Patents Assigned to ACCUMETRA, LLC
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Patent number: 11935229Abstract: A method for calculating and reporting image quality properties of an image acquisition device after a subject or object has been scanned consists of a scan quality monitoring system with automated software for receiving scans and radiation dose data from scanners and automated algorithms for analyzing image quality metrics and radiation dose tradeoffs. Image quality assessment methods include algorithms for measuring fundamental imaging characteristics, level and type of image artifacts, and comparisons against large databases of historical data for the scanner and protocols. Image quality reports are further customized to report on expected clinical performance of image detection or measurement tasks.Type: GrantFiled: July 21, 2020Date of Patent: March 19, 2024Assignee: ACCUMETRA, LLCInventor: Ricardo S. Avila
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Publication number: 20210012488Abstract: A method for calculating and reporting image quality properties of an image acquisition device after a subject or object has been scanned consists of a scan quality monitoring system with automated software for receiving scans and radiation dose data from scanners and automated algorithms for analyzing image quality metrics and radiation dose tradeoffs. Image quality assessment methods include algorithms for measuring fundamental imaging characteristics, level and type of image artifacts, and comparisons against large databases of historical data for the scanner and protocols. Image quality reports are further customized to report on expected clinical performance of image detection or measurement tasks.Type: ApplicationFiled: July 21, 2020Publication date: January 14, 2021Applicant: ACCUMETRA, LLCInventor: Ricardo S. Avila
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Patent number: 10719930Abstract: A method for calculating and reporting image quality properties of an image acquisition device after a subject or object has been scanned consists of a scan quality monitoring system with automated software for receiving scans and radiation dose data from scanners and automated algorithms for analyzing image quality metrics and radiation dose tradeoffs. Image quality assessment methods include algorithms for measuring fundamental imaging characteristics, level and type of image artifacts, and comparisons against large databases of historical data for the scanner and protocols. Image quality reports are further customized to report on expected clinical performance of image detection or measurement tasks.Type: GrantFiled: April 13, 2016Date of Patent: July 21, 2020Assignee: ACCUMETRA, LLCInventor: Ricardo S. Avila
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Patent number: 10660600Abstract: A device for measuring image quality properties of an image acquisition device while the subject or object is being scanned contains an embedded grid pattern to measure spatial distortion along the length of the image acquisition table. The device also contains reference materials, which may run along the length of the device, for measuring fundamental imaging properties such as signal strength, noise, and resolution. Automated software can detect the device within an acquisition, measure its properties, and provide data and reports on the quality of the image acquisition.Type: GrantFiled: April 13, 2016Date of Patent: May 26, 2020Assignee: ACCUMETRA, LLCInventor: Ricardo S. Avila
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Publication number: 20180096477Abstract: A method for calculating and reporting image quality properties of an image acquisition device after a subject or object has been scanned consists of a scan quality monitoring system with automated software for receiving scans and radiation dose data from scanners and automated algorithms for analyzing image quality metrics and radiation dose tradeoffs. Image quality assessment methods include algorithms for measuring fundamental imaging characteristics, level and type of image artifacts, and comparisons against large databases of historical data for the scanner and protocols. Image quality reports are further customized to report on expected clinical performance of image detection or measurement tasks.Type: ApplicationFiled: April 13, 2016Publication date: April 5, 2018Applicant: ACCUMETRA, LLCInventor: Ricardo S. Avila
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Publication number: 20180035970Abstract: A device for measuring image quality properties of an image acquisition device while the subject or object is being scanned contains an embedded grid pattern to measure spatial distortion along the length of the image acquisition table. The device also contains reference materials, which may run along the length of the device, for measuring fundamental imaging properties such as signal strength, noise, and resolution. Automated software can detect the device within an acquisition, measure its properties, and provide data and reports on the quality of the image acquisition.Type: ApplicationFiled: April 13, 2016Publication date: February 8, 2018Applicant: ACCUMETRA, LLCInventor: Ricardo S. Avila