Patents Represented by Attorney Lathop & Gage LLP

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  • Medical device durability test apparatus having an integrated particle counter and method of use
    Patent number: 7621192
    Abstract: Apparatuses and methods for determining particle shed rates of implantable or inter-dwelling devices are disclosed. Durability test apparatuses with integrated particle counters produce time-dependent particle shed rate profiles. The apparatuses are designed to accommodate pulsatile flow, resembling a heartbeat at the implantable device. In an embodiment, the pulsatile flow is converted to a steady flow before fluid enters the integrated particle counter.
    Type: Grant
    Filed: July 28, 2006
    Date of Patent: November 24, 2009
    Assignee: Dynatek Laboratories, Inc.
    Inventors: James C. Conti, Elaine R. Strope
  • Award display
    Patent number: D612288
    Type: Grant
    Filed: August 13, 2008
    Date of Patent: March 23, 2010
    Inventor: Steve Finneseth