Patents Assigned to AMO Wavefront Sciences, LLP
  • Geometric measurement system and method of measuring a geometric characteristic of an object
    Patent number: 7616330
    Abstract: A geometric measurement system is adapted to precisely measure one or more surfaces of objects such as corneas, molds, contact lenses in molds, contact lenses, or other objects in a fixture. The geometric measurement system can employ one or more of three possible methods of measurement: Shack-Hartmann wavefront sensing with wavefront stitching; phase diversity sensing; and white light interferometry.
    Type: Grant
    Filed: April 9, 2007
    Date of Patent: November 10, 2009
    Assignee: AMO Wavefront Sciences, LLP
    Inventors: Daniel R. Neal, Thomas Daniel Raymond, William Shea Powers