Abstract: A flexible, reconfigurable processing system architecture allows for the implementation of a variety of processing system configurations to be implemented on a single device, which is preferably a PCI bus add-in extension board with an attached daughter card attached and electrically connected thereto through a PCI Mezzanine type connector, and which is plugged into a personal computer PCI expansion slot. The architecture uses the PCI bus, for example, as the local CPU bus for an embedded processor, which not only allows for flexibility in system configuration but also allows PCI devices to be hidden from the host CPU to allow for proper system startup. The architecture further permits an embedded processing CPU to be re-booted when the secondary PCI bus host bus bridge fails to respond without affecting host CPU or other secondary PCI bus peripheral devices.

Abstract: A power control system and method controls power supplied from a power source to a resistive load, such as a LED illumination array, to prevent the load from exceeding a high temperature limit. The power control system and method generates a pulse train that represents heating in the load and uses digital logic to model the load temperature and calculate a temperature out value. When the temperature out value increases to reach a high temperature limit value, the power source is disconnected from the load. When the temperature out value decreases to reach a base temperature value, the power source is re-connected to the load.

Abstract: A power control system and method controls power supplied from a power source to a resistive load, such as a LED illumination array, to prevent the load from exceeding a high temperature limit. The power control system and method generates a pulse train that represents heating in the load and uses digital logic to model the load temperature and calculate a temperature out value. When the temperature out value increases to reach a high temperature limit value, the power source is disconnected from the load. When the temperature out value decreases to reach a base temperature value, the power source is re-connected to the load.

Abstract: A flexible, reconfigurable processing system architecture allows for the implementation of a variety of processing system configurations to be implemented on a single device, which is preferably a PCI bus add-in extension board with an attached daughter card attached and electrically connected thereto through a PCI Mezzanine type connector, and which is plugged into a personal computer PCI expansion slot. The architecture uses the PCI bus, for example, as the local CPU bus for an embedded processor, which not only allows for flexibility in system configuration but also allows PCI devices to be hidden from the host CPU to allow for proper system startup. The architecture further permits an embedded processing CPU to be re-booted when the secondary PCI bus host bus bridge fails to respond without affecting host CPU or other secondary PCI bus peripheral devices.

Abstract: A flexible, reconfigurable processing system architecture allows for the implementation of a variety of processing system configurations to be implemented on a single device, which is preferably a PCI bus add-in extension board with an attached daughter card attached and electrically connected thereto through a PCI Mezzanine type connector, and which is plugged into a personal computer PCI expansion slot. The architecture uses the PCI bus, for example, as the local CPU bus for an embedded processor, which not only allows for flexibility in system configuration but also allows PCI devices to be hidden from the host CPU to allow for proper system startup. The architecture further permits an embedded processing CPU to be re-booted when the secondary PCI bus host bus bridge fails to respond without affecting host CPU or other secondary PCI bus peripheral devices.

Abstract: A three-dimensional inspection system is used to obtain three-dimensional information pertaining to an article having specular surfaces, such as a BGA device, by projecting a pattern of light onto the article at an oblique angle with respect to the article. The system includes patterned light projector having an optical axis disposed at an oblique angle with respect to the plane of the article being inspected and an image detector or camera disposed generally above the article being inspected to detect the image of the pattern projected on the article. The patterned light projector includes an extended light source that directs light along the optical axis and a light patterning member disposed at an angle with respect to the optical axis such that the light pattern is in focus in an image plane parallel to the plane of the article, thereby satisfying the Scheimpflug condition. The light pattern preferably includes lines of light projected onto the article with a substantially equal thickness and spacing.

Abstract: An inspection system and method uses a first illumination apparatus, such as a ring illumination apparatus to illuminate one or more reflective elements, such as solder balls on an electronic component or other protruding surfaces or objects. The ring illumination apparatus includes a substantially ring-shaped light source that provides a substantially even illumination across the one or more reflective elements. An illumination detection device detects light beams reflecting off of the illuminated reflective elements for forming a first captured image. The system and method then uses a second, different illumination apparatus, such as an on-axis illumination apparatus to illuminate the reflective elements. The second illumination apparatus is selected so as to illuminate unwanted reflective elements substantially the same as they are illuminated by the first illumination apparatus while illuminating the desired reflective elements differently.

Abstract: The present invention provides a novel system and method that permits a “mask” to be directly incorporated into an image during image processing. This is accomplished by processing binary images or image data which are encoded using two bits rather than the usual one. The second bit is defined to be a “mask enable”, which directs a processor to pass the original data through to the output image regardless of the processing result for that pixel. The present invention also provides a means of automatically providing background data to the processor for pixels outside the original image so that the result image is always the same size as the original image. For binary images, the background may be defined to have a value of “0” or “1”, and this value is provided to the processing engine in place of all of the pixels which lie outside the original image.

Abstract: A method for creating, describing, editing and distributing user programs, such a digital signal processing programs of the type used in machine vision applications, across multiple processing targets. Such programs are optimized on and for the target system to execute the fastest on each target system based on the target system's individual processor, operating system and memory type. The user program is made up of a series of operations called “steps” that are organized in a hierarchical structure or list and which encapsulate the data necessary for the target processor to optimally execute and program and allows optional editing in a target system native and step specific GUI environment. The user programs generated by the present method are not in a computer language nor are they created by directed programming techniques. Further, they are not interpreted. Rather, the steps include one or more associated step objects that in turn call step agents at the time of step program execution.

Abstract: A data processing system including a data processor, also called a processing accelerator, processes at least one processor word each clock cycle. Each processor word includes multiple complete data samples which are received individually as part of a sequential stream of logically adjacent or related data samples such as in image data pixels which are part of an image to be processed by a machine vision system. A predetermined number of the data samples are stored together, as a processor word, in dedicated processing accelerator memory. For example, four 8 bit data samples can be stored together as one 32 bit processor word. The system also includes a data aligner which allows the processing accelerator to process at least one processor word comprised of at least one data sample from two processor words. The aligner controls data sample alignment such as for example, pixel alignment in the case of a vision system, to facilitate image data processing.

Abstract: A method of accurately locating a sub-pixel maximum on a two-dimensional grid having an x axis and a y axis is provided. The method, which is especially suitable for locating a sub-pixel maximum, which falls intermediate grid point locations, begins by identifying a grid point having a maximum grid point value. Then, a quadrangle containing the sub-pixel maximum is determined by locating neighboring grid points along the x and y axes, which have the next greatest grid point values. Next, four one-dimensional, fractional maxima are computed along each side of a quadrangle. Next, two lines connecting one-dimensional maxima along the opposite sides of the quadrangle are computed. Finally, a location for the sub-pixel maximum is calculated where the two computed lines intersect.

Abstract: An inspection system and method uses a first illumination apparatus to illuminate one or more features, such as solder balls on an electronic component or other protruding surfaces or features on an object being inspected. Once the object being inspected is illuminated, a first reflected image of the plurality of features is captured by an illumination detection device. The first reflected image is stored in an image buffer. The object being inspected is then illuminated by at least one additional illumination apparatus. Each additional illumination apparatus is selected so that it differs from the other illumination apparatuses in either geometrical arrangement, degree of diffusion or illumination characteristic. An additional reflected image of the object is then captured by the illumination detection device while the object is illuminated by each additional illumination apparatus. Each additional reflected image is also stored in an image buffer.

Abstract: An inspection system and method for optically inspecting substantially the entire circumference of a cylindrical surface, such as a cigarette is provided. The system includes first and second moveable supports for supporting and transporting the cigarette so that a first side of the cylindrical surface of the cigarette is presented to a first visual inspection apparatus and a second side, which includes at least those portions of the cylindrical surface of the cigarette not included in the first side, is presented to a second visual inspection apparatus. Each visual inspection apparatus includes an illumination source for illuminating the presented side of the cigarette's surface. Each illumination source is configured to direct light onto the cigarette's surface substantially in the direction of the longitudinal axis of the cigarette at a low, acute angle with respect to the longitudinal axis.

Abstract: A three-dimensional inspection system is used to obtain three-dimensional information pertaining to an article having specular surfaces, such as a BGA device, by projecting a pattern of light onto the article at an oblique angle with respect to the article. The system includes patterned light projector having an optical axis disposed at an oblique angle with respect to the plane of the article being inspected and an image detector or camera disposed generally above the article being inspected to detect the image of the pattern projected on the article. The patterned light projector includes an extended light source that directs light along the optical axis and a light patterning member disposed at an angle with respect to the optical axis such that the light pattern is in focus in an image plane parallel to the plane of the article, thereby satisfying the Scheimpflug condition. The light pattern preferably includes lines of light projected onto the article with a substantially equal thickness and spacing.

Abstract: An illumination apparatus and method illuminates one or more reflective elements, such as solder balls on an electronic component or other protruding surfaces or objects. The illumination apparatus includes one or more arc shaped or arc shape arranged light sources that provides a substantially even illumination across the one or more reflective elements. An illumination detection device detects light beams reflecting off of the illuminated reflective elements for forming a reflected image. A method of processing the reflected image includes locating one or more points on each reflected image element representing an illuminated reflective element. The points on the reflected image elements are used to located the pattern of the reflected image elements and/or to fit an outline around each image element corresponding to a known percentage of the true dimensions of each solder ball or other reflective element.

Abstract: An apparent network interface permits one processor such as a processor embedded within a larger processing system (an embedded processor) to communicate to a host processor or other processors and devices on the network to which the embedded processor is attached, using standard network communication mechanisms/protocols such as TCP/IP, NFS, FTP, HTTP, etc. The web server protocol HTTP is particularly useful because it permits the embedded computer to publish a user interface for remote monitoring and remote control using a standard web browser application. The invention provides the host computer with an apparent network interface that appears to be a standard network device, such as an Ethernet interface card. This apparent interface communicates directly with the embedded processor, which appears to be a device on this apparent network.

Abstract: A data extraction processor receives data, such as image data, at a high rate of speed and generates processed results, generally at a much lower overall data rate. This sort of processing is particularly useful for machine vision image data, because it can reduce a large image data set to a much smaller data set that is more immediately useful for the currently running application. The data extraction processor may include a segmentation processor, a gradient processor, or other similar types of data extraction processors. The disclosed data extraction processor includes a data flow controller which provides image data to the processors and receives the results from the processors. The data flow controller includes at least one FIFO (first-in, first-out) memory, which allows for the provision of data to the data extraction processor and the receipt of result data therefrom to occur at different rates.

Abstract: The present invention provides a novel system and method that permits a "mask" to be directly incorporated into an image during image processing. This is accomplished by processing binary images or image data which are encoded using two bits rather than the usual one. The second bit is defined to be a "mask enable", which directs a processor to pass the original data through to the output image regardless of the processing result for that pixel. The present invention also provides a means of automatically providing background data to the processor for pixels outside the original image so that the result image is always the same size as the original image. For binary images, the background may be defined to have a value of "0" or "1", and this value is provided to the processing engine in place of all of the pixels which lie outside the original image.

Abstract: A data resampler for a data processing system for logically adjacent data samples is provided. The data resampler includes a memory subsystem for storing samples to be rendered, a digital differential analyzer (DDA) for generating an interpolation corner address for a sample to be rendered and which also generates a set of interpolation fractions. The resampler also includes a fetch unit, which receives the generated interpolation corner address and generates four source addresses of samples to be fetched from the memory subsystem. A number of memory units are included in the resampler. The first memory unit is a first in, first out FIFO memory, for holding the generated interpolation fractions and for permitting the DDA and fetch unit to continue to operate during memory read latency periods. The second memory unit is also a FIFO memory and is used to hold pixel data.

Abstract: An inspection system and method uses a ring illumination apparatus to illuminate one or more reflective elements, such as solder balls on an electronic component or other protruding surfaces or objects. The ring illumination apparatus includes a substantially ring-shaped light source that provides a substantially even illumination across the one or more reflective elements. An illumination detection device detects light beams reflecting off of the illuminated reflective elements for forming a reflected image. A method of processing the reflected image includes locating one or more edges of each reflected image element representing an illuminated reflective element. The edges of the reflected image elements are located by determining the maximum intensity gradient in the pixels forming the reflected image element. The inspection system and method thereby determines various characteristics such as the absence/presence, location, pitch, size and shape of each reflective element.