Abstract: The purpose of this invention is to automatically generate high quality test programs for the functional testing stage of microprocessor design. Programs for the functional testing are generated by a computer program using a random instruction generator. The generator produces instructions using four levels of abstraction: instructions, instruction categories, sequences, and functions. By choosing the level from which to pick instructions, test programs containing complicated sequences can be created, while at the same time random numbers may be used to produce instructions.
Type:
Grant
Filed:
September 2, 1993
Date of Patent:
January 30, 1996
Assignee:
Matsushita Electric Industrial Co., Ltd.