Patents Represented by Attorney Fleshner & Film, LLP

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  • Device for compensating for a test temperature deviation in a semiconductor device handler
    Patent number: 6861861
    Abstract: A semiconductor device handler is provided, in which a test temperature deviation of a semiconductor device caused by heat produced by the semiconductor device itself during testing is compensated for, allowing a test of the semiconductor device to be carried out at an exact temperature, or within an exact temperature range.
    Type: Grant
    Filed: February 14, 2003
    Date of Patent: March 1, 2005
    Assignee: LG Electronics Inc.
    Inventors: Jae Myeong Song, Chul Ho Ham, Chan Ho Park, Eui Sung Hwang, Woo Young Lim, Jae Bong Seo, Eung Yong Lee, Byeng Gi Lee