Abstract: A test apparatus comprising a plurality of test units that test a device under test; a plurality of housing sections that respectively house the test units therein; a plurality of opening/closing sections that are disposed respectively in the housing sections and that expose the test units to the outside or isolate the test units from the outside; and a control section that independently controls whether each of the opening/closing sections is allowed to be opened. The control section may allow test units that are not supplied with power to be exposed to the outside. For at least one of (i) a period during which one of the test units is performing a predetermined operation, (ii) a predetermined period before the period during which one of the test units is performing the predetermined operation, and (iii) a predetermined period after the period during which one of the test units is performing the predetermined operation, the control section may prohibit other test units from being exposed to the outside.

Abstract: Provided is a communication system comprising a host apparatus and an electronic device that is implemented in an apparatus that communicates with the host apparatus via a network. The electronic device includes an operation circuit that operates when the electronic device is implemented; a diagnostic circuit that tests the operation circuit; and a result transmitting section that transmits a test result obtained by the diagnostic circuit to the host apparatus via the network. The host apparatus includes a test information storage section that stores in advance test information indicating test content to be performed by the diagnostic circuit; and a test information transmitting section that, when the test information is requested by the electronic device, transmits the test information to the electronic device.

Abstract: A liquid crystal panel (11) includes, on an element substrate (20); a source wire (24); a gate wire (25) intersecting with the source wire (24); a TFT (27) arranged in the vicinity of the intersection of the source wire (24) and the gate wire (25); a pixel electrode (28) connected to the TFT (27); a capacitance wire (26) arranged in parallel with the gate wire (25) so as to form a capacitance between the capacitance wire (26) and the pixel electrode (28); a branch wire (36) branching off from the capacitance wire (26) and arranged parallel to the source wire (24) so as to overlap at least partially the source wire (24) through a gate insulating film (31); and an auxiliary wire (39) disposed between the branch wire (36) and the gate wire (25) and arranged in parallel with the source wire (24) so as to overlap at least partially the source wire (24) through the gate insulating film (31).

Abstract: A computer input device (e.g. a mouse) with a finger-triggered sensor is described. The sensor generates input signals in addition to the conventional mouse signals generated by click buttons, tracking device and scrolling wheel. The sensor may be an optical sensor, a touch-sensitive sensor or other types of sensors. The signals generated by the sensor, either alone or in combination with other signals generated by the buttons, tracking device or scrolling wheel, may be interpreted to generate various messages for the operating system and/or application programs. The interpretation may be performed by a circuit on the input device, by a driver program on the host computer, or both. The sensor may be provided on a mouse, a laptop keyboard that has a pointing device, an external keyboard equipped with a pointing device, or on a stand-alone device that can be electrically connected to a computer through its available ports.

Abstract: Even pressure is applied to a mounting target, even in a case where electronic components having different heights from each other are attempted to be mounted to a substrate, or in a case where an electronic component is attempted to be mounted to a substrate whose rear surface is provided with another electronic component. A mounting device 100 includes a lower pressurizing section 102 as a first pressurizing section and an upper pressurizing section 104 as a second pressurizing section, and pressurizes a substrate, a plurality of electronic components, and the like, sandwiched between the lower pressurizing section 102 and the upper pressurizing section 104, thereby mounting the substrate to the plurality of electronic components. The lower pressurizing section 102 or the upper pressurizing section 104 includes a dilatancy fluid 116.

Abstract: A method for compensating for color variations introduced by printer hardware limitations and other factors is described. First, for each printer model or each individual printer, the extent of color variation throughout a printed page is determined. Based on this determination, each page is partitioned into a plurality of image areas. Then, in an actual printing process, the page of image is printed in a multi-pass process where each image area is printed in a separate pass. The digital image data is shifted and/or rotated for each pass, and the paper is shifted and/or rotated correspondingly, so that the different image areas printed in different passes form a complete image on the final printed page. From the standpoint of the pointer hardware, all passes involve printing the same area of a physical page, resulting in reduced color variation across the page.

Abstract: Provided is a semiconductor element in which decrease in reliability of wiring is suppressed. A driver IC (10) has a plurality of output bumps (12) arranged in the direction (direction A) along the long sides (11a and 11b). The output bumps include a plurality of source bumps (12a) arranged near the center section of the long side, and a plurality of gate bumps (12b) arranged towards the end portions of the long side. The source bumps are arranged close to the long side (11a), and the gate bumps are arranged closer to the long side (11b) than the source bumps.

Abstract: Provided is a test apparatus that tests a device under test including an external interface circuit that transfers signals between an internal circuit inside a device and the outside of the device, the test apparatus comprising a pattern generating section that inputs, to the external interface circuit, a test pattern for testing the external interface circuit; an interface control section that causes the external interface circuit to loop back and output the test pattern; and an interface judging section that judges acceptability of the external interface circuit based on the test pattern looped back and output by the external interface circuit.

Abstract: A method for managing a plurality of print jobs is implemented in a print job management apparatus connected to printers. The method includes receiving print job, and visually presenting a display screen to a user, the display screen including first, second and third panels for classifying the received print jobs according to processing phase thereof, the first panel being provided for listing print jobs that are awaiting assignment of printers thereto for processing the print jobs, the second panel being provided for listing print jobs that have been assigned to printers and that have not been completed by the assigned printers, the third panel being provided for listing at least one of first and second categories of print jobs, the first category including print jobs that have been completed, the second category including print jobs that have been cancelled.

Abstract: Provided is a signal output control section that inputs to a digitizer a reference signal whose frequency changes at each prescribed measurement cycle; a data extracting section that extracts a number of pieces of data corresponding to an integer multiple of a period of the reference signal in each measurement cycle, from pieces of data of a reference digital signal output by the digitizer according to the reference signal that come after a prescribed wait interval has passed since an initiation timing of each measurement cycle; a distortion identifying section that calculates the non-linear distortion caused by the digitizer for each frequency of the reference signal, based on the data in each measurement cycle extracted by the data extracting section; and a distortion calculating section that calculates the non-linear distortion caused by the digitizer when the analog signal input to the digitizer has a frequency that differs from any of the plurality of frequencies at which the reference signal transitions

Abstract: A wafer unit for testing is electrically connected to a plurality of chips to be tested formed on a wafer to be tested, the wafer unit for testing including: a connecting wafer provided to face the wafer to be tested, and to be electrically connected to each of the plurality of chips to be tested; and a temperature distribution adjusting section provided on the connecting wafer, and to adjust a temperature distribution of the wafer to be tested.

Abstract: An acoustic wave device includes: a piezoelectric substrate; at least five IDTs (InterDigital Transducers) arranged on the substrate in directions of SAW (Surface Acoustic Wave) propagation; and two balanced terminals connected to two first IDTs that are two out of the at least five IDTs and are 180 degrees out of phase. One of a pair of comb electrodes of one of the two first IDTs is connected to one of the two balanced terminals, and one of a pair of comb electrodes of the other one of the two first IDTs being connected to the other one of the two balanced terminals. The other comb electrodes of the two first IDTs are connected in series, and one of a pair of comb electrodes that form an IDT that is included in the at least five IDTs and is not connected to the two first IDTs is grounded.

Abstract: A test apparatus testing a device under test includes a main pattern generating section that generates a main pattern, a plurality of sub-pattern generating sections each of which generates a sub-pattern corresponding to a different one of segment cycles based on a main pattern, the segment cycles formed by dividing a test cycle period, a test signal supplying section that supplies, to the device under test, a multiplexed test pattern formed by switching sub-patterns generated by the plurality of sub-pattern generating sections at each of the segment cycles, and a plurality of delay selecting sections each of which selects one of a main pattern that is from the main pattern generating section and a delayed main pattern that is formed by delaying the main pattern from the main pattern generating section by a test cycle, to supply the selected one to the corresponding sub-pattern generating section.

Abstract: A Josephson quantum computing device and an integrated circuit using Josephson quantum computing devices which can realize a NOT gate operation controlled with 2 bits will be provided. The Josephson quantum computing device (1) comprises: a superconducting ring member (10) having a ?-junction (6) and a 0-junction (7); and a quantum state detecting member (20) constituted by a superconducting quantum interference device arranged outside of the superconducting ring member, wherein a bonding and an antibonding state brought about by a tunneling effect between a |?> and a |?> state as two states degenerate in energy of the superconducting ring member (10) are regarded as quantum bits. The bonding and antibonding states as the quantum bits are read out by the quantum state detecting member (20). The two bit controlled NOT gate operation can be performed by the two quantum bits comprising said quantum bits.

Abstract: There is provided a light receiving device including a polarization dispersing section that disperses a polarization direction of incoming light into a plurality of polarization directions, a light collecting section that has a metal pattern shaped like concentric circles on a surface thereof, where the light collecting section collects light that has passed through the polarization dispersing section, and a light receiving section that receives the light collected by the light collecting section. Also provided are a light receiving device manufacturing method and a light receiving method. The light collecting section may have a surface plasmon antenna that has the metal pattern shaped like the concentric circles on a surface thereof, and the light receiving section may receive the light collected toward a center of the concentric circles of the metal pattern of the light collecting section, through a hole at the center of the concentric circles, on a rear side of the light collecting section.

Abstract: A duplexer with a reduced filter loss is provided. The duplexer includes two or more filters F1 and F2 that are connected to a common terminal and that have different passbands. At least one of the filters F1 and F2 includes a plurality of series resonators S1 to Sn connected in series to a path between an input terminal and an output terminal of the filter, and parallel resonators P1 to Pm connected in parallel to the above-mentioned path. An inductance L1 is connected in parallel to at least one of the series resonators, and the series resonator S1 having the inductance L1 connected in parallel thereto is divided into a plurality of resonators S11 to S13 connected in series.

Abstract: There is provided a sequence control apparatus for outputting a sequence of control signals to operate a control target, including a sequence storing section that stores thereon sequence data in association with each state received from outside, where the sequence data includes a plurality of control signals to be sequentially supplied to the control target and a plurality of pieces of time interval information designating time intervals during which the plurality of control signals are respectively kept supplied to the control target, a sequence data selecting section that, on reception of a state from the outside, selects sequence data associated with the state, a sequence reading section that sequentially reads the plurality of control signals and the plurality of pieces of time interval information included in the selected sequence data and sequentially supplies the plurality of control signals to the control target, and a time control section that refers to the plurality of sequentially read pieces of ti

Abstract: Provided is a test apparatus that tests a device under test, comprising a waveform generator that generates a test signal to be supplied to the device under test; a digitizer that measures a response signal output by the device under test; a judging section that judges acceptability of the device under test based on the measurement result of the digitizer; and a loop-back path that connects an output terminal of the waveform generator to an input terminal of the digitizer when calibration is performed for the waveform generator and the digitizer. The loop-back path includes a noise removal filter that eliminates a noise component from a signal passed therethrough; and a path switching section that connects the waveform generator to the digitizer via the noise removal filter when the digitizer is being calibrated, and connects the waveform generator to the digitizer without including the noise removal filter therebetween when the waveform generator is being calibrated.

Abstract: In a print shop system including a plurality of printers and a print shop management server which manages print jobs, an improved method is described for detecting color components in a document page for purposes of assigning the document to appropriate printers for printing. First, each page element is analyzed without rasterizing the page. If a raster image is colored, its location and size are added to an image information list. If a non-raster graphical element overlaps a raster image previously stored in the image information list, the overlapped raster image is removed from the list. After analyzing all page elements of the page, if any raster image remains in the image information list, the page is marked as colored. Otherwise, the page is rasterized to detect colored using a conventional method. The resolution used for page rasterization may be controlled by a user.

Abstract: Provided is a test apparatus for testing a device under test, including: a level comparing section that receives a signal under test output from the device under test and outputs a logical value, the logical value indicating a comparison result obtained by comparing a signal level of the signal under test with preset first threshold and second threshold; an acquiring section that acquires the logical value output from the level comparing section, according to a strobe signal supplied thereto; an expected value comparing circuit that determines whether the logical value acquired by the acquiring section corresponds to a preset expected value; and a threshold control section that sets an upper limit and a lower limit of a voltage of the eye mask to the level comparing section as the first threshold and the second threshold, when an eye mask test is performed for determining whether an eye opening of the signal under test is larger than a predefined eye mask.