Patents Assigned to Applied Particle Technology, Inc.
  • Patent number: 11614392
    Abstract: A method and apparatus for particle counting and wavelength or angle performed in combination in order to characterize an aerosol is disclosed. In one example, data regarding particle counting (such as from an optical particle sensor) and data regarding angle or wavelength (such as from an ensemble measurement sensor) may be separately generated, with the separately generated data being analyzed in combination in order to characterize the aerosol. In another example, data regarding particle counting and regarding angle or wavelength may be generated in combination in order to characterize the aerosol.
    Type: Grant
    Filed: December 6, 2019
    Date of Patent: March 28, 2023
    Assignee: Applied Particle Technology, Inc.
    Inventors: Tandeep S. Chadha, Jiaxi Fang, Pratim Biswas
  • Patent number: 11499954
    Abstract: Systems, apparatuses, and methods for monitoring an environment are provided. One system includes a monitoring unit positioned within an environment and including an acoustic sensor configured to generate detected acoustic data regarding acoustics in the environment, and a controller having one or more processors and one or more non-transitory memory devices that store instructions for controlling the one or more first processors to receive and store the detected acoustic data, determine, based on the detected acoustic data, whether a noise is above a threshold, and determine, based on the detected acoustic data and that the noise is above the threshold, an estimated source of the noise.
    Type: Grant
    Filed: October 20, 2020
    Date of Patent: November 15, 2022
    Assignee: Applied Particle Technology, Inc.
    Inventors: Tandeep Singh Chadha, Jiaxi Fang, Pratim Biswas
  • Publication number: 20200182765
    Abstract: A method and apparatus for particle counting and wavelength or angle performed in combination in order to characterize an aerosol is disclosed. In one example, data regarding particle counting (such as from an optical particle sensor) and data regarding angle or wavelength (such as from an ensemble measurement sensor) may be separately generated, with the separately generated data being analyzed in combination in order to characterize the aerosol. In another example, data regarding particle counting and regarding angle or wavelength may be generated in combination in order to characterize the aerosol.
    Type: Application
    Filed: December 6, 2019
    Publication date: June 11, 2020
    Applicant: Applied Particle Technology, Inc.
    Inventors: Tandeep S. Chadha, Jiaxi Fang, Pratim Biswas
  • Patent number: 10670572
    Abstract: Systems, apparatuses, and methods for monitoring an environment are provided. These systems, apparatus, and methods may include a monitoring unit positioned within the environment that includes an air quality sensor configured to generate particle data, a communications unit configured to directly or indirectly transmit data between the monitoring unit and a remote computing unit, and a controller with instructions to cause the air quality sensor to generate particle data about particles in the environment, and transmit the particle data to the remote computing unit. The remote computing unit may be positioned outside the environment, and include a second processor, another communications unit, and another non-transitory memory device with instructions to receive and store the particle data, and determine, based on the received particle data generated by the air quality sensor, whether a first exposure threshold has been exceeded for the monitoring unit.
    Type: Grant
    Filed: March 5, 2019
    Date of Patent: June 2, 2020
    Assignee: Applied Particle Technology, Inc.
    Inventors: Tandeep Singh Chadha, Jiaxi Fang, Pratim Biswas