Abstract: A single optical fiber is placed at or near the nadir of the curvilinear section of the optical surface of a light emitting device. The LED element illuminates the bar code characters on the surface of the object being read, and the reflected light is transmitted up the optical fiber to a sensory means or the like. The elements are encased in an optical plastic medium for strength and durability, and resistance to environmental extremes.

Abstract: A data display and management system includes a microprocessor whose functions are implemented by instructions in data from a directly connected main memory. A mass data storage memory is connected to the main memory and has permanently stored instructions therein for the microprocessor. A display control system which operates asynchronously with the microprocessor includes a display controller, display memory, character memory means, and a visual character attribute generator. By linking one or more row attribute bytes, or pointers, to each row of characters stored in the display memory the display controller performs character and row manipulation on a display device without transferring whole blocks of data in the display memory. Multi-region display segmentation into horizontal and vertical split regions, smooth or discrete scrolling of individual regions, and various editing functions are achieved by modifying the associated display memory pointers.

Abstract: A circuit and a method of operation thereof are disclosed which provides an enhanced test feature for programmable logic arrays. Programmable logic arrays (PLA's) are becoming more complex and many utilize feedback into the array as part of their normal logic function. Those devices utilizing feedback require an abnormally large number of logic cycles to be run in order to provide a known feedback input into the output circuitry so that the combination of all input signals into the array is known. The preload circuit disclosed herein provides a method of applying a known signal to the feedback circuitry, thereby reducing the number of cycles required to complete a test function as well as reducing the number of pins required for the test feature. The circuit is readily fabricated in an integrated circuit form in conjunction with the PLA circuitry. The test circuitry is readily adapted to high speed automated test equipment.

Abstract: A buried n-channel junction field-effect transistor (JFET) fabricated in standard bipolar integrated circuit starting material. The transistor has a deep p-well as the bottom gate formed in an n-type body. The source is surrounded by the p-well while the drain is the epitaxial layer near the surface of the body outside the p-well. A buried channel connects the source and drain. A p-layer above the buried channel forms the top gate. Gate leakage current and noise are very low.

Abstract: A bipolar logic gate formed in an isolated N-type epitaxial layer in an integrated circuit device includes a normally operated vertical NPN switch transistor clamped by an inversely operated NPM clamp transistor. The base of the clamp transistor is formed by a high energy boron ion implant into a portion of the N-type epitaxial layer extending through the P-type base of the switch transistor. Multiple outputs are provided by Schottky barrier diodes formed on the N-type epitaxial layer.

Abstract: Monolithic integration of digital logic circuitry, precision control circuitry, and high voltage interface circuits on the same semiconductor chip is achieved, using various combinations selected from D-MOS, vertical NPN, lateral NPN, PNP, P-MOS, N-MOS, and J-FET components. Cathode driver circuits for a plasma display panel are integrated with this technology. Other applications include automotive and television circuits.

Abstract: A nonvolatile semiconductor memory device formed of a plurality of memory cells arranged in a matrix pattern includes a plurality of reference cells, a reference voltage supply, and differential type sensing amplifiers connected to output lines of the memory cells and to an output line of the reference cells. In one embodiment the storage capability of each memory cell is tested by comparing the cell voltage to the reference voltage by selectively connecting the reference cell output line with the sensing amplifier associated with the column containing the cell under test. A memory cell is determined to be defective when the difference between the cell voltage and the reference voltage, that is, the output of the differential sensing amplifier, is below a predetermined value.

Abstract: In order to produce wafers suitable for fabrication of integrated circuits, an ingot of raw silicon must undergo a process which includes several steps. The ingot must be sawed into slices, the slices edge ground to remove roughness of the edges, lapped to remove as much saw damage as possible, stress relief etched to remove as small a damaged area as possible, then polished. Each of these steps requires removal of some of the material of the slice. The use of laser annealing reduces the amount of surface removed, as it repairs some surface damage, smoothes the surface, and when accomplished in a partial vacuum, improves the chemical composition of the material as related to electrical activity.

Abstract: A display control system which operates asynchronously with a microprocessor includes a display controller, display memory, character memory means, and a visual character attribute generator. By linking one or more row attribute bytes, or pointers, to each row of characters stored in the display memory the display controller performs character and row manipulation on a display device without transferring whole blocks of data in the display memory. Multi-region display segmentation into horizontal and vertical split regions, smooth or discrete scrolling of individual regions, and various editing functions are achieved by modifying the associated display memory pointers. In one embodiment the display controller is a single integrated circuit device.

Abstract: A circuit and a method of operation thereof are disclosed to compensate for second order non-linearities in bandgap voltage references. The circuit is readily fabricated as an integrated circuit in conjunction with circuitry utilized to correct linear variations. The circuit accurately compensates for the non-linear bow effect over a temperature range of -55.degree. C. to +150.degree. C.

Abstract: Control signals are transmitted through a.c. mains supply lines to control operation of electrical equipment powered from the supply lines. A near short-circuit condition is introduced across the a.c. mains supply lines, for example, by firing a thyristor connected in series with a fuse across the supply lines, for the final portion of positive half cycles of the mains supply voltage, thus holding the voltage to a near zero value for this length of time. A receiver coupled to the mains supply lines includes a zero crossing detector circuit which responds to the near zero voltage conditions across the supply lines to perform a particular control operation on an associated appliance connected to the receiver. Different control operations may be effected by defining the control signals over a group of half cycles of the a.c.

Abstract: A monitor for optimizing the ultrasonic bonding of materials by analyzing the impedance of an ultrasonic transducer used to effect the bond. The electrical impedance of the transducer, which is proportional to its mechanical impedance, is determined by applying an ultrasonic voltage thereto and monitoring the resultant change in current amplitude. A pair of differentiators produces a second derivative signal of the impedance with respect to time, with a negative-going zero crossing of this signal corresponding to completion of the bond. Loss of wire, mechanical malfunctions and improper bonds are also detected by the monitor, to form a real time quality control system.

Abstract: A machine for sharpening circular saw blades includes a pneumatically operated indexing mechanism, with the indexing mechanism being responsive to the position of a grinding mechanism which moves perpendicular to the plane of the saw blade to engage the cutting surface of a tooth.

Abstract: A circuit arrangement for controlling the operating functions in a device such as a broadcast receiver, including an up/down counter associated with each operating function wherein a particular count corresponds to a certain setting of the operating function. Switch means coupled by a single conductor to the common inputs of two threshold-value circuits provide one of several voltages thereto which cause one or the other or neither of the threshold-value circuits to output a control signal to the up/down center, which in turn counts up, down, or remains at the same count.

Abstract: A negative, high energy radiation resist based on styrene-allyl methacrylate copolymers and substitutional modifications thereof, yielding a linear copolymer with highly sensitive allyl pendant groups together with a thermally stable, solvent resistant backbone. This resist exhibits improved e-beam sensitivity without the attendant problems of swelling during development and flow during heat processing.

Abstract: Apparatus suitable for use with teletext display apparatus which is arranged to operate in a plurality of display modes, including a graphic display mode, in response to digital coded control signals, and to display in each mode digital coded data signals which provide the display information for the viewer. The digital coded control signals are interspersed among the digital coded data signals, with the result that no display information is normally available when a digital coded control signal is present, but the apparatus is so arranged that, in the graphics display mode, the digital coded, data signal which arrived immediately before the digital coded control signal is held over, and used to fill in the blank space that would correspond to the presence of the digital coded control signal. `Hold over` is effected by arranging that a current data signal is held in a data store, and that the stored data is pushed out only by a subsequent data signal.