Abstract: A method and system for reproducing digital data read from a storage device. A second-order differentiation of a digital signal representing the digital data is calculated to control an automatic gain control (AGC) and phase lock loop (PLL) to rapidly correct amplitude and frequency offset of the digital signal being read from the storage device.

Abstract: A method for magnetically measuring the magnetic read width (MRW) of magnetic recording heads having a track width that is equal or smaller than the wavelength of visible light is provided. The heads comprise a magnetic read head spin valve sensor and the magnetic read head sensor signal is used to derive an unknown track width from comparing to the sensor response of a known track width. Using this method, track widths in the regions at the wavelength of light and below (<500 nm) can be directly measured without destroying the respective sensor material.

Abstract: The present invention concerns at least an antiferromagnetic layer, which is in direct contact with a ferromagnetic layer for inducing an exchange bias in the ferromagnetic layer. Thus, the ferromagnetic layer is pinned by the antiferromagnetic layer, also referred to as the pinning layer. The antiferromagnetic or pinning layer comprises a compound from the group of orthoferrites, which show a variety of advantages. For example, these antiferromagnets can have a Néel temperature TN ranging from at least 623 K to 740 K depending on the compounds, and they can display a weak ferromagnetic moment. Therefore, a magnetic device comprising the mentioned structure can be used properly in an environment of a high operating temperature. The compound can be described by the formula RFe1−xTMxO3with R a rare earth element or Yttrium, and TM a transition metal which can be one element of the groups IB to VIII.

Abstract: A jig for inspecting the appearance of small parts with an optical microscope, the jig is equipped with a base, having an upper flat surface which becomes a mounting stage of the optical microscope, and is also provided with a member for moving the upper flat surface at least in a direction approximately parallel to a direction of an optical axis of an objective lens of the optical microscope in order to focus the optical microscope on an inspection portion of the small parts mounted on the upper flat surface. The jig is also equipped with an inspection-object supporting portion, provided with a member for supporting the small parts at the predetermined portion on the base. Furthermore, the jig is equipped with reflecting mirrors which have a mirrorlike surface with an inclined angle of approximately 45 degrees to the upper flat surface of the base.