Abstract: Systems, methods, and computer programs for increasing a contrast for a lithography system are disclosed. In one aspect, a method of optimizing a process for imaging a feature on a substrate using a photolithography system is disclosed, the method including obtaining an optical spectrum of a light beam for the imaging, wherein the light beam includes pulses having a plurality of different wavelengths, and narrowing the optical spectrum of the pulses of the light beam for the imaging to improve a quality metric of the imaging.
Type:
Application
Filed:
February 10, 2020
Publication date:
May 26, 2022
Applicants:
ASML Nethlands B. V., Cymer, LLC
Inventors:
Willard Earl CONLEY, Joshua Jon THORNES, Duan-Fu Stephen HSU