Abstract: In order to provide an IC tester which can measure noise measuring performance in a position where a DUT to be analyzed on an evaluation board is mounted quantitatively, a noise evaluation circuit comprises a reference resistor which generates thermal noise, a reference noise generator a summing circuit, an amplifying circuit which amplifies result of the calculation in the summing circuit, a switch, and an evaluation board having the reference resistor, the reference noise generator, the summing circuit, the amplifying circuit, and the switch thereon for evaluating the DUT to be evaluated. Two kinds of electricity value which is output by the amplifying circuit by an on/off operation of the switch are calculated with noise figure F according to three kinds of electricity value including electricity value such as the reference noise electricity.

Abstract: In order to provide an IC tester which can measure noise measuring performance in a position where a DUT to be analyzed on an evaluation board is mounted quantitatively, a noise evaluation circuit comprises a reference resistor which generates thermal noise, a reference noise generator a summing circuit, an amplifying circuit which amplifies result of the calculation in the summing circuit, a switch, and an evaluation board having the reference resistor, the reference noise generator, the summing circuit, the amplifying circuit, and the switch thereon for evaluating the DUT to be evaluated. Two kinds of electricity value which is output by the amplifying circuit by an on/off operation of the switch are calculated with noise figure F according to three kinds of electricity value including electricity value such as the reference noise electricity.