Abstract: A system for synchronizing chaotic transmitters and receivers that is less sensitive to channel effects than other known chaotic communication methods. The system employs duplicate transmitter and receiving modules and in addition to the chaotic output a synchronizing signal which occupies a reduced bandwidth. The small bandwidth affords the system a greater resistance to the affects of frequency dependent channel distortion and noise. The broad band chaotic signal is transmitted and appears to be noise to an unauthorized listener. The receiving unit employs band pass filtering, and when the signal is received the receiver filters the chaotic signal through band pass filters which eliminate channel noise and make gain control easier to implement.

Abstract: An apparatus for measuring local carrier concentration in a preselected area of a semi-conductor is shown and described. An exciting light (preferably a laser) alters the sample's band-gap by photo injecting electron hole pairs in the area being measured. Because of the Franz-Keldysh effect, the photo injected carriers alter the sample's reflectivity. An optical fiber conducts a broad band source of probing light to the excited area on the sample. The sample reflects some of the broad band light back into a fiber that conducts the reflected light to an optical analyzer. The optical analyzer includes a dispersive element that disperses the reflected light onto a linear array of detectors. The analyzer thus simultaneously samples multiple wavelengths in the reflected spectrum. From the resulting samples, a computer deconvolutes the spectral line shape into a measurement of the local electric field and the local carrier concentration.

Abstract: A method and apparatus to use an Atomic Force Microscope to take measurements of surface forces, indentation, adhesion and mechanical properties such as hardness and elasticity. The force between a probe mounted cantilever and a sample is measured as a function cantilever deflection measured by a electron tunneling microscope. The sample and the tip of the tunneling microscope are each mounted on piezoelectric manipulators which provide for position control. Position of the sample and probe are measured from the voltages applied to the piezoelectric manipulators. Penetration is determined by the relative motion between the probe and sample. Presently, this invention has a force resolution of 1 nN and a depth resolution of 0.02 nm.

Abstract: A combination of optical interconnect technology with superconducting matal to form a superconducting neural network array. Superconducting material in a matrix has the superconducting current decreased in one filament of the matrix by interaction of the Cooper pairs with radiation controlled by a spatial light modulator. This decrease in current results in a switch of current, in a relative sense, to another filament in the matrix. This "switching" mechanism can be used in a digital or analog fashion in a superconducting computer application.

Abstract: A combination of optical interconnect technology with superconducting matal to form a superconducting neural network array. Superconducting material in a matrix has the superconducting current decreased in one filament of the matrix by interaction of the Cooper pairs with radiation controlled by a spatial light modulator. This decrease in current results in a switch of current, in a relative sense, to another filament in the matrix. This "switching" mechanism can be used in a digital or analog fashion in a superconducting computer application.