Patents Represented by Law Firm Tandiorio & Teska
  • Patent number: 5792951
    Abstract: A measurement system including a plurality of self calibrating probes. Each probe has a sensor for providing a signal related to a physical parameter to be measured, and a connector for interfacing the sensor with a monitor. The connector includes a memory device for storing calibration data unique to the sensor. A cable interconnects the sensor with the connector. The monitor of the system includes a microprocessor for polling the storage device on the probe to extract the calibration data, and a software routine which converts the signal provided by the sensor into a calibrated signal and applies the extracted calibration data to the signal provided by the sensor.
    Type: Grant
    Filed: December 18, 1995
    Date of Patent: August 11, 1998
    Assignee: Cambridge AccuSense, Inc.
    Inventors: Raouf A. Ismail, Rajesh M. Nair
  • Patent number: 5389794
    Abstract: A surface pit and mound detection and discrimination system including a device for scanning a beam of radiation over a surface, and a mechanism for detecting a local slope on the surface for differentiating between whether the beam of radiation is scanning a pit or a mound on the surface.
    Type: Grant
    Filed: November 25, 1992
    Date of Patent: February 14, 1995
    Assignee: QC Optics, Inc.
    Inventors: Nicholas C. Allen, Sergey V. Broude, Eric T. Chase, Pascal Miller, Jay L. Ormsby, Bruno Rostaing, Lloyd P. Quackenbos