Abstract: An inspection system for detecting contraband in cargo containers, vehicles, rail cars, etc. having an X-ray source and X-ray imaging capability. A cargo container or vehicle is scanned with the beam to look for possible target objects, such as contraband. If the X-ray image shows the existence of targets or possible targets at specific sites, each site may be probed with neutrons by placing a beam converter plate in front of the same X-ray beam used for X-ray imaging, converting the beam to a neutron beam. The neutrons are quickly thermalized and captured by materials producing nuclear reactions with specific elements, yielding gamma rays whose energy is characteristic of particular specific elements. For special nuclear materials, the neutron probe beam can induce the emission of fission neutrons which can be detected. Disclosed are embodiments where the cargo container is fixed and the X-ray equipment is mobile and where the cargo container is mobile and the X-ray equipment is fixed.

Abstract: A radiographic inspection apparatus for large containers, vehicles and structures having a movable frame which can straddle the container or object being inspected. The straddling frame has opposed parallel sides which carry a source of penetrating radiation and a detector array. The source or sources and detectors are moved along the length of a container while radiographic image data is being sequentially recorded. By summing or collecting the sequence of data over the length of a container as the straddling frame moves along, a full two-dimensional radiographic image of the container may be obtained. Radiographic images may be enhanced either by providing uniform motion for the straddling frame or by measuring non-uniform motion and compensating corresponding regions of the radiographic image.

Abstract: Computed tomography inspection apparatus and method of inspecting electronic devices and features of PCBs/PWBs, such as solder bonds, tracings and vias. The system scans radiation passed through the devices in thin slices and detects attenuated radiation from which it generates data representing slice images with high resolution. The detected image data are analyzed automatically by an image data analyzer which receives model data against which it compares and evaluates the detected image data.

Abstract: A method for reliability testing of wafer stage integrated circuit devices wherein a hardness factor is established relating device substrate currents to device lifetimes attributable to interface trap degradation. A beam of ionizing radiation is then directed onto the device until a critical dose is reached, at which time the device fails. The critical dose is plotted against hardness factors so that device lifetimes may be predicted.

Abstract: An optical system with feedback control of the pulse energy of an attenuated laser pulse output by the system having a laser, attenuators, and a servo control subsystem. The attenuators include a beam attenuator module within the servo loop for variable adjustment of laser beam attenuation, and a plurality of light absorbing filters outside of the servo loop which can be selectively switched into or out of the beam path for further attentuation by known fixed amounts. A Brewster window, a photodiode and associated electronics sample the beam following attentuation by the beam attenuator module, and deliver a feedback signal to a microprocessor. The microprocessor compares the feedback signal and a used input desired pulse energy, then causes the beam attenuator module to adjust the amount attenuation so that the output beam energy is maintained within about five percent of the desired energy.

Abstract: A test apparatus for electron devices, such as integrated circuits, at the wafer stage of fabrication, wherein a beam of ionizing radiation is directed through an electrical probe card and onto the wafer under test. The probe card and the radiation beam share a common port through which a selected device or group of devices is exposed, but other devices on the wafer are not similarly exposed. A microscope, supported on a frame, is interchangeable with the radiation beam source, sharing the common port, so that a tested device may be observed.