Patents Assigned to ACTOPROBE, LLC
  • Publication number: 20230317111
    Abstract: A diode-laser-based active transducer integrated on a heat-assisted magnetic recording head includes a diode laser structure, as a laser source, and a waveguide-transducer integrated with the laser structure as an intracavity element. Being a part of the laser cavity, the waveguide-transducer very efficiently delivers and couples the high-intensity intracavity laser light to a plasmonic antenna/transducer that concentrates the delivered near-field light to an optical spot of subwavelength nano-size volume to locally heat the surface of the magnetic recording medium.
    Type: Application
    Filed: June 6, 2023
    Publication date: October 5, 2023
    Applicant: ACTOPROBE LLC
    Inventors: ALEXANDER A. UKHANOV, GENNADY A. SMOLYAKOV, FEI HUNG CHU
  • Publication number: 20220357360
    Abstract: A new semiconductor-laser-integrated Atomic Force Microscopy (AFM) optical probe integrates a semiconductor laser and a silicon cantilever AFM probe into a robust easy-to-use chip to enable AFM measurements, optical imaging, and spectroscopy at the nanoscale.
    Type: Application
    Filed: March 17, 2022
    Publication date: November 10, 2022
    Applicant: ACTOPROBE LLC
    Inventors: ALEXANDER A. UKHANOV, GENNADY A. SMOLYAKOV, FEI HUNG CHU
  • Patent number: 11016119
    Abstract: A new monolithic Atomic Force Microscopy (AFM) active optical probe monolithically integrates a base of the probe, a cantilever, a semiconductor laser source, an AFM tip, and a photodetector into a robust, easy-to-use single semiconductor chip to enable AFM measurements, optical imaging, and optical spectroscopy at the nanoscale.
    Type: Grant
    Filed: April 11, 2017
    Date of Patent: May 25, 2021
    Assignee: ACTOPROBE LLC
    Inventors: Alexander A. Ukhanov, Gennady A. Smolyakov, Fei Hung Chu, Chengao Wang
  • Patent number: 10663485
    Abstract: A new resonant-cavity-enhanced Atomic Force Microscopy (AFM) active optical probe integrates a semiconductor laser source and an aperture AFM/near-field scanning optical microscopy (NSOM) probe in either external-resonant-cavity or internal-resonant-cavity configuration to enable both conventional AFM measurements and optical imaging and spectroscopy at the nanoscale.
    Type: Grant
    Filed: July 10, 2018
    Date of Patent: May 26, 2020
    Assignee: ACTOPROBE LLC
    Inventors: Alexander A. Ukhanov, Gennady A. Smolyakov
  • Patent number: 9482691
    Abstract: A new active optical Atomic Force Microscopy (AFM) probe integrating monolithically a semiconductor laser source, an AFM tip, and a photodetector into a robust, easy-to use single semiconductor chip to enable both conventional AFM measurements and optical imaging and spectroscopy at the nanoscale.
    Type: Grant
    Filed: January 8, 2016
    Date of Patent: November 1, 2016
    Assignee: ACTOPROBE, LLC
    Inventors: Alexander A. Ukhanov, Gennady A. Smolyakov