Patents Represented by Law Firm Muramatsu & Associat
  • Semiconductor integrated circuit evaluation system
    Patent number: 6061283
    Abstract: A semiconductor integrated circuit evaluation system for evaluating, at high speed, functions of a device under test and a test pattern for testing the device under test without using an actual tester or designed device.
    Type: Grant
    Filed: October 23, 1998
    Date of Patent: May 9, 2000
    Assignee: Advantest Corp.
    Inventors: Koji Takahashi, Hiroaki Yamoto, Hidenobu Matsumura