Abstract: A method and system for automatically determining regions in scanned object are provided. The method includes performing a scout scan of an object and automatically determining regions within the object based on attenuation information from the scout scan.
Type:
Grant
Filed:
November 23, 2005
Date of Patent:
July 19, 2011
Assignee:
General Electric Company
Inventors:
Thomas Louis Toth, Michael Patrick Daly