Abstract: Various aspects directed towards an integrated transverse electromagnetic (TEM) transmission line structure for probe calibration are disclosed. In one example, the integrated TEM transmission line structure includes a printed circuit board (PCB) and an air-dielectric coplanar waveguide (CPW). For this example, the air-dielectric CPW includes an air trace in a cutout slot of the PCB. In another example, a method is disclosed, which includes forming an air-dielectric CPW on a PCB in which the air-dielectric CPW includes an air trace in a cutout slot of the PCB. In a further example, an integrated TEM transmission line structure includes an air-dielectric CPW with an air trace. For this example, a first connector is electrically coupled to a first end of the air-dielectric CPW, and a second connector is electrically coupled to a second end of the air-dielectric CPW.

Abstract: A system and method for testing a device under test (DUT) combines measurement data of field components values made at different sampling locations away from the DUT with computer-aided design layout of the DUT. The combined computer-aided design layout of the DUT and the measurement data can then be displayed for analysis.

Abstract: A system and method for performing radiation source analysis on a device under test (DUT) uses discrete Fourier transform on measured field components values at different sampling locations away from the DUT to derive field component values at locations on the DUT. The results of the discrete Fourier transform are multiplied by a complex phase adjustment term as a function of distance from the sampling locations to the DUT to translate the measured field component values back to the locations on the surface of the DUT.

Abstract: A system and method for measuring near field information of a device under test (DUT) uses a reference probe and a measurement probe that are configured to sense a field. A probe calibration factor is used to determine corresponding field values for signals from the measurement probe at sampling locations about the DUT. The probe calibration factor is derived from measured signals about a conductive trace using a probe and simulated field information for the conductive trace when subjected to a simulated reference signal.

Abstract: A system and method for performing radiation source analysis on a device under test (DUT) uses discrete Fourier transform on measured field components values at different sampling locations away from the DUT to derive field component values at locations on the DUT. The results of the discrete Fourier transform are multiplied by a complex phase adjustment term as a function of distance from the sampling locations to the DUT to translate the measured field component values back to the locations on the surface of the DUT.