Abstract: A method of reticle inspection, comprising generating a test reticle comprising a plurality of test pattern-features thereon; manufacturing a wafer using the reticle; and determining a transfer of at least one of said plurality of pattern features from said reticle to said wafer. Preferably, a neural network is trained using the determination. Preferably, a reticle is inspected by running detected defects through the neural network to determine if the detected defect has a consequence.

Abstract: A circuit board for mounting a bare chip in the form of a flip chip. A metallic foil for protecting circuits in a state insulated therefrom is arranged in an area where the bare chip is located.

Abstract: A charged particle beam column comprises: a particle source; an objective lens; a pre-lens deflection unit for deflecting a beam of charged particles away from the optical axis on such a path that the combined action of the objective lens and the pre-lens deflection unit directs the beam of charged particles towards the optical axis to hit the specimen surface from a first direction; and an in-lens deflection unit arranged in the vicinity of the objective lens for redirecting the deflected beam of charged particles on such a path that the combined action of the objective lens and the in-lens deflection unit redirects the beam of charged particles towards the optical axis to hit the specimen surface under said large beam landing angle from a second direction substantially opposite to said first direction.

Abstract: A process for producing an intravenously-administrable gamma globulin solution substantially free of contaminating viruses by fractionating an impure gamma globulin solution and then treating the purified gamma globulin, with a solvent-detergent for viral inactivation and a heat treating for viral inactivation. Thereafter, denatured impurities, residual solvent and aggregate generated by the heat treatment are removed from the gamma globulin.

Abstract: For measuring the volume, the process utilizes the same means as are used for reading an optical code, such as a laser scanner or CCD reader. A choice of different measuring procedures are proposed which suit different situations and are all based on scannings and readings performed on the object. Where required, the process can accommodate the inclination angles of the scan planes. The volume measurement is accompanied by the reading of an optical code provided on the object.

Abstract: A method and apparatus for reducing speckle during inspection of articles used in the manufacture of semiconductor devices, including wafers, masks, photomasks, and reticles. The coherence of a light beam output by a coherent light source, such as a pulsed laser, is reduced by disposing elements in a light path. Examples of such elements include optical fiber bundles; optical light guides; optical gratings; an integrating sphere; and an acousto-optic modulator. These various elements may be combined as desired, such that light beams output by the element combinations have optical path length differences that are greater than a coherence length of the light beam output by the coherent light source.

Abstract: An image display device is provided which comprises an antiglare surface having unevenness and pixels having a minimum pixel pitch (a) of about 10 to about 100 &mgr;m, wherein a ratio (Sm/a) of an average spacing of roughness peak (Sm) of said unevenness to the minimum pixel pitch (a) is about 0.4 or smaller. In the image display device, the generation of “glittering” can be restrained.

Abstract: A method and system for automatic EDX analysis of defects quantitatively take into consideration x-ray signals attributable to the background. The method and system are capable of automatically identifying suitable locations for background and defect x-ray sampling. The method and system are also capable of effectively and quantitatively, rather than qualitatively, removing signals attributable to the background and not the defect. One advantageous feature that enables the method and system to have a high throughput is termed “trace element analysis.” The method and system are particularly beneficial for analysis of defects on semiconductor wafers and, due to automation, are suitable for in-line inspection of wafers in the fabrication plant.

Abstract: The present invention provides a next stage buffer receiving a pair of complementary signals from a flip-flop in a latch sense amplifier circuit, wherein the next stage buffer comprises: a plurality of logic gates of the same type, each of which individually includes a series connection of at least an individual first conductivity type field effect transistor individually provided to the plurality of logic gates and a common first conductivity type field effect transistor commonly provided to the plurality of logic gates, and the common first conductivity type field effect transistor is connected to a carrier supply line which supplies carriers to the common first conductivity type field effect transistor, so that the plurality of logic gates have a common node between the first conductivity type field effect transistors and the common first conductivity type field effect transistor.

Abstract: A yield enhancement system organizes defect classification and attribute information into a global classification scheme. The global classes are used to identify defect sources and to generate inspection and review plans. The system accumulates defect information in a database and continually refines the information to improve the accuracy of the classification assignments and the identification of the defect sources.

Abstract: An iterative method enabling a request plan to be established for an observation satellite. A plan consists in a succession of requests which are associated with pluralities of opportunities for satisfying said requests. The plan must also comply with a plurality of constraints. Each iteration k of the iterative method is made up of the following steps: new opportunity is selected; a provisional plan is derived from the preceding plan k-1 as calculated in-the preceding iteration, and from the new opportunity; provisional plan is verified for compliance with said plurality of constraints; the quality of said provisional plan is evaluated; and it is determined whether the provisional plan should be confirmed as plan k as a function of the quality of said provisional plan and of the quality of said preceding plan k-1.

Abstract: In a code division multiple access (CDMA) cellular type mobile radio communication system, in order to realize effective system operation with neither more nor less of radio base stations which are simultaneously communicated with a mobile station on carrying out soft handoff, it is possible for the mobile station to communicate with the radio base stations having proper numbers in accordance with propagation environment and a moving speed of the mobile station by changing threshold levels for selection of the radio base stations and a hysteresis margin therefor on the basis of a variation rate in a propagation loss estimated by a reception level of a pilot signal.

Abstract: A photolithographic track system for semiconductor wafer manufacture, that includes an Atomic Force Microscope (AFM), having a scanning stylus probe measurement device coupled to the AFM head, for measuring overlay between masks and layers in an inspected wafer, so as to generate overlay data. The AFM is situated in-track.

Abstract: The present invention relates to an ink-jet recording head having a pressure generating chamber communicating with a nozzle aperture for jetting an ink droplet. A portion of the pressure generating chamber is composed of a diaphragm. An ink droplet is jetted by the displacement of a piezoelectric layer formed on the surface of the diaphragm. A connection between a lead electrode, for applying voltage to a piezoelectric element including a lower electrode, the piezoelectric layer and an upper electrode are respectively formed in an area corresponding to the pressure generating chamber. The piezoelectric element is provided in an area opposite to a passage communicating with the pressure generating chamber other than an area opposite to the pressure generating chamber. The ink-jet recording head is mounted in an ink-jet recording device and is used for recording on a recording medium.

Abstract: The present invention provides a method for the quantification and assessment of platelet activation in whole blood samples and monitoring of antiplatelet pharmacologic agents. The method for quantifying platelet activation includes exposing platelets to a physiological concentration of an agonist that activates some of the platelets, resulting in the formation of at least one binding site on the surface of the activated platelets, and measuring the activated platelets. The present invention provides a method of assessing specific components of platelet activation.

Abstract: A motor for an electric power steering assembly includes a yoke, a multi-polar magnetic field portion composed of at least four poles secured to the inner wall of the yoke, a shaft disposed within the yoke so as to be able to rotate freely, an armature secured to the shaft having a winding constructed by winding wiring into an even number of slots formed on the outer circumferential surface of a core so as to extend in the axial direction thereof, a commutator including a plurality of segments secured to an end portion of the shaft; and a plurality of brushes contacting the surface of the commutator.

Abstract: A system for controlling a servo-controlled gearbox (C), configured so as to use gear-shifting strategies similar to those used by a human driver so as to improve the driving sensation experienced by the driver. The control system uses a plurality of sensors (SENS) disposed in the vehicle for detecting the various operative conditions and a system of rules (a rule-based system) for implementing the strategies provided for.