Abstract: A process for manufacturing electroluminescent lamps using a laser beam to remove a material layer of a multi-layer material structure, in which the laser beam has a first energy level directed at a first material layer, e.g., a conductor, laid over a second material layer, e.g., an insulator/substrate. The laser beam is moved in an overlapping fashion such as spiral pattern motion across the first material layer. A part of the first material layer is sublimed exposing a region of the second material under the area where the spiral pattern was applied. Additionally, a second laser beam having a second energy level, e.g., higher than the first energy level, is moved along a path over the exposed second material layer subliming the remaining underlying layers to form the final lamp shape.

Abstract: An x-ray diffraction system for determining stress in integrated circuit materials includes a source of x-rays (3) that are directed toward a sample holding mechanism for diffracting from the test sample (8). An x-ray detector (14) is arranged for detecting high back reflected diffracted x-ray intensity data representing stress in the test sample. A two-dimensional detection and storage arrangement (24) is arranged for detecting and storing the data representing stress in the test sample. A data processor (2) accesses the stored data from the two-dimensional detection and storage arrangement and processes the data representing stress in the test sample to determine stress in the test sample.

Abstract: A whole body stereotaxis apparatus comprising a base plate (2) to accommoe a patient, two side strips (4, 6) which are attached to the base plate (2) at the marginal or side edges thereof and laterally delimit the base plate (2) and to which arches (10, 12) extending over the base plate (2) can be attached, characterized in that a central strip (8) is mounted on the base plate (2) and comprises bores (22) to accommodate accessories.