S. Medower, James E. Millerd
-
Patent number: 7754106Abstract: A release agent is flash evaporated and deposited onto a support substrate under conventional vapor-deposition conditions and a conductive metal oxide, such as ITO, is subsequently sputtered or deposited by reactive electron beam onto the resulting release layer in the same process chamber to form a very thin film of conductive material. The resulting multilayer product is separated from the support substrate, crushed to brake up the metal-oxide film into flakes, and heated or mixed in a solvent to separate the soluble release layer from the metallic flakes. Thus, by judiciously controlling the deposition of the ITO on the release layer, transparent flakes may be obtained with the desired optical and physical characteristics.Type: GrantFiled: June 7, 2006Date of Patent: July 13, 2010Assignee: Sigma Laboratories of Arizona, LLCInventors: Michael G. Mikhael, Angelo Yializis
-
Patent number: D629977Type: GrantFiled: April 20, 2010Date of Patent: December 28, 2010Assignee: Easycare, Inc.Inventor: Garrett N. Ford
-
Patent number: D630012Type: GrantFiled: June 15, 2010Date of Patent: January 4, 2011Inventor: Shifra Pomerantz
-
Patent number: D630841Type: GrantFiled: June 15, 2010Date of Patent: January 18, 2011Inventor: Shifra Pomerantz
-
Patent number: D639657Type: GrantFiled: March 23, 2010Date of Patent: June 14, 2011Inventors: Robert Q. Hoyt, Chase H. Hoyt