Abstract: The present invention provides dynamic control of back gate bias on pull-up pFETs in a FinFET SRAM cell. A method according to the present invention includes providing a bias voltage to a back gate of at least one transistor in the SRAM cell, and dynamically controlling the bias voltage based on an operational mode (e.g., Read, Half-Select, Write, Standby) of the SRAM cell.
Type:
Grant
Filed:
April 12, 2006
Date of Patent:
March 23, 2010
Assignee:
International Business Machines Corporation
Inventors:
Rajiv V. Joshi, Keunwoo Kim, Edward J. Nowak, Richard Q. Williams