Abstract: A mask is reused to form the same pattern in multiple layers in semiconductor processing. Reference marks that allow alignment accuracy to be checked are also formed with the mask. The manner of using the mask advantageously mitigates interference between reference marks in different layers.

Abstract: A storage system includes a storage operating system configured to provide two-step data deduplication in which, during a data storage operation and prior to committing data to a storage medium of the storage system, context-aware data deduplication is performed on the data to obtain context-aware deduplicated data, and, subsequent to committing the context-aware deduplicated data to the storage medium, a context-independent data deduplication operation is performed on the context-aware deduplicated data to obtain context-independent deduplicated context-aware deduplicated data, for commitment to the storage medium.

Abstract: A device and method for facilitating compliance with a medication regimen are disclosed. The device incorporates an icon set that illustrates concepts relating to the medication regimen in a pictographic form that is easily recognized and comprehended. The device is programmed with medication instructions, and generates medication reminders for the medication instructions by displaying icons from the icon set. The device may additionally display text, play audio, vibrate, send text messages to other devices, etc. The device may accept input from the individual and/or caregiver regarding the medication instructions or the medication events. The device may also contain the medication, control access and dosing of the medication, and administer the medication to the individual. The device may also communicate information regarding the medication regimen to the caregiver, such as prescription renewal requests.

Abstract: A virtual user interface allows a collection or cluster of data storage devices (nodes of the cluster) to be managed remotely by providing access to cluster management software running on one or more nodes of the cluster. Moreover, the virtual user interface fails-over, such that, if a node hosting an instance of the virtual user interface is unable to continue hosting (e.g., communication becomes unreliable, hardware failure, etc.), the hosting duties are substantially automatically migrated to another node in the cluster. Further, failover rules are substantially automatically organized at an initiation of the cluster, and adjusted in accordance with ongoing events occurring in the cluster to provide an administrator with substantially seamless cluster management capabilities.

Abstract: Test structures are formed during semiconductor processing. The test structures allow performance characteristics to be monitored as the process proceeds. The test structures are formed with a single mask that is used in a manner that also allows alignment marks to be formed which do not interfere with one another as subsequent levels are patterned. The manner of using the mask also allows different types of test structures having different features to be formed. The different types of test structures can provide insight into performance characteristics of different types of devices.

Abstract: A virtual machine can be migrated from a first physical server to a second physical server. Rebaselining of the virtual machine after migration can be mitigated, thereby mitigating recopying of the virtual machine's data to a second location on a backup data store, for example. A unique identifier for the virtual machine is used to determine if it has been migrated to another physical server. If a migration is detected, it is determined whether the virtual machine had a data store backup relationship prior to the migration. If a prior data backup relationship is detected, this prior relationship is used for the virtual machine at its migrated location on the second physical server for subsequent data backups. Conformance testing is used to mitigate multiple data backups of the VM, comprising data backups to a data store for both the first and second VM hosting servers.

Abstract: A core file that may be generated when a data storage system encounters a problem can be automatically and securely sent to a remote (e.g., offsite) support enterprise. Moreover, given the size of such files and the additional requirements associated with sending such files securely, the transmission of the core file may be monitored such that, if a problem occurs during the transmission, the pieces of the file that have been successfully transmitted are not resent, but merely those pieces that still need to be (successfully) transmitted. In this manner, the time and resources required to securely transmit such large files are more efficiently utilized.

Abstract: Different types of test structures are formed during semiconductor processing. One type of test structure comprises features that are aligned with one another and that are formed from different layers. Other types of test structures comprise features formed from respective layers that are not aligned with other test structure features. The different types of test structures are formed with a single mask that is used in a manner that also allows alignment marks to be formed which do not interfere with one another as subsequent layers are patterned. The different types of test structures can provide insight into performance characteristics of different types of devices as the semiconductor process proceeds.

Abstract: An apparatus and method for rapidly resuming the processing of client requests after a system failure event are disclosed. Accordingly, a surviving storage system, upon detecting a system failure event at a partner storage system, executes a takeover routine and conditions its system memory to reflect the state of the system memory of the failed storage system by processing client requests or commands stored in an operations log mirror. Then, the storage system converts the unused portion of the log mirror for use as an operations log, and resumes processing client requests prior to flushing any data to storage devices.

Abstract: A method to form a vertical interconnect advantageous for high-density semiconductor devices. A conductive etch stop layer, preferably of cobalt silicide, is formed. The etch stop layer may be in the form of patterned lines or wires. A layer of contact material is formed on and in contact with the etch stop layer. The layer of contact material is patterned to form posts. Dielectric is deposited over and between the posts, then the dielectric planarized to expose the tops of the posts. The posts can serve as vertical interconnects which electrically connect a next conductive layer formed on and in contact with the vertical interconnects with the underlying etch stop layer. The patterned dimension of vertical interconnects formed according to the present disclosure can be substantially the same as the minimum feature size, even at very small minimum feature size.

Abstract: A nonvolatile memory cell having a contact area between a phase-change material such as a chalcogenide and a heat source which is smaller than photolithographic limits is described. To form this cell, a conductive or semiconductor pillar is exposed at a dielectric surface and recessed by selective etch. A thin, conformal layer of a spacer material is deposited on the dielectric top surface, the pillar top surface, and the sidewalls of the recess, then removed from horizontal surfaces by anistropic etch, leaving a spacer on the sidewalls defining a reduced volume within the recess. The phase change material is deposited within the spacer, having a reduced contact area to the underlying conductive or semiconductor pillar.

Abstract: One or more diffusion barriers are formed around one or more conductors in a three dimensional or 3D memory cell. The diffusion barriers allow the conductors to comprise very low resistivity materials, such as copper, that may otherwise out diffuse into surrounding areas, particularly at elevated processing temperatures. Utilizing lower resistivity materials allows device dimension to be reduced by mitigating increases in resistance that occur when the size of the conductors is reduced. As such, more cells can be produced over a given area, thus increasing the density and storage capacity of a resulting memory array.