Abstract: A diode-laser-based active transducer integrated on a heat-assisted magnetic recording head includes a diode laser structure, as a laser source, and a waveguide-transducer integrated with the laser structure as an intracavity element. Being a part of the laser cavity, the waveguide-transducer very efficiently delivers and couples the high-intensity intracavity laser light to a plasmonic antenna/transducer that concentrates the delivered near-field light to an optical spot of subwavelength nano-size volume to locally heat the surface of the magnetic recording medium.
Type:
Application
Filed:
June 6, 2023
Publication date:
October 5, 2023
Applicant:
ACTOPROBE LLC
Inventors:
ALEXANDER A. UKHANOV, GENNADY A. SMOLYAKOV, FEI HUNG CHU
Abstract: A new semiconductor-laser-integrated Atomic Force Microscopy (AFM) optical probe integrates a semiconductor laser and a silicon cantilever AFM probe into a robust easy-to-use chip to enable AFM measurements, optical imaging, and spectroscopy at the nanoscale.
Type:
Application
Filed:
March 17, 2022
Publication date:
November 10, 2022
Applicant:
ACTOPROBE LLC
Inventors:
ALEXANDER A. UKHANOV, GENNADY A. SMOLYAKOV, FEI HUNG CHU
Abstract: A new monolithic Atomic Force Microscopy (AFM) active optical probe monolithically integrates a base of the probe, a cantilever, a semiconductor laser source, an AFM tip, and a photodetector into a robust, easy-to-use single semiconductor chip to enable AFM measurements, optical imaging, and optical spectroscopy at the nanoscale.
Type:
Grant
Filed:
April 11, 2017
Date of Patent:
May 25, 2021
Assignee:
ACTOPROBE LLC
Inventors:
Alexander A. Ukhanov, Gennady A. Smolyakov, Fei Hung Chu, Chengao Wang
Abstract: A new resonant-cavity-enhanced Atomic Force Microscopy (AFM) active optical probe integrates a semiconductor laser source and an aperture AFM/near-field scanning optical microscopy (NSOM) probe in either external-resonant-cavity or internal-resonant-cavity configuration to enable both conventional AFM measurements and optical imaging and spectroscopy at the nanoscale.
Type:
Grant
Filed:
July 10, 2018
Date of Patent:
May 26, 2020
Assignee:
ACTOPROBE LLC
Inventors:
Alexander A. Ukhanov, Gennady A. Smolyakov
Abstract: A new active optical Atomic Force Microscopy (AFM) probe integrating monolithically a semiconductor laser source, an AFM tip, and a photodetector into a robust, easy-to use single semiconductor chip to enable both conventional AFM measurements and optical imaging and spectroscopy at the nanoscale.
Type:
Grant
Filed:
January 8, 2016
Date of Patent:
November 1, 2016
Assignee:
ACTOPROBE, LLC
Inventors:
Alexander A. Ukhanov, Gennady A. Smolyakov